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An assessment of the impact of derating to improve initial power on performance is shown on this slide. Consider a distribution of breakdown voltage for a specific manufacturing lot of product that has been assembled. To ensure the best possible screening, KEMET’s components are 100% thermally and electrically surge stressed prior to 100% electrical screening. The application of thermal and electrical stresses to the device will alter the breakdown distribution. The objective of applying these stresses to the components is to exercise the construction of each device in order to identify weaker parts that would not meet the minimum standards at 100% electrical screening. During KEMET’s 100% electrical screening, a portion of the manufactured lot may not pass the screening limit. The tail of the distribution that falls below the screening limit is removed from the lot.
