PESD15VL1BA Prod. Quality Datasheet by Nexperia USA Inc.

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Product Quality Information
© 2019 Nexperia B.V.
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Quality Information for Product Type PESD15VL1BA
Quality and reliability data provided by Nexperia Semiconductors is intended to be a non-binding estimate of
product performance only. It does not imply that any performance levels reflected in such data can be met if
the product is operated outside the conditions expressly stated in the latest published data sheet for a
device or in your application.
Quick reference
Information
Content
Device Type
PESD15VL1BA
Ordering Information (12NCs)
9340 584 23115, 9340 584 23135, 9340 584 23145
Qualification Grade
automotive
Package
SOD323 (SC-76)
Waferfab
Nexperia DHAM
Assembly
Nexperia ATGD
ESD HBM
> 8000 V
Calculated Failure Rate
0.52 FIT
MTBF/MTTF
1.92E+09 hours
Explanation
Automotive qualified products are in accordance with the AEC-Q101.
Electrostatic Discharge (ESD) tests are performed as described in the AEC-Q101 with each 3 positive and 3
negative pulses for each stress voltage level.
Test considered for FIT calculation: High Temperature Reverse Bias (HTRB, AEC-Q101 Test # 5). The
parameters for calculation of FIT and MTBF/MTTF are as follows: Confidence level 60%, junction
temperature derated to 55 °C, activation energy 0.7 eV, test time 168 - 1000 hrs.
For discrete semiconductor devices the Mean Time Between Failure (MTBF) is replaced by the Mean Time To
Failure (MTTF) acronym. MTTF is calculated from the Intrinsic Failure Rate.

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