This application note explores the basics of this increasingly important category of semiconductor technologies and devices and features NI hardware and software solutions that help MEMS manufacturers test and measure these devices efficiently and confidently.
This application note is focused on battery module and pack level testing using examples of real-world industry applications.
This application note focuses specifically on test considerations around high-power PAs and how the steps taken in validation of these devices can be different from PAs that operate at lower power levels.
This application note is created with the assumption that the reader is familiar with WLAN PHY-layer testing and is based on the use of a vector signal transceiver (VST) for stimulation and measurement of an RF front-end device.