ADIS16201 Datasheet by Analog Devices Inc.

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ANALOG Programmable Dual-Axis DEVICES |nclinometer/Accelerometer ADISIBZOI Rem: Documenl Feedback 1mmm wwmmmmwmdwlmfimm
Programmable Dual-Axis
Inclinometer/Accelerometer
Data Sheet
ADIS16201
Rev. E Document Feedback
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FEATURES
Dual-axis inclinometer/accelerometer measurements
12-, 14-bit digital inclination/acceleration sensor outputs
±1.7 g accelerometer measurement range
±9inclinometer measurement range, linear output
12-bit digital temperature sensor output
Digitally controlled sensitivity and bias calibration
Digitally controlled sample rate
Digitally controlled frequency response
Dual alarm settings with rate/threshold limits
Auxiliary digital I/O
Digitally activated self test
Digitally activated low power mode
SPI®-compatible serial interface
Auxiliary 12-bit ADC input and DAC output
Single-supply operation: 3.0 V to +3.6 V
3500 g powered shock survivability
APPLICATIONS
Platform control, stabilization, and leveling
Tilt sensing, inclinometers
Motion/position measurement
Monitor/alarm devices (security, medical, safety)
FUNCTIONAL BLOCK DIAGRAM
SCLK
DIN
DOUT
CS
RST DIO0 DIO1
SPI
PORT
TEMPERATURE
SENSOR
SELF-TEST
POWER
MANAGEMENT AUXILIARY
I/O
ALARMS
DIGITAL
CONTROL
SIGNAL
CONDITIONING
AND
CONVERSION
CALIBRATION
AND
DIGITAL
PROCESSING
ADIS16201
VDD
COM
AUX
ADC AUX
DAC VREF
DUAL-AXIS
ACCELEROMETER
05462-001
Figure 1.
GENERAL DESCRIPTION
The ADIS16201 is a complete, dual-axis acceleration and
inclination angle measurement system available in a single
compact package enabled by the Analog Devices iSensor
integration. By enhancing the Analog Devices iMEMS® sensor
technology with an embedded signal processing solution, the
ADIS16201 provides factory calibrated and tunable digital
sensor data in a convenient format that can be accessed using a
serial peripheral interface (SPI). The SPI interface provides
access to measurements for dual-axis linear acceleration, dual-
axis linear inclination angle, temperature, power supply, and
one auxiliary analog input. Easy access to calibrated digital
sensor data provides developers with a system-ready device,
reducing development time, cost, and program risk.
Unique characteristics of the end system are accommodated
easily through several built-in features, such as a single
command in-system offset calibration, along with convenient
sample rate and bandwidth control.
The ADIS16201 offers the following embedded features, which
eliminate the need for external circuitry and provide a simplified
system interface:
Configurable alarm function
Auxiliary 12-bit ADC
Auxiliary 12-bit DAC
Configurable digital I/O port
Digital self-test function
The ADIS16201 offers two power management features for
managing system-level power dissipation: low power mode and
a configurable shutdown feature.
The ADIS16201 is available in a 9.2 mm × 9.2 mm × 3.9 mm
laminate-based land grid array (LGA) package with a
temperature range of −40°C to +125°C.
ADIS16201 Data Sheet
Rev. E | Page 2 of 31
TABLE OF CONTENTS
Features .............................................................................................. 1
Applications ....................................................................................... 1
Functional Block Diagram .............................................................. 1
General Description ......................................................................... 1
Revision History ............................................................................... 2
Specifications ..................................................................................... 3
Timing Specifications .................................................................. 5
Timing Diagrams .......................................................................... 5
Absolute Maximum Ratings ............................................................ 6
ESD Caution .................................................................................. 6
Pin Configuration and Function Descriptions ............................. 7
Typical Performance Characteristics ............................................. 8
Theory of Operation ...................................................................... 13
Accelerometer Operation .......................................................... 13
Inclinometer Operation ............................................................. 13
Temperature Sensor ................................................................... 13
Basic Operation............................................................................... 14
Data Output Register Access..................................................... 14
Programming and Control ............................................................ 16
Control Register Overview........................................................ 16
Control Register Access ............................................................. 16
Control Register Details................................................................. 18
Calibration ................................................................................... 18
Calibration Register Definitions ............................................... 18
Alarms .......................................................................................... 20
Sample Period Control .............................................................. 22
Filtering Control ......................................................................... 23
Power-Down Control ................................................................ 23
Status Feedback........................................................................... 24
Command Control ..................................................................... 24
Miscellaneous Control Register................................................ 25
Peripherals ....................................................................................... 26
Auxiliary ADC Function ........................................................... 26
Auxiliary DAC Function ........................................................... 26
General Purpose I/O Control ................................................... 27
Applications Information .............................................................. 28
Serial Peripheral Interface (SPI) ............................................... 28
Hardware Considerations ......................................................... 28
Grounding and Board Layout Recomendations .................... 28
Band Gap Reference ................................................................... 29
Power Supply Considerations ................................................... 29
Assembly ...................................................................................... 29
Example Pad Layout ................................................................... 29
X-Ray Sensitivity ........................................................................ 29
Outline Dimensions ....................................................................... 30
Ordering Guide .......................................................................... 30
REVISION HISTORY
3/2019—Rev. D to Rev. E
Added Endnote 1 in Table 1 ............................................................ 3
Added X-Ray Sensitivity Section .................................................. 29
Changes to Ordering Guide .......................................................... 30
7/2018—Rev. C to Rev. D
Changes to Inclinometer Operation Section .............................. 13
Deleted Figure 31 and Figure 32; Renumbered Sequentially ... 13
Deleted Figure 33 ............................................................................ 14
Changed Applications Section to Applications Information
Section .............................................................................................. 28
Added Power Supply Considerations Section, Power-On-Reset
Function Section, Transient Current from VDD Ramp Rate
Section, and Assembly Section ..................................................... 29
Deleted Power-On Reset Operation Section, Figure 40, Second-
Level Assembly Section, Figure 41, and Table 32; Renumbered
Sequentially ..................................................................................... 30
Change to Ordering Guide ............................................................ 30
8/2013Rev. B to Rev. C
Changes to Endnote 5 and Added Endnote 6; Table 1 ................. 4
Changed Digital Input/Output Voltage to COM Parameter from
−0.3 V to +5.5 V to −0.3 V to +5.3 V.............................................. 6
Changes to SMPL_PRD Register Definition Section, Table 24,
and AVG_CNT Register Definition Section ............................... 24
Changes to Table 31 ....................................................................... 28
4/2013Rev. A to Rev. B
Changes to Table 2 ............................................................................. 5
Updated Outline Dimensions ....................................................... 31
Changes to Ordering Guide .......................................................... 31
5/2006Rev. 0 to Rev. A
Changes to Figure 3 ........................................................................... 5
Changes to Figure 35 ...................................................................... 18
Changes to Status Feedback Section ............................................ 25
3/2006Revision 0: Initial Version
Data Sheet ADIS16201
Rev. E | Page 3 of 31
SPECIFICATIONS
TA = −40oC to +125°C, VDD = 3.3 V, tilt = 0°, unless otherwise noted.
Table 1.
Parameter Conditions Min Typ Max Unit
INCLINOMETER Each axis
Input Range Operable to ~±90 degrees ±70 Degrees
Relative Accuracy1 ±15 degrees, 25°C, max filter ±0.25 Degrees
±30 degrees, 25°C, max filter ±0.5 Degrees
±60 degrees, 25°C, max filter ±1.5 Degrees
Sensitivity ±60 degrees, 25°C 9.9 10 10.1 LSB/degrees
Sensitivity over Temperature ±30 degrees ±50 ppm/°C
Offset1 At 25°C 2037 2048 2059 LSB
Offset over Temperature ±0.082 LSB/°C
ACCELEROMETER Each axis
Input Range2 At 25°C ±1.7
g
Nonlinearity2 % of full scale ±0.5 ±2.5 %
Alignment Error X sensor to Y sensor ±0.1 Degrees
Cross Axis Sensitivity ±2 %
Sensitivity At 25°C 2.140 2.162 2.184 LSB/mg
Sensitivity over Temperature ±50 ppm/°C
Offset At 25°C, 0 g 8151 8192 8233 LSB
Offset over Temperature ±0.33 LSB/°C
ACCELEROMETER NOISE PERFORMANCE
Output Noise At 25°C, no averaging 22 LSB rms
Noise Density At 25°C, no averaging 0.37 LSB/√Hz rms
ACCELEROMETER FREQUENCY RESPONSE
Sensor Bandwidth 2250 Hz
Sensor Resonant Frequency 5.5 kHz
ACCELEROMETER SELF-TEST STATE3
Output Change When Active At 25°C 372 708 1040 LSB
TEMPERATURE SENSOR
Output at 25°C 1278 LSB
Scale Factor −2.13 LSB/°C
ADC INPUT
Resolution 12 Bits
Integral Nonlinearity ±2 LSB
Differential Nonlinearity ±1 LSB
Offset Error ±4 LSB
Gain Error ±2 LSB
Input Range 0 2.5 V
Input Capacitance During acquisition 20 pF
ON-CHIP VOLTAGE REFERENCE 2.5 V
Accuracy At 25°C −10 +10 mV
Reference Temperature Coefficient ±40 ppm/°C
Output Impedance 70 Ω
DAC OUTPUT 5 kΩ/100 pF to GND
Resolution 12 Bits
Relative Accuracy For Code 101 to Code 4095 4 LSB
Differential Nonlinearity 1 LSB
Offset Error ±5 mV
Gain Error ±0.5 %
Output Range 0 to 2.5 V
ADIS16201 Data Sheet
Rev. E | Page 4 of 31
Parameter Conditions Min Typ Max Unit
Output Impedance 2
Output Settling Time 10 µs
LOGIC INPUTS
Input High Voltage, VINH 2.0 V
Input Low Voltage, VINL 0.8 V
Logic 1 Input Current, IINH V
IH = VDD ±0.2 ±1 µA
Logic 0 Input Current, IINL V
IL = 0 V −40 −60 A
Input Capacitance, CIN 10 pF
DIGITAL OUTPUTS
Output High Voltage, VOH I
SOURCE = 1.6 mA 2.4 V
Output Low Voltage, VOL I
SINK = 1.6 mA 0.4 V
SLEEP TIMER
Timeout Period4 0.5 128 Seconds
FLASH MEMORY
Endurance5 20,000 Cycles
Data Retention6 T
J = 85°C 20 Years
CONVERSION RATE
Minimum Conversion Time 244 s
Maximum Conversion Time 484 ms
Maximum Throughput Rate 4096 SPS
Minimum Throughput Rate 2.066 SPS
POWER SUPPLY
Operating Voltage Range VDD 3.0 3.3 3.6 V
Power Supply Current Normal mode, SMPL_TIME ≥
0x08 (fS ≤ 910 Hz), at 25°C 11 14 mA
Fast mode, SMPL_TIME ≤ 0x07
(fS ≥ 1024 Hz), at 25°C 36 42 mA
Sleep mode, at 25°C 500 750 µA
Turn-On Time7 130 ms
1 X-ray exposure may degrade this performance metric.
2 Guaranteed by iMEMs packaged part testing, design, and/or characterization.
3 Self-test response changes as the square of VDD.
4 Guaranteed by design.
5 Endurance is qualified as per JEDEC Standard 22 Method A117 and measured at −40°C, +25°C, +85°C, and +125°C.
6 Retention lifetime equivalent at junction temperature (TJ) 85°C as per JEDEC Standard 22 Method A117. Retention lifetime decreases with junction temperature.
7 The start-up time defines the time from VDD > 3.0 V to the first output register update. This parameter does not account for filter settling, which depends on the
SMPL_PRD and AVG_CNT settings.
Table 2‘
Data Sheet ADIS16201
Rev. E | Page 5 of 31
TIMING SPECIFICATIONS
TA = 25°C, VDD = 3.3 V, tilt = 0°, unless otherwise noted.
Table 2.
Parameter Description Min1 Typ Max Unit
fSCLK Fast mode, SMPL_TIME ≤ 0x07 (fS ≥ 1024 Hz) 0.01 2.5 MHz
Normal mode, SMPL_TIME ≥ 0x08 (fS ≤ 910 Hz) 0.01 1.0 MHz
tDATARATE Chip select period, fast mode, SMPL_TIME ≤ 0x07 (fS 1024 Hz) 32 μs
tDATARATE Chip select period, normal mode, SMPL_TIME ≥ 0x08 (fS 910 Hz) 42 μs
tSTALL Stall period, fast mode, SMPL_PRD 0x07 (fS1024 Hz) 10 μs
tSTALL Stall period, normal mode, SMPL_PRD ≥ 0x08 (fS ≤ 910 Hz) 12 μs
tcs Chip select to clock edge 48.8 ns
tDAV Data output valid after SCLK edge 100 ns
tDSU Data input setup time before SCLK rising edge 24.4 ns
tDHD Data input hold time after SCLK rising edge 48.8 ns
tDF Data output fall time 5 12.5 ns min
tDR Data output rise time 5 12.5 ns min
tSFS CS high after SCLK edge 5 ns typ
1 Guaranteed by design, not tested.
TIMING DIAGRAMS
CS
SCLK
t
DATA RATE
t
STALL
=
t
DATA RATE
– 16/
f
SCLK
t
STALL
05462-002
Figure 2. SPI Chip Select Timing
CS
SCLK
DOUT
DIN
1 2 3 4 5 615 16
W/R A5 A4 A3 A2 D2
MSB DB14
D1 LSB
DB13 DB12 DB10DB11 DB2 LSBDB1
t
CS
t
SFS
t
DAV
t
DHD
t
DSU
05462-003
Figure 3. SPI Timing
(Utilizing SPI Settings Typically Identified as Phase = 1, Polarity = 1)
Table 3‘ Table 4‘ Package Characteristics ESD CAUTION A M ESD (elemosmic discharge) sensi‘ive device. Chavged dewces and mum boavds can dlschavge wlmcux daemon Alxhough m pmducl feaxures pa‘emed 0v pvopnelavy pmecuon cwcumy, damage may occur on devices subjected m high enevgy ESD Thevefove. pvopev ESD pvecaunonx should be \aken \0 mm performante degradauan m ‘035 of mnmanzmy
ADIS16201 Data Sheet
Rev. E | Page 6 of 31
ABSOLUTE MAXIMUM RATINGS
Table 3.
Parameter Rating
Acceleration (Any Axis, Unpowered) 3500 g
Acceleration (Any Axis, Powered)
g
VDD to COM 0.3 V to +7.0 V
Digital Input/Output Voltage to COM −0.3 V to +5.3 V
Analog Inputs to COM 0.3 to VDD + 0.3 V
Analog Inputs to COM −0.3 to VDD + 0.3 V
Operating Temperature Range −40°C to +125°C
Storage Temperature Range 65°C to +150°C
Stresses at or above those listed under Absolute Maximum
Ratings may cause permanent damage to the product. This is a
stress rating only; functional operation of the product at these
or any other conditions above those indicated in the operational
section of this specification is not implied. Operation beyond
the maximum operating conditions for extended periods may
affect product reliability.
Table 4. Package Characteristics
Package Type θJA θJC Device Weight
16-Terminal LGA 250°C/W 25°C/W 0.6 grams
ESD CAUTION
Table 5‘ Pin Function Descripfions ADC EDGE Hm DE (W: |:||:||:||:| |:l|:l|:l|:l W
Data Sheet ADIS16201
Rev. E | Page 7 of 31
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
AUX ADC
VDD
VREF
COM
NC
AUX COM
DIO1
DIO0
NC = NO INTERNAL
CONNECTION
AUX DAC
NC
AUX COM
RST
SCLK
DOUT
DIN
X SENSOR
Y SENSOR
OR
CS
ADIS16201
BOTTOM
VIEW
(Not to Scale)
1
2
3
12
9
10
11
4
5
6
7
8
16
13 14 15
05462-004
Figure 4. Pin Configuration
Table 5. Pin Function Descriptions
Pin No. Mnemonic Type 1 Description
1 SCLK I Serial Clock. SCLK provides the serial clock for accessing data from the part and writing serial data
to the control registers.
2 DOUT O Data Out. The data on this pin represents data being read from the control registers and is clocked
out on the falling edge of the SCLK.
3 DIN I Data In. Data written to the control registers is provided on this input and is clocked in on the
rising edge of the SCLK.
4 CS I Chip Select, Active Low. This input frames the serial data transfer.
5, 6 DIO0, DIO1 I/O Multifunction Digital I/O Pins.
7, 11 NC No Connect.
8, 10 AUX COM S Auxiliary Grounds. Connect to GND for proper operation.
9
RST
I
Reset, Active Low. This input resets the embedded microcontroller to a known state.
12 AUX DAC O Auxiliary DAC Analog Voltage Output.
13 VDD S +3.3 V Power Supply.
14 AUX ADC I Auxiliary ADC Analog Input Voltage.
15 VREF O Precision Reference Output.
16 COM S Common. Reference point for all circuitry in the ADIS16201.
1 S = Supply; O = Output; I = Input.
all
ADIS16201 Data Sheet
Rev. E | Page 8 of 31
TYPICAL PERFORMANCE CHARACTERISTICS
2.144
2.9 3.7
POWER SUPPLY (V)
ACCELERATION SENSITIVITY (LSB/mg)
2.174
2.170
2.165
2.161
2.157
2.153
2.148
3.0 3.1 3.2 3.3 3.4 3.5 3.6
05462-005
Figure 5. Acceleration Sensitivity vs. Power Supply at 25°C
25
0
–150 150
(ppm/°C)
QUANTITY
20
15
10
5
–120 –90 –60 –30 030 60 90 120
05462-006
Figure 6. Acceleration Sensitivity Tempco Histogram at 3.3 V
2.132
–60 140
TEMPERATURE (°C)
ACCELERATION SENSITIVITY (LSB/mg)
2.192
2.183
2.175
2.166
2.158
2.149
2.141
–40 –20 020 40 60 80 100 120
05462-007
Figure 7. Acceleration Sensitivity vs. Temperature at 3.3 V
140
0
–18
–17
–15
–14
–12
–11
–9
–8
–6
–5
–3
–2
0
2
3
5
6
8
9
11
12
14
15
17
18
(mg)
QUANTITY
120
100
80
60
40
20
05462-008
Figure 8. Acceleration Offset Distribution at 25°C/3.3 V/0 g
20
0
–200 200
(ppm/°C)
QUANTITY
18
16
14
12
10
8
6
4
2
–160 –120 –80 –40 040 80 120 160
05462-009
Figure 9. Acceleration Offset Tempco Histogram at 3.3 V
50
–50
2.9 3.7
POWER SUPPLY (V)
ACCELERATION OFFSET (LSB)
40
30
20
10
0
–10
–20
–30
–40
3.0 3.1 3.2 3.3 3.4 3.5 3.6
05462-010
Figure 10. Acceleration Offset vs. Supply at 25°C
Data Sheet ADIS16201
Rev. E | Page 9 of 31
90
0
0.18
0.19
0.20
0.21
0.22
0.23
0.24
0.25
0.26
0.27
0.28
0.29
0.30
0.31
0.32
0.33
0.34
0.35
0.36
0.37
0.38
0.39
0.40
0.41
0.42
(g)
QUANTITY
80
70
60
50
40
30
20
10
05462-011
Figure 11. X-Axis Self-Test Level at 25°C/3.3 V
80
0
0.18
0.19
0.20
0.21
0.22
0.23
0.24
0.25
0.26
0.27
0.28
0.29
0.30
0.31
0.32
0.33
0.34
0.35
0.36
0.37
0.38
0.39
0.40
0.41
0.42
(g)
QUANTITY
70
60
50
40
30
20
10
05462-012
Figure 12. Y-Axis Self-Test Level at 25°C/3.3 V
1200
200
2.9 3.7
POWER SUPPLY (V)
SELF-TEST SHIFT (LSB)
1000
800
600
400
3.0 3.1 3.2 3.3 3.4 3.5 3.6
05462-013
Figure 13. Self-Test Shift vs. Supply at 25°C
140
0
–1.2
–1.1
–1.0
–0.9
–0.8
–0.7
–0.6
–0.5
–0.4
–0.3
–0.2
–0.1
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
1.1
1.2
(Degrees)
QUANTITY
120
100
80
60
40
20
05462-014
Figure 14. Inclination Offset Distribution at 25°C/3.3 V/0 g
20
0
–200 200
(ppm/°C)
QUANTITY
18
16
14
12
10
8
6
4
2
–160 –120 –80 –40 040 80 120 160
05462-015
Figure 15. Inclination Offset Tempco Histogram at 3.3 V
10
–10
2.9 3.7
POWER SUPPLY (V)
INCLINATION OFFSET (LSB)
3.0 3.1 3.2 3.3 3.4 3.5 3.6
8
6
4
2
0
–2
–4
–6
–8
05462-016
Figure 16. Inclination Offset vs. Supply at 25°C
m. .lll..
ADIS16201 Data Sheet
Rev. E | Page 10 of 31
150
0
607.6
607.8
608.0
608.2
608.4
608.6
608.8
609.0
609.2
609.4
609.6
609.8
610.0
610.2
610.4
610.6
610.8
611.0
611.2
611.4
611.6
611.8
612.0
612.2
612.4
(µV/LSB)
QUANTITY
125
100
75
50
25
05462-017
Figure 17. ADC Gain Distribution at 25°C/3.3 V
80
0
–2.4
–2.1
–1.8
–1.5
–1.2
–0.9
–0.6
–0.3
0
0.3
0.6
0.9
1.2
1.5
1.8
2.1
2.4
2.7
3.0
3.3
3.6
3.9
4.2
4.5
4.8
(mV)
QUANTITY
70
60
50
40
30
20
10
05462-018
Figure 18. ADC Offset Distribution at 25°C/3.3 V
3
–3 116381
ADC STATE
(LSB)
2
1
0
–1
–2
4096 8191 12286
05462-019
Figure 19. Typical ADC Integral Nonlinearity at 25°C/3.3 V
3
–3 116381
ADC STATE
(LSB)
2
1
0
–1
–2
4096 8191 12286
05462-020
Figure 20. Typical ADC Differential Nonlinearity
120
0
606.6
606.9
607.2
607.5
607.8
608.1
608.4
608.7
609.0
609.3
609.6
609.9
610.2
610.5
610.8
611.1
611.4
611.7
612.0
612.3
612.6
612.9
613.2
613.5
617.0
(µV/LSB)
QUANTITY
100
80
60
40
20
05462-021
Figure 21. DAC Gain Distribution at 25°C/3.3 V
45
0
–2.7
–2.4
–2.1
–1.8
–1.5
–1.2
–0.9
–0.6
–0.3
0
0.3
0.6
0.9
1.2
1.5
1.8
2.1
2.4
2.7
3.0
3.3
3.6
3.9
4.2
4.8
(mV)
QUANTITY
40
35
30
25
20
15
10
5
05462-022
Figure 22. DAC Offset Distribution at 25°C/3.3 V
Data Sheet ADIS16201
Rev. E | Page 11 of 31
5
–5 04096
DAC STATE
NONLINEARITY (LSB)
4
3
2
1
0
–1
–2
–3
–4
512 1024 1536 2048 2560 3072 3584
3.0V/–40°C
3.0V/+25°C
3.0V/+125°C
3.3V /40°C
3.3V/+25°C
3.3V/+125°C
3.6V/40°C
3.6V/+25°C
3.6V/+125°C
05462-023
Figure 23. Typical DAC Integral Nonlinearity
250
0
2.4975
2.4977
2.4979
2.4981
2.4983
2.4985
2.4987
2.4989
2.4991
2.4993
2.4995
2.4997
2.4999
2.5001
2.5003
2.5005
2.5007
2.5009
2.5011
2.5013
2.5015
2.5017
2.5019
2.5021
2.5023
(V)
QUANTITY
200
150
100
50
05462-024
Figure 24. VREF Distribution at 25°C/3.3 V
60
0
15
16
16
17
17
18
18
19
19
20
20
21
21
22
22
23
23
24
24
25
25
26
26
27
27
C)
QUANTITY
50
40
30
20
10
05462-025
Figure 25. Temperature Distribution at 25°C/3.3 V
140
0
9.4
9.6
9.7
9.9
10.0
10.2
10.3
10.5
10.6
10.8
10.9
11.1
11.2
11.4
11.5
11.7
11.8
12.0
12.1
12.3
12.4
12.6
12.7
12.9
13.0
(mA)
QUANTITY
120
100
80
60
40
20
05462-026
Figure 26. Normal Mode Power Supply Current Distribution at 25°C/3.3 V
140
0
29.0
29.6
30.2
30.8
31.4
32.0
32.6
33.2
33.8
34.4
35.0
35.6
36.2
36.8
37.4
38.0
38.6
39.2
39.8
40.4
41.0
41.6
42.2
42.8
43.4
(mA)
QUANTITY
120
100
80
60
40
20
05462-027
Figure 27. Fast Mode Power Supply Current Distribution at 25°C/3.3 V
180
0
370
378
386
394
402
410
418
426
434
442
450
458
466
474
482
490
498
506
514
522
530
538
546
554
562
(µA)
QUANTITY
160
140
120
100
80
60
40
20
05462-028
Figure 28. Sleep Mode Power Supply Current Distribution at 25°C/3.3 V
\\
ADIS16201 Data Sheet
Rev. E | Page 12 of 31
0
–50 150
TEMPERATURE (°C)
SLEEP MODE CURRENT (A)
0.0010
0.0008
0.0006
0.0004
0.0002
–30 –10 10 30 50 70 90 110
130
05462-029
Figure 29. Sleep Mode Current vs. Temperature at 3.3 V
0
2.9 3.7
SUPPLY VOLTAGE (V)
SLEEP MODE CURRENT (A)
0.0010
0.0008
0.0006
0.0004
0.0002
3.0 3.1 3.2 3.3 3.4 3.5 3.6
05462-030
Figure 30. Sleep Mode Current vs. Supply at 25°C
Data Sheet ADIS16201
Rev. E | Page 13 of 31
THEORY OF OPERATION
The ADIS16201 is a complete dual-axis digital inclinometer/
accelerometer that uses Analog Devices’ surface-micromachining
process and embedded signal processing to make a functionally
complete, low cost dual-axis sensor.
The ADIS16201 offers a fully calibrated, dualaxis
micromachined sensor element that develops independent
analog signals representative of the acceleration levels applied to
the part. An on-board precision ADC samples the acceleration
signals, along with the power supply voltage, an internal
temperature signal, and the auxiliary analog input signal. These
signals are then processed and latched into addressable output
registers. The serial peripheral interface (SPI) provides
convenient, digital access to these registers.
In addition, the acceleration signals are further processed to
produce inclination angle data for both axes. The inclination
angle data represents the tilt away from the ideal plane, which
in this case, is normal to the earths gravitational force. This
calculation assumes that no force outside of the earth’s
gravitational force is acting on the device.
ACCELEROMETER OPERATION
The acceleration sensor used in the ADIS16201 is a surface-
machined, polysilicon structure built on top of a silicon wafer.
Polysilicon springs suspend the structure over the surface of the
wafer and provide a resistance against acceleration forces.
Acceleration causes a deflection in the differential capacitor
structure that includes both fixed plates and plates that are
attached to the moving mass. The fixed plates are driven by a set
of square waves that are 180o out-of-phase from one another.
Acceleration deflects the beam and unbalances the differential
capacitor, resulting in an output square wave whose amplitude
is proportional to acceleration. Phase sensitive demodulation
techniques rectify the signal and determine the direction of the
acceleration. The output of the demodulator is amplified,
digitized, and processed to remove any process variations and
sensitivities to supply variations.
INCLINOMETER OPERATION
The ADIS16201 computes incline angles, with respect to the
horizontal plane (normal to the gravity vector), using the
following formulas:
arcsin 1
X
X
a
g

θ
=
arcsin 1
Y
Y
a
g

θ
=
Incline angle results have the least sensitivity to noise and
quantization when the accelerometer orientation is perpendicular
to the gravity vector (incline angle = 0°) and have the most
sensitivity to noise when the accelerometer orientation is
parallel with the gravity vector (incline angle = 90°). Any
linear acceleration, including vibration, causes error in the
angle measurements.
TEMPERATURE SENSOR
The TEMP_OUT control register allows the end user to
monitor the internal temperature of the ADIS16201 to an
accuracy of ±5°C. The output data is presented in a straight
binary format with a nominal 25°C die temperature correlating
to a 1278 LSB read through the TEMP_OUT output data
register. The temperature scale factor of2.129 LSB/°C allows
for a resolution of less than 0.5°C in the temperature reading
within the output data register.
/\ Table 6‘ Register Read Command BR Map Wi‘ \\
ADIS16201 Data Sheet
Rev. E | Page 14 of 31
BASIC OPERATION
The ADIS16201 is designed for simple integration into indus-
trial system designs, requiring only a 3.3 V power supply and a
4-wire, industry standard, serial peripheral interface (SPI).
Registers that are accessed using the SPI interface facilitate all of
the input/output functions on the ADIS16201. Each of these
registers is assigned a unique address and data format tailored
for its specific function. The SPI port operates in a full duplex
mode; data is clocked out of the DOUT pin at the same time
command/address data is clocked in through the DIN pin. For
more information on basic SPI port operation, see the
Applications Information section.
DATA OUTPUT REGISTER ACCESS
For the most basic operation of the ADIS16201, output data
registers require only read commands for accessing calibrated
sensor data, along with the temperature, power supply, and
auxiliary analog input channel data. Each read command
requires two full 16-bit cycles. The first cycle is for transmitting
the register address, and the second cycle is for reading the data.
Table 6 displays the appropriate bit map for the read command.
Bit A0 through Bit A5 contain the address of the register being
accessed. The appropriate sequencing for each SPI signal (CS,
SLCK, DIN, and DOUT) during a read command can be found
in Figure 31.
The data output register configuration is broken down into three
different functions: new data ready bit (ND), alarm indicator
(EA), and data bits (D0 to D13). The ND bit is used to determine
if a particular register has been updated since the last read
command. A Logic Level 1 for ND indicates that unread data is
available. When a register is read, this bit is set to a 0 logic level.
The alarm indicator provides users with a simple method for
passively monitoring a variety of status/alarm conditions and can
be used to simplify system-level processing requirements.
The two acceleration output data registers are 14 bits in length
and are formatted as twos complement binary numbers. The
rest of the data output registers are 12 bits in length, leaving D12
and D13 as don’t care bits. The output format for each of these
registers, along with their addresses, can be found in Table 7.
Each output data register has two different addresses. The first
address is for the upper byte, which contains the most
significant bits (D8 to D13), ND, and EA data. The second
address is for the lower byte, which contains the eight least
significant bits (D0 to D7). Reading either of these addresses
results in all 16 bits being clocked out on the DOUT line as
defined in Table 6 during the next SPI cycle.
ADDRESS IDLE NEXT COMMAND
BASED ON PREVIOUS COMMAND 16-BIT DATA WORD
CS
SCLK
DIN
DOUT
READ BIT = 0 ZERO
05462-034
Figure 31. Register Read Command Sequence
Table 6. Register Read Command Bit Map
DIN W/R1 0 A5 A4 A3 A2 A1 A0 x x x x x x x x
DOUT ND EA D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
Upper Byte Lower Byte
1 The W/R bit is always 0 for read commands.
Table 7‘ Dan: amp“: Register lnformafiun
Data Sheet ADIS16201
Rev. E | Page 15 of 31
Table 7. Data Output Register Information
Name Function Address
Resolution
(Bits)
Data
Format
Scale Factor
(per LSB)
SUPPLY_OUT Power Supply Data 0x03, 0x02 12 Binary 1.22 mV
XACCL_OUT X-Axis Acceleration Data 0x05, 0x04 14 Twos complement 0.4625 mg
YACCL_OUT Y-Axis Acceleration Data 0x07, 0x06 14 Twos complement 0.4625 mg
AUX_ADC Auxiliary Analog Input Data 0x09, 0x08 12 Binary 0.61 mV
TEMP_OUT Sensor Temperature Data 0x0B, 0x0A 12 Binary −0.47°C
XINCL_OUT X-Axis Inclination Data 0x0D, 0x0C 12 Twos complement 0.1°
YINCL_OUT Y-Axis Inclination Data 0x0F, 0x0E 12 Twos complement 0.1°
Table 8. Output Coding Example, XACCL_OUT1, 2
Acceleration Level Binary Output HEX Output Decimal
+1.7 g 00 1110 0101 1011 0x0E5B 3675
+1 g 00 1000 0111 0010 0x0872 2162
+0.4625 g 00 0011 1110 1000 0x03E8 1000
+0.4625 mg 00 0000 0000 0001 0x0001 1
0 g 00 0000 0000 0000 0x0000 0
0.4625 mg 11 1111 1111 1111 0x3FFF −1
0.4265 g 11 1100 0001 1000 0x3C18 1000
1 g 11 0111 1000 1110 0x378E 2162
1.7 g 11 0001 1010 0101 0x31A5 3675
1 Two MSBs have been masked off and are not considered in the coding.
2 Nominal sensitivity (2.162 LSB/mg) and zero offset null performance are assumed.
ADIS16201 Data Sheet
Rev. E | Page 16 of 31
PROGRAMMING AND CONTROL
CONTROL REGISTER OVERVIEW
The ADIS16201 offers many programmable features that are
controlled by writing commands to the appropriate control
registers using the SPI. For added system flexibility and
programmability, the following sections describe these controls
and specify the 28 digital control registers that are available
using the SPI interface. A high level listing of these registers is
given within Table 9. The following sections expand upon the
functionality of each of these control registers, providing for the
full clarification of the behavior of each of the control registers.
Available control modes for the device include selectable sample
rates for reading the seven output vectors, configurable output
data, alarm settings, control of the on-board 12-bit auxiliary
DAC, handling of the two general-purpose I/O lines, facilitation
of the sleep mode, enabling the self-test mode, and other
miscellaneous control functions.
The conversion process is repeated continually, providing for
continuous update of the seven output registers. The new data
ready bit (ND) flags bits common to all seven output registers,
allowing the completion of the conversion process to be tracked
via the SPI. As an alternative, the digital I/O lines can be configured
through software control to create a data-ready hardware function
that can signal the completion of the conversion process.
Two independent alarms provide the ability to monitor any one
of the seven output registers. They can be configured to report
an alarm condition on either fixed thresholds or rates of change.
The alarm conditions are monitored through the SPI. In addition,
the user can configure the digital I/O lines through software
control to create an alarm function that allows for monitoring
of the alarm conditions through hardware.
The seven output signals noted above are calibrated independ-
ently at the factory, delivering a high degree of accuracy. In
addition, the user has access to independent offset and scale
factors for each of the two acceleration and inclination output
vectors. This allows independent scaling and level adjustment
control of any one these four registers prior to the values being
read via the SPI. In turn, field level calibrations can be implemented
within the sensor itself using these offset and scale variables.
System level commands provided within the sensor include
automatic zeroing of the four outputs using a single null command
via the SPI. In addition, the original factory calibration settings
can be recovered at any point, using a simple factory reset
command.
CONTROL REGISTER ACCESS
The control registers within the ADIS16201 are based upon a
16-bit/2-byte format, and they are accessed via the SPI. The SPI
operates in full duplex mode with the data clocked out of the
DOUT pin at the same time data is clocked in through the DIN
pin. All commands written to the ASIS16201 are categorized as
write commands or read commands. All write commands are
self-contained and take place within a single cycle. Each read
command requires two cycles to complete; the first cycle is for
transmitting the register address, and the second cycle is for
reading the data. During the second cycle, when the data out
line is active, the data in line is used to receive the next
sequential command. This allows for overlapping the commands.
For more information on basic SPI port operation, see the
Applications Information section.
The read and write commands are identified through the most
significant bit (MSB), B15, of the received data. Write a 1 to B15
to indicate a write command. Write a 0 to B15 to indicate a read
command. Bit B13 through Bit B8 contain the address of the
control register that is being accessed. The remaining eight bits
of the write command contain the data that is being written into
the part, whereas the remaining eight bits of the read command
contain don’t care levels. Given that the data within the write
command is eight bits in length, the 8-bit data format is the
default byte size. A write command operates on a single chip
select cycle, as shown in Figure 32. The read command operates
on a 2-chip select cycle basis, as seen in Figure 31. All 64 bytes
of register space are accessed using the 6-bit address. Data
written into the device is one byte at a time with the address of
each byte being explicitly called out in the write command.
Conversely, data being read from the device consists of two,
back-to-back, 8-bit variables being sent out, with the first byte
out corresponding to the upper address (odd number address)
and the second byte relating to the next lower address space
(even number address). For example, a data read of Address 03h
results in the data from Address 03h being fed out followed by
data from Address 02h. Likewise, a data read of Address 02h
results in the same data stream being output from the device.
The ADIS16201 is a flash-based device with the nonvolatile
functional registers implemented as flash registers. Take into
account the endurance limitation of 20,000 writes when
considering the system-level integration of these devices. The
nonvolatile column in Table 9 indicates which registers are
recovered upon power-up. The user must instigate a manual
flash update command (using the command register) in order
to store the nonvolatile data registers, once they are configured
properly. When performing a manual flash update command,
the user needs to ensure that the power supply remains within
limits for a minimum of 50 μs after the write is initiated. This
ensures a successful write of the nonvolatile data.
Table 9‘ Control Register Mapping Table 10. Register Write Command Bil Map
Data Sheet ADIS16201
Rev. E | Page 17 of 31
Table 9. Control Register Mapping
Register Name Type Nonvolatile Address Bytes Function
0x00 to 0x01 2 Reserved
SUPPLY_OUT R 0x02 2 Power supply output data
XACCL_OUT R 0x04 2 X-axis acceleration output data
YACCL_OUT R 0x06 2 Y-axis acceleration output data
AUX_ADC R 0x08 2 Auxiliary ADC data
TEMP_OUT R 0x0A 2 Temperature output data
XINCL_OUT R 0x0C 2 X-axis inclination output data
YINCL_OUT R 0x0E 2 Y-axis inclination output data
XACCL_ OFF R/W X 0x10 2 X-axis acceleration offset factor
YACCL_ OFF
R/W
X
0x12
2
Y-axis acceleration offset factor
XACCL_ SCALE R/W X 0x14 2 X-axis acceleration scale factor
YACCL_ SCALE R/W X 0x16 2 Y-axis acceleration scale factor
XINCL_OFF R/W X 0x18 2 X-axis inclination offset factor
YINCL_ OFF R/W X 0x1A 2 Y-axis inclination offset factor
XINCL_SCALE R/W X 0x1C 2 X-axis inclination scale factor
YINCL_ SCALE R/W X 0x1E 2 Y-axis inclination scale factor
ALM_MAG1 R/W X 0x20 2 Alarm 1 amplitude threshold
ALM_MAG2 R/W X 0x22 2 Alarm 2 amplitude threshold
ALM_SMPL1 R/W X 0x24 2 Alarm 1 sample period
ALM_SMPL2 R/W X 0x26 2 Alarm 2 sample period
ALM_CTRL R/W X 0x28 2 Alarm source control register
0x2A to 0x2F 6 Reserved
AUX_DAC R/W 0x30 2 Auxiliary DAC data
GPIO_CTRL R/W 0x32 2 Auxiliary digital I/O control register
MSC_CTRL R/W 0x34 2 Miscellaneous control register
SMPL_PRD R/W X 0x36 2 ADC sample period control
AVG_CNT
R/W
X
0x38
2
Defines number of samples used by moving average filter
PWR_MDE R/W 0x3A 2 Counter used to determine length of power-down mode
STATUS R 0x3C 2 System status register
COMMAND W 0x3E 2 System command register
Table 10. Register Write Command Bit Map
DIN W/R 0 A5 A4 A3 A2 A1 A0 D7 D6 D5 D4 D3 D2 D1 D0
Upper Byte Lower Byte
ADDRESS DATA
CS
SCLK
DIN
WRITE BIT = 1 ZERO
05462-035
Figure 32. Control Register Write Command Sequence of SPI Signals
ADIS16201 Data Sheet
Rev. E | Page 18 of 31
CONTROL REGISTER DETAILS
The control registers in the ADIS16201 are 16 bits in length.
Each of them has been assigned an address for their upper byte
and lower byte. The bit map of each control register uses the
numerical assignments that are displayed in the following table.
MSB LSB
15 14 13 12 11 10 9 8
7 6 5 4 3 2 1 0
The upper byte consists of Bit 8 to Bit 15, and the lower byte
consists of Bit 0 to Bit 7. Each of the following sections provides
a description of each register that includes purpose, relevant
scaling information, bit maps, addresses, and default values.
CALIBRATION
The ADIS16201 outputs are precalibrated at the factory, providing
a high degree of accuracy and simpler system implementation.
In addition, for system or field updates, the device has eight
control registers associated with calibrating the acceleration and
inclination output data (see the Calibration Register Definitions
section). Each of these registers has read/write capability and is
16 bits (2 bytes) in length. All calibration registers are 12 bits in
length, with the exception of the inclination offset registers, which
are 9 bits in length. All data values are aligned to the LSB. The
OFFSET registers all utilize the twos complement format
allowing for both positive and negative offsets. All scale registers
utilize the straight binary format.
The data within these eight calibration registers is utilized in
offsetting and scaling of the output data registers according to
the following relationship:

CxAOutput
where:
x represents the raw data prior to calibration.
C is the offset.
A is the scalar.
Output represents the output data register where the resultant
data is stored.
All four inertial sensor outputs (X and Y acceleration, X and Y
inclination) have their own independent set of calibration
registers.
Simple access to these registers enables field calibration to
correct for in-system error sources. In particular, the offset
control registers allow the user to reset to 0°/0 mg reference
point for the device. This is particularly important when
considering the stack-up of the tolerances in mounting the
ADIS16201 to a printed circuit board (PCB), the PCB to an
enclosure, the enclosure mounted to the chassis of a piece of
equipment, and so on.
The result is that the ADIS16201 mechanical reference can be
offset several degrees from that of the end equipment
mechanical reference, resulting in an accumulation of offset
errors in the inclination and acceleration data output registers.
The offset registers provide a convenient tool for managing
these types of errors.
A global command is implemented within the ADIS16201 to
simplify the loading of the offsets. Once the end piece of
equipment is leveled to its desired reference point, a null
command can be sent to the ADIS16201 via the command
control register, which zeros the two acceleration and the two
inclination output data registers. This command loads all four
offset registers with the inverse of their contents at the time of
the null command. Consequently, on the next reading of the
seven output data registers, the two acceleration and two
inclination output data registers should be reset to mid-scale
(neglecting noise and repeatability limitations). It is suggested
that when the null command is implemented, the AVG_CNT
control register be set to 08h in order to maximize the filtering
and reduce the effects of noise in determining the values to be
loaded into the offset control registers. Optionally, the user can
manually load each of the eight calibration registers via the SPI
in order to calibrate the end system. This is applicable when the
user plans to adjust the scale factors, thus requiring an external
stimulus to excite the ADIS16201.
CALIBRATION REGISTER DEFINITIONS
XACCL_OFF Register Definition
Address Scale1 Default Format Access
0x11, 0x10 0.4624 mg 0x0000 Twos
complement
R/W
1 Scale is the weight of each LSB.
The XACCL_OFF register is the user-controlled register for
calibrating system-level acceleration offset errors. For the X-axis
acceleration, it represents the C variable in the calibration
equation. The maximum calibration range is ±0.945 g, or
+2047/−2048 codes, assuming nominal sensor sensitivity. The
contents of this register are nonvolatile.
Table 11. XACCL_OFF Bit Designations
Bit Description
15:12 Not used
11:0 Data bits
Table 15. XINCLJJFF Bis Designations Table 13. YACCLioFF Bis Designations Table 16. XlNCLiscALE Bil Designaiiuns Table I4. YACCLiscALE Bis Designations
Data Sheet ADIS16201
Rev. E | Page 19 of 31
XACCL_SCALE Register Definition
Address Scale1 Default Format Access
0x15, 0x14 0.0488% 0x0800 Binary R/W
1 Scale is the weight of each LSB.
The XACCL_SCALE register is the user-controlled register for
calibrating system-level acceleration sensitivity errors. For the
X-axis acceleration, it represents the A variable in the calibration
equation. This register offers a sensitivity calibration range of 0 to
2, or 0 to 4095 codes, assuming nominal sensor sensitivity. The
contents of this register are nonvolatile.
Table 12. XACCL_SCALE Bit Designations
Bit
Description
15:12 Not used
11:0 Data bits
YACCL_OFF Register Definition
Address Scale1 Default Format R/W
0x13, 0x12 0.4624 mg 0x0000 Twos
complement
Both
1 Scale is the weight of each LSB.
The YACCL_OFF register is the user-controlled register for
calibrating system-level acceleration offset errors. For the Y-axis
acceleration, it represents the C variable in the calibration
equation. The maximum calibration range is ±0.945 g, or
+2047/−2048 codes, assuming nominal sensor sensitivity. The
contents of this register are nonvolatile.
Table 13. YACCL_OFF Bit Designations
Bit Description
15:12 Not used
11:0 Data bits
YACCL_SCALE Register Definition
Address Scale1 Default Format Access
0x17, 0x16 0.0488% 0x0800 Binary R/W
1 Scale is the weight of each LSB.
The YACCL_SCALE register is the user-controlled register for
calibrating system-level acceleration sensitivity errors. For the
Y-axis acceleration, it represents the A variable in the calibration
equation. This register offers a sensitivity calibration range of 0 to
2, or 0 to 4095 codes, assuming nominal sensor sensitivity. The
contents of this register are nonvolatile.
Table 14. YACCL_SCALE Bit Designations
Bit Description
15:12 Not used
11:0 Data bits
XINCL_OFF Register Definition
Address Scale1 Default Format Access
0x19, 0x18 0. 0x0000 Twos
complement
R/W
1 Scale is the weight of each LSB.
The XINCL_OFF register is the user-controlled register for
calibrating system-level inclination offset errors. For the X-axis
inclination, it represents the C variable in the calibration
equation. The maximum calibration range is ±25.5° or
+255/−256 codes, assuming nominal sensor sensitivity. The
contents of this register are nonvolatile.
Table 15. XINCL_OFF Bit Designations
Bit Description
15:9 Not used
8:0 Data bits
XINCL_SCALE Register Definition
Address Scale1 Default Format Access
0x1D, 0x1C 0.0488% 0x0800 Binary R/W
1 Scale is the weight of each LSB.
The XINCL_SCALE register is the user-controlled register for
calibrating system-level inclination sensitivity errors. For the X-
axis inclination, it represents the A variable in the calibration
equation. The calibration range is from 0 to 2, or 0 to 4095
codes, assuming nominal sensor sensitivity. The contents of this
register are nonvolatile.
Table 16. XINCL_SCALE Bit Designations
Bit Description
15:12 Not used
11:0 Data bits
YINCL_OFF Register Definition
Address Scale1 Default Format Access
0x1B, 0x1A 0.1º 0x0000 Twos
complement
R/W
1 Scale is the weight of each LSB.
The YINCL_OFF register is the user-controlled register for
calibrating system-level inclination offset errors. For the Y-axis
inclination, it represents the C variable in the calibration
equation. The maximum calibration range is ±25.5º or +255/
−256 codes, assuming nominal sensor sensitivity. The contents
of this register are nonvolatile.
Table 17. YINCL_OFF Bit Designations
Bit Description
15:9 Not used
8:0 Data bits
ADIS16201 Data Sheet
Rev. E | Page 20 of 31
YINCL_SCALE Register Definition
Address Scale1 Default Format Access
0x1F, 0x1E 0.0488% 0x0800 Binary R/W
1 Scale is the weight of each LSB.
The YINCL_SCALE register is the user-controlled register for
calibrating system-level inclination sensitivity errors. For the
Y-axis inclination, it represents the A variable in the calibration
equation. The calibration range is from 0 to 2, or 0 to 4095 codes,
assuming nominal sensor sensitivity. The contents of this register
are nonvolatile.
Table 18. YINCL_SCALE Bit Designations
Bit
Description
15:12 Not used
11:0 Data bits
ALARMS
The ADIS16201 contains two independent alarm functions that are
referred to as Alarm 1 and Alarm 2. The Alarm 1 function is
managed by the ALM_MAG1 and ALM_SMPL1 control registers.
The Alarm 2 function is managed by the ALM_MAG2 and
ALM_SMPL2 control registers. Both the Alarm 1 and Alarm 2
functions share the ALM_CTRL register. For simplicity, the
following text references the Alarm 1 functionality only.
The 16-bit ALM_CTRL register serves three distinct roles in
controlling the Alarm 1 function. First, it is used to enable the
overall Alarm 1 function and select the output data variable that
is to be monitored for the alarm condition. Second, it is used to
select whether the Alarm 1 function is based upon a predefined
threshold (THR) level or a predefined rate-of-change (ROC)
slope. Third, the ALM_CTRL register can be used in setting up
one of the two general-purpose input/output lines (GPIOs) to
serve as a hardware output that indicates when an alarm
condition has occurred. Enabling the I/O alarm function,
setting its polarity, and controlling its operation are
accomplished using this register.
Note that when enabled, the hardware output indicator serves
both the Alarm 1 and Alarm 2 functions and cannot be used to
differentiate between one alarm condition and the other. It is
simply used to indicate that an alarm is active and that the user
should poll the device via the SPI to determine the source of the
alarm condition (see the STATUS Register Definition section).
Because the ALM_CTRL, MSC_CTRL, and GPIO_CTRL
control registers can influence the same GPIO pins, a priority
level has been established to avoid conflicting assignments of
the two GPIO pins. This priority level is defined as
MSC_CTRL, which has precedence over ALM_CTRL, which
has precedence over GPIO_CTRL.
The ALM_MAG1 control register used in controlling the
Alarm 1 function has two roles. The first role is to store the
value with which the output data variable is compared to
discern if an alarm condition exists or not. The second role is to
identify whether the alarm should be active for excursions
above or below the alarm limit. If 1 is written to the GT1 bit of
the ALM_MAG1 control register, the alarm is active for
excursions extending above a given limit. If 0 is written to the
GT1 bit, the alarm is active for excursions dropping below the
given limit. The comparison value contained within the
ALM_MAG1 control register is located within the lower 14 bits.
The format utilized for this 14-bit value should match that of
the output data register that is being monitored for the alarm
condition. For instance, if the YINCL_OUT output data register
is being monitored by Alarm 1, then the 14-bit value within the
ALM_MAG1 control register takes on a twos complement
format with each LSB equating to nominal 0.1° (assumes unity
scale and zero offset factors). The ALM_MAG value is
compared against the instantaneous value of the parameter
being monitored.
Use caution when monitoring the temperature output register
for the alarm conditions. Here, the negative temperature scale
factor results in the greater than and less than selections
requiring reverse logic.
When the THR function is enabled, the output data variable is
compared against the ALM_MAG1 level. When the ROC
function is enabled, the comparison of the output data variable
is against the ALM_MAG1 level averaged over the number of
samples, as identified in the ALM_SMPL1 control register. This
acts to create a comparison of (Δ units/Δ time) or the derivative
of the output data variable against a predefined slope.
Data Sheet ADIS16201
Rev. E | Page 21 of 31
The versatility built into the alarm function is intended to allow
the user to adapt to a number of different applications. For
example, in the case of monitoring a twos complement variable,
the GT1 bit within the ALM_MAG1 control register can allow
for the detection of negative excursions below a fixed level. In
addition, the Alarm 1 and Alarm 2 functions can be set to
monitor the same variable that allows the user to discern if an
output variable remains within a predefined window.
Other options include the ROC function that can be used in
monitoring high frequency shock levels in the acceleration
outputs or slowly changing outputs in the inclination level over
a period of a minute or more. With the addition of the alarm
hardware functionality, the ADIS16201 can be left to run
independently of the main processor and interrupt the system
only when an alarm condition occurs. Conversely, the alarm
condition can be monitored through the routine polling of any
one of the seven data output registers.
Note that the alarm functions work from instantaneous data
and not averaged data that can be present when the AVG_CNT
register is not set to 0. The alarm hardware output indicator is
not latched but tracks the actual alarm conditions in real time.
ALM_MAG1 Register Definition
Address Default1 Format Access
0x21, 0x20 0x0000 Not applicable R/W
1 Default is valid only until the first register write cycle.
The ALM_MAG1 register contains the threshold level for
Alarm 1. The contents of this register are nonvolatile.
Table 19. ALM_MAG1 Bit Designations
Bit Description
15 Greater than active alarm bit.
1: Alarm is active for an output greater than Alarm
Magnitude 1 register setting.
0: Alarm is active for an output less than Alarm
Magnitude 1 register setting.
14 Not used.
13:0 Data bits. This number can be either twos
complement or straight binary. The format is set by
the value being monitored by this function.
ALM_SMPL1 Register Definition
Address Default1 Format Access
0x25, 0x24 0x0000 Binary R/W
1 Default is valid only until the first register write cycle.
The ALM_SMPL1 register contains the sample period
information for Alarm 1, when it is set for rate-of-change alarm
monitoring. The rate-of-change alarm function averages the
change in the output variable over the specified number of
samples and compares this change directly to the values
specified in the ALM_MAG1 register. The contents of this
register are nonvolatile.
Table 20. ALM_SMPL1 Bit Designations
Bit Description
15:8 Not used
7:0 Data bits
ALM_MAG2 Register Definition
Address Default1 Format Access
0x23, 0x22 0x0000 Not applicable R/W
1 Default is valid only until the first register write cycle.
The ALM_MAG2 register contains the threshold level for
Alarm 2. The contents of this register are nonvolatile.
Table 21. ALM_MAG2 Bit Designations
Bit Description
15 Greater than active alarm bit.
1: Alarm is active for an output greater than Alarm
Magnitude 2 register setting.
0: Alarm is active for an output less than Alarm
Magnitude 2 register setting.
14 Not used.
13:0 Data bits. This number can be either twos
complement or straight binary. The format is set by
the value being monitored by this function.
ALM_SMPL2 Register Definition
Address Default1 Format Access
0x27, 0x26 0x0000 Binary R/W
1 Default is valid only until the first register write cycle.
The ALM_SMPL2 register contains the sample period
information for Alarm 2, when it is set for rate-of-change alarm
monitoring. The rate-of-change alarm function averages the
change in the output variable over the specified number of
samples and compares this change directly to the values
specified in the ALM_MAG1 register. The contents of this
register are nonvolatile.
Table 22. ALM_SMPL2 Bit Designations
Bit Description
15:8 Not used
7:0 Data bits
\-__ \~
ADIS16201 Data Sheet
Rev. E | Page 22 of 31
ALM_CTRL Register Definition
Address Default1 Format Access
0x29, 0x28 0x0000 Not applicable R/W
1 Default is valid only until the first register write cycle.
The ALM_CTRL register contains the alarm control variables.
Table 23. ALM_CTRL Bit Designations
Bit Value Description
15 Rate of change (ROC) enable for Alarm 2.
1: ROC is active.
0: ROC is inactive.
14:12 Alarm 2 source selection.
000 Alarm disable.
001 Alarm source: power supply output.
010 Alarm source: X-acceleration output.
011 Alarm source: Y-acceleration output.
100 Alarm source: auxiliary ADC output.
101 Alarm source: temperature sensor output.
110 Alarm source: X-inclination output.
111 Alarm source: Y-inclination output.
11 Rate of change (ROC) enable for Alarm 1.
1: ROC is active.
0: ROC is inactive.
10:8 Alarm 1 source selection.
000 Alarm disable.
001 Alarm source: power supply output.
010 Alarm source: X-acceleration output.
011 Alarm source: Y-acceleration output.
100 Alarm source: auxiliary ADC output.
101 Alarm source: temperature sensor output.
110 Alarm source: X-inclination output.
111 Alarm source: Y-inclination output.
7:3 Not used.
2 Alarm output enable.
1: Alarm output enabled.
0: Alarm output disabled.
1 Alarm output polarity.
1: Active high.
0: Active low.
0 Alarm output line select.
1: DIO1.
0: DIO0.
SAMPLE PERIOD CONTROL
The seven output data variables within the ADIS16201 are
sampled and updated at a rate based upon the SMPL_PRD
control register. The sample period can be precisely controlled
over more than a 3-decade range using a time base with two
settings and a 7-bit binary count. The use of a time base that
varies with a ratio of 1:31 allows for a more optimal resolution
in the sample period than a straight binary counter. This is
reflected in Figure 33, where the frequency is presented on a
logarithmic scale. The choice of the two time base settings
results in making the sample period setting more linear vs. the
logarithmic frequency scale.
Note that the sample period given is defined as the cumulative
time required to sample, process, and update all seven data output
variables. The seven data output variables are sampled as a
group and in unison with one another. Whatever update rate is
selected for one signal, all seven output data variables are updated
at the same rate whether they are monitored via the SPI or not.
For a sample period setting of less than 1098.9 μs (SMPL_RATE ≤
0x07), the overall power dissipation in the part rises by approxi-
mately 300%. The default setting for the SMPL_RATE register is
0x04 at initial power-up, thus allowing for the maximum SPI
clock rate of 2.5 MHz.
256
0
1 10k
FREQUENCY (Hz)
SMPL_PRD VALUE
192
128
64
10 100 1k
05462-036
Figure 33. SMPL_PRD Values vs. Sample Frequency
Data Sheet ADIS16201
Rev. E | Page 23 of 31
SMPL_PRD Register Definition
Address Default1 Format Access
0x37, 0x36 0x000A Not applicable R/W
1 Default is valid only until the first register write cycle.
After using the manual flash update (COMMAND[3]), the data
within this register is nonvolatile, allowing for data recovery
upon reset. The initial value is set to 0x0A upon initial power-
up, allowing for a sample period of ~744 μs.
Table 24. SMPL_PRD Bit Descriptions
Bit Description
15:8 Not used.
7 ADC time base control.
0: tB = 122.1 μs
1: tB = 3.784 ms .
6:0 ADC sample period control (NS).
Relationship to the sample period control:
tS = tB × (NS + 1)
FILTERING CONTROL
The ADIS16201 has the ability to perform basic filtering on the
seven output data variables through the AVG_CNT control
register. The filtering performed is that of a low-pass, moving
average filter. The size of the data being averaged (number of
filter taps) is determined through the AVG_CNT control
register. The filtering applied through the AVG_CNT control
register is applied to all seven data output variables concurrently
and, thus, one output variable cannot be filtered differently
from another.
The number of taps (N) within the moving average filter is
calculated as
CNTAVG
N
_
2
where AVG_CNT is shown as a decimal value. With AVG_CNT
set to 00h, N is reduced to 1, which effectively disables the
moving average filter.
At the other extreme, when AVG_CNT is set to its maximum
setting of 08h, N increases to 256, effectively reducing the
apparent bandwidth by 256. Note that the contribution from
each tap is set to 1/(N) allowing for unity gain in the filter
response. The frequency response of the moving average filter is
given as:
)sin(
)sin(
)(
s
s
tfN
tfN
fH
The more taps, the more poles, thus the steeper the slope of the
roll-off. Use caution with this filter mechanism because the
amplitudes of the sideband peaks within the stop band are not
reduced with an increasing number of taps, potentially allowing
for high frequency components to leak through. Sample
frequency response plots for the moving average filter, utilizing
various numbers of taps, are detailed in Figure 34.
1.0
H(f)
–0.5
00.5
f/fs
FREQUENCY (Hz)
NUMBER OF TAPS
0.5
0
0.1 0.2 0.3 0.4
N = 2
N = 4
N = 16
05462-037
Figure 34. Number of Taps vs. Sample Frequency Response
AVG_CNT Register Definition
Address Default1 Format Access
0x39, 0x38 0x0006 Binary R/W
1 Default is valid only until the first register write cycle.
The AVG_CNT register contains information that represents
the number of averages to be applied to the output data. The
number of averages can be calculated by powers of 2. For
example, the default value of the register, 4, would result in 16
averages applied to the output data. The number of averages can
be set to 1, 2, 4, 8, 16, 32, 64, 128, and 256.
Table 25. AVG_CNT Bit Description
Bit Description
15:4 Not used
3:0 Data bits (maximum = 1000, or a decimal value of 8)
POWER-DOWN CONTROL
The ADIS16201 has the ability to power down for user-defined
amounts of time, using the PWR_MDE control register. The
amount of time specified by the PWR_MDE control register is
equal to the binary count of the 8-bit control word multiplied
by 0.5 seconds. Therefore, the 255 codes cover an overall
shutdown time period of 127.5 seconds. The PWR_MDE
register is volatile and is set to 0 upon both initial power-up and
subsequent wake-ups from the power-down period. By setting
the PWR_MDE control register to a non-zero state, the
ADIS16201 automatically powers down once the next sample
period is completed and the seven data output registers are
updated.
ADIS16201 Data Sheet
Rev. E | Page 24 of 31
Once the ADIS16201 is placed into the power-down mode, it
can only return to normal operation by timing out, a reset
command (using the RST hardware control line), or by cycling
the power applied to the part. Once awake, the seven data
output registers can be scanned to determine what the state of
the output registers were prior to powering down. Once the
data is recovered, the device can be powered down again by
writing a non-zero value to the PWR_MDE control register and
starting the process over.
Once the power-down time is complete, the recovery time for
the ADIS16201 is approximately 2 ms. This recovery time is
implemented within the device to allow for recovery of the ADC
prior to performing the next data conversion. Note that the ND
data bit within the seven data output control registers is cleared
when the ADIS16201 is powered down. Likewise, the new data
hardware I/O line is placed into an inactive state prior to being
powered down. The DAC is placed into a power-down mode as
well, which results in the DAC output dropping to 0 V during
the power-down period. All control register settings are retained
while powered down with the exception of the PWR_MDE
control register, which is reset to 0 prior to power-down.
PWR_MDE Register Definition
Address Default1 Format Access
0x3B, 0x3A 0x0000 Binary R/W
1 Default is valid only until the first register write cycle.
The power-down period is determined by multiplying the
binary value represented by the data bits times the constant
0.5 seconds. This results in a variable power-down period of
0.5 seconds to 127.5 seconds with 0.5 seconds resolution in the
setting. A setting of 0 disables the power-down mode, whereas
any non-zero entry places the device in the power-down mode
at the next update of the data output registers. The power-down
register is volatile and is set to all 0s upon initial power-up and
recovery from the power-down mode.
Table 26. PWR_MDE Bit Descriptions
Bit Description
15:8 Not used
7:0 Data bits
STATUS FEEDBACK
The status control register within the ADIS16201 is utilized in
determining the present state of the device. The ability to monitor
the device becomes necessary when and if the ADIS16201 has
registered an alarm or error condition as indicated by the “alarm
enable” (14) within the seven output data registers. The 16-bit
status register is broken into two bytes. The three lower bits of the
lower data byte are used to indicate which error condition exists,
while the two lower bits of the upper data byte are utilized in
indicating which alarm condition exists.
STATUS Register Definition
Address Default1 Format Access
0x3D, 0x3C 0x0000 Not applicable Read only
1 Default is valid only until the first register write cycle.
The STATUS control register contains the alarm/error flags that
indicate abnormal operating conditions. See Table 27 for each
status bit definition. All flags are cleared upon the reading of the
status register. The flags are set on a continuing basis as long as
the error or alarm conditions persist.
Table 27. STATUS Bit Descriptions
Bit Description
15:10 Not used.
9 Alarm 2 status.
1: Active
0: Normal mode
8 Alarm 1 status.
1: Active
0: Normal mode
7:4 Not used.
3 SPI communications failure.
1: Error condition
0: Normal mode
2 Control register update failed.
1: Error condition
0: Normal mode
1 Power supply above 3.625 V.
1: Error condition
0: Normal mode
0 Power supply below 2.975 V.
1: Error condition
0: Normal mode
COMMAND CONTROL
The COMMAND control register is utilized in sending global
commands to the ADIS16201 device. There are four separate
commands that act as global commands in the controlling of
the ADIS16201 operation. Any one of the four commands can
be implemented by writing 1 to its corresponding bit location.
The command control register has write-only capability and is
volatile. Table 28 describes each of these global commands.
COMMAND Register Definition
Address Default1 Format Access
0x3F, 0x3E 0x0000 Not applicable Write only
1 Default is valid only until the first register write cycle.
Data Sheet ADIS16201
Rev. E | Page 25 of 31
Table 28. COMMAND Bit Descriptions
Bit Description
15:8 Not used.
7 Software Reset Command. Allows for resetting of the
device via the SPI.
6:4 Not used.
3 Manual Flash Update Command. This command is
utilized in updating all of the nonvolatile registers to
flash. Once the command is initiated, the supply
voltage, VDD, must remain within specified limits for
50 ms to assure proper update of the nonvolatile
registers to flash.
2 Auxiliary DAC Latch Command. This command acts to
latch the AUX_DAC control register data into the
auxiliary DAC upon receipt of the command. This allows
for sequential loading of the upper and lower AUX_DAC
data bytes via the SPI without having the auxiliary DAC
transition into unwanted, intermediate states based
upon the individual AUX_DAC data bytes. Once the two
bytes of AUX_DAC are loaded, the DAC latch command
is initiated to move the data into the auxiliary DAC itself.
1 Factory Reset Command. Allows the user to reset all
four system level offset registers and all four system
level scale registers to the nominal settings (000h and
800h, respectively) upon receipt of command. Data
within the moving average filters will likewise be reset.
As the manual flash command identified below, this
command stores all of the nonvolatile registers to flash.
Once the command is initiated, the supply voltage, VDD,
must remain within specified limits for 50 ms to assure
proper update of the nonvolatile registers to flash.
0 Null Command. Loads the X/Y inclination offset as well
as the X/Y acceleration offset registers with values that
zero out the inclination and acceleration outputs.
Useful as a single command to simultaneously zero
both inclination and acceleration outputs. As the
manual flash command identified below, this command
stores all of the nonvolatile registers to flash. Once the
command is initiated, the supply voltage, VDD, must
remain within specified limits for 50 ms to assure
proper update of the nonvolatile registers to flash.
MISCELLANEOUS CONTROL REGISTER
The MSC_CTRL control register within the ADIS16201
provides control of two miscellaneous functions: the data-ready
hardware I/O function and the self-test function. The bits to
control these two functions are shown in Table 29.
The operation of the data-ready hardware I/O function is very
similar to the alarm hardware I/O function (controlled through
the ALM_CTRL control register). In this case, the MSC_CNTRL
register can be used in setting up one of the two GPIO pins to
serve as the hardware output pin that indicates when the
sampling, conversion, and processing of the seven data output
variables has been completed. This register provides the ability
to enable the data-ready hardware function and establish its
polarity.
The data-ready hardware I/O pin is reset automatically to an
inactive state part way through the next conversion cycle,
resulting in a pulse train with a duty cycle varying from ~15%
to 35%, depending upon the sample period setting. Upon
completion of the next sample/conversion/processing cycle, the
data ready hardware I/O line is reasserted.
The MSC_CTRL, ALM_CTRL, and GPIO_CTRL control
registers can influence the same GPIO pins. A priority level has
been established to avoid conflicting assignments of the two
GPIO pins. This priority level is defined as MSC_CTRL and has
precedence over ALM_CTRL, which has precedence over
GPIO_CTRL.
The self-test enable bit allows the user to place the ADIS16201
into a diagnostics mode for purposes of verifying the operation
of the base sensor. When this bit is set high, an electrostatic
force is generated internally to the sensor. The resulting
movement within the sensor allows the end user to test if the
accelerometer is functional. Typical change in the output is
328 mg (corresponding to 708 LSB). Once the self-test enable
bit is returned to a low state, normal operation is resumed.
MSC_CTRL Register Definition
Address Default1 Format Access
0x35, 0x34 0x0000 Not applicable R/W
1 Default is valid only until the first register write cycle.
The 16-bit miscellaneous control register is used in the
controlling of the self-test and data-ready hardware functions.
This includes turning on and off the self-test function, as well as
enabling and configuring the data-ready function. For the data-
ready function, the written values are nonvolatile, allowing for
data recovery upon reset. The self-test data is volatile and is set
to 0s upon reset. This register has read/write capability.
Table 29. MSC_CTRL Bit Descriptions
Bit Description
15:9 Not used.
8 Self-test enable.
1: ST enabled
0: ST disabled
7:3 Not used.
2 Data-ready enable.
1: DR enabled
0: DR disabled
1 Data-ready polarity.
1: Active high
0: Active low
0 Data-ready line select.
1: DIO1
0: DIO0
ADIS16201 Data Sheet
Rev. E | Page 26 of 31
PERIPHERALS
AUXILIARY ADC FUNCTION
The auxiliary ADC function integrates a standard 12-bit ADC
into the ADIS16201 to digitize other system-level analog signals.
The output of the ADC can be monitored through the AUX_ADC
control register, as defined in Table 6 and Table 7. The ADC
consists of a 12-bit successive approximation converter. The
output data is presented in straight binary format, with the full-
scale range extending from 0 V to VREF. A high precision, low
drift, factory-calibrated 2.5 V reference is also provided.
Figure 35 shows the equivalent circuit of the analog input
structure of the ADC. The input capacitor, C1, is typically 4 pF
and can be attributed to parasitic package capacitance. The two
diodes provide ESD protection for the analog input. Care must
be taken to ensure that the analog input signals never exceed
the supply rails by more than 300 mV. This would cause these
diodes to become forward-biased and start conducting. They
can handle 10 mA without causing irreversible damage to the
part. The resistor is a lumped component that represents the on
resistance of the switches. The value of this resistance is typically
100 Ω. Capacitor C2 represents the ADC sampling capacitor
and is typically 16 pF.
C2
C1
R1
VDD
D
D
05462-038
Figure 35. Equivalent Analog Input Circuit
Conversion Phase: Switch Open
Track Phase: Switch Closed
For ac applications, removing high frequency components from
the analog input signal is recommended through the use of an
RC low-pass filter on the relevant analog input pins.
In applications where harmonic distortion and signal-to-noise
ratio are critical, the analog input should be driven from a low
impedance source. Large source impedances significantly affect
the ac performance of the ADC. This can necessitate the use of
an input buffer amplifier. When no input amplifier is used to
drive the analog input, the source impedance should be limited
to values lower than 1 kΩ. The maximum source impedance
depends on the amount of total harmonic distortion (THD)
that can be tolerated.
AUXILIARY DAC FUNCTION
The auxiliary DAC function integrates a standard 12-bit DAC
into the ADIS16201. The DAC output is buffered and fed off-
chip to allow for the control of miscellaneous system-level
functions. Data is downloaded through the writing of two
adjacent data bytes, as defined in its register definition. To
prevent the DAC from transitioning through inadvertent states
during data downloads, a single command is used to
simultaneously latch both data bytes into the DAC after they
have been written into the AUX_DAC control register. This
command is implemented by writing 1 to Bit 2 of the command
control register, which, once received, results in the DAC output
transitioning to the desired state.
The DAC output provides an output range of 0 V to 2.5 V. The
DAC output buffer features a true rail-to-rail output stage. This
means that, unloaded, the output is capable of reaching within
5 mV of ground. Moreover, the DAC’s linearity performance
(when driving a 5 kΩ resistive load to ground) is good through
the full transfer function, except for Code 0 to Code 100.
Linearity degradation near ground is caused by saturation of the
output amplifier. As the output is forced to sink more current,
the nonlinear region at the bottom of the transfer function
becomes larger. Larger current demands can significantly limit
output voltage swing.
AUX_DAC Register Definition
Address Default1 Format Access
0x31, 0x30 0x0000 Binary R/W
1 Default is valid only until the first register write cycle.
The AUX_DAC register controls the ADIS16201’s DAC function.
The data bits provide a 12-bit binary format number with 0
representing 0 V and 0x0FFFh representing 2.5 V. The data
within this register is volatile and is set to 0s upon reset. This
register has read/write capability.
Table 30. AUX_DAC Bit Descriptions
Bit Description
15:12 Not used
11:0 Data bits
Data Sheet ADIS16201
Rev. E | Page 27 of 31
GENERAL PURPOSE I/O CONTROL
As previously noted, the ADIS16201 provides two general-
purpose, bidirectional I/O pins (GPIOs) that are available to the
user for control of auxiliary circuits within the target application.
All I/O pins are 5 V tolerant, meaning that the GPIOs support
an input voltage of 5 V. All GPIO pins have an internal pull-up
resistor of approximately 100 kΩ, and their drive capability is
1.6 mA. The direction, as well as the logic level, can be
controlled for these GPIO pins through the GPIO_CTRL
control register, as defined in Table 31.
These same GPIO pins are also controllable through the
ALM_CTRL and MSC_CTRL control registers. The priority for
these three control registers in controlling the two GPIO pins is
MSC_CTRL has precedence over ALM_CTRL, which has
precedence over GPIO_CTRL.
GPIO_CTRL Register Definition
Address Default1 Format Access
0x33, 0x32 0x0000 Not applicable R/W
1 Default is valid only until the first register write cycle.
Auxiliary Digital I/O Control Register. The data within this
register is volatile and is set to 0s upon reset.
Table 31. GPIO_CTRL Bit Descriptions
Bit Description
15:10 Not used.
9 General-Purpose I/O Line 1 polarity.
0: Low
1: High
8 General-Purpose I/O Line 0 polarity.
0: Low
1: High
7:2 Not used.
1 General-Purpose I/O Line 1, data direction control.
0: Input
1: Output
0 General-Purpose I/O Line 0, data direction control.
0: Input
1: Output
r, 1h /R E 2&3 CS 67bit b CS Hi; CS ”2” (15 IIIIZIIIIIII IIIIZIIIIIII IZIIZIIIIIZI IZIIZIIIIIZI EIEIEIEI IIIIIIIIIIII IIIIIIIIIIII EIElElEI
ADIS16201 Data Sheet
Rev. E | Page 28 of 31
APPLICATIONS INFORMATION
SERIAL PERIPHERAL INTERFACE (SPI)
The ADIS16201 integrates a hardware SPI on-chip. SPI is an
industry-standard synchronous serial interface that allows data
to be transmitted and received simultaneously, that is, full duplex
up to a maximum bit rate of 2.5 Mbps depending upon the
sample period selection. The SPI port is configured for slave
operation and consists of four pins.
DOUT
The data out pin (DOUT) is an output pin used to transmit
data out of the ADIS16201. The data is transmitted in a 16-bit
(2byte) format, MSB first.
DIN
The data-in pin (DIN) is an input pin that is used for the
reception of data from the master. The data is received in a
16-bit (2-byte) format with the W/R control bit and address
contained in the first data byte and the data contained within
the second data byte, MSB first.
SCLK
The serial clock pin (SCLK) is used to synchronize the data
being transmitted and received through the SCLK period.
Therefore, a 16-bit (2-byte) word is transmitted/received after
16 SCLK periods. The SCLK pin is configured as an input.
CS
In the ADIS16201 a transfer is initiated by the assertion of the
chip select pin (CS), which is an active-low signal. The SPI port
then transmits and receives data in 16-bit blocks until the
transfer is concluded by de-assertion of CS.
The control registers within the ADIS16201 are based upon a
16-bit (2-byte) format. Data is loaded in from the DIN pin of
the ADIS16201 on the rising edge of SCLK. This requires 16
serial clocks for every data transfer framed by the low period of
the CS line. The part operates in full duplex mode with the data
clocked out of the DOUT pin, likewise on the rising edge of the
SCLK. For each read command received, the corresponding
output data is clocked out of the DOUT pin during the
following cycle, as defined by the CS line.
Output Response
Figure 36 displays the typical output response for the
ADIS16201 for several gravitational measurement orientations.
This is a convenient plot for understanding the basic orientation
of the inertial sensor measurement axes.
BOTTOM
VIEW
(Not to Scale)
1
1
1
1
X_ACCL
OUT
= 0LSB
Y_ACCL
OUT
= –2162LSB
NOTES
1. DATA SHOWN IN TWOS COMPLEMENT FORMAT.
X_ACCL
OUT
= 0LSB
Y_ACCL
OUT
= +2162LSB
X_ACCL
OUT
= –2162LSB
Y_ACCL
OUT
= 0LSB
X_ACCL
OUT
= +2162LSB
Y_ACCL
OUT
= 0LSB
EARTH’S SURFACE
05462-039
Figure 36. Output Response vs. Orientation
HARDWARE CONSIDERATIONS
The ADIS16201 can be operated from a single 3.3 V (3.0 V to
3.6 V) power supply. The ADIS16201 integrates two decoupling
capacitors that are 1 μF and 0.1 μF in value. For the local
operation of the ADIS16201, no additional power supply
decoupling capacitance is required.
However, if the system power supply presents a substantial
amount of noise, additional filtering can be required. If
additional capacitors are required, connect the ground terminal
of each of these capacitors directly to the underlying ground
plane. Finally, note that all analog and digital grounds should be
referenced to the same system ground reference point.
GROUNDING AND BOARD LAYOUT
RECOMENDATIONS
Maintaining low impedance signal return paths can be very
critical in managing system-level noise effects. For best results,
use a single, continuous ground plane that is tied to each
ADIS16201 ground pin via short via and trace lengths. In
addition to maintaining a low-impedance ground structure,
routing the SPI signals away from any sensitive analog circuits,
such as the ADC and DACs (if they are in use), can help
mitigate system-level noise risks.
ClDElcli “JD D DEED |:l|:l|:l|:l
Data Sheet ADIS16201
Rev. E | Page 29 of 31
BAND GAP REFERENCE
The ADIS16201 provides an on-chip band gap reference of
2.5 V that is utilized by the on-board ADC and DAC. This
internal reference also appears on the VREF pin. This reference
can be connected to external circuits in the system. An external
buffer would be required because of the low drive capability of
the VREF output.
POWER SUPPLY CONSIDERATIONS
The ADIS16201 is a precision sensing system that uses an
embedded processor for critical interface and signal processing
functions. Supporting this processor requires a low impedance
power supply, which can manage transient current demands that
happen during normal operation, as well as during the start-up
process. Transient current demands start when the voltage on
the VDD pin reaches ~2.1 V. Therefore, it is important for the
voltage on the VDD pin to reach 3 V as quickly as possible.
Linear VDD ramp profiles that reach 3 V in 100 µs provide
reliable results when used in conjunction with design practices
that support a low dynamic source impedance. The ADP1712 is
a linear regulator that can support the recommended ramp profile.
See the ADIS1620x/21x/22x Power Regulator Suggestion page
for a reference design suggestion for using this regulator with the
ADIS16201.
Power-On-Reset Function
The ADIS16201 has a power-on-reset (POR) function that
triggers a reset if the voltage on the VDD pin fails to transition
between 2.35 V and 2.7 V within 128 ms.
Transient Current from VDD Ramp Rate
Because the ADIS16201 contains 2 μF of decoupling capacitance
on VDD and some systems may use additional filtering
capacitance, the VDD ramp rate has a direct impact on the
initial transient current requirements. Use the following
formula to estimate the transient current associated with the
capacitance (C) and VDD ramp rate (dV/dt):
( )
dt
dV
Cti =
For example, if VDD transitions from 0 V to 3.3 V in 33 µs,
dV/dt is equal to 100000 V/S (3.3 V/33 µs). When charging the
internal 2 µF capacitor (no external capacitance), the charging
current for this ramp rate is 200 mA during the 33 µs ramp time.
This relationship provides a tool for evaluating the initial charging
currents against the current-limit thresholds of system power
supplies, which can cause power supply interruptions and the
appearance of failed startups. This relationship can also be
important for maintaining surge current ratings of series
elements.
ASSEMBLY
When developing a process flow for installing ADIS16201
devices on PCBs, see the JEDEC J-STD-020C standard for
reflow temperature profile and processing information. The
ADIS16201 can use the tin (Sn), lead (Pb) eutectic process and
the Pb-free eutectic process from this standard. One exception
to the standard is that the peak temperature exposure is 240°C.
For a complete list of assembly process suggestions, see the
ADIS162xx LGA Assembly Guidelines page. See Figure 37 for an
example pattern of the location of the ADIS16201 on a PCB.
EXAMPLE PAD LAYOUT
1.178 BSC
(8 PLCS)
0.500 BSC
(16 PLCS)
1.127 BSC
(16 PLCS)
0.670 BSC
(12 PLCS)
7.873 BSC
(2 PLCS)
05462-041
Figure 37. Example Pad Layout
X-RAY SENSITIVITY
Exposure to high dose rate X-rays, such as those in production
systems that inspect solder joints in electronic assemblies, may
affect accelerometer bias errors. For optimal performance, avoid
exposing the ADIS16201 to this type of inspection.
ADIS16201 Data Sheet
Rev. E | Page 30 of 31
OUTLINE DIMENSIONS
121409-C
SIDE VIEW
TOP VIEW BOTTOM VIEW
PIN 1
INDICATOR
1.000 BSC
(16×)
3.90
MAX
1
4
5
8
9
1213 16
5.391
BSC
(4×)
2.6955
BSC
(8×)
5.00
TYP
8.373
BSC
(2×)
0.200
MIN
(ALL SIDES)
0.797 BSC
(12×)
0.373 BSC
(16×)
9.35
9.20 SQ
9.05
Figure 38. 16-Terminal Stacked Land Grid Array [LGA]
(CC-16-2)
Dimensions shown in millimeters
ORDERING GUIDE
Model1 Temperature Range Package Description Package Option
ADIS16201CCCZ −40°C to +125°C 16-Terminal Stacked Land Grid Array [LGA] CC-16-2
ADIS16201/PCBZ Evaluation Board
EVAL-ADIS2Z Evaluation System
1 Z = RoHS Compliant Part.
ANALOG DEVICES www.analug.cum
Data Sheet ADIS16201
Rev. E | Page 31 of 31
NOTES
©20062019 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D05462-0-3/19(E)

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