Texas Instruments 的 TMUX1119 规格书

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An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
TMUX1119
SCDS401B –DECEMBER 2018REVISED MAY 2020
TMUX1119 5-V, Low-Leakage-Current, 2:1 Precision Switch
1
1 Features
1 Wide supply range: 1.08 V to 5.5 V
Low leakage current: 3 pA
Low on-resistance: 1.8 Ω
Low charge injection: –6 pC
-40°C to +125°C Operating temperature
1.8 V Logic Compatible
Fail-Safe Logic
Rail to Rail Operation
Bidirectional Signal Path
Break-before-make switching
ESD protection HBM: 2000 V
2 Applications
Ultrasound scanners
Patient monitoring & diagnostics
Blood glucose monitors
Optical module
Optical transport
Remote radio units
Data acquisition systems
Semiconductor test equipment
Factory automation and industrial controls
Flow transmitters
Programmable logic controllers (PLC)
Analog input modules
Battery Test
3 Description
The TMUX1119 is a complementary metal-oxide
semiconductor (CMOS) single-pole double-throw
(2:1) switch. Wide operating supply of 1.08 V to 5.5 V
allows for use in a broad array of applications from
medical equipment to industrial systems. The device
supports bidirectional analog and digital signals on
the source (Sx) and drain (D) pins ranging from GND
to VDD. All logic inputs have 1.8 V logic compatible
thresholds, ensuring both TTL and CMOS logic
compatibility when operating in the valid supply
voltage range. Fail-Safe Logic circuitry allows
voltages on the control pins to be applied before the
supply pin, protecting the device from potential
damage.
The TMUX1119 is part of the precision switches and
multiplexers family of devices. These devices have
very low on and off leakage currents and low charge
injection, allowing them to be used in high precision
measurement applications. A low supply current of 3
nA and small package options enable use in portable
applications.
Device Information(1)
PART NUMBER PACKAGE BODY SIZE (NOM)
TMUX1119 SC70 (6) 2.00 mm × 1.25 mm
SOT-23 (6) 2.90 mm x 1.60 mm
(1) For all available packages, see the package option addendum
at the end of the data sheet.
SPACER
SPACER
Application Example Block Diagram
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Table of Contents
1 Features.................................................................. 1
2 Applications ........................................................... 1
3 Description ............................................................. 1
4 Revision History..................................................... 2
5 Pin Configuration and Functions......................... 3
6 Specifications......................................................... 4
6.1 Absolute Maximum Ratings ...................................... 4
6.2 ESD Ratings.............................................................. 4
6.3 Recommended Operating Conditions....................... 4
6.4 Thermal Information.................................................. 4
6.5 Electrical Characteristics (VDD = 5 V ±10 %)............ 5
6.6 Electrical Characteristics (VDD = 3.3 V ±10 %)......... 7
6.7 Electrical Characteristics (VDD = 1.8 V ±10 %)......... 9
6.8 Electrical Characteristics (VDD = 1.2 V ±10 %)....... 11
6.9 Typical Characteristics............................................ 13
7 Parameter Measurement Information ................ 16
7.1 On-Resistance ........................................................ 16
7.2 Off-Leakage Current ............................................... 16
7.3 On-Leakage Current ............................................... 17
7.4 Transition Time ....................................................... 17
7.5 Break-Before-Make................................................. 18
7.6 Charge Injection...................................................... 18
7.7 Off Isolation............................................................. 19
7.8 Crosstalk ................................................................. 19
7.9 Bandwidth ............................................................... 20
8 Detailed Description............................................ 21
8.1 Overview ................................................................. 21
8.2 Functional Block Diagram....................................... 21
8.3 Feature Description................................................. 21
8.4 Device Functional Modes........................................ 23
8.5 Truth Tables............................................................ 23
9 Application and Implementation ........................ 24
9.1 Application Information............................................ 24
9.2 Typical Application ................................................. 24
9.3 Design Requirements.............................................. 24
9.4 Detailed Design Procedure..................................... 25
9.5 Application Curve.................................................... 25
10 Power Supply Recommendations ..................... 25
11 Layout................................................................... 26
11.1 Layout Guidelines ................................................. 26
11.2 Layout Example .................................................... 26
12 Device and Documentation Support ................. 27
12.1 Documentation Support ........................................ 27
12.2 Related Links ........................................................ 27
12.3 Receiving Notification of Documentation Updates 27
12.4 Community Resources.......................................... 27
12.5 Trademarks........................................................... 27
12.6 Electrostatic Discharge Caution............................ 27
12.7 Glossary................................................................ 27
13 Mechanical, Packaging, and Orderable
Information ........................................................... 27
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision A (November 2019) to Revision B Page
Changed status of DBV package From: Product Preview To: Production Data .................................................................... 1
Added Thermal information for DBV package........................................................................................................................ 4
Changes from Original (December 2018) to Revision A Page
Changed the data sheet title From: Precision Analog Multiplexer To: Precision Switch........................................................ 1
Changed the Applications list ................................................................................................................................................. 1
Changed Thermal Information for DCK package ................................................................................................................... 4
l TEXAS INSTRUMENTS
1SEL 6 S2
2VDD 5 D
3GND 4 S1
Not to scale
1SEL 6 S2
2VDD 5 D
3GND 4 S1
Not to scale
3
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5 Pin Configuration and Functions
DCK Package
6-Pin SC70
Top View
DBV Package
6-Pin SOT-23
Top View
(1) I = input, O = output, I/O = input and output, P = power
Pin Functions
PIN TYPE(1) DESCRIPTION
NAME NO.
SEL 1 I Select pin: controls state of the switch according to Table 1. (Logic Low = S1 to D, Logic High = S2 to D)
VDD 2 P Positive power supply. This pin is the most positive power-supply potential. For reliable operation, connect
a decoupling capacitor ranging from 0.1 µF to 10 µF between VDD and GND.
GND 3 P Ground (0 V) reference
S1 4 I/O Source pin 1. Can be an input or output.
D 5 I/O Drain pin. Can be an input or output.
S2 6 I/O Source pin 2. Can be an input or output.
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SCDS401B DECEMBER 2018REVISED MAY 2020
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(1) Stresses beyond those listed under Absolute Maximum Rating may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Condition. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) The algebraic convention, whereby the most negative value is a minimum and the most positive value is a maximum.
6 Specifications
6.1 Absolute Maximum Ratings
Over operating free-air temperature range (unless otherwise noted).(1)(2)
MIN MAX UNIT
VDD Supply voltage –0.5 6 V
VSEL or VEN Logic control input pin voltage (SEL) –0.5 6 V
ISEL or IEN Logic control input pin current (SEL) –30 30 mA
VSor VDSource or drain voltage (Sx, D) –0.5 VDD+0.5 V
ISor ID (CONT) Source or drain continuous current (Sx, D) –30 30 mA
Tstg Storage temperature –65 150 °C
TJJunction temperature 150 °C
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.2 ESD Ratings
VALUE UNIT
V(ESD) Electrostatic discharge
Human body model (HBM), per
ANSI/ESDA/JEDEC JS-001, all pins(1) ±2000
V
Charged device model (CDM), per JEDEC
specification JESD22-C101, all pins(2) ±750
6.3 Recommended Operating Conditions
Over operating free-air temperature range (unless otherwise noted).
MIN NOM MAX UNIT
VDD Supply voltage 1.08 5.5 V
VSor VDSignal path input and output voltage (source or drain pin) (Sx, D) 0 VDD V
VSEL Logic control input pin voltage (SEL) 0 5.5 V
TAAmbient temperature –40 125 °C
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
6.4 Thermal Information
THERMAL METRIC(1)
TMUX1119
UNITDCK (SC70) DBV (SOT-23)
6 PINS 6 PINS
RθJA Junction-to-ambient thermal resistance 243.1 212.3 °C/W
RθJC(top) Junction-to-case (top) thermal resistance 206.0 156.7 °C/W
RθJB Junction-to-board thermal resistance 128.3 96.5 °C/W
ΨJT Junction-to-top characterization parameter 107.8 80.7 °C/W
ΨJB Junction-to-board characterization parameter 128.0 96.2 °C/W
RθJC(bot) Junction-to-case (bottom) thermal resistance N/A N/A °C/W
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(1) When VSis 4.5 V, VDis 1.5 V, and vice versa.
6.5 Electrical Characteristics (VDD = 5 V ±10 %)
At TA= 25°C, VDD = 5 V (unless otherwise noted).
PARAMETER TEST CONDITIONS TA MIN TYP MAX UNIT
ANALOG SWITCH
RON On-resistance VS= 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C 1.8 4 Ω
–40°C to +85°C 4.5 Ω
–40°C to +125°C 4.9 Ω
ΔRON On-resistance matching between
channels
VS= 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C 0.13 Ω
–40°C to +85°C 0.4 Ω
–40°C to +125°C 0.5 Ω
RON
FLAT On-resistance flatness VS= 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C 0.85 Ω
–40°C to +85°C 1.4 Ω
–40°C to +125°C 1.6 Ω
IS(OFF) Source off leakage current(1)
VDD = 5 V
Switch Off
VD= 4.5 V / 1.5 V
VS= 1.5 V / 4.5 V
Refer to Off-Leakage Current
25°C –0.08 ±0.005 0.08 nA
–40°C to +85°C –0.3 0.3 nA
–40°C to +125°C –0.9 0.9 nA
ID(ON)
IS(ON) Channel on leakage current
VDD = 5 V
Switch On
VD= VS= 2.5 V
Refer to On-Leakage Current
25°C –0.025 ±0.003 0.025 nA
–40°C to +85°C –0.3 0.3 nA
–40°C to +125°C –0.95 0.95 nA
ID(ON)
IS(ON) Channel on leakage current
VDD = 5 V
Switch On
VD= VS= 4.5 V / 1.5 V
Refer to On-Leakage Current
25°C –0.1 ±0.01 0.1 nA
–40°C to +85°C –0.35 0.35 nA
–40°C to +125°C –2 2 nA
LOGIC INPUTS (SEL)
VIH Input logic high –40°C to +125°C 1.49 5.5 V
VIL Input logic low –40°C to +125°C 0 0.87 V
IIH
IIL Input leakage current 25°C ±0.005 µA
IIH
IIL Input leakage current –40°C to +125°C ±0.05 µA
CIN Logic input capacitance 25°C 1 pF
CIN Logic input capacitance –40°C to +125°C 2 pF
POWER SUPPLY
IDD VDD supply current Logic inputs = 0 V or 5.5 V 25°C 0.003 µA
–40°C to +125°C 1 µA
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Electrical Characteristics (VDD = 5 V ±10 %) (continued)
At TA= 25°C, VDD = 5 V (unless otherwise noted).
PARAMETER TEST CONDITIONS TA MIN TYP MAX UNIT
DYNAMIC CHARACTERISTICS
tTRAN Switching time between channels VS= 3 V
RL= 200 , CL= 15 pF
Refer to Transition Time
25°C 12 ns
–40°C to +85°C 18 ns
–40°C to +125°C 19 ns
tOPEN
(BBM) Break before make time VS= 3 V
RL= 200 , CL= 15 pF
Refer to Break-Before-Make
25°C 8 ns
–40°C to +85°C 1 ns
–40°C to +125°C 1 ns
QCCharge Injection VD= 1 V
RS= 0 , CL= 1 nF
Refer to Charge Injection 25°C –6 pC
OISO Off Isolation
RL= 50 , CL= 5 pF
f = 1 MHz
Refer to Off Isolation 25°C –65 dB
RL= 50 , CL= 5 pF
f = 10 MHz
Refer to Off Isolation 25°C –45 dB
XTALK Crosstalk
RL= 50 , CL= 5 pF
f = 1 MHz
Refer to Crosstalk 25°C –65 dB
RL= 50 , CL= 5 pF
f = 10 MHz
Refer to Crosstalk 25°C –45 dB
BW Bandwidth RL= 50 , CL= 5 pF
Refer to Bandwidth 25°C 250 MHz
CSOFF Source off capacitance f = 1 MHz 25°C 6 pF
CSON
CDON On capacitance f = 1 MHz 25°C 20 pF
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(1) When VSis 3 V, VDis 1 V, and vice versa.
6.6 Electrical Characteristics (VDD = 3.3 V ±10 %)
At TA= 25°C, VDD = 3.3 V (unless otherwise noted).
PARAMETER TEST CONDITIONS TA MIN TYP MAX UNIT
ANALOG SWITCH
RON On-resistance VS= 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C 3.7 8.8 Ω
–40°C to +85°C 9.5 Ω
–40°C to +125°C 9.8 Ω
ΔRON On-resistance matching between
channels
VS= 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C 0.13 Ω
–40°C to +85°C 0.4 Ω
–40°C to +125°C 0.5 Ω
RON
FLAT On-resistance flatness VS= 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C 1.9 Ω
–40°C to +85°C 2 Ω
–40°C to +125°C 2.2 Ω
IS(OFF) Source off leakage current(1)
VDD = 3.3 V
Switch Off
VD= 3 V / 1 V
VS= 1 V / 3 V
Refer to Off-Leakage Current
25°C –0.05 ±0.001 0.05 nA
–40°C to +85°C –0.1 0.1 nA
–40°C to +125°C –0.5 0.5 nA
ID(ON)
IS(ON) Channel on leakage current
VDD = 3.3 V
Switch On
VD= VS= 3 V / 1 V
Refer to On-Leakage Current
25°C –0.1 ±0.005 0.1 nA
–40°C to +85°C –0.35 0.35 nA
–40°C to +125°C –2 2 nA
LOGIC INPUTS (SEL)
VIH Input logic high –40°C to +125°C 1.35 5.5 V
VIL Input logic low –40°C to +125°C 0 0.8 V
IIH
IIL Input leakage current 25°C ±0.005 µA
IIH
IIL Input leakage current -40°C to 125°C ±0.05 µA
CIN Logic input capacitance 25°C 1 pF
CIN Logic input capacitance –40°C to +125°C 2 pF
POWER SUPPLY
IDD VDD supply current Logic inputs = 0 V or 5.5 V 25°C 0.003 µA
–40°C to +125°C 0.8 µA
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Electrical Characteristics (VDD = 3.3 V ±10 %) (continued)
At TA= 25°C, VDD = 3.3 V (unless otherwise noted).
PARAMETER TEST CONDITIONS TA MIN TYP MAX UNIT
DYNAMIC CHARACTERISTICS
tTRAN Switching time between channels VS= 2 V
RL= 200 , CL= 15 pF
Refer to Transition Time
25°C 14 ns
–40°C to +85°C 20 ns
–40°C to +125°C 21 ns
tOPEN
(BBM) Break before make time VS= 2 V
RL= 200 , CL= 15 pF
Refer to Break-Before-Make
25°C 9 ns
–40°C to +85°C 1 ns
–40°C to +125°C 1 ns
QCCharge Injection VD= 1 V
RS= 0 , CL= 1 nF
Refer to Charge Injection 25°C –6 pC
OISO Off Isolation
RL= 50 , CL= 5 pF
f = 1 MHz
Refer to Off Isolation 25°C –65 dB
RL= 50 , CL= 5 pF
f = 10 MHz
Refer to Off Isolation 25°C –45 dB
XTALK Crosstalk
RL= 50 , CL= 5 pF
f = 1 MHz
Refer to Crosstalk 25°C –65 dB
RL= 50 , CL= 5 pF
f = 10 MHz
Refer to Crosstalk 25°C –45 dB
BW Bandwidth RL= 50 , CL= 5 pF
Refer to Bandwidth 25°C 250 MHz
CSOFF Source off capacitance f = 1 MHz 25°C 6 pF
CSON
CDON On capacitance f = 1 MHz 25°C 20 pF
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(1) When VSis 1.62 V, VDis 1 V, and vice versa.
6.7 Electrical Characteristics (VDD = 1.8 V ±10 %)
At TA= 25°C, VDD = 1.8 V (unless otherwise noted).
PARAMETER TEST CONDITIONS TA MIN TYP MAX UNIT
ANALOG SWITCH
RON On-resistance VS= 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C 40 Ω
–40°C to +85°C 80 Ω
–40°C to +125°C 80 Ω
ΔRON On-resistance matching between
channels
VS= 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C 0.4 Ω
–40°C to +85°C 1.5 Ω
–40°C to +125°C 1.5 Ω
IS(OFF) Source off leakage current(1)
VDD = 1.98 V
Switch Off
VD= 1.62 V / 1 V
VS= 1 V / 1.62 V
Refer to Off-Leakage Current
25°C –0.05 ±0.003 0.05 nA
–40°C to +85°C –0.1 0.1 nA
–40°C to +125°C –0.5 0.5 nA
ID(ON)
IS(ON) Channel on leakage current
VDD = 1.98 V
Switch On
VD= VS= 1.62 V / 1 V
Refer to On-Leakage Current
25°C –0.1 ±0.005 0.1 nA
–40°C to +85°C –0.5 0.5 nA
–40°C to +125°C –2 2 nA
LOGIC INPUTS (SEL)
VIH Input logic high –40°C to +125°C 1.07 5.5 V
VIL Input logic low –40°C to +125°C 0 0.68 V
IIH
IIL Input leakage current 25°C ±0.005 µA
IIH
IIL Input leakage current –40°C to +125°C ±0.05 µA
CIN Logic input capacitance 25°C 1 pF
CIN Logic input capacitance –40°C to +125°C 2 pF
POWER SUPPLY
IDD VDD supply current Logic inputs = 0 V or 5.5 V 25°C 0.001 µA
–40°C to +125°C 0.85 µA
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Electrical Characteristics (VDD = 1.8 V ±10 %) (continued)
At TA= 25°C, VDD = 1.8 V (unless otherwise noted).
PARAMETER TEST CONDITIONS TA MIN TYP MAX UNIT
DYNAMIC CHARACTERISTICS
tTRAN Transition time between channels VS= 1 V
RL= 200 , CL= 15 pF
Refer to Transition Time
25°C 28 ns
–40°C to +85°C 44 ns
–40°C to +125°C 44 ns
tOPEN
(BBM) Break before make time VS= 1 V
RL= 200 , CL= 15 pF
Refer to Break-Before-Make
25°C 16 ns
–40°C to +85°C 1 ns
–40°C to +125°C 1 ns
QCCharge Injection VD= 1 V
RS= 0 , CL= 1 nF
Refer to Charge Injection 25°C –3 pC
OISO Off Isolation
RL= 50 , CL= 5 pF
f = 1 MHz
Refer to Off Isolation 25°C –65 dB
RL= 50 , CL= 5 pF
f = 10 MHz
Refer to Off Isolation 25°C –45 dB
XTALK Crosstalk
RL= 50 , CL= 5 pF
f = 1 MHz
Refer to Crosstalk 25°C –65 dB
RL= 50 , CL= 5 pF
f = 10 MHz
Refer to Crosstalk 25°C –45 dB
BW Bandwidth RL= 50 , CL= 5 pF 25°C 250 MHz
CSOFF Source off capacitance f = 1 MHz 25°C 6 pF
CSON
CDON On capacitance f = 1 MHz 25°C 20 pF
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(1) When VSis 1 V, VDis 0.8 V, and vice versa.
6.8 Electrical Characteristics (VDD = 1.2 V ±10 %)
At TA= 25°C, VDD = 1.2 V (unless otherwise noted).
PARAMETER TEST CONDITIONS TA MIN TYP MAX UNIT
ANALOG SWITCH
RON On-resistance VS= 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C 70 Ω
–40°C to +85°C 105 Ω
–40°C to +125°C 105 Ω
ΔRON On-resistance matching between
channels
VS= 0 V to VDD
ISD = 10 mA
Refer to On-Resistance
25°C 0.4 Ω
–40°C to +85°C 1.5 Ω
–40°C to +125°C 1.5 Ω
IS(OFF) Source off leakage current(1)
VDD = 1.32 V
Switch Off
VD= 1 V / 0.8 V
VS= 0.8 V / 1 V
Refer to Off-Leakage Current
25°C –0.05 ±0.003 0.05 nA
–40°C to +85°C –0.1 0.1 nA
–40°C to +125°C –0.5 0.5 nA
ID(ON)
IS(ON) Channel on leakage current
VDD = 1.32 V
Switch On
VD= VS= 1 V / 0.8 V
Refer to On-Leakage Current
25°C –0.1 ±0.005 0.1 nA
–40°C to +85°C –0.5 0.5 nA
–40°C to +125°C –2 2 nA
LOGIC INPUTS (SEL)
VIH Input logic high –40°C to +125°C 0.96 5.5 V
VIL Input logic low –40°C to +125°C 0 0.36 V
IIH
IIL Input leakage current 25°C ±0.005 µA
IIH
IIL Input leakage current –40°C to +125°C ±0.05 µA
CIN Logic input capacitance 25°C 1 pF
CIN Logic input capacitance –40°C to +125°C 2 pF
POWER SUPPLY
IDD VDD supply current Logic inputs = 0 V or 5.5 V 25°C 0.003 µA
–40°C to +125°C 0.7 µA
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Electrical Characteristics (VDD = 1.2 V ±10 %) (continued)
At TA= 25°C, VDD = 1.2 V (unless otherwise noted).
PARAMETER TEST CONDITIONS TA MIN TYP MAX UNIT
DYNAMIC CHARACTERISTICS
tTRAN Transition time between channels VS= 1 V
RL= 200 , CL= 15 pF
Refer to Transition Time
25°C 55 ns
–40°C to +85°C 190 ns
–40°C to +125°C 190 ns
tOPEN
(BBM) Break before make time VS= 1 V
RL= 200 , CL= 15 pF
Refer to Break-Before-Make
25°C 28 ns
–40°C to +85°C 1 ns
–40°C to +125°C 1 ns
QCCharge Injection VD= 1 V
RS= 0 , CL= 1 nF
Refer to Charge Injection 25°C –2 pC
OISO Off Isolation
RL= 50 , CL= 5 pF
f = 1 MHz
Refer to Off Isolation 25°C –65 dB
RL= 50 , CL= 5 pF
f = 10 MHz
Refer to Off Isolation 25°C –45 dB
XTALK Crosstalk
RL= 50 , CL= 5 pF
f = 1 MHz
Refer to Crosstalk 25°C –65 dB
RL= 50 , CL= 5 pF
f = 10 MHz
Refer to Crosstalk 25°C –45 dB
BW Bandwidth RL= 50 , CL= 5 pF 25°C 250 MHz
CSOFF Source off capacitance f = 1 MHz 25°C 6 pF
CSON
CDON On capacitance f = 1 MHz 25°C 20 pF
l TEXAS INSTRUMENTS (WV F 100
VS or VD - Source or Drain Voltage (V)
On-Leakage (pA)
0 0.5 1 1.5 2 2.5 3 3.5 4
-40
-30
-20
-10
0
10
20
30
40
VDD = 1.32 V VDD = 1.98 V VDD = 3.63 V
D005
VS or VD - Source or Drain Voltage (V)
On Resistance (:)
0 0.5 1 1.5 2 2.5 3 3.5
0
1
2
3
4
5
6
7
8
TA = 25qC
TA = 125qC
TA = 85qC
TA = -40qC
D003
VS or VD - Source or Drain Voltage (V)
On Resistance (:)
0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2
0
10
20
30
40
50
60
70
80
VDD = 1.62 V
VDD = 1.98 V
VDD = 1.08 V
VDD = 1.32 V
D004
VS or VD - Source or Drain Voltage (V)
On Resistance (:)
0 1 2 3 4 5 5.5
0
1
2
3
4
5
6
VDD = 5.5 V
VDD = 4.5 V
VDD = 3.63 V
VDD = 3 V
D001
VS or VD - Source or Drain Voltage (V)
On Resistance (:)
0 1 2 3 4 5
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
5
TA = 25qC
TA = 125qC
TA = 85qC
TA = -40qC
D002
13
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6.9 Typical Characteristics
at TA= 25°C, VDD = 5 V (unless otherwise noted)
TA= 25°C
Figure 1. On-Resistance vs Source or Drain Voltage
VDD = 5 V
Figure 2. On-Resistance vs Temperature
VDD = 3.3 V
Figure 3. On-Resistance vs Temperature
TA= 25°C
Figure 4. On-Resistance vs Source or Drain Voltage
TA= 25°C
Figure 5. On-Leakage vs Source or Drain Voltage
VDD = 5 V
Figure 6. On-Leakage vs Source or Drain Voltage
l TEXAS INSTRUMENTS // o 4 500 R2 4 we \
VD - Drain Voltage (V)
Charge Injection (pC)
0 1 2 3 4 5
-20
-15
-10
-5
0
5
10
15
20
VDD = 5 V
VDD = 3.3 V
D011
VD - Drain Voltage (V)
Charge Injection (pC)
0 0.5 1 1.5 2
-5
-3
-1
1
3
5
VDD = 1.8 V
VDD = 1.2 V
D012
Temperature (qC)
Supply Current (PA)
-40 -20 0 20 40 60 80 100 120 140
-0.1
0
0.1
0.2
0.3
0.4
VDD = 5 V
VDD = 3.3 V
VDD = 1.8 V
VDD = 1.2 V
D009
Logic Voltage (V)
Supply Current (PA)
0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5
0
100
200
300
400
500
VDD = 5 VVDD = 3.3 V
D010
Temperature (qC)
Leakage Current (nA)
-40 -20 0 20 40 60 80 100 120
-1
-0.75
-0.5
-0.25
0
0.25
0.5
0.75
1
IS(OFF)
I(ON)
D007
Temperature (qC)
Leakage Current (nA)
-40 -20 0 20 40 60 80 100 120
-3
-2
-1
0
1
2
3
I(ON)
IS(OFF)
D008
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Typical Characteristics (continued)
VDD = 3.3 V
Figure 7. Leakage Current vs Temperature
VDD = 5 V
Figure 8. Leakage Current vs Temperature
VSEL = 5.5 V
Figure 9. Supply Current vs Temperature
TA= 25°C
Figure 10. Supply Current vs Logic Voltage
TA= -40°C to 125°C
Figure 11. Charge Injection vs Drain Voltage
TA= -40°C to 125°C
Figure 12. Charge Injection vs Drain Voltage
l TEXAS INSTRUMENTS
Frequency (Hz)
Gain (dB)
-8
-7
-6
-5
-4
-3
-2
-1
0
1M 10M 100M
D015
VDD - Supply Voltage (V)
Time (ns)
0.5 1.5 2.5 3.5 4.5 5.5
0
5
10
15
20
25
30
Rising
Falling
D013
Frequency (Hz)
Magnitude (dB)
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
100k 1M 10M 100M
D014
15
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Typical Characteristics (continued)
TA= 25°C
Figure 13. Output TTRANSITION vs Supply Voltage
TA= 25°C
Figure 14. Xtalk and Off-Isolation vs Frequency
TA= 25°C
Figure 15. On Response vs Frequency
Qfiwi
VDD
VDD
S1
S2
GND
VS
D
VD
A
Is (OFF)
V
D
VS
ISD
Sx
16
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7 Parameter Measurement Information
7.1 On-Resistance
The on-resistance of a device is the ohmic resistance between the source (Sx) and drain (D) pins of the device.
The on-resistance varies with input voltage and supply voltage. The symbol RON is used to denote on-resistance.
The measurement setup used to measure RON is shown in Figure 16. Voltage (V) and current (ISD) are measured
using this setup, and RON is computed with RON =V/ISD:
Figure 16. On-Resistance Measurement Setup
7.2 Off-Leakage Current
Source leakage current is defined as the leakage current flowing into or out of the source pin when the switch is
off. This current is denoted by the symbol IS(OFF).
The setup used to measure off-leakage current is shown in Figure 17.
Figure 17. Off-Leakage Measurement Setup
‘5‘ TEXAS INSTRUMENTS
VIH VIL
tTRANSITION
10%
90%
OUTPUT
0 V
ADDRESS
DRIVE
(VSEL)
VDD
tTRANSITION
VSOUTPUT
RLCL
SEL
D
GND
VSEL
0 V
tr < 5ns tf < 5ns
VDD
VDD
0.1F
S2
S1
VDD
VDD
S1
GND
VS
S2
D
VD
ID (ON)
VDD
VDD
S1
GND
VS
S2
D
Vs
A
IS (ON)
N.C.
N.C.
A
17
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7.3 On-Leakage Current
Source on-leakage current is defined as the leakage current flowing into or out of the source pin when the switch
is on. This current is denoted by the symbol IS(ON).
Drain on-leakage current is defined as the leakage current flowing into or out of the drain pin when the switch is
on. This current is denoted by the symbol ID(ON).
Either the source pin or drain pin is left floating during the measurement. Figure 18 shows the circuit used for
measuring the on-leakage current, denoted by IS(ON) or ID(ON).
Figure 18. On-Leakage Measurement Setup
7.4 Transition Time
Transition time is defined as the time taken by the output of the device to rise or fall 10% after the address signal
has risen or fallen past the logic threshold. The 10% transition measurement is utilized to provide the timing of
the device. System level timing can then account for the time constant added from the load resistance and load
capacitance. Figure 19 shows the setup used to measure transition time, denoted by the symbol tTRANSITION.
Figure 19. Transition-Time Measurement Setup
l TEXAS INSTRUMENTS
VDD
VDD
VSS
VSS
OUTPUT
CL
SEL
S2
D
GND
0.1F 0.1F
VOUT
Output
VSQC = CL × VOUT
VOUT
VSEL
VD
S1
N.C.
0 V
VDD
VSEL
VDD
0 V
tBBM 1
90%
Output
0 V
tOPEN (BBM) = min ( tBBM 1, tBBM 2)
tBBM 2
ADDRESS
DRIVE
(VSEL)
tr < 5ns tf < 5ns VSOUTPUT
RLCL
SEL
D
GND
VSEL
VDD
VDD
0.1F
S2
S1
18
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7.5 Break-Before-Make
Break-before-make delay is a safety feature that prevents two inputs from connecting when the device is
switching. The output first breaks from the on-state switch before making the connection with the next on-state
switch. The time delay between the break and the make is known as break-before-make delay. Figure 20 shows
the setup used to measure break-before-make delay, denoted by the symbol tOPEN(BBM).
Figure 20. Break-Before-Make Delay Measurement Setup
7.6 Charge Injection
The TMUX1119 has a transmission-gate topology. Any mismatch in capacitance between the NMOS and PMOS
transistors results in a charge injected into the drain or source during the falling or rising edge of the gate signal.
The amount of charge injected into the source or drain of the device is known as charge injection, and is denoted
by the symbol QC.Figure 21 shows the setup used to measure charge injection from Drain (D) to Source (Sx).
Figure 21. Charge-Injection Measurement Setup
‘5‘ TEXAS INSTRUMENTS a?
OUT
S
V
Channel-to-Channel Crosstalk 20 Log V
§ ·
˜ ¨ ¸
© ¹
NETWORK
ANALYZER
GND
S1
S2
VSIG
50Q
VOUT
RL
50Q
RL
D
50Q
VS
VDD
0.1µF
OUT
S
V
Off Isolation 20 Log V
§ ·
˜ ¨ ¸
© ¹
GND
NETWORK
ANALYZER
VOUT
S
D
50Q
VSIG
RL
50Q
SX
RL
50Q
VS
VDD
0.1µF
19
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7.7 Off Isolation
Off isolation is defined as the ratio of the signal at the drain pin (D) of the device when a signal is applied to the
source pin (Sx) of an off-channel. Figure 22 shows the setup used to measure, and the equation used to
calculate off isolation.
Figure 22. Off Isolation Measurement Setup
(1)
7.8 Crosstalk
Crosstalk is defined as the ratio of the signal at the drain pin (D) of a different channel, when a signal is applied
at the source pin (Sx) of an on-channel. Figure 23 shows the setup used to measure, and the equation used to
calculate crosstalk.
Figure 23. Crosstalk Measurement Setup
(2)
l TEXAS INSTRUMENTS
GND
NETWORK
ANALYZER
VOUT
S
D
50Q
VSIG
RL
50Q
VS
VDD
0.1µF
SX
RL
50Q
20
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7.9 Bandwidth
Bandwidth is defined as the range of frequencies that are attenuated by less than 3 dB when the input is applied
to the source pin (Sx) of an on-channel, and the output is measured at the drain pin (D) of the device. Figure 24
shows the setup used to measure bandwidth.
Figure 24. Bandwidth Measurement Setup
l TEXAS INSTRUMENTS
TMUX1119
SEL
S1
D
S2
21
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8 Detailed Description
8.1 Overview
The TMUX1119 is an 2:1, 1-ch. (SPDT), analog switch where the input is controlled with a single select (SEL)
control pin.
8.2 Functional Block Diagram
Figure 25. TMUX1119 Functional Block Diagram
8.3 Feature Description
8.3.1 Bidirectional Operation
The TMUX1119 conducts equally well from source (Sx) to drain (D) or from drain (D) to source (Sx). The device
has very similar characteristics in both directions and supports both analog and digital signals.
8.3.2 Rail to Rail Operation
The valid signal path input/output voltage for TMUX1119 ranges from GND to VDD.
8.3.3 1.8 V Logic Compatible Inputs
The TMUX1119 has 1.8-V logic compatible control for the logic control input (SEL). The logic input threshold
scales with supply but still provide 1.8-V logic control when operating at 5.5 V supply voltage. 1.8-V logic level
inputs allow the TMUX1119 to interface with processors that have lower logic I/O rails and eliminates the need
for an external translator, which saves both space and BOM cost. For more information on 1.8 V logic
implementations refer to Simplifying Design with 1.8 V logic Muxes and Switches
8.3.4 Fail-Safe Logic
The TMUX1119 supports Fail-Safe Logic on the control input pin (SEL) allowing for operation up to 5.5 V,
regardless of the state of the supply pin. This feature allows voltages on the control pin to be applied before the
supply pin, protecting the device from potential damage. Fail-Safe Logic minimizes system complexity by
removing the need for power supply sequencing on the logic control pins. For example, the Fail-Safe Logic
feature allows the select pin of the TMUX1119 to be ramped to 5.5 V while VDD = 0 V. Additionally, the feature
enables operation of the TMUX1119 with VDD = 1.2 V while allowing the select pin to interface with a logic level
of another device up to 5.5 V.
l TEXAS INSTRUMENTS ‘41/
SD
CGDP
CGDN
CGSN
CGSP
OFF ON
OFF ON
Temperature (qC)
Leakage Current (nA)
-40 -20 0 20 40 60 80 100 120
-3
-2
-1
0
1
2
3
I(ON)
IS(OFF)
D008
22
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Feature Description (continued)
8.3.5 Ultra-low Leakage Current
The TMUX1119 provides extremely low on-leakage and off-leakage currents. The TMUX1119 is capable of
switching signals from high source-impedance inputs into a high input-impedance op amp with minimal offset
error because of the ultra-low leakage currents. Figure 26 shows typical leakage currents of the TMUX1119
versus temperature.
Figure 26. Leakage Current vs Temperature
8.3.6 Ultra-low Charge Injection
The TMUX1119 has a transmission gate topology, as shown in Figure 27. Any mismatch in the stray capacitance
associated with the NMOS and PMOS causes an output level change whenever the switch is opened or closed.
Figure 27. Transmission Gate Topology
l TEXAS INSTRUMENTS
VD - Drain Voltage (V)
Charge Injection (pC)
0 1 2 3 4 5
-20
-15
-10
-5
0
5
10
15
20
VDD = 5 V
VDD = 3.3 V
D011
23
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Feature Description (continued)
The TMUX1119 has special charge-injection cancellation circuitry that reduces the drain-to-source charge
injection to -6 pC at VD= 1 V as shown in Figure 28.
Figure 28. Charge Injection vs Drain Voltage
8.4 Device Functional Modes
The select (SEL) pin of the TMUX1119 controls which switch is connected to the drain of the device. When a
given input is not selected, that source pin is in high impedance mode (HI-Z). The control pins can be as high as
5.5 V.
8.5 Truth Tables
Table 1. TMUX1119 Truth Table
CONTROL LOGIC (SEL) Selected Source (Sx) Connected To Drain (D) Pin
0 S1
1 S2
ADC
TX/RX
MUX
MOSI
TX
32 kHz
MSP430FR599
8 MHz
OPA836
OPA835
TMUX1119
x1
TMUX1119
x2 SEL
SEL
24
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9 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
9.1 Application Information
The TMUX11xx family offers ulta-low input and output leakage currents and low charge injection. These devices
operate up to 5.5 V, and offer true rail-to-rail input and output of both analog and digital signals. The TMUX1119
has a low on-capacitance which allows faster settling time when multiplexing inputs in the time domain. These
features make the TMUX11xx devices a family of precision, high-performance switches and multiplexers for low-
voltage applications.
9.2 Typical Application
Figure 29 shows an ultrasonic gas meter front end. The ultrasonic front end design utilizes time of flight (TOF)
measurement to determine the amount of gas flowing in a pipe. The circuit utilizes the MSP430FR5994, two ultra
low power operational amplifiers, OPA835 and OPA836, along with two TMUX1119, 2:1 precision switches.
Figure 29. Ultrasonic Gas Meter System
9.3 Design Requirements
For this design example, use the parameters listed in Table 2.
Table 2. Design Parameters
PARAMETERS VALUES
Supply (VDD) 5 V
I/O signal range 0 V to VDD (Rail to Rail)
Control logic thresholds 1.8 V compatible
Single-shot standard deviation (STD) <2 ns
Zero-flow drift (ZFD) <1 ns
TEXAS INSTRUMENTS
VS or VD - Source or Drain Voltage (V)
On Resistance (:)
0 1 2 3 4 5 5.5
0
1
2
3
4
5
6
VDD = 5.5 V
VDD = 4.5 V
VDD = 3.63 V
VDD = 3 V
D001
25
TMUX1119
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9.4 Detailed Design Procedure
The TMUX1119 can be operated without any external components except for the supply decoupling capacitors.
All inputs passing through the switch must fall within the recommend operating conditions of the TMUX1119,
including signal range and continuous current. For this design with a supply of 5 V the signal range can be 0 V to
5 V, and the max continuous current can be 30 mA.
The TMUX1119 device is a bidirectional, single-pole double-throw (SPDT) switch that offers low on-resistance,
low leakage, and low power. These features make this device suitable for portable and power sensitive
applications such as ultrasonic gas metering systems. The two TMUX1119 devices are used to switch the
transmission and reception signals from the MCU to the two transceivers in an efficient manner without distortion.
Exceptional on-resistance flatness, leakage performance, and charge injection allows the TMUX1119 to be
utilized in place of the TS5A9411 in Ultrasonic Gas Meter Front-End With MSP430™ Reference Design. For a
more detailed analysis of the entire system refer to the reference design.
9.5 Application Curve
The TMUX1119 is capable of switching signals with minimal distortion because of the ultra-low leakage currents
and excellent On-resistance flatness. Figure 30 shows how the on-resistance fo the TMUX1119 varies with
different supply voltages.
TA= 25°C
Figure 30. On-Leakage vs Source or Drain Voltage
10 Power Supply Recommendations
The TMUX1119 operates across a wide supply range of 1.08 V to 5.5 V. Do not exceed the absolute maximum
ratings because stresses beyond the listed ratings can cause permanent damage to the devices.
Power-supply bypassing improves noise margin and prevents switching noise propagation from the VDD supply to
other components. Good power-supply decoupling is important to achieve optimum performance. For improved
supply noise immunity, use a supply decoupling capacitor ranging from 0.1 μF to 10 μF from VDD to ground.
Place the bypass capacitors as close to the power supply pins of the device as possible using low-impedance
connections. TI recommends using multi-layer ceramic chip capacitors (MLCCs) that offer low equivalent series
resistance (ESR) and inductance (ESL) characteristics for power-supply decoupling purposes. For very sensitive
systems, or for systems in harsh noise environments, avoiding the use of vias for connecting the capacitors to
the device pins may offer superior noise immunity. The use of multiple vias in parallel lowers the overall
inductance and is beneficial for connections to ground planes.
l TEXAS INSTRUMENTS WORST BETTER / $2 HEIU S
Via to
GND plane
C
Wide (low inductance)
trace for power
TMUX1119
WORST BETTER BEST
1W min.
W
2W
26
TMUX1119
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11 Layout
11.1 Layout Guidelines
11.1.1 Layout Information
When a PCB trace turns a corner at a 90° angle, a reflection can occur. A reflection occurs primarily because of
the change of width of the trace. At the apex of the turn, the trace width increases to 1.414 times the width. This
increase upsets the transmission-line characteristics, especially the distributed capacitance and self–inductance
of the trace which results in the reflection. Not all PCB traces can be straight and therefore some traces must
turn corners. Figure 31 shows progressively better techniques of rounding corners. Only the last example (BEST)
maintains constant trace width and minimizes reflections.
Figure 31. Trace Example
Route high-speed signals using a minimum of vias and corners which reduces signal reflections and
impedance changes. When a via must be used, increase the clearance size around it to minimize its
capacitance. Each via introduces discontinuities in the signal’s transmission line and increases the chance of
picking up interference from the other layers of the board. Be careful when designing test points, through-
hole pins are not recommended at high frequencies.
Figure 32 illustrates an example of a PCB layout with the TMUX1119. Some key considerations are:
Decouple the VDD pin with a 0.1-µF capacitor, placed as close to the pin as possible. Make sure that the
capacitor voltage rating is sufficient for the VDD supply.
Keep the input lines as short as possible.
Use a solid ground plane to help reduce electromagnetic interference (EMI) noise pickup.
Do not run sensitive analog traces in parallel with digital traces. Avoid crossing digital and analog traces if
possible, and only make perpendicular crossings when necessary.
11.2 Layout Example
Figure 32. TMUX1119 Layout Example
l TEXAS INSTRUMENTS Am
27
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12 Device and Documentation Support
12.1 Documentation Support
12.1.1 Related Documentation
Texas Instruments, Ultrasonic Gas Meter Front-End With MSP430™ Reference Design.
Texas Instruments, True Differential, 4 x 2 MUX, Analog Front End, Simultaneous-Sampling ADC Circuit.
Texas Instruments, Improve Stability Issues with Low CON Multiplexers.
Texas Instruments, Simplifying Design with 1.8 V logic Muxes and Switches.
Texas Instruments, Eliminate Power Sequencing with Powered-off Protection Signal Switches.
Texas Instruments, System-Level Protection for High-Voltage Analog Multiplexers.
Texas Instruments, QFN/SON PCB Attachment.
Texas Instruments, Quad Flatpack No-Lead Logic Packages.
12.2 Related Links
The table below lists quick access links. Categories include technical documents, support and community
resources, tools and software, and quick access to order now.
12.3 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper
right corner, click on Alert me to register and receive a weekly digest of any product information that has
changed. For change details, review the revision history included in any revised document.
12.4 Community Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
12.5 Trademarks
E2E is a trademark of Texas Instruments.
12.6 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
12.7 Glossary
SLYZ022 TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
13 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
I TEXAS INSTRUMENTS Sample: Sample:
PACKAGE OPTION ADDENDUM
www.ti.com 10-Dec-2020
Addendum-Page 1
PACKAGING INFORMATION
Orderable Device Status
(1)
Package Type Package
Drawing Pins Package
Qty Eco Plan
(2)
Lead finish/
Ball material
(6)
MSL Peak Temp
(3)
Op Temp (°C) Device Marking
(4/5)
Samples
TMUX1119DBVR ACTIVE SOT-23 DBV 6 3000 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 125 26HT
TMUX1119DCKR ACTIVE SC70 DCK 6 3000 RoHS & Green NIPDAU | NIPDAUAG Level-1-260C-UNLIM -40 to 125 1DF
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6) Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
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I TEXAS INSTRUMENTS
PACKAGE OPTION ADDENDUM
www.ti.com 10-Dec-2020
Addendum-Page 2
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device Package
Type Package
Drawing Pins SPQ Reel
Diameter
(mm)
Reel
Width
W1 (mm)
A0
(mm) B0
(mm) K0
(mm) P1
(mm) W
(mm) Pin1
Quadrant
TMUX1119DBVR SOT-23 DBV 6 3000 178.0 9.0 2.4 2.5 1.2 4.0 8.0 Q3
TMUX1119DCKR SC70 DCK 6 3000 178.0 9.0 2.4 2.5 1.2 4.0 8.0 Q3
PACKAGE MATERIALS INFORMATION
www.ti.com 5-Jun-2020
Pack Materials-Page 1
I TEXAS INSTRUMENTS TAPE AND REEL BOX DIMENSIONS
*All dimensions are nominal
Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm)
TMUX1119DBVR SOT-23 DBV 6 3000 180.0 180.0 18.0
TMUX1119DCKR SC70 DCK 6 3000 180.0 180.0 18.0
PACKAGE MATERIALS INFORMATION
www.ti.com 5-Jun-2020
Pack Materials-Page 2
MECHANICAL DATA DCK (R-PDSO-GS) PLASTIC SMALL-OUTLINE PACKAGE E 18’) 6 4 7 H Fl H ‘fi «40 1233 \ ’i’ To enugemane Seanng Mane Pm 1/ ' ‘ ' ‘ ‘ maexArea Wm H m} j; / ‘ u / Um "4L 1—]; f Scamg Mane \\ \ / 31 409555574/8 U‘ /200/ , m m hmeters AH \mec' mmens‘mrs Tm drawmq \s sumsc: 0 change wmu: nome Body mmensmns do nut mc‘ude mom flcsh m aroms'm Mom Has» and pruvuswon W m exceed 015 :2r m FuHs an JFDFC M07763 vunuhcn AB NO'FS Umm> INSrRUMEm-s www.1i.com
LAND PATTERN DATA 7PJSOiC6> PLASTC SMALL OU’LME NOTES' maop> Exc'm‘e Boc'd Luyum stem Openings Based or a stencfl hickncss uf 127mm (005mm) * 1* :E /23\\der Musk Cpen‘wg “ 2m Geometry M \meur dimensmns are m m'flhrvete's Th's drawqu is sweat (a chc'vge mm: 'vuhce Custume's shoud p‘uce a new 01 We cvcmt buurd (abr'cahun c'awmg rm :0 uHer the ce'fle' smder musk defined and, ”Jbficuhon \PC77351 is reco'n'nended (Dr uHernme designs Laser cumrg opc'mvcs mm "apczmda wuHs and mo rouncmq corners wm am bcncr aosxc recuscv mstomcrs show can thew Guard assemwy sue for gene design recommencnmons Exomme sxercu deswgw basec on a 50% vo‘umemc bad My paste M‘cr m M4523 var other new rccowmcwdatnrs. ' hams Q‘ INSTRUMENTS www.li.com
www.ti.com
PACKAGE OUTLINE
C
0.22
0.08 TYP
0.25
3.0
2.6
2X 0.95
1.45 MAX
0.15
0.00 TYP
6X 0.50
0.25
0.6
0.3 TYP
8
0 TYP
1.9
A
3.05
2.75
B
1.75
1.45
(1.1)
SOT-23 - 1.45 mm max heightDBV0006A
SMALL OUTLINE TRANSISTOR
4214840/C 06/2021
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. Body dimensions do not include mold flash or protrusion. Mold flash and protrusion shall not exceed 0.25 per side.
4. Leads 1,2,3 may be wider than leads 4,5,6 for package orientation.
5. Refernce JEDEC MO-178.
0.2 C A B
1
34
5
2
INDEX AREA
PIN 1
6
GAGE PLANE
SEATING PLANE
0.1 C
SCALE 4.000
www.ti.com
EXAMPLE BOARD LAYOUT
0.07 MAX
ARROUND 0.07 MIN
ARROUND
6X (1.1)
6X (0.6)
(2.6)
2X (0.95)
(R0.05) TYP
4214840/C 06/2021
SOT-23 - 1.45 mm max heightDBV0006A
SMALL OUTLINE TRANSISTOR
NOTES: (continued)
6. Publication IPC-7351 may have alternate designs.
7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.
SYMM
LAND PATTERN EXAMPLE
EXPOSED METAL SHOWN
SCALE:15X
PKG
1
34
5
2
6
SOLDER MASK
OPENING
METAL UNDER
SOLDER MASK
SOLDER MASK
DEFINED
EXPOSED METAL
METAL
SOLDER MASK
OPENING
NON SOLDER MASK
DEFINED
(PREFERRED)
SOLDER MASK DETAILS
EXPOSED METAL
www.ti.com
EXAMPLE STENCIL DESIGN
(2.6)
2X(0.95)
6X (1.1)
6X (0.6)
(R0.05) TYP
SOT-23 - 1.45 mm max heightDBV0006A
SMALL OUTLINE TRANSISTOR
4214840/C 06/2021
NOTES: (continued)
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
9. Board assembly site may have different recommendations for stencil design.
SOLDER PASTE EXAMPLE
BASED ON 0.125 mm THICK STENCIL
SCALE:15X
SYMM
PKG
1
34
5
2
6
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