NXP Semiconductors
Data Sheet: Technical Data
Document Number: IMX6ULLCEC
Rev. 1.3, 08/2018
Ordering Information
See Table 1 on page 3
MCIMX6Y0DVM05AA MCIMX6Y0DVM05AB
MCIMX6Y1DVM05AA MCIMX6Y1DVM05AB
MCIMX6Y1DVK05AA MCIMX6Y1DVK05AB
MCIMX6Y2DVM05AA MCIMX6Y2DVM05AB
MCIMX6Y2DVM09AA MCIMX6Y2DVM09AB
MCIMX6Y7DVM09AA MCIMX6Y7DVM09AB
MCIMX6Y7DVK05AA MCIMX6Y7DVK05AB
MCIMX6Y2DVK09AB
Package Information
Plastic Package
MAPBGA 14 x 14 mm, 0.8 mm pitch
MAPBGA 9 x 9 mm, 0.5 mm pitch
NXP reserves the right to change the production detail specifications as may be required
to permit improvements in the design of its products.
1 i.MX 6ULL Introduction
The i.MX 6ULL processors represent NXP’s latest
achievement in integrated multimedia-focused products
offering high performance processing with a high degree
of functional integration, targeted towards the growing
market of connected devices.
The i.MX 6ULL is a high performance, ultra efficient
processor family with featuring NXP’s advanced
implementation of the single Arm Cortex®-A7 core,
which operates at speeds of up to 900 MHz. i.MX 6ULL
includes integrated power management module that
reduces the complexity of external power supply and
simplifies the power sequencing. Each processor in this
family provides various memory interfaces, including
LPDDR2, DDR3, DDR3L, Raw and Managed NAND
flash, NOR flash, eMMC, Quad SPI, and a wide range of
other interfaces for connecting peripherals, such as
WLAN, Bluetooth™, GPS, displays, and camera
sensors.
i.MX 6ULL Applications
Processors for Consumer
Products
1. i.MX 6ULL Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . 1
1.1. Ordering Information . . . . . . . . . . . . . . . . . . . . . . . 3
1.2. Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
2. Architectural Overview . . . . . . . . . . . . . . . . . . . . . . . . . . 10
2.1. Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
3. Modules List . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
3.1. Special Signal Considerations . . . . . . . . . . . . . . . 18
3.2. Recommended Connections for Unused Analog
Interfaces . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
4. Electrical Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 21
4.1. Chip-Level Conditions . . . . . . . . . . . . . . . . . . . . . 21
4.2. Power Supplies Requirements and Restrictions . 31
4.3. Integrated LDO Voltage Regulator Parameters . . 32
4.4. PLL’s Electrical Characteristics . . . . . . . . . . . . . . 34
4.5. On-Chip Oscillators . . . . . . . . . . . . . . . . . . . . . . . 36
4.6. I/O DC Parameters . . . . . . . . . . . . . . . . . . . . . . . . 37
4.7. I/O AC Parameters . . . . . . . . . . . . . . . . . . . . . . . . 40
4.8. Output Buffer Impedance Parameters . . . . . . . . . 43
4.9. System Modules Timing . . . . . . . . . . . . . . . . . . . . 46
4.10. Multi-Mode DDR Controller (MMDC) . . . . . . . . . . 57
4.11. General-Purpose Media Interface (GPMI) Timing 58
4.12. External Peripheral Interface Parameters . . . . . . 66
4.13. A/D converter . . . . . . . . . . . . . . . . . . . . . . . . . . . . 98
5. Boot Mode Configuration . . . . . . . . . . . . . . . . . . . . . . . 103
5.1. Boot Mode Configuration Pins . . . . . . . . . . . . . . 103
5.2. Boot Device Interface Allocation . . . . . . . . . . . . 104
6. Package Information and Contact Assignments . . . . . 111
6.1. 14 x 14 mm Package Information . . . . . . . . . . . . 111
6.2. 9 x 9 mm Package Information . . . . . . . . . . . . . . 124
7. Revision History . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 138
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
2NXP Semiconductors
i.MX 6ULL Introduction
The i.MX 6ULL processors are specifically useful for applications such as:
• Telematics
• Audio playback
• Connected devices
• IoT Gateway
• Access control panels
• Human Machine Interfaces (HMI)
• Portable medical and health care
• IP phones
• Smart appliances
•eReaders
The features of the i.MX 6ULL processors include:
• Single-core Arm Cortex-A7—The single core A7 provides a cost-effective and power-efficient
solution.
• Multilevel memory system—The multilevel memory system of processor is based on the L1
instruction and data caches, L2 cache, and internal and external memory. The processor supports
many types of external memory devices, including DDR3, low voltage DDR3, LPDDR2, NOR
Flash, NAND Flash (MLC and SLC), OneNAND™, Quad SPI, and managed NAND, including
eMMC up to rev 4.4/4.41/4.5.
• Smart speed technology—Power management implemented throughout the IC that enables
multimedia features and peripherals to consume minimum power in both active and various low
power modes.
• Dynamic voltage and frequency scaling—The power efficiency of devices by scaling the voltage
and frequency to optimize performance.
• Multimedia powerhouse—The multimedia performance of processor is enhanced by a multilevel
cache system, NEON™ MPE (Media Processor Engine) co-processor, a programmable smart
DMA (SDMA) controller, an asynchronous audio sample rate converter, an Electrophoretic
Display (EPD) controller, and a Pixel processing pipeline (PXP) to support 2D image processing,
including color-space conversion, scaling, alpha-blending, and rotation.
• 2x Ethernet interfaces—2x 10/100 Mbps Ethernet controllers.
• Human-machine interface—Each processor supports one digital parallel display interface.
• Interface flexibility—Each processor supports connections to a variety of interfaces: two
high-speed USB on-the-go with PHY, multiple expansion card ports (high-speed MMC/SDIO host
and other), two 12-bit ADC modules with up to 10 total input channels and two CAN ports.
• Advanced security—The processors deliver hardware-enabled security features that enable secure
e-commerce, digital rights management (DRM), information encryption, secure boot, AES-128
encryption, SHA-1, SHA-256 HW acceleration engine, and secure software downloads. The
security features are discussed in the i.MX 6ULL Security Reference Manual (IMX6ULLSRM).
i.MX 6ULL Introduction
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 3
• Integrated power management—The processors integrate linear regulators and internally generate
voltage levels for different domains. This significantly simplifies system power management
structure.
For a comprehensive list of the i.MX 6ULL features, see Section 1.2, Features"”.
1.1 Ordering Information
Table 1 provides examples of orderable part numbers covered by this data sheet.
Table 1. Ordering Information
Part Number Feature Package
Junction
Temperature Tj
(C)
MCIMX6Y0DVM05AA
MCIMX6Y0DVM05AB
Features supports:
• 528 MHz, commercial grade for general purpose
• No security
• No LCD/CSI
•No CAN
• Ethernet x1
• USB OTG x1
• ADC x1
•UART x4
•SAI x1
• No ESAI
•Timer x2
•PWM x4
•I2C x2
•SPI x2
14 x 14 mm, 0.8 pitch
MAPBGA
0 to +95
MCIMX6Y1DVM05AA
MCIMX6Y1DVM05AB
Features supports:
• 528 MHz, commercial grade for general purpose
• Basic security
• No LCD/CSI
•CAN x1
• Ethernet x1
• USB OTG x2
• ADC x1
•UART x8
•SAI x3
•ESAI x1
•Timer x4
•PWM x8
•I2C x4
•SPI x4
14 x 14 mm, 0.8 pitch
MAPBGA
0 to +95
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
4NXP Semiconductors
i.MX 6ULL Introduction
MCIMX6Y2DVM05AA
MCIMX6Y2DVM05AB
Features supports:
• 528 MHz, commercial grade for general purpose
• Basic security
• With LCD/CSI
•CAN x2
• Ethernet x2
• USB OTG x2
• ADC x2
•UART x8
•SAI x3
•ESAI x1
•Timer x4
•PWM x8
•I2C x4
•SPI x4
14 x 14 mm, 0.8 pitch
MAPBGA
0 to +95
MCIMX6Y1DVK05AA
MCIMX6Y1DVK05AB
Features supports:
• 528 MHz, commercial grade for general purpose
• Basic security
• No LCD/CSI
•CAN x1
• Ethernet x1
• USB OTG x2
• ADC x1
•UART x8
•SAI x3
•ESAI x1
•Timer x4
•PWM x8
•I2C x4
•SPI x4
9 x 9 mm, 0.5 pitch
MAPBGA
0 to +95
MCIMX6Y7DVK05AA
MCIMX6Y7DVK05AB
Features supports:
• 528 MHz, commercial grade for general purpose
• Basic security
• With LCD/CSI
•EPDC
•No CAN
• Ethernet x1
• USB OTG x2
• ADC x2
•UART x4
•SAI x3
•ESAI x1
•Timer x4
•PWM x4
•I2C x4
•SPI x4
9 x 9 mm, 0.5 pitch
MAPBGA
0 to +95
Table 1. Ordering Information
Part Number Feature Package
Junction
Temperature Tj
(C)
i.MX 6ULL Introduction
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 5
Figure 1 describes the part number nomenclature so that the users can identify the characteristics of the
specific part number they have (for example, cores, frequency, temperature grade, fuse options, and silicon
MCIMX6Y2DVK09AB Features supports:
• 900 MHz, commercial grade for general purpose
• Basic security
• With LCD/CSI
•CAN x2
• Ethernet x2
• USB OTG x2
• ADC x2
•UART x8
•SAI x3
•ESAI x1
•Timer x4
•PWM x8
•I2C x4
•SPI x4
9 x 9 mm, 0.5 pitch
MAPBGA
0 to +95
MCIMX6Y2DVM09AB
MCIMX6Y2DVM09AB
Features supports:
• 900 MHz, commercial grade for general purpose
• Basic security
• With LCD/CSI
•CAN x2
• Ethernet x2
• USB OTG x2
• ADC x2
•UART x8
•SAI x3
•ESAI x1
•Timer x4
•PWM x8
•I2C x4
•SPI x4
14 x 14mm, 0.8 pitch
MAPBGA
0 to +95
MCIMX6Y7DVM09AA
MCIMX6Y7DVM09AB
Features supports:
• 900 MHz, commercial grade for general purpose
• Basic security
• With LCD/CSI
•EPDC
•No CAN
• Ethernet x1
• USB OTG x2
• ADC x2
•UART x4
•SAI x3
•ESAI x1
•Timer x4
•PWM x4
•I2C x4
•SPI x4
14 x 14mm, 0.8 pitch
MAPBGA
0 to +95
Table 1. Ordering Information
Part Number Feature Package
Junction
Temperature Tj
(C)
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
6NXP Semiconductors
i.MX 6ULL Introduction
revision). The primary characteristic which describes which data sheet applies to a specific part is the
temperature grade (junction) field.
• The i.MX 6ULL Applications Processors for Consumer Products Data Sheet (IMX6ULLCEC)
covers parts listed with a “D (Commercial temp)”
Ensure to have the proper data sheet for specific part by verifying the temperature grade (junction) field
and matching it to the proper data sheet. If there will be any questions, visit the web page
NXP.com/imx6series or contact a NXP representative for details.
Figure 1. Part Number Nomenclature—i.MX 6ULL
1.2 Features
The i.MX 6ULL processors are based on Arm Cortex-A7 MPCore™ Platform, which has the following
features:
• Supports single Arm Cortex-A7 MPCore (with TrustZone) with:
— 32 KB L1 Instruction Cache
— 32 KB L1 Data Cache
— Private Timer and Watchdog
Part differentiator @
With EPDC 7
Reserved 6
5
4
3
General Purpose 2 (Full Feature) 2
General Purpose 1 (Reduced Feature) 1
Baseline 0
Junction Temperature (Tj)
+
Consumer: 0 to + 95 °C D
Industrial: -40 to +105 °C C
Arm Cortex-A7 Frequency $$
528 MHz 05
792 MHz 08
900 MHz 09
Package Type
ROHS
MAPBGA 14 x 14 mm, 0.8 pitch VM
MAPBGA 9 x 9 mm, 0.5 pitch VK
Qualification Level MC
Prototype Samples PC
Mass Production MC
Special SC
i.MX 6 Family X
i.MX 6ULL Y
Silicon Rev A
Rev 1.0 (Mask number: 0N70S) A
Rev 1.1 (Mask number: 1N70S) B
Fuse Option %
Reserved A
MC IMX6 X @+VV $$ %A
i.MX 6ULL Introduction
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 7
— Cortex-A7 NEON Media Processing Engine (MPE) Co-processor
• General Interrupt Controller (GIC) with 128 interrupts support
• Global Timer
• Snoop Control Unit (SCU)
• 128 KB unified I/D L2 cache
• Single Master AXI bus interface output of L2 cache
• Frequency of the core (including Neon and L1 cache), as per Table 10, "Operating Ranges," on
page 24.
• NEON MPE coprocessor
— SIMD Media Processing Architecture
— NEON register file with 32x64-bit general-purpose registers
— NEON Integer execute pipeline (ALU, Shift, MAC)
— NEON dual, single-precision floating point execute pipeline (FADD, FMUL)
— NEON load/store and permute pipeline
— 32 double-precision VFPv3 floating point registers
The SoC-level memory system consists of the following additional components:
— Boot ROM, including HAB (96 KB)
— Internal multimedia/shared, fast access RAM (OCRAM, 128 KB)
• External memory interfaces: The i.MX 6ULL processors support latest, high volume, cost effective
handheld DRAM, NOR, and NAND Flash memory standards.
— 16-bit LP-DDR2-800, 16-bit DDR3-800 and DDR3L-800
— 8-bit NAND-Flash, including support for Raw MLC/SLC, 2 KB, 4 KB, and 8 KB page size,
BA-NAND, PBA-NAND, LBA-NAND, OneNAND™ and others. BCH ECC up to 40 bits.
— 16/8-bit NOR Flash. All EIMv2 pins are muxed on other interfaces.
Each i.MX 6ULL processor enables the following interfaces to external devices (some of them are muxed
and not available simultaneously):
•Displays:
— One parallel display port, support max 85 MHz display clock and up to WXGA (1366 x 768)
at 60 Hz
— Support 24-bit, 18-bit, 16-bit, and 8-bit parallel display
— Electrophoretic display controller support direct-driver for E-Ink EPD panel, with up to
2048x1536 resolution at 106 Hz
• Camera sensors:
— One parallel camera port, up to 24 bit and 133.3 MHz pixel clock
— Support 24-bit, 16-bit, 10-bit, and 8-bit input
— Support BT.656 interface
• Expansion cards:
— Two MMC/SD/SDIO card ports all supporting:
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
8NXP Semiconductors
i.MX 6ULL Introduction
– 1-bit or 4-bit transfer mode specifications for SD and SDIO cards up to UHS-I SDR-104
mode (104 MB/s max)
– 1-bit, 4-bit, or 8-bit transfer mode specifications for MMC cards up to 52 MHz in both SDR
and DDR modes (104 MB/s max)
– 4-bit or 8-bit transfer mode specifications for eMMC chips up to 200 MHz in HS200 mode
(200 MB/s max)
•USB:
— Two high speed (HS) USB 2.0 OTG (Up to 480 Mbps), with integrated HS USB PHY
• Miscellaneous IPs and interfaces:
— Three I2S/SAI/AC97, up to 1.4 Mbps each
—ESAI
— Sony Philips Digital Interface Format (SPDIF), Rx and Tx
— Eight UARTs, up to 5.0 Mbps each:
– Providing RS232 interface
– Supporting 9-bit RS485 multidrop mode
– Support RTS/CTS for hardware flow control
— Four eCSPI (Enhanced CSPI), up to 52 Mbps each
— Four I2C, supports 400 kbps
— Two 10/100 Ethernet Controller (IEEE1588 compliant)
— Eight Pulse Width Modulators (PWM)
— System JTAG Controller (SJC)
— GPIO with interrupt capabilities
— 8x8 Key Pad Port (KPP)
— One Quad SPI to connect to serial NOR flash
— Two Flexible Controller Area Network (FlexCAN)
— Three Watchdog timers (WDOG)
— 8-bit/10-bit/12-bit/16-bit camera interface
— Two 12-bit Analog to Digital Converters (ADC) with up to 10 input channels in total
The i.MX 6ULL processors integrate advanced power management unit and controllers:
• Provide PMU, including LDO supplies, for on-chip resources
• Use Temperature Sensor for monitoring the die temperature
• Use Voltage Sensor for monitoring the die voltage
• Support DVFS techniques for low power modes
• Use SW State Retention and Power Gating for Arm and NEON
• Support various levels of system power modes
• Use flexible clock gating control scheme
i.MX 6ULL Introduction
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 9
The i.MX 6ULL processors use dedicated hardware accelerators to meet the targeted multimedia
performance. The use of hardware accelerators is a key factor in obtaining high performance at low power
consumption numbers, while having the CPU core relatively free for performing other tasks.
The i.MX 6ULL processors incorporate the following hardware accelerators:
• PXP—Pixel Processing Pipeline for image resize, rotation, overlay and CSC. Off loading key pixel
processing operations are required to support the LCD display applications.
• ASRC—Asynchronous Sample Rate Converter
Security functions are enabled and accelerated by the following hardware:
• Arm TrustZone including the TZ architecture (separation of interrupts, memory mapping, etc.)
• SJC—System JTAG Controller. Protecting JTAG from debug port attacks by regulating or
blocking the access to the system debug features.
• SNVS—Secure Non-Volatile Storage, including Secure Real Time Clock, both active tamper and
passive tamper detection logic has up to 10 tamper inputs. Voltage monitor, temperature monitor,
and clock frequency monitor protects the secure key storage.
• CSU—Central Security Unit. Enhancement for the IC Identification Module (IIM). Will be
configured during boot and by eFUSEs and will determine the security level operation mode as
well as the TZ policy.
• A-HAB—Advanced High Assurance Boot—HABv4 with the new embedded enhancements:
AES-128 encryption, SHA-1, and SHA-256 HW acceleration engine, 2048-bit RSA key, version
control mechanism, warm boot, CSU, and TZ initialization.
NOTE
The actual feature set depends on the part numbers as described in Table 1.
Functions, such as display and camera interfaces, connectivity interfaces.
E
E
P
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
10 NXP Semiconductors
Architectural Overview
2 Architectural Overview
The following subsections provide an architectural overview of the i.MX 6ULL processor system.
2.1 Block Diagram
Figure 2 shows the functional modules in the i.MX 6ULL processor system.
.
Figure 2. i.MX 6ULL System Block Diagram
Debug
DAP
TPIU
CTIs
SJC
SPBA
Clock & Reset
PLL (6)
CCM
GPC
SRC
XTAL OSC
32K OSC
Timer/Control
WDOG (3)
(
GPT
EPIT (2)
Temp Monitor
Image Procssing
Pixel Processing Pipeline
(PXP)
Security
CSU
Fuse Box
SNVS
(SRTC)
Power Management
LDOs
WLAN Modem IC Digital Audio
CMOS Sensor
LCD Panel
Tamper
Detection
NOR FLASH
(Quad SPI)
NOR FLASH
(Parallel )
USB OTG
(dev/host)
LP-DDR2
/ DDR3
Keypad
10/100M
Ethernet x2
Controller Area
Network
JTAG
(IEEE1149 .6)
eINK Panel
Sensors
Battery Control
Device
MMC/SD
SDXC
MMC/SD
eMMC/eSD
Crystal and
Clock Source
NAND FLASH
Display Interface
LCDIF
Smart DMA
SDMA
CAN x2
External Memory
MMDC
EIM
GPMI & BCH
QSPI
Internal Memory
OCRAM 128 KB
ROM 96 KB
ARM Cortex A 7
MPCore Platform
Cortex-A7 Core
I-cahce
32 KB D-cache
32 KB
NEON ETM
SCU & Timer
L2 Cache 128 KB
Shared Peripherals
eCSPI (4)
SPDIF Tx /Rx
SAI (3)
UART (8)
AP Peripherals
uSDHC (2)
I2C (4)
PWM (8)
OCOTP
IOMUXC
KPP
GPIO
Ethernet (2)
USB OTG (2)
CAN (2)
Camera Interface
CSI
AXI and AHB Switch Fabric
2)
ASRC
MQS
ESAI
Eletrophoretic Display (EPD)
HAB
Modules List
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 11
3 Modules List
The i.MX 6ULL processors contain a variety of digital and analog modules. Table 2 describes these
modules in alphabetical order.
Table 2. i.MX 6ULL Modules List
Block Mnemonic Block Name Subsystem Brief Description
ADC1
ADC2
Analog to Digital
Converter
— The ADC is a 12-bit general purpose analog to digital
converter.
Arm Arm Platform Arm The Arm Core Platform includes 1x Cortex-A7 core. It
also includes associated sub-blocks, such as the Level
2 Cache Controller, SCU (Snoop Control Unit), GIC
(General Interrupt Controller), private timers, watchdog,
and CoreSight debug modules.
ASRC Asynchronous Sample
Rate Converter
Multimedia
Peripherals
The Asynchronous Sample Rate Converter (ASRC)
converts the sampling rate of a signal associated to an
input clock into a signal associated to a different output
clock. The ASRC supports concurrent sample rate
conversion of up to 10 channels of about -120dB
THD+N. The sample rate conversion of each channel is
associated to a pair of incoming and outgoing sampling
rates. The ASRC supports up to three sampling rate
pairs.
BCH Binary-BCH ECC
Processor
System Control
Peripherals
The BCH module provides up to 40-bit ECC
encryption/decryption for NAND Flash controller
(GPMI)
CCM
GPC
SRC
Clock Control Module,
General Power Controller,
System Reset Controller
Clocks, Resets, and
Power Control
These modules are responsible for clock and reset
distribution in the system, and also for the system power
management.
CSI Parallel CSI Multimedia
Peripherals
The CSI IP provides parallel CSI standard camera
interface port. The CSI parallel data ports are up to 24
bits. It is designed to support 24-bit RGB888/YUV444,
CCIR656 video interface, 8-bit YCbCr, YUV or RGB,
and 8-bit/10-bit/16-bit Bayer data input.
CSU Central Security Unit Security The Central Security Unit (CSU) is responsible for
setting comprehensive security policy within the i.MX
6ULL platform.
DAP Debug Access Port System Control
Peripherals
The DAP provides real-time access for the debugger
without halting the core to:
• System memory and peripheral registers
• All debug configuration registers
The DAP also provides debugger access to JTAG scan
chains. The DAP module is internal to the Cortex-A7
Core Platform.
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12 NXP Semiconductors
Modules List
DCP Data co-processor Security This module provides support for general encryption
and hashing functions typically used for security
functions. Because its basic job is moving data from
memory to memory, it also incorporates a memory-copy
(memcopy) function for both debugging and as a more
efficient method of copying data between memory
blocks than the DMA-based approach.
eCSPI1
eCSPI2
eCSPI3
eCSPI4
Configurable SPI Connectivity
Peripherals
Full-duplex enhanced Synchronous Serial Interface,
with data rate up to 52 Mbit/s. It is configurable to
support Master/Slave modes, four chip selects to
support multiple peripherals.
EIM NOR-Flash /PSRAM
interface
Connectivity
Peripherals
The EIM NOR-FLASH / PSRAM provides:
• Support 16-bit (in muxed IO mode only) PSRAM
memories (sync and async operating modes), at
slow frequency
• Support 16-bit (in muxed IO mode only) NOR-Flash
memories, at slow frequency
• Multiple chip selects
ENET1
ENET2
Ethernet Controller Connectivity
Peripherals
The Ethernet Media Access Controller (MAC) is
designed to support 10/100 Mbit/s Ethernet/IEEE 802.3
networks. An external transceiver interface and
transceiver function are required to complete the
interface to the media. The module has dedicated
hardware to support the IEEE 1588 standard. See the
ENET chapter of the reference manual for details.
EPDC Electrophoretic Display
Controller
Multimedia
Peripherals
The EPDC is a feature-rich, low power, and high
performance direct-drive active matrix EPD controller. It
is specially designed to drive E-INKTM EPD panels,
supporting a wide variety of TFT backplanes.
EPIT1
EPIT2
Enhanced Periodic
Interrupt Timer
Timer Peripherals Each EPIT is a 32-bit “set and forget” timer that starts
counting after the EPIT is enabled by software. It is
capable of providing precise interrupts at regular
intervals with minimal processor intervention. It has a
12-bit prescaler for division of input clock frequency to
get the required time setting for the interrupts to occur,
and counter value can be programmed on the fly.
Table 2. i.MX 6ULL Modules List (continued)
Block Mnemonic Block Name Subsystem Brief Description
Modules List
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 13
ESAI Enhanced Serial Audio
Interface
Connectivity
Peripherals
The Enhanced Serial Audio Interface (ESAI) provides a
full-duplex serial port for serial communication with a
variety of serial devices, including industry-standard
codecs, SPDIF transceivers, and other processors.
The ESAI consists of independent transmitter and
receiver sections, each section with its own clock
generator. All serial transfers are synchronized to a
clock. Additional synchronization signals are used to
delineate the word frames. The normal mode of
operation is used to transfer data at a periodic rate, one
word per period. The network mode is also intended for
periodic transfers; however, it supports up to 32 words
(time slots) per period. This mode can be used to build
time division multiplexed (TDM) networks. In contrast,
the on-demand mode is intended for non-periodic
transfers of data and to transfer data serially at high
speed when the data becomes available.
The ESAI has 12 pins for data and clocking connection
to external devices.
FLEXCAN1
FLEXCAN2
Flexible Controller Area
Network
Connectivity
Peripherals
The CAN protocol was primarily, but not only, designed
to be used as a vehicle serial data bus, meeting the
specific requirements of this field: real-time processing,
reliable operation in the Electromagnetic interference
(EMI) environment of a vehicle, cost-effectiveness and
required bandwidth. The FlexCAN module is a full
implementation of the CAN protocol specification,
Version 2.0 B, which supports both standard and
extended message frames.
GPIO1
GPIO2
GPIO3
GPIO4
GPIO5
General Purpose I/O
Modules
System Control
Peripherals
Used for general purpose input/output to external ICs.
Each GPIO module supports 32 bits of I/O.
GPMI General Purpose
Memory Interface
Connectivity
Peripherals
The GPMI module supports up to 8x NAND devices and
40-bit ECC encryption/decryption for NAND Flash
Controller (GPMI2). GPMI supports separate DMA
channels for each NAND device.
GPT1
GPT2
General Purpose Timer Timer peripherals Each GPT is a 32-bit “free-running” or “set and forget”
mode timer with programmable prescaler and compare
and capture register. A timer counter value can be
captured using an external event and can be configured
to trigger a capture event on either the leading or trailing
edges of an input pulse. When the timer is configured to
operate in “set and forget” mode, it is capable of
providing precise interrupts at regular intervals with
minimal processor intervention. The counter has output
compare logic to provide the status and interrupt at
comparison. This timer can be configured to run either
on an external clock or on an internal clock.
Table 2. i.MX 6ULL Modules List (continued)
Block Mnemonic Block Name Subsystem Brief Description
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
14 NXP Semiconductors
Modules List
LCDIF LCD interface Connectivity
peripherals
The LCDIF is a general purpose display controller used
to drive a wide range of display devices varying in size
and capability. The LCDIF is designed to support dumb
(synchronous 24-bit Parallel RGB interface) and smart
(asynchronous parallel MPU interface) LCD devices.
MQS Medium Quality Sound Multimedia
Peripherals
MQS is used to generate 2-channel medium quality
PWM-like audio via two standard digital GPIO pins.
PWM1
PWM2
PWM3
PWM4
PWM5
PWM6
PWM7
PWM8
Pulse Width Modulation Connectivity
peripherals
The pulse-width modulator (PWM) has a 16-bit counter
and is optimized to generate sound from stored sample
audio images and it can also generate tones. It uses
16-bit resolution and a 4x16 data FIFO to generate
sound.
PXP Pixel Processing Pipeline Display peripherals A high-performance pixel processor capable of 1
pixel/clock performance for combined operations, such
as color-space conversion, alpha blending,
gamma-mapping, and rotation. The PXP is enhanced
with features specifically for gray scale applications. In
addition, the PXP supports traditional pixel/frame
processing paths for still-image and video processing
applications, allowing it to interface with the integrated
EPD.
RNGB Random Number
Generator
Security Random number generating module.
QSPI Quad SPI Connectivity
peripherals
Quad SPI module acts as an interface to external serial
flash devices. This module contains the following
features:
• Flexible sequence engine to support various flash
vendor devices
• Single pad/Dual pad/Quad pad mode of operation
• Single Data Rate/Double Data Rate mode of
operation
• Parallel Flash mode
• DMA support
• Memory mapped read access to connected flash
devices
• Multi-master access with priority and flexible and
configurable buffer for each master
SAI1
SAI2
SAI3
— — The SAI module provides a synchronous audio
interface (SAI) that supports full duplex serial interfaces
with frame synchronization, such as I2S, AC97, TDM,
and codec/DSP interfaces.
Table 2. i.MX 6ULL Modules List (continued)
Block Mnemonic Block Name Subsystem Brief Description
Modules List
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 15
SDMA Smart Direct Memory
Access
System Control
Peripherals
The SDMA is multi-channel flexible DMA engine. It
helps in maximizing system performance by off-loading
the various cores in dynamic data routing. It has the
following features:
• Powered by a 16-bit Instruction-Set micro-RISC
engine
• Multi-channel DMA supporting up to 32 time-division
multiplexed DMA channels
• 48 events with total flexibility to trigger any
combination of channels
• Memory accesses including linear, FIFO, and 2D
addressing
• Shared peripherals between Arm and SDMA
• Very fast Context-Switching with 2-level priority
based preemptive multi-tasking
• DMA units with auto-flush and prefetch capability
• Flexible address management for DMA transfers
(increment, decrement, and no address changes on
source and destination address)
• DMA ports can handle unit-directional and
bi-directional flows (copy mode)
• Up to 8-word buffer for configurable burst transfers
for EMIv2.5
• Support of byte-swapping and CRC calculations
• Library of Scripts and API is available
SJC System JTAG Controller System Control
Peripherals
The SJC provides JTAG interface, which complies with
JTAG TAP standards, to internal logic. The i.MX 6ULL
processors use JTAG port for production, testing, and
system debugging. In addition, the SJC provides BSR
(Boundary Scan Register) standard support, which
complies with IEEE1149.1 and IEEE1149.6 standards.
The JTAG port must be accessible during platform initial
laboratory bring-up, for manufacturing tests and
troubleshooting, as well as for software debugging by
authorized entities. The i.MX 6ULL SJC incorporates
three security modes for protecting against
unauthorized accesses. Modes are selected through
eFUSE configuration.
SNVS Secure Non-Volatile
Storage
Security Secure Non-Volatile Storage, including Secure Real
Time Clock, Security State Machine, Master Key
Control, and Violation/Tamper Detection and reporting.
SPDIF Sony Philips Digital
Interconnect Format
Multimedia
Peripherals
A standard audio file transfer format, developed jointly
by the Sony and Phillips corporations. Has Transmitter
and Receiver functionality.
System Counter — — The system counter module is a programmable system
counter which provides a shared time base to the
Cortex A series cores as part of Arm’s generic timer
architecture. It is intended for use in application where
the counter is always powered on and supports
multiple, unrelated clocks.
Table 2. i.MX 6ULL Modules List (continued)
Block Mnemonic Block Name Subsystem Brief Description
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
16 NXP Semiconductors
Modules List
TSC Touch Screen Touch Controller With touch controller to support 4-wire and 5-wire
resistive touch panel.
TZASC Trust-Zone Address
Space Controller
Security The TZASC (TZC-380 by Arm) provides security
address region control functions required for intended
application. It is used on the path to the DRAM
controller.
UART1
UART2
UART3
UART4
UART5
UART6
UART7
UART8
UART Interface Connectivity
Peripherals
Each of the UARTv2 module supports the following
serial data transmit/receive protocols and
configurations:
• 7- or 8-bit data words, 1 or 2 stop bits, programmable
parity (even, odd or none)
• Programmable baud rates up to 5 Mbps.
• 32-byte FIFO on Tx and 32 half-word FIFO on Rx
supporting auto-baud
uSDHC1
uSDHC2
SD/MMC and SDXC
Enhanced Multi-Media
Card / Secure Digital Host
Controller
Connectivity
Peripherals
i.MX 6ULL specific SoC characteristics:
All four MMC/SD/SDIO controller IPs are identical and
are based on the uSDHC IP. They are:
• Fully compliant with MMC command/response sets
and Physical Layer as defined in the Multimedia Card
System Specification, v4.5/4.2/4.3/4.4/4.41/
including high-capacity (size > 2 GB) cards HC MMC.
• Fully compliant with SD command/response sets
and Physical Layer as defined in the SD Memory
Card Specifications, v3.0 including high-capacity
SDXC cards up to 2 TB.
• Fully compliant with SDIO command/response sets
and interrupt/read-wait mode as defined in the SDIO
Card Specification, Part E1, v3.0
Two ports support:
• 1-bit or 4-bit transfer mode specifications for SD and
SDIO cards up to UHS-I SDR104 mode (104 MB/s
max)
• 1-bit, 4-bit, or 8-bit transfer mode specifications for
MMC cards up to 52 MHz in both SDR and DDR
modes (104 MB/s max)
• 4-bit or 8-bit transfer mode specifications for eMMC
chips up to 200 MHz in HS200 mode (200 MB/s max)
However, the SoC level integration and I/O muxing logic
restrict the functionality to the following:
• Instances #1 and #2 are primarily intended to serve
as interfaces to on-board peripherals. These ports
are equipped with “Card detection” and “Write
Protection” pads and do not support hardware reset.
• All ports can work with 1.8 V and 3.3 V cards. There
are two completely independent I/O power domains
for Ports #1 and #2 in four bit configuration (SD
interface).
Table 2. i.MX 6ULL Modules List (continued)
Block Mnemonic Block Name Subsystem Brief Description
Modules List
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 17
USB Universal Serial Bus 2.0 Connectivity
Peripherals
USBO2 (USB OTG1 and USB OTG2) contains:
• Two high-speed OTG 2.0 modules with integrated
HS USB PHYs
• Support eight Transmit (TX) and eight Receive (Rx)
endpoints, including endpoint 0
WDOG1
WDOG3
Watch Dog Timer Peripherals The Watch Dog Timer supports two comparison points
during each counting period. Each of the comparison
points is configurable to evoke an interrupt to the Arm
core, and a second point evokes an external event on
the WDOG line.
WDOG2
(TZ)
Watch Dog (TrustZone) Timer Peripherals The TrustZone Watchdog (TZ WDOG) timer module
protects against TrustZone starvation by providing a
method of escaping normal mode and forcing a switch
to the TZ mode. TZ starvation is a situation where the
normal OS prevents switching to the TZ mode. Such
situation is undesirable as it can compromise the
system’s security. Once the TZ WDOG module is
activated, it must be serviced by TZ software on a
periodic basis. If servicing does not take place, the timer
times out. Upon a time-out, the TZ WDOG asserts a TZ
mapped interrupt that forces switching to the TZ mode.
If it is still not served, the TZ WDOG asserts a security
violation signal to the CSU. The TZ WDOG module
cannot be programmed or deactivated by a normal
mode SW.
Table 2. i.MX 6ULL Modules List (continued)
Block Mnemonic Block Name Subsystem Brief Description
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
18 NXP Semiconductors
Modules List
3.1 Special Signal Considerations
Table 3 lists special signal considerations for the i.MX 6ULL processors. The signal names are listed in
alphabetical order.
The package contact assignments can be found in Section 6, Package Information and Contact
Assignments".” Signal descriptions are provided in the i.MX 6ULL Reference Manual (IMX6ULLRM).
Table 3. Special Signal Considerations
Signal Name Remarks
CCM_CLK1_P/
CCM_CLK1_N
One general purpose differential high speed clock Input/output is provided.
It can be used:
• To feed external reference clock to the PLLs and further to the modules inside SoC.
• To output internal SoC clock to be used outside the SoC as either reference clock or as a
functional clock for peripherals.
See the i.MX 6ULL Reference Manual (IMX6ULLRM) for details on the respective clock trees.
Alternatively one may use single ended signal to drive CLK1_P input. In this case corresponding
CLK1_N input should be tied to the constant voltage level equal 1/2 of the input signal swing.
Termination should be provided in case of high frequency signals.
After initialization, the CLK1 input/output can be disabled (if not used). If unused, either or both of
the CLK1_N/P pairs may remain unconnected.
RTC_XTALI/RTC_XTALO If the user wishes to configure RTC_XTALI and RTC_XTALO as an RTC oscillator, a 32.768 kHz
crystal, (100 k ESR, 10 pF load) should be connected between RTC_XTALI and RTC_XTALO.
Keep in mind the capacitors implemented on either side of the crystal are about twice the crystal
load capacitor. To hit the exact oscillation frequency, the board capacitors need to be reduced to
account for board and chip parasitics. The integrated oscillation amplifier is self biasing, but
relatively weak. Care must be taken to limit parasitic leakage from RTC_XTALI and RTC_XTALO
to either power or ground (>100 M). This will debias the amplifier and cause a reduction of startup
margin. Typically RTC_XTALI and RTC_XTALO should bias to approximately 0.5 V.
If it is desired to feed an external low frequency clock into RTC_XTALI the RTC_XTALO pin should
be remain unconnected or driven with a complimentary signal. The logic level of this forcing clock
should not exceed VDD_SNVS_CAP level and the frequency should be <100 kHz under typical
conditions.
In case when high accuracy real time clock are not required, system may use internal low
frequency ring oscillator. It is recommended to connect RTC_XTALI to GND and keep RTC_XTALO
unconnected.
XTALI/XTALO A 24.0 MHz crystal should be connected between XTALI and XTALO.
The crystal must be rated for a maximum drive level of 250 W. An ESR (equivalent series
resistance) of typical 80 is recommended. NXP BSP (board support package) software requires
24 MHz on XTALI/XTALO.
The crystal can be eliminated if an external 24 MHz oscillator is available in the system. In this
case, XTALO must be directly driven by the external oscillator and XTALI is not connected.
If this clock is used as a reference for USB, then there are strict frequency tolerance and jitter
requirements. See OSC24M chapter and relevant interface specifications chapters for details.
DRAM_VREF When using DDR_VREF with DDR I/O, the nominal reference voltage must be half of the
NVCC_DRAM supply. The user must tie DDR_VREF to a precision external resistor divider. Use a
1k0.5% resistor to GND and a 1 k0.5% resistor to NVCC_DRAM. Shunt each resistor with a
closely-mounted 0.1 µF capacitor.
To reduce supply current, a pair of 1.5 k0.1% resistors can be used. Using resistors with
recommended tolerances ensures the ± 2% DDR_VREF tolerance (per the DDR3 specification) is
maintained when two DDR3 ICs plus the i.MX 6ULL are drawing current on the resistor divider.
fl
k!)
fl
k!)
k!)
Modules List
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 19
3.2 Recommended Connections for Unused Analog Interfaces
Table 5 shows the recommended connections for unused analog interfaces.
ZQPAD DRAM calibration resistor 240 1% used as reference during DRAM output buffer driver
calibration should be connected between this pad and GND.
GPANAIO This signal is reserved for NXP manufacturing use only. This output must remain unconnected.
JTAG_nnnn The JTAG interface is summarized in Table 4. Use of external resistors is unnecessary. However,
if external resistors are used, the user must ensure that the on-chip pull-up/down configuration is
followed. For example, do not use an external pull down on an input that has on-chip pull-up.
JTAG_TDO is configured with a keeper circuit such that the non-connected condition is eliminated
if an external pull resistor is not present. An external pull resistor on JTAG_TDO is detrimental and
should be avoided.
JTAG_MOD is referenced as SJC_MOD in the i.MX 6ULL reference manual. Both names refer to
the same signal. JTAG_MOD must be externally connected to GND for normal operation.
Termination to GND through an external pull-down resistor (such as 1 k) is allowed. JTAG_MOD
set to hi configures the JTAG interface to mode compliant with IEEE1149.1 standard. JTAG_MOD
set to low configures the JTAG interface for common SW debug adding all the system TAPs to the
chain.
NC These signals are No Connect (NC) and should be disconnected by the user.
POR_B This cold reset negative logic input resets all modules and logic in the IC.
May be used in addition to internally generated power on reset signal (logical AND, both internal
and external signals are considered active low).
ONOFF ONOFF can be configured in debounce, off to on time, and max time-out configurations. The
debounce and off to on time configurations supports 0, 50, 100 and 500 ms. Debounce is used to
generate the power off interrupt. While in the ON state, if ONOFF button is pressed longer than the
debounce time, the power off interrupt is generated. Off to on time supports the time it takes to
request power on after a configured button press time has been reached. While in the OFF state,
if ONOFF button is pressed longer than the off to on time, the state will transition from OFF to ON.
Max time-out configuration supports 5, 10, 15 seconds and disable. Max time-out configuration
supports the time it takes to request power down after ONOFF button has been pressed for the
defined time.
TEST_MODE TEST_MODE is for NXP factory use. The user must tie this pin directly to GND.
Table 4. JTAG Controller Interface Summary
JTAG I/O Type On-chip Termination
JTAG_TCK Input 47 kpull-up
JTAG_TMS Input 47 kpull-up
JTAG_TDI Input 47 kpull-up
JTAG_TDO 3-state output Keeper
JTAG_TRSTB Input 47 kpull-up
JTAG_MOD Input 100 kpull-up
Table 3. Special Signal Considerations (continued)
Signal Name Remarks
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
20 NXP Semiconductors
Modules List
Table 5. Recommended Connections for Unused Analog Interfaces
Module Pad Name Recommendations
if Unused
CCM CCM_CLK1_N, CCM_CLK1_P Not connect
USB USB_OTG1_CHD_B, USB_OTG1_DN, USB_OTG1_DP, USB_OTG1_VBUS,
USB_OTG2_DN, USB_OTG2_DP, USB_OTG2_VBUS
Not connect
ADC ADC_VREFH Tie to
VDDA_ADC_3P3
VDDA_ADC_3P3 VDDA_ADC_3P3
must be powered
even if the ADC is
not used.
Electrical Characteristics
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 21
4 Electrical Characteristics
This section provides the device and module-level electrical characteristics for the i.MX 6ULL processors.
4.1 Chip-Level Conditions
This section provides the device-level electrical characteristics for the IC. See Table 6 for a quick reference
to the individual tables and sections.
Table 6. i.MX 6ULL Chip-Level Conditions
For these characteristics Topic appears
Absolute Maximum Ratings on page 22
Thermal Resistance on page 22
Operating Ranges on page 24
External Clock Sources on page 26
Maximum Supply Currents on page 27
Power Modes on page 28
USB PHY Current Consumption on page 31
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
22 NXP Semiconductors
Electrical Characteristics
4.1.1 Absolute Maximum Ratings
4.1.2 Thermal Resistance
4.1.2.1 14 x 14 mm (VM) Package Thermal Resistance
Table 8 displays the 14 x 14 mm (VM) package thermal resistance data.
Table 7. Absolute Maximum Ratings
Parameter Description Symbol Min Max Unit
Core Supply Voltage VDDSOC_IN -0.3 1.6 V
Internal Supply Voltage VDDARM_CAP
VDDSOC_CAP
-0.3 1.4 V
GPIO Supply Voltage NVCC_CSI
NVCC_ENET
NVCC_GPIO
NVCC_UART
NVCC_LCD
NVCC_NAND
NVCC_SD1
-0.5 3.7 V
DDR IO Supply Voltage NVCC_DRAM -0.4 1.9751
1The absolute maximum voltage includes an allowance for 400 mV of overshoot on the IO pins. Per JEDEC standards, the
allowed signal overshoot must be derated if NVCC_DRAM exceeds 1.575 V.
V
VDD_SNVS_IN Supply Voltage VDD_SNVS_IN -0.3 3.6 V
VDDHIGH_IN Supply voltage VDD_HIGH_IN -0.3 3.7 V
USB VBUS USB_OTG1_VBUS
USB_OTG2_VBUS
—5.5 V
Input voltage on USB_OTG_DP and
USB_OTG_DN pins
USB_OTG1_DP/USB_OTG1_DN
USB_OTG2_DP/USB_OTG2_DN
-0.3 3.63 V
Input/Output Voltage Range Vin/Vout -0.5 OVDD+0.32
2OVDD is the I/O supply voltage.
V
ESD damage Immunity:
Human Body Model (HBM)
Charge Device Model (CDM)
Vesd
—
—
2000
500
V
Storage Temperature Range TSTORAGE -40 150 o C
Table 8. 14 x 14 (VM) Thermal Resistance Data
Rating Test Conditions Symbol Value Unit Notes
Junction to Ambient
Natural convection
Single-layer board (1s) RJA 58.4 oC/W 1,2
Junction to Ambient
Natural convection
Four-layer board (2s2p) RJA 37.6 oC/W 1,2,3
Electrical Characteristics
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 23
4.1.2.2 9 x 9 MM (VK) Package Thermal Resistance
Table 9 displays the 9 x 9 MM (VK) thermal resistance data.
Junction to Ambient (@200
ft/min)
Single layer board (1s) RJMA 48.6 oC/W 1,3
Junction to Ambient (@200
ft/min)
Four layer board (2s2p) RJMA 32.9 oC/W 1,3
Junction to Board — RJB 21.8 oC/W 4
Junction to Case — RJC 19.3 oC/W 5
Junction to Package Top Natural Convection JT 2.3 oC/W 6
Junction to Package Bottom Natural Convection JB 12.0 oC/W 7
1Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site (board)
temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal
resistance.
2Per SEMI G38-87 and JEDEC JESD51-2 with the single layer board horizontal.
3Per JEDEC JESD51-6 with the board horizontal.
4Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is measured on
the top surface of the board near the package.
5Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method
1012.1).
6Thermal characterization parameter indicating the temperature difference between package top and the junction temperature
per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is written as Psi-JT.
7Thermal characterization parameter indicating the temperature difference between package bottom center and the junction
temperature per JEDEC JESD51-12. When Greek letters are not available, the thermal characterization parameter is written
as Psi-JB
Table 9. 9 x 9 MM (VK) Thermal Resistance Data
Rating Test Conditions Symbol Value Unit Notes
Junction to Ambient
Natural Convection
Single-layer board (1s) RJA 65.6 oC/W 1,2
Junction to Ambient
Natural Convection
Four-layer board (2s2p) RJA 36.2 oC/W 1,2,3
Junction to Ambient (@200
ft/min)
Single layer board (1s) RJMA 51.2 oC/W 1,3
Junction to Ambient (@200
ft/min)
Four layer board (2s2p) RJMA 31.8 oC/W 1,3
Junction to Board — RJB 17.1 oC/W 4
Junction to Case — RJC 14.5 oC/W 5
Junction to Package Top Natural Convection JT 0.6 oC/W 6
Junction to Package Bottom Natural Convection JB_CSB 11.1 oC/W 7
Table 8. 14 x 14 (VM) Thermal Resistance Data (continued)
Rating Test Conditions Symbol Value Unit Notes
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
24 NXP Semiconductors
Electrical Characteristics
4.1.3 Operating Ranges
Table 10 provides the operating ranges of the i.MX 6ULL processors. For details on the chip's power
structure, see the “Power Management Unit (PMU)” chapter of the i.MX 6ULL Reference Manual
(IMX6ULLRM).
1Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site (board)
temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal
resistance.
2Per SEMI G38-87 and JEDEC JESD51-2 with the single layer board horizontal.
3Per JEDEC JESD51-6 with the board horizontal.
4Thermal resistances between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is measured on
the top surface of the board near the package.
5Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method
1012.1).
6Thermal characterization parameter indicating the temperature difference between package top and the junction temperature
per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is written as Psi-JT.
7Thermal resistance between the die and the central solder balls on the bottom of the package based on simulation.
Table 10. Operating Ranges
Parameter
Description Symbol Operating
Conditions Min Typ Max1Unit Comment
Run Mode: LDO
Enabled
VDD_SOC_IN A7 core at 900
MHz
1.375 — 1.5 V VDD_SOC_IN must be 125 mV
higher than the LDO Output Set
Point (VDD_ARM_CAP and
VDD_SOC_CAP) for correct
supply voltage regulation.
A7 core at 528
MHz and below
1.275 — 1.5
VDD_ARM_CAP A7 core at 900
MHz
1.25 1.275 1.3 V —
A7 core at 528
MHz
1.15 — 1.3
A7 core at 396
MHz
1.00 — 1.3
A7 core at 198
MHz
0.925 — 1.3
VDD_SOC_CAP A7 core at 900
MHz
1.225 — 1.3 V —
A7 core at 528
MHz and below
1.15 — 1.3
Run Mode: LDO
Bypassed
VDD_SOC_IN A7 core
operations at 528
MHz or below.
1.15 — 1.3 V A7 core operation above 528 MHz
is not supported when LDO is
bypassed.
Electrical Characteristics
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 25
Low Power Run
Mode: LDO
Enabled
VDD_SOC_IN — 1.275 — 1.5 V VDD_SOC_IN must be 125 mV
higher than the LDO Output Set
Point (VDD_ARM_CAP and
VDD_SOC_CAP) for correct
supply voltage regulation.
VDD_SOC_CAP All PLL
bypassed, all
clocks running at
24 MHz or below.
0.925 — 1.3 V —
VDD_ARM_CAP 0.925 — 1.3 V
Low Power Run
Mode: LDO
Bypassed
VDD_SOC_IN All PLL
bypassed, all
clocks running at
24 MHz or below.
0.925 — 1.3 V —
SUSPEND (DSM)
Mode
VDD_SOC_IN — 0.9 — 1.3 V Refer to Table 15 Low Power Mode
Current and Power Consumption
on page -29
VDD_HIGH
internal regulator
VDD_HIGH_IN — 2.80 — 3.6 V Must match the range of voltages
that the rechargeable backup
battery supports.
Backup battery
supply range
VDD_SNVS_IN2 — 2.40 — 3.6 V Can be combined with
VDDHIGH_IN, if the system does
not require keeping real time and
other data on OFF state.
USB supply
voltages
USB_OTG1_VBUS — 4.40 — 5.5 V —
USB_OTG2_VBUS — 4.40 — 5.5 V —
DDR I/O supply NVCC_DRAM LPDDR2 1.14 1.2 1.3 V —
DDR3L 1.28 1.35 1.45 V —
DDR3 1.43 1.5 1.575 V —
NVCC_DRAM2P5 — 2.25 2.5 2.75 V —
GPIO supplies NVCC_CSI — 1.65 1.8,
2.8,
3.3
3.6 V All digital I/O supplies
(NVCC_xxxx) must be powered
(unless otherwise specified in this
data sheet) under normal
conditions whether the associated
I/O pins are in use or not.
NVCC_ENET
NVCC_GPIO
NVCC_UART
NVCC_LCD
NVCC_NAND
NVCC_SD1
A/D converter VDDA_ADC_3P3 — 3.0 3.15 3.6 V VDDA_ADC_3P3 must be
powered when chip is in RUN
mode, IDLE mode, or SUSPEND
mode.
VDDA_ADC_3P3 should not be
powered when chip is in SNVS
mode.
Table 10. Operating Ranges (continued)
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
26 NXP Semiconductors
Electrical Characteristics
Table 11 shows on-chip LDO regulators that can supply on-chip loads.
4.1.4 External Clock Sources
Each i.MX 6ULL processor has two external input system clocks: a low frequency (RTC_XTALI) and a
high frequency (XTALI).
The RTC_XTALI is used for low-frequency functions. It supplies the clock for wake-up circuit,
power-down real time clock operation, and slow system and watch-dog counters. The clock input can be
connected to either external oscillator or a crystal using internal oscillator amplifier. Additionally, there is
an internal ring oscillator, which can be used instead of the RTC_XTALI if accuracy is not important.
The system clock input XTALI is used to generate the main system clock. It supplies the PLLs and other
peripherals. The system clock input can be connected to either external oscillator or a crystal using internal
oscillator amplifier.
Table 12 shows the interface frequency requirements.
The typical values shown in Table 12 are required for use with NXP BSPs to ensure precise time keeping
and USB operation. For RTC_XTALI operation, two clock sources are available.
Temperature Operating Ranges
Junction
temperature
TJ Standard
Commercial
0—95
oC See i.MX 6ULL Product Lifetime
Usage Estimates for information on
product lifetime (power-on years)
for this processor.
1Applying the maximum voltage results in maximum power consumption and heat generation. NXP recommends a voltage set
point = (Vmin + the supply tolerance). This result in an optimized power/speed ratio.
2In setting VDD_SNVS_IN voltage with regards to Charging Currents and RTC, refer to the i.MX 6ULL Hardware Development
Guide (IMX6ULLHDG).
Table 11. On-Chip LDOs1 and their On-Chip Loads
1On-chip LDOs are designed to supply i.MX 6ULL loads and must not be used to supply external loads.
Voltage Source Load Comment
VDD_HIGH_CAP NVCC_DRAM_2P5 Board-level connection to VDD_HIGH_CAP
Table 12. External Input Clock Frequency
Parameter Description Symbol Min Typ Max Unit
RTC_XTALI Oscillator1,2
1External oscillator or a crystal with internal oscillator amplifier.
2The required frequency stability of this clock source is application dependent. For recommendations, see the Hardware
Development Guide for i.MX 6ULL Applications Processors (IMX6ULLHDG).
fckil — 32.7683/32.0
3Recommended nominal frequency 32.768 kHz.
—kHz
XTALI Oscillator2,4
4External oscillator or a fundamental frequency crystal with internal oscillator amplifier.
fxtal —24—MHz
Table 10. Operating Ranges (continued)
Electrical Characteristics
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 27
• On-chip 40 kHz ring oscillator—this clock source has the following characteristics:
— Approximately 25 µA more Idd than crystal oscillator
— Approximately ±50% tolerance
— No external component required
— Starts up quicker than 32 kHz crystal oscillator
• External crystal oscillator with on-chip support circuit:
— At power up, ring oscillator is utilized. After crystal oscillator is stable, the clock circuit
switches over to the crystal oscillator automatically.
— Higher accuracy than ring oscillator
— If no external crystal is present, then the ring oscillator is utilized
The decision of choosing a clock source should be taken based on real-time clock use and precision
time-out.
4.1.5 Maximum Supply Currents
The data shown in Table 13 represent a use case designed specifically to show the maximum current
consumption possible. All cores are running at the defined maximum frequency and are limited to L1
cache accesses only to ensure no pipeline stalls. Although a valid condition, it would have a very limited
practical use case, if at all, and be limited to an extremely low duty cycle unless the intention was to
specifically show the worst case power consumption.
See the i.MX 6ULL Power Consumption Measurement Application Note (AN4581) for more details on
typical power consumption under various use case definitions.
Table 13. Maximum Supply Currents
Power Line Conditions Max Current Unit
VDD_SOC_IN 900 MHz Arm clock
based on Dhrystone
test
500 mA
VDD_HIGH_IN — 1251mA
VDD_SNVS_IN — 5002A
USB_OTG1_VBUS
USB_OTG2_VBUS
—50
3mA
VDDA_ADC_3P3 100 Ohm maximum
loading for touch panel
35 mA
Primary Interface (IO) Supplies
NVCC_DRAM — (See4)—
NVCC_DRAM_2P5 — 50 mA
NVCC_GPIO N=16 Use maximum IO Equation5—
NVCC_UART N=16 Use maximum IO equation5—
NVCC_ENET N=16 Use maximum IO equation5—
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28 NXP Semiconductors
Electrical Characteristics
4.1.6 Power Modes
The i.MX 6ULL has the following power modes:
• RUN Mode: CPU is active, some portion of the chip can be clock gated or power gated. Support
multiple voltage/frequency scaling set point for power saving;
• Low Power Mode: CPU in WFI state or power gate, some portion of the chip can be shut off for
power saving. The Suspend, Low Power Idle, System Idle are consider as sub-modes of the RUN
mode;
• SNVS Mode: only RTC and tamper detection logic is active, with 12 GPIOs in low power state
retention mode;
• OFF Mode: all power rails are off.
The following table summarizes the external power supply state in all the power modes.
NVCC_LCD N=29 Use maximum IO equation5—
NVCC_NAND N=17 Use maximum IO equation5—
NVCC_SD N=6 Use maximum IO equation5—
NVCC_CSI N=12 Use maximum IO equation5—
MISC
DRAM_VREF — 1 mA
1The actual maximum current drawn from VDD_HIGH_IN will be as shown plus any additional current drawn from the
VDD_HIGH_CAP outputs, depending upon actual application configuration (for example, NVCC_DRAM_2P5 supplies).
2The maximum VDD_SNVS_IN current may be higher depending on specific operating configurations, such as
BOOT_MODE[1:0] not equal to 00, or use of the Tamper feature. During initial power on, VDD_SNVS_IN can draw up to 1
mA, if available. VDD_SNVS_CAP charge time will increase if less than 1 mA is available.
3This is the maximum current per active USB physical interface.
4The DRAM power consumption is dependent on several factors, such as external signal termination. DRAM power
calculators are typically available from the memory vendors. They take in account factors, such as signal termination. See
the i.MX 6ULL Power Consumption Measurement Application Note (AN4581) or examples of DRAM power consumption
during specific use case scenarios.
5General equation for estimated, maximum power consumption of an IO power supply:
Imax = N x C x V x (0.5 x F)
Where:
N—Number of IO pins supplied by the power line
C—Equivalent external capacitive load
V—IO voltage
(0.5 xF)—Data change rate. Up to 0.5 of the clock rate (F)
In this equation, Imax is in Amps, C in Farads, V in Volts, and F in Hertz.
Table 14. Power Supply State in Power Modes
Power Rail RUN Low Power SNVS OFF
VDD_SOC_IN ON ON OFF OFF
Table 13. Maximum Supply Currents (continued)
Power Line Conditions Max Current Unit
Electrical Characteristics
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 29
4.1.6.1 RUN Mode
In RUN mode, the CPU is active and running, and the analog / digital peripheral modules inside the
processor will be enabled. In this mode, all the external power rails to the processor have to be ON and the
SoC will be able to draw as many current.
Typically, when the CPU is doing DVFS, it switches the VDD_ARM voltage according to Table 10.
4.1.6.2 Low Power Mode
When the CPU is not running, the processor can enter low power mode. i.MX 6ULL processor supports a
very flexible set of power mode configurations in low power mode.
Typically there are three low power modes used, System IDLE, Low Power IDLE, and SUSPEND:
• System IDLE—This is a mode that the CPU can automatically enter when there is no thread
running. All the peripherals can keep working and the CPU’s state is retained so the interrupt
response can be very short. The cores are able to individually enter the WAIT state.
• Low Power IDLE—This mode is for the case when the system needs to have lower power but still
keep some of the peripherals alive. Most of the peripherals, analog modules, and PHYs are shut
off. The interrupt response in this mode is expected to be longer than the System IDLE, but its
power is much lower.
• Suspend—This mode has the greatest power savings; all clocks, unused analog/PHYs, and
peripherals are off. The external DRAM stays in Self-Refresh mode. The exit time from this mode
is much longer.
Table 15 shows the current core consumption (not including I/O) of i.MX 6ULL processors in selected low
power modes.
VDD_HIGH_IN ON ON OFF OFF
VDD_SNVS ON ON ON OFF
USB_OTG1_VBUS
USB_OTG2_VBUS
ON / OFF ON / OFF OFF OFF
NVCC_DRAM_2P5 ON ON OFF OFF
VDDA_ADC_3P3 ON / OFF ON / OFF OFF OFF
NVCC_DRAM ON ON OFF OFF
NVCC_XXX ON / OFF ON / OFF OFF OFF
Table 15. Low Power Mode Current and Power Consumption
Mode Test Conditions Supply Typical Units
Table 14. Power Supply State in Power Modes (continued)
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30 NXP Semiconductors
Electrical Characteristics
SYSTEM IDLE:
LDO Enabled
• LDO_ARM and LDO_SOC are set to 1.15 V
• LDO_2P5 set to 2.5 V, LDO_1P1 set to 1.1 V
• CPU in WFI, CPU clock gated
• DDR is in self refresh
• 24 MHz XTAL is ON
• 528 PLL is active, other PLLs are power down
• High-speed peripheral clock gated, but remain
powered
VDD_SOC_IN (1.275 V) 9 mA
VDD_HIGH_IN (3.0 V) 9.7
VDD_SNVS_IN (3.0 V) 0.04
Total 40.7 mW
SYSTEM IDLE:
LDO Bypassed
• LDO_ARM and LDO_SOC are set to bypass
mode
• LDO_2P5 set to 2.5 V, LDO_1P1 set to 1.1 V
• CPU in WFI, CPU clock gated
• DDR is in self refresh
• 24 MHz XTAL is ON
• 528 PLL is active, other PLLs are power down
• High-speed peripheral clock gated, but remain
powered
VDD_SOC_IN (1.25 V) 8.5 mA
VDD_HIGH_IN (3.0 V) 8.8
VDD_SNVS_IN (3.0 V) 0.04
Total 37.15 mW
LOW POWER IDLE:
LDO Enabled
• LDO_SOC is set to 1.15 V, LDO_ARM is in PG
mode
• LDO_2P5 and LDO_1P1 are set to weak mode
• CPU in power gate mode
• DDR is in self refresh
• All PLLs are power down
• 24 MHz XTAL is off, 24 MHz RCOSC used as
clock source
• High-speed peripheral are powered off
VDD_SOC_IN (1.025 V) 1.6 mA
VDD_HIGH_IN (3.0 V) 1.25
VDD_SNVS_IN (3.0 V) 0.03
Total 5.48 mW
LOW POWER IDLE:
LDO Bypassed
• LDO_SOC is in bypass mode, LDO_ARM is in PG
mode
• LDO_2P5 and LDO_1P1 are set to weak mode
• CPU in power gate mode
• DDR is in self refresh
• All PLLs are power down
• 24 MHz XTAL is off, 24 MHz RCOSC used as
clock source
• High-speed peripheral are powered off
VDD_SOC_IN (0.9 V) 1.5 mA
VDD_HIGH_IN (3.0 V) 0.3
VDD_SNVS_IN (3.0 V) 0.05
Total 2.4 mW
SUSPEND: • LDO_SOC is in bypass mode, LDO_ARM is in PG
mode
• LDO_2P5 and LDO_1P1 are shut off
• CPU in power gate mode
• DDR is in self refresh
• All PLLs are power down
• 24 MHz XTAL is off, 24 MHz RCOSC is off
• All clocks are shut off, except 32 kHz RTC
• High-speed peripheral are powered off
VDD_SOC_IN (0.9 V) 0.3 mA
VDD_HIGH_IN (3.0 V) 0.03
VDD_SNVS_IN (3.0 V) 0.03
Total 0.45 mW
SNVS: • All SOC digital logic, analog module are shut off
• 32 kHz RTC is alive
• Tamper detection circuit remains active
VDD_SOC_IN (0 V) 0 mA
VDD_HIGH_IN (0 V) 0
VDD_SNVS_IN (3.0 V) 0.03
Total 0.09 mW
Table 15. Low Power Mode Current and Power Consumption (continued)
Electrical Characteristics
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 31
4.1.6.3 SNVS Mode
SNVS mode is also called RTC mode, where only the power for the SNVS domain remain on. In this
mode, only the RTC and tamper detection logic is still active.
The power consumption in SNVS model with all the tamper detection logic enabled will be less than 0.03
mA@3.0V on VDD_SNVS for typical silicon at 25C.
In SNVS mode, the supported wakeup source are RTC alarm, ONOFF event, and also the 12 GPIO pads
in VDD_SNVS_IN domain.
In some applications, the SNVS mode is powered by non-rechargeable coin cell battery, so the power
consumption in SNVS mode has to be very low.
4.1.6.4 OFF Mode
In OFF mode, all power rails are shut off.
4.1.7 USB PHY Current Consumption
4.1.7.1 Power Down Mode
In power down mode, everything is powered down, including the USB VBUS valid detectors in typical
condition. Table 16 shows the USB interface current consumption in power down mode.
NOTE
The currents on the VDD_HIGH_CAP and VDD_USB_CAP were
identified to be the voltage divider circuits in the USB-specific level
shifters.
4.2 Power Supplies Requirements and Restrictions
The system design must comply with power-up sequence, power-down sequence, and steady state
guidelines as described in this section to guarantee the reliable operation of the device. Any deviation from
these sequences may result in the following situations:
• Excessive current during power-up phase
• Prevention of the device from booting
• Irreversible damage to the processor (worst-case scenario)
Table 16. USB PHY Current Consumption in Power Down Mode
VDD_USB_CAP (3.0 V) VDD_HIGH_CAP (2.5 V) NVCC_PLL (1.1 V)
Current 5.1 A 1.7 A < 0.5 A
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32 NXP Semiconductors
Electrical Characteristics
4.2.1 Power-Up Sequence
The below restrictions must be followed:
• VDD_SNVS_IN supply must be turned on before any other power supply.
• If a coin cell is used to power VDD_SNVS_IN, then ensure that it is connected before any other
supply is switched on.
• VDD_HIGH_IN should be turned on before VDD_SOC_IN.
NOTE
The POR_B input (if used) must be immediately asserted at power-up and
remain asserted until after the last power rail reaches its working voltage. In
the absence of an external reset feeding the POR_B input, the internal POR
module takes control. See the i.MX 6ULL Reference Manual
(IMX6ULLRM) for further details and to ensure that all necessary
requirements are being met.
NOTE
Need to ensure that there is no back voltage (leakage) from any supply on
the board towards the 3.3 V supply (for example, from the external
components that use both the 1.8 V and 3.3 V supplies).
NOTE
USB_OTG1_VBUS and USB_OTG2_VBUS are not part of the power
supply sequence and may be powered at any time.
4.2.2 Power-Down Sequence
The following restrictions must be followed:
• VDD_SNVS_IN supply must be turned off after any other power supply.
• If a coin cell is used to power VDD_SNVS_IN, then ensure that it is removed after any other supply
is switched off.
• VDD_HIGH_IN should be turned off after VDD_SOC_IN is switched off.
4.2.3 Power Supplies Usage
All I/O pins should not be externally driven while the I/O power supply for the pin (NVCC_xxx) is OFF.
This can cause internal latch-up and malfunctions due to reverse current flows. For information about I/O
power supply of each pin, see “Power Rail” columns in pin list tables of Section 6, Package Information
and Contact Assignments".”
4.3 Integrated LDO Voltage Regulator Parameters
Various internal supplies can be powered ON from internal LDO voltage regulators. All the supply pins
named *_CAP must be connected to external capacitors. The onboard LDOs are intended for internal use
Electrical Characteristics
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 33
only and should not be used to power any external circuitry. See the i.MX 6ULL Reference Manual
(IMX6ULLRM) for details on the power tree scheme.
NOTE
The *_CAP signals should not be powered externally. These signals are
intended for internal LDO operation only.
4.3.1 Digital Regulators (LDO_ARM, LDO_SOC)
There are two digital LDO regulators (“Digital”, because of the logic loads that they drive, not because of
their construction). The advantages of the regulators are to reduce the input supply variation because of
their input supply ripple rejection and their on-die trimming. This translates into more stable voltage for
the on-chip logics.
These regulators have two basic modes:
• Power Gate. The regulation FET is switched fully off limiting the current draw from the supply.
The analog part of the regulator is powered down here limiting the power consumption.
• Analog regulation mode. The regulation FET is controlled such that the output voltage of the
regulator equals the programmed target voltage. The target voltage is fully programmable in 25 mV
steps.
For additional information, see the i.MX 6ULL Reference Manual (IMX6ULLRM).
4.3.2 Analog Regulators (LDO_1P1, LDO_2P5, and LDO_USB)
4.3.2.1 LDO_1P1
The LDO_1P1 regulator implements a programmable linear-regulator function from VDD_HIGH_IN (see
Table 10 for minimum and maximum input requirements). Typical Programming Operating Range is 1.0
V to 1.2 V with the nominal default setting as 1.1 V. The LDO_1P1 supplies the USB PHY, and PLLs. A
programmable brown-out detector is included in the regulator that can be used by the system to determine
when the load capability of the regulator is being exceeded to take the necessary steps. Current-limiting
can be enabled to allow for in-rush current requirements during start-up, if needed. Active-pull-down can
also be enabled for systems requiring this feature.
For information on external capacitor requirements for this regulator, see the Hardware Development
Guide for i.MX 6ULL Applications Processors (IMX6ULLHDG).
For additional information, see the i.MX 6ULL Reference Manual (IMX6ULLRM).
4.3.2.2 LDO_2P5
The LDO_2P5 module implements a programmable linear-regulator function from VDD_HIGH_IN (see
Table 10 for minimum and maximum input requirements). Typical Programming Operating Range is
2.25 V to 2.75 V with the nominal default setting as 2.5 V. LDO_2P5 supplies the DDR IOs, USB PHY,
E-fuse module, and PLLs. A programmable brown-out detector is included in the regulator that can be
used by the system to determine when the load capability of the regulator is being exceeded, to take the
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
34 NXP Semiconductors
Electrical Characteristics
necessary steps. Current-limiting can be enabled to allow for in-rush current requirements during start-up,
if needed. Active-pull-down can also be enabled for systems requiring this feature. An alternate self-biased
low-precision weak-regulator is included that can be enabled for applications needing to keep the output
voltage alive during low-power modes where the main regulator driver and its associated global bandgap
reference module are disabled. The output of the weak-regulator is not programmable and is a function of
the input supply as well as the load current. Typically, with a 3 V input supply the weak-regulator output
is 2.525 V and its output impedance is approximately 40 ..
For information on external capacitor requirements for this regulator, see the Hardware Development
Guide for i.MX 6ULL Applications Processors (IMX6ULLHDG).
For additional information, see the i.MX 6ULL Reference Manual (IMX6ULLRM).
4.3.2.3 LDO_USB
The LDO_USB module implements a programmable linear-regulator function from the USB VUSB
voltages (4.4 V–5.5 V) to produce a nominal 3.0 V output voltage. A programmable brown-out detector
is included in the regulator that can be used by the system to determine when the load capability of the
regulator is being exceeded, to take the necessary steps. This regulator has a built in power-mux that allows
the user to select to run the regulator from either USB VBUS supply, when both are present. If only one
of the USB VBUS voltages is present, then, the regulator automatically selects this supply. Current limit
is also included to help the system meet in-rush current targets.
For information on external capacitor requirements for this regulator, see the Hardware Development
Guide for i.MX 6ULL Applications Processors (IMX6ULLHDG).
For additional information, see the i.MX 6ULL Reference Manual (IMX6ULLRM).
4.4 PLL’s Electrical Characteristics
4.4.1 Audio/Video PLL’s Electrical Parameters
Table 17. Audio/Video PLL’s Electrical Parameters
Parameter Value
Clock output range 650 MHz ~1.3 GHz
Reference clock 24 MHz
Lock time <11250 reference cycles
Electrical Characteristics
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 35
4.4.2 528 MHz PLL
4.4.3 Ethernet PLL
4.4.4 480 MHz PLL
4.4.5 Arm PLL
Table 18. 528 MHz PLL’s Electrical Parameters
Parameter Value
Clock output range 528 MHz PLL output
Reference clock 24 MHz
Lock time <11250 reference cycles
Table 19. Ethernet PLL’s Electrical Parameters
Parameter Value
Clock output range 500 MHz
Reference clock 24 MHz
Lock time <11250 reference cycles
Table 20. 480 MHz PLL’s Electrical Parameters
Parameter Value
Clock output range 480 MHz PLL output
Reference clock 24 MHz
Lock time <383 reference cycles
Table 21. Arm PLL’s Electrical Parameters
Parameter Value
Clock output range 648 MHz ~ 1296 MHz
Reference clock 24 MHz
Lock time <2250 reference cycles
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36 NXP Semiconductors
Electrical Characteristics
4.5 On-Chip Oscillators
4.5.1 OSC24M
This block implements an amplifier that when combined with a suitable quartz crystal and external load
capacitors implement an oscillator. The oscillator is powered from NVCC_PLL.
The system crystal oscillator consists of a Pierce-type structure running off the digital supply. A straight
forward biased-inverter implementation is used.
4.5.2 OSC32K
This block implements an amplifier that when combined with a suitable quartz crystal and external load
capacitors implement a low power oscillator. It also implements a power mux such that it can be powered
from either a ~3 V backup battery (VDD_SNVS_IN) or VDD_HIGH_IN such as the oscillator consumes
power from VDD_HIGH_IN when that supply is available and transitions to the backup battery when
VDD_HIGH_IN is lost.
In addition, if the clock monitor determines that the OSC32K is not present, then the source of the 32 K
will automatically switch to a crude internal ring oscillator. The frequency range of this block is
approximately 10–45 kHz. It highly depends on the process, voltage, and temperature.
The OSC32k runs from VDD_SNVS_CAP supply, which comes from the
VDD_HIGH_IN/VDD_SNVS_IN. The target battery is a ~3 V coin cell. Proper choice of coin cell type
is necessary for chosen VDD_HIGH_IN range. Appropriate series resistor (Rs) must be used when
connecting the coin cell. Rs depends on the charge current limit that depends on the chosen coin cell. For
example, for Panasonic ML621:
• Average Discharge Voltage is 2.5 V
• Maximum Charge Current is 0.6 mA
For a charge voltage of 3.2 V, Rs = (3.2-2.5)/0.6 m = 1.17 k.
Table 22. OSC32K Main Characteristics
Min Typ Max Comments
Fosc — 32.768 KHz — This frequency is nominal and determined mainly by the crystal selected.
32.0 K would work as well.
Current consumption — 4 A—The 4 A is the consumption of the oscillator alone (OSC32k). Total supply
consumption will depend on what the digital portion of the RTC consumes.
The ring oscillator consumes 1 A when ring oscillator is inactive, 20 A
when the ring oscillator is running. Another 1.5 A is drawn from vdd_rtc
in the power_detect block. So, the total current is 6.5 A on vdd_rtc when
the ring oscillator is not running.
Bias resistor — 14 M — This the integrated bias resistor that sets the amplifier into a high gain
state. Any leakage through the ESD network, external board leakage, or
even a scope probe that is significant relative to this value will debias the
amp. The debiasing will result in low gain, and will impact the circuit's ability
to start up and maintain oscillations.
“1“
or
non_ _ _
predliver
i uvdd
pmos (an)
pad
Voh min
Electrical Characteristics
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 37
4.6 I/O DC Parameters
This section includes the DC parameters of the following I/O types:
• General Purpose I/O (GPIO)
• Double Data Rate I/O (DDR) for LPDDR2 and DDR3/DDR3L modes
NOTE
The term ‘OVDD’ in this section refers to the associated supply rail of an
input or output.
Figure 3. Circuit for Parameters Voh and Vol for I/O Cells
4.6.1 XTALI and RTC_XTALI (Clock Inputs) DC Parameters
Table 23 shows the DC parameters for the clock inputs.
Crystal Properties
Cload — 10 pF — Usually crystals can be purchased tuned for different Cloads. This Cload
value is typically 1/2 of the capacitances realized on the PCB on either side
of the quartz. A higher Cload will decrease oscillation margin, but
increases current oscillating through the crystal.
ESR — 50 k 100 kEquivalent series resistance of the crystal. Choosing a crystal with a higher
value will decrease the oscillating margin.
Table 23. XTALI and RTC_XTALI DC Parameters 1
Parameter Symbol Test Conditions Min Max Unit
XTALI high-level DC input voltage Vih — 0.8 x NVCC_PLL NVCC_PLL V
XTALI low-level DC input voltage Vil — 0 0.2 V
RTC_XTALI high-level DC input voltage Vih — 0.8 1.1 V
RTC_XTALI low-level DC input voltage Vil — 0 0.2 V
Table 22. OSC32K Main Characteristics
Min Typ Max Comments
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38 NXP Semiconductors
Electrical Characteristics
4.6.2 Single Voltage General Purpose I/O (GPIO) DC Parameters
Table 24 shows DC parameters for GPIO pads. The parameters in Table 24 are guaranteed per the
operating ranges in Table 10, unless otherwise noted.
1The DC parameters are for external clock input only.
Table 24. Single Voltage GPIO DC Parameters
Parameter Symbol Test Conditions Min Max Units
High-level output voltage1
1Overshoot and undershoot conditions (transitions above OVDD and below GND) on switching pads must be held below 0.6 V,
and the duration of the overshoot/undershoot must not exceed 10% of the system clock cycle. Overshoot/ undershoot must be
controlled through printed circuit board layout, transmission line impedance matching, signal line termination, or other
methods. Non-compliance to this specification may affect device reliability or cause permanent damage to the device.
VOH Ioh= -0.1mA (ipp_dse=001,010)
Ioh= -1mA
(ipp_dse=011,100,101,110,111)
OVDD-0.15 – V
Low-level output voltage1VOL Iol= 0.1mA (ipp_dse=001,010)
Iol= 1mA
(ipp_dse=011,100,101,110,111)
–0.15V
High-Level input voltage1,2
2To maintain a valid level, the transition edge of the input must sustain a constant slew rate (monotonic) from the current DC
level through to the target DC level, Vil or Vih. Monotonic input transition time is from 0.1 ns to 1 s.
VIH — 0.7 x OVDD OVDD V
Low-Level input voltage1,2 VIL — 0 0.3 x
OVDD
V
Input Hysteresis (OVDD= 1.8V) VHYS_LowVDD OVDD=1.8V 200 — mV
Input Hysteresis (OVDD=3.3V VHYS_HighVDD OVDD=3.3V 200 — mV
Schmitt trigger VT+2,3
3Hysteresis of 250 mV is guaranteed over all operating conditions when hysteresis is enabled.
VTH+ — 0.5 x OVDD — mV
Schmitt trigger VT-2,3 VTH- — — 0.5 x
OVDD
mV
Pull-up resistor (22_k PU) RPU_22K Vin=0V — 212 uA
Pull-up resistor (22_k PU) RPU_22K Vin=OVDD — 1 uA
Pull-up resistor (47_k PU) RPU_47K Vin=0V — 100 uA
Pull-up resistor (47_k PU) RPU_47K Vin=oOVDD — 1 uA
Pull-up resistor (100_k PU) RPU_100K Vin=0V — 48 uA
Pull-up resistor (100_k PU) RPU_100K Vin=OVDD — 1 uA
Pull-down resistor (100_k PD) RPD_100K Vin=OVDD — 48 uA
Pull-down resistor (100_k PD) RPD_100K Vin=0V — 1 uA
Input current (no PU/PD) IIN VI = 0, VI = OVDD -1 1 uA
Keeper Circuit Resistance R_Keeper VI =0.3 x OVDD, VI = 0.7 x OVDD 105 175 k
Electrical Characteristics
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NXP Semiconductors 39
4.6.3 DDR I/O DC Parameters
The DDR I/O pads support LPDDR2 and DDR3/DDR3L operational modes. For details on supported
DDR memory configurations, see Section 4.10, Multi-Mode DDR Controller (MMDC)".
MMDC operation with the standards stated above is contingent upon the board DDR design adherence to
the DDR design and layout requirements stated in the Hardware Development Guide for the i.MX 6ULL
Applications Processor (IMX6ULLHDG).
4.6.3.1 LPDDR2 Mode I/O DC Parameters
4.6.3.2 DDR3/DDR3L Mode I/O DC Parameters
The parameters in Table 27 are guaranteed per the operating ranges in Table 10, unless otherwise noted.
Table 25. LPDDR2 I/O DC Electrical Parameters1
1Note that the JEDEC LPDDR2 specification (JESD209_2B) supersedes any specification in this document.
Parameters Symbol Test Conditions Min Max Unit
High-level output voltage VOH Ioh= -0.1mA 0.9 x OVDD — V
Low-level output voltage VOL Iol= 0.1mA — 0.1 x OVDD V
Input Reference Voltage Vref — 0.49 x OVDD 0.51 x OVDD V
DC High-Level input voltage Vih_DC — Vref+0.13 OVDD V
DC Low-Level input voltage Vil_DC — OVSS Vref-0.13 V
Differential Input Logic High Vih_diff — 0.26 Note2
2The single-ended signals need to be within the respective limits (Vih(dc) max, Vil(dc) min) for single-ended signals as well as
the limitations for overshoot and undershoot.
—
Differential Input Logic Low Vil_diff — Note2-0.26 —
Pull-up/Pull-down Impedance Mismatch Mmpupd — -15 15 %
240 unit calibration resolution Rres — — 10
Keeper Circuit Resistance Rkeep — 110 175 k
Input current (no pull-up/down) Iin VI = 0, VI = OVDD -2.5 2.5 A
Table 27. DDR3/DDR3L I/O DC Electrical Characteristics
Parameters Symbol Test Conditions Min Max Unit
High-level output voltage VOH Ioh= -0.1mA
Voh (for ipp_dse=001)
0.8 x OVDD1—V
Low-level output voltage VOL Iol= 0.1mA
Vol (for ipp_dse=001)
0.2 x OVDD — V
High-level output voltage VOH Ioh= -1mA
Voh (for all except ipp_dse=001)
0.8 x OVDD — V
Low-level output voltage VOL Iol= 1mA
Vol (for all except ipp_dse=001)
0.2 x OVDD — V
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Electrical Characteristics
4.6.4 LVDS I/O DC Parameters
The LVDS interface complies with TIA/EIA 644-A standard. See TIA/EIA STANDARD 644-A,
“Electrical Characteristics of Low Voltage Differential Signaling (LVDS) Interface Circuits” for details.
Table 28 shows the Low Voltage Differential Signaling (LVDS) I/O DC parameters.
4.7 I/O AC Parameters
This section includes the AC parameters of the following I/O types:
• General Purpose I/O (GPIO)
• Double Data Rate I/O (DDR) for LPDDR2 and DDR3/DDR3L modes
The GPIO and DDR I/O load circuit and output transition time waveforms are shown in Figure 4 and
Figure 5.
Input Reference Voltage Vref — 0.49 x OVDD 0.51 x ovdd V
DC High-Level input voltage Vih_DC — Vref2+0.1 OVDD V
DC Low-Level input voltage Vil_DC — OVSS Vref-0.1 V
Differential Input Logic High Vih_diff — 0.2 See Note3V
Differential Input Logic Low Vil_diff — — -0.2 V
Termination Voltage Vtt Vtt tracking OVDD/2 0.49 x OVDD 0.51 x OVDD V
Pull-up/Pull-down Impedance Mismatch Mmpupd — -10 10 %
240 unit calibration resolution Rres — — 10
Keeper Circuit Resistance Rkeep — 105 165 k
Input current (no pull-up/down) Iin VI = 0,VI = OVDD -2.9 2.9 A
1OVDD – I/O power supply (1.425 V–1.575 V for DDR3 and 1.283 V–1.45 V for DDR3L)
2Vref – DDR3/DDR3L external reference voltage
3The single-ended signals need to be within the respective limits (Vih(dc) max, Vil(dc) min) for single-ended signals as well as
the limitations for overshoot and undershoot.
Table 28. LVDS I/O DC Characteristics
Parameter Symbol Test Conditions Min Typ Max Unit
Output Differential Voltage VOD Rload-100 Diff 250 350 450 mV
Output High Voltage VOH IOH = 0 mA 1.25 1.375 1.6 V
Output Low Voltage VOL IOL = 0 mA 0.9 1.025 1.25 V
Offset Voltage VOS — 1.125 1.2 1.375 V
Table 27. DDR3/DDR3L I/O DC Electrical Characteristics (continued)
Parameters Symbol Test Conditions Min Max Unit
Electrical Characteristics
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NXP Semiconductors 41
Figure 4. Load Circuit for Output
Figure 5. Output Transition Time Waveform
4.7.1 General Purpose I/O AC Parameters
The I/O AC parameters for GPIO in slow and fast modes are presented in the Table 29 and Table 30,
respectively. Note that the fast or slow I/O behavior is determined by the appropriate control bits in the
IOMUXC control registers.
Table 29. General Purpose I/O AC Parameters 1.8 V Mode
Parameter Symbol Test Condition Min Typ Max Unit
Output Pad Transition Times, rise/fall
(Max Drive, ipp_dse=111)
tr, tf 22 pF Cload, slow slew rate
22 pF Cload, fast slew rate —— 2.72/2.79
1.69/1.82
ns
Output Pad Transition Times, rise/fall
(High Drive, ipp_dse=101)
tr, tf 22 pF Cload, slow slew rate
22 pF Cload, fast slew rate —— 3.99/4.44
2.14/2.50
Output Pad Transition Times, rise/fall
(Medium Drive, ipp_dse=100)
tr, tf 22 pF Cload, slow slew rate
22 pF Cload, fast slew rate —— 4.52/5.01
2.52/3.07
Output Pad Transition Times, rise/fall
(Low Drive. ipp_dse=011)
tr, tf 22 pF Cload, slow slew rate
22 pF Cload, fast slew rate —— 5.15/5.68
3.44/3.73
Input Transition Times1
1Hysteresis mode is recommended for inputs with transition times greater than 25 ns.
trm — — — 25 ns
Test Point
From Output
Under Test
CL
CL includes package, probe and fixture capacitance
0V
OVDD
20%
80% 80%
20%
tr tf
Output (at pad)
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Electrical Characteristics
4.7.2 DDR I/O AC Parameters
The DDR I/O pads support LPDDR2 and DDR3/DDR3L operational modes. For details on supported
DDR memory configurations, see Section 4.10, Multi-Mode DDR Controller (MMDC)".
MMDC operation with the standards stated above is contingent upon the board DDR design adherence to
the DDR design and layout requirements stated in the Hardware Development Guide for the i.MX 6ULL
Applications Processor (IMX6ULLHDG).
Table 31 shows the AC parameters for DDR I/O operating in LPDDR2 mode.
Table 30. General Purpose I/O AC Parameters 3.3 V Mode
Parameter Symbol Test Condition Min Typ Max Unit
Output Pad Transition Times, rise/fall
(Max Drive, ipp_dse=101)
tr, tf 22 pF Cload, slow slew rate
22 pF Cload, fast slew rate —— 1.84/2.06
1.09/1.35
ns
ns
Output Pad Transition Times, rise/fall
(High Drive, ipp_dse=011)
tr, tf 22 pF Cload, slow slew rate
22 pF Cload, fast slew rate —— 2.44/2.75
1.75/2.02
Output Pad Transition Times, rise/fall
(Medium Drive, ipp_dse=010)
tr, tf 22 pF Cload, slow slew rate
22 pF Cload, fast slew rate —— 3.26/3.70
2.47/2.92
Output Pad Transition Times, rise/fall
(Low Drive. ipp_dse=001)
tr, tf 22 pF Cload, slow slew rate
22 pF Cload, fast slew rate —— 5.26/6.19
4.88/5.77
Input Transition Times1
1Hysteresis mode is recommended for inputs with transition times greater than 25 ns.
trm — — — 25 ns
Table 31. DDR I/O LPDDR2 Mode AC Parameters1
Parameter Symbol Test Condition Min Max Unit
AC input logic high Vih(ac) — Vref + 0.22 OVDD V
AC input logic low Vil(ac) — 0 Vref - 0.22 V
AC differential input high voltage2Vidh(ac) — 0.44 — V
AC differential input low voltage Vidl(ac) — — 0.44 V
Input AC differential cross point voltage3Vix(ac) Relative to Vref -0.12 0.12 V
Over/undershoot peak Vpeak — — 0.35 V
Over/undershoot area (above OVDD
or below OVSS)
Varea 400 MHz — 0.3 V-ns
Electrical Characteristics
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Table 32 shows the AC parameters for DDR I/O operating in DDR3/DDR3L mode.
4.8 Output Buffer Impedance Parameters
This section defines the I/O impedance parameters of the i.MX 6ULL processors for the following I/O
types:
• Single Voltage General Purpose I/O (GPIO)
Single output slew rate, measured between
Vol (ac) and Voh (ac)
tsr 50 to Vref.
5 pF load.
Drive impedance = 40
± 30%
1.5 3.5 V/ns
50 to Vref.
5pF load.Drive
impedance = 60 ±
30%
12.5
Skew between pad rise/fall asymmetry + skew
caused by SSN
tSKD clk = 400 MHz —0.1 ns
1Note that the JEDEC LPDDR2 specification (JESD209_2B) supersedes any specification in this document.
2Vid(ac) specifies the input differential voltage | Vtr - Vcp | required for switching, where Vtr is the “true” input signal and Vcp
is the “complementary” input signal. The Minimum value is equal to Vih(ac) - Vil(ac).
3The typical value of Vix(ac) is expected to be about 0.5 x OVDD. and Vix(ac) is expected to track variation of OVDD. Vix(ac)
indicates the voltage at which differential input signal must cross.
Table 32. DDR I/O DDR3/DDR3L Mode AC Parameters1
1Note that the JEDEC JESD79_3C specification supersedes any specification in this document.
Parameter Symbol Test Condition Min Typ Max Unit
AC input logic high Vih(ac) — Vref + 0.175 — OVDD V
AC input logic low Vil(ac) — 0 — Vref - 0.175 V
AC differential input voltage2
2Vid(ac) specifies the input differential voltage | Vtr-Vcp | required for switching, where Vtr is the “true” input signal and Vcp is
the “complementary” input signal. The Minimum value is equal to Vih(ac) - Vil(ac).
Vid(ac) — 0.35 — — V
Input AC differential cross point voltage3
3The typical value of Vix(ac) is expected to be about 0.5 x OVDD. and Vix(ac) is expected to track variation of OVDD. Vix(ac)
indicates the voltage at which differential input signal must cross.
Vix(ac) Relative to Vref Vref - 0.15 — Vref + 0.15 V
Over/undershoot peak Vpeak — — — 0.4 V
Over/undershoot area (above OVDD
or below OVSS)
Varea 400 MHz — — 0.5 V-ns
Single output slew rate, measured between Vol
(ac) and Voh (ac)
tsr Driver impedance = 34 2.5 — 5 V/ns
Skew between pad rise/fall asymmetry + skew
caused by SSN
tSKD clk = 400 MHz ——
0.1 ns
Table 31. DDR I/O LPDDR2 Mode AC Parameters1 (continued)
Parameter Symbol Test Condition Min Max Unit
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Electrical Characteristics
• Double Data Rate I/O (DDR) for LPDDR2, and DDR3/DDR3L modes
NOTE
GPIO and DDR I/O output driver impedance is measured with “long”
transmission line of impedance Ztl attached to I/O pad and incident wave
launched into transmission line. Rpu/Rpd and Ztl form a voltage divider that
defines specific voltage of incident wave relative to OVDD. Output driver
impedance is calculated from this voltage divider (see Figure 6).
Figure 6. Impedance Matching Load for Measurement
ipp_do
Cload = 1p
Ztl , L = 20 inches
predriver
PMOS (Rpu)
NMOS (Rpd)
pad
OVDD
OVSS
t,(ns)
0
U,(V)
OVDD
t,(ns)
0
VDD
Vin (do)
Vout (pad)
U,(V)
Vref
Rpu = Vovdd - Vref1
Vref1 Ztl
Rpd = Ztl
Vref2
Vovdd - Vref2
Vref1 Vref2
Electrical Characteristics
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NXP Semiconductors 45
4.8.1 Single Voltage GPIO Output Buffer Impedance
Table 33 shows the GPIO output buffer impedance (OVDD 1.8 V).
Table 34 shows the GPIO output buffer impedance (OVDD 3.3 V).
4.8.2 DDR I/O Output Buffer Impedance
Table 35 shows DDR I/O output buffer impedance of i.MX 6ULL processors.
Note:
1. Output driver impedance is controlled across PVTs using ZQ calibration procedure.
2. Calibration is done against 240 external reference resistor.
3. Output driver impedance deviation (calibration accuracy) is ±5% (max/min impedance) across PVTs.
Table 33. GPIO Output Buffer Average Impedance (OVDD 1.8 V)
Parameter Symbol Drive Strength (DSE) Typ Value Unit
Output Driver
Impedance
Rdrv
001
010
011
100
101
110
111
260
130
88
65
52
43
37
Table 34. GPIO Output Buffer Average Impedance (OVDD 3.3 V)
Parameter Symbol Drive Strength (DSE) Typ Value Unit
Output Driver
Impedance
Rdrv
001
010
011
100
101
110
111
157
78
53
39
32
26
23
Table 35. DDR I/O Output Buffer Impedance
Parameter Symbol Test Conditions DSE
(Drive Strength)
Typical
Unit
NVCC_DRAM=1.5 V
(DDR3)
DDR_SEL=11
NVCC_DRAM=1.2 V
(LPDDR2)
DDR_SEL=10
Output Driver
Impedance Rdrv
000
001
010
011
100
101
110
111
Hi-Z
240
120
80
60
48
40
34
Hi-Z
240
120
80
60
48
40
34
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Electrical Characteristics
4.9 System Modules Timing
This section contains the timing and electrical parameters for the modules in each i.MX 6ULL processor.
4.9.1 Reset Timings Parameters
Figure 7 shows the reset timing and Table 36 lists the timing parameters.
Figure 7. Reset Timing Diagram
4.9.2 WDOG Reset Timing Parameters
Figure 8 shows the WDOG reset timing and Table 37 lists the timing parameters.
Figure 8. WDOGn_B Timing Diagram
NOTE
RTC_XTALI is approximately 32 kHz. RTC_XTALI cycle is one period or
approximately 30 s.
NOTE
WDOG1_B output signals (for each one of the Watchdog modules) do not
have dedicated pins, but are muxed out through the IOMUX. See the IOMUX
manual for detailed information.
Table 36. Reset Timing Parameters
ID Parameter Min Max Unit
CC1 Duration of POR_B to be qualified as valid. 1 — RTC_XTALI cycle
Table 37. WDOGn_B Timing Parameters
ID Parameter Min Max Unit
CC3 Duration of WDOGn_B Assertion 1 — RTC_XTALI cycle
POR_B
CC1
(Input)
WDOGn_B
CC3
(Output)
Electrical Characteristics
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NXP Semiconductors 47
4.9.3 External Interface Module (EIM)
The following subsections provide information on the EIM.
4.9.3.1 EIM Interface Pads Allocation
EIM supports 32-bit, 16-bit and 8-bit devices operating in address/data separate or multiplexed modes.
Table 38 provides EIM interface pads allocation in different modes.
4.9.3.2 General EIM Timing-Synchronous Mode
Figure 9, Figure 10, and Table 39 specify the timings related to the EIM module. All EIM output control
signals may be asserted and deasserted by an internal clock synchronized to the EIM_BCLK rising edge
according to corresponding assertion/negation control fields.
Table 38. EIM Multiplexing1
1For more information on configuration ports mentioned in this table, see the i.MX 6ULL reference manual.
Setup
Non Multiplexed Address/Data Mode Multiplexed Address/Data mode
8 Bit 16 Bit 16 Bit 32 Bit
MUM = 0,
DSZ = 100
MUM = 0,
DSZ = 101
MUM = 0,
DSZ = 001
MUM = 1,
DSZ = 001
MUM = 1,
DSZ = 011
A[15:0] EIM_DA[15:0] EIM_DA[15:0] EIM_DA[15:0] EIM_DA[15:0] EIM_DA[15:0]
A[25:16] EIM_A[25:16] EIM_A[25:16] EIM_A[25:16] EIM_A[25:16] EIM_D[9:0]
D[7:0],
EIM_EB0
EIM_D[7:0] — EIM_D[7:0] EIM_DA[7:0] EIM_DA[7:0]
D[15:8],
EIM_EB1
— EIM_D[15:8] EIM_D[15:8] EIM_DA[15:8] EIM_DA[15:8]
D[23:16],
EIM_EB2
————EIM_D[7:0]
D[31:24],
EIM_EB3
————EIM_D[15:8]
fl?
f
f
f f
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mml
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48 NXP Semiconductors
Electrical Characteristics
,
Figure 9. EIM Outputs Timing Diagram
Figure 10. EIM Inputs Timing Diagram
4.9.3.3 Examples of EIM Synchronous Accesses
Table 39. EIM Bus Timing Parameters 1
ID Parameter
BCD = 0 BCD = 1 BCD = 2 BCD = 3
Min Max Min Max Min Max Min Max
WE1 EIM_BCLK Cycle
time2
t — 2 x t — 3 x t — 4 x t —
WE2 EIM_BCLK Low
Level Width
0.4 x t — 0.8 x t — 1.2 x t — 1.6 x t —
WE3 EIM_BCLK High
Level Width
0.4 x t — 0.8 x t — 1.2 x t — 1.6 x t —
WE4
EIM_ADDRxx
EIM_CSx_B
EIM_WE_B
EIM_OE_B
EIM_BCLK
EIM_EBx_B
EIM_LBA_B
Output Data
...
WE5
WE6 WE7
WE8 WE9
WE10 WE11
WE12 WE13
WE14 WE15
WE16 WE17
WE3
WE2
WE1
Input Data
EIM_WAIT_B
EIM_BCLK
WE19
WE18
WE21
WE20
Electrical Characteristics
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WE4 Clock rise to
address valid3
-0.5 x t -
1.25
-0.5 x t + 1.75 -t - 1.25 -t + 1.75 -1.5 x t -
1.25
-1.5 x t
+1.75
-2 x t -
1.25
-2 x t + 1.75
WE5 Clock rise to
address invalid
0.5 x t -
1.25
0.5 x t + 1.75 t - 1.25 t + 1.75 1.5 x t -
1.25
1.5 x t
+1.75
2 x t -
1.25
2 x t + 1.75
WE6 Clock rise to
EIM_CSx_B valid
-0.5 x t -
1.25
-0.5 x t + 1.75 -t - 1.25 - t + 1.75 -1.5 x t -
1.25
-1.5 x t
+1.75
-2 x t -
1.25
-2 x t + 1.75
WE7 Clock rise to
EIM_CSx_B invalid
0.5 x t -
1.25
0.5 x t + 1.75 t - 1.25 t + 1.75 1.5 x t -
1.25
1.5 x t
+1.75
2 x t -
1.25
2 x t + 1.75
WE8 Clock rise to
EIM_WE_B Valid
-0.5 x t -
1.25
-0.5 x t + 1.75 -t - 1.25 - t + 1.75 -1.5 x t -
1.25
-1.5 x t
+1.75
-2 x t -
1.25
-2 x t + 1.75
WE9 Clock rise to
EIM_WE_B Invalid
0.5 x t -
1.25
0.5 x t + 1.75 t - 1.25 t + 1.75 1.5 x t -
1.25
1.5 x t
+1.75
2 x t -
1.25
2 x t + 1.75
WE10 Clock rise to
EIM_OE_B Valid
-0.5 x t -
1.25
-0.5 x t + 1.75 -t - 1.25 - t + 1.75 -1.5 x t -
1.25
-1.5 x t
+1.75
-2 x t -
1.25
-2 x t + 1.75
WE11 Clock rise to
EIM_OE_B Invalid
0.5 x t -
1.25
0.5 x t + 1.75 t - 1.25 t + 1.75 1.5 x t -
1.25
1.5 x t
+1.75
2 x t -
1.25
2 x t + 1.75
WE12 Clock rise to
EIM_EBx_B Valid
-0.5 x t -
1.25
-0.5 x t + 1.75 -t - 1.25 - t + 1.75 -1.5 x t -
1.25
-1.5 x t
+1.75
-2 x t -
1.25
-2 x t + 1.75
WE13 Clock rise to
EIM_EBx_B Invalid
0.5 x t -
1.25
0.5 x t + 1.75 t - 1.25 t + 1.75 1.5 x t -
1.25
1.5 x t
+1.75
2 x t -
1.25
2 x t + 1.75
WE14 Clock rise to
EIM_LBA_B Valid
-0.5 x t -
1.25
-0.5 x t + 1.75 -t - 1.25 - t + 1.75 -1.5 x t -
1.25
-1.5 x t
+1.75
-2 x t -
1.25
-2 x t + 1.75
WE15 Clock rise to
EIM_LBA_B Invalid
0.5 x t -
1.25
0.5 x t + 1.75 t - 1.25 t + 1.75 1.5 x t -
1.25
1.5 x t
+1.75
2 x t -
1.25
2 x t + 1.75
WE16 Clock rise to
Output Data Valid
-0.5 x t -
1.25
-0.5 x t + 1.75 -t - 1.25 - t + 1.75 -1.5 x t -
1.25
-1.5 x t
+1.75
-2 x t -
1.25
-2 x t + 1.75
WE17 Clock rise to
Output Data Invalid
0.5 x t -
1.25
0.5 x t + 1.75 t - 1.25 t + 1.75 1.5 x t -
1.25
1.5 x t
+1.75
2 x t -
1.25
2 x t + 1.75
WE18 Input Data setup
time to Clock rise
2 — 4—————
WE19 Input Data hold
time from Clock
rise
2 — 2—————
WE20 EIM_WAIT_B
setup time to Clock
rise
2 — 4—————
WE21 EIM_WAIT_B hold
time from Clock
rise
2 — 2—————
Table 39. EIM Bus Timing Parameters (continued)1
ID Parameter
BCD = 0 BCD = 1 BCD = 2 BCD = 3
Min Max Min Max Min Max Min Max
{E9
flak?
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Electrical Characteristics
Figure 11 to Figure 14 provide few examples of basic EIM accesses to external memory devices with the
timing parameters mentioned previously for specific control parameters settings.
Figure 11. Synchronous Memory Read Access, WSC=1
1t is the maximum EIM logic (axi_clk) cycle time. The maximum allowed axi_clk frequency depends on the fixed/non-fixed
latency configuration, whereas the maximum allowed EIM_BCLK frequency is:
—Fixed latency for both read and write is 132 MHz.
—Variable latency for read only is 132 MHz.
—Variable latency for write only is 52 MHz.
In variable latency configuration for write, if BCD = 0 & WBCDD = 1 or BCD = 1, axi_clk must be 104 MHz. Write BCD = 1 and
104 MHz axi_clk, will result in an EIM_BCLK of 52 MHz. When the clock branch to EIM is decreased to 104 MHz, other buses
are impacted which are clocked from this source. See the CCM chapter of the i.MX 6ULL Reference Manual (IMX6ULLRM) for
a detailed clock tree description.
2EIM_BCLK parameters are being measured from the 50% point, that is, high is defined as 50% of signal value and low is
defined as 50% as signal value.
3For signal measurements, “High” is defined as 80% of signal value and “Low” is defined as 20% of signal value.
Last Valid Address Address v1
D(v1)
EIM_BCLK
EIM_ADDRxx
EIM_DATAxx
EIM_WE_B
EIM_LBA_B
EIM_OE_B
EIM_EBx_B
EIM_CSx_B
WE4 WE5
WE6 WE7
WE10 WE11
WE13
WE12
WE14
WE15
WE18
WE19
rah
Electrical Characteristics
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Figure 12. Synchronous Memory, Write Access, WSC=1, WBEA=0 and WADVN=0
Figure 13. Muxed Address/Data (A/D) Mode, Synchronous Write Access, WSC=6, ADVA=0, ADVN=1, and
ADH=1
NOTE
In 32-bit muxed address/data (A/D) mode the 16 MSBs are driven on the
data bus.
Last Valid Address Address V1
D(V1)
EIM_BCLK
EIM_ADDRxx
EIM_DATAxx
EIM_WE_B
EIM_LBA_B
EIM_OE_B
EIM_EBx_B
EIM_CSx_B
WE4 WE5
WE6 WE7
WE8 WE9
WE12
WE13
WE14
WE15
WE16 WE17
EIM_BCLK
EIM_WE_B
EIM_LBA_B
EIM_OE_B
EIM_EBx_B
EIM_CSx_B
Address V1 Write Data
WE4
WE16
WE6
WE7
WE9
WE8
WE10
WE11
WE14 WE15
WE17
WE5
Last Valid Address
EIM_ADDRxx/
EIM_ADxx
1
J
avg
2
‘6
f
E
f TA
4 f
¢ »
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i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
52 NXP Semiconductors
Electrical Characteristics
Figure 14. 16-Bit Muxed A/D Mode, Synchronous Read Access, WSC=7, RADVN=1, ADH=1, OEA=0
4.9.3.4 General EIM Timing-Asynchronous Mode
Figure 15 through Figure 19, and Table 40 help to determine timing parameters relative to the chip select
(CS) state for asynchronous and DTACK EIM accesses with corresponding EIM bit fields and the timing
parameters mentioned above.
Asynchronous read & write access length in cycles may vary from what is shown in Figure 15 through
Figure 18 as RWSC, OEN and CSN is configured differently. See the i.MX 6ULL Reference Manual
(IMX6ULLRM) for the EIM programming model.
Figure 15. Asynchronous Memory Read Access (RWSC = 5)
Last
EIM_BCLK
EIM_ADDRxx/
EIM_WE_B
EIM_LBA_B
EIM_OE_B
EIM_EBx_B
EIM_CSx_B
Address V1 Data
Valid Address
EIM_ADxx
WE5
WE6
WE7
WE14 WE15
WE10
WE11
WE12 WE13
WE18
WE19
WE4
Last Valid Address Address V1
D(V1)
EIM_ADDRxx/
EIM_DATAxx[7:0]
EIM_WE_B
EIM_LBA_B
EIM_OE_B
EIM_EBx_B
EIM_CSx_B
Next Address
WE39
WE35
WE37
WE32
WE36
WE38
WE43
WE40
WE31
WE44
INT_CLK
start of
access
end of
access
MAXDI
MAXCSO
MAXCO
EIM_ADxx
E|M_ADDRXX/
/WTWM
: k H“ 4
ii;
E|M_ADDRxx/
—”i“ *
, “Nd
Electrical Characteristics
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 53
Figure 16. Asynchronous A/D Muxed Read Access (RWSC = 5)
Figure 17. Asynchronous Memory Write Access
Addr. V1 D(V1)
EIM_ADDRxx/
EIM_WE_B
EIM_LBA_B
EIM_OE_B
EIM_EBx_B
EIM_CSx_B
WE39
WE35A
WE37
WE36
WE38
WE40A
WE31
WE44
INT_CLK
start of
access
end of
access
MAXDI
MAXCSO
MAXCO
WE32A
EIM_ADxx
EIM_WE_B
EIM_OE_B
EIM_EBx_B
EIM_CSx_B
WE33
WE45
WE34
WE46
Addr. V1 D(V1)
EIM_ADDRxx/
WE31
WE42
WE41
WE32A
EIM_DATAxx
EIM_LBA_B
WE39
WE40A
E|M_ADDRxx/ »HV1 1
—
a: :
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54 NXP Semiconductors
Electrical Characteristics
Figure 18. Asynchronous A/D Muxed Write Access
Figure 19. DTACK Mode Read Access (DAP=0)
EIM_WE_B
EIM_OE_B
EIM_EBx_B
EIM_CSx_B
WE33
WE45
WE34
WE46
Addr. V1 D(V1)
EIM_ADDRxx/
WE31
WE42
WE41
WE32A
EIM_DATAxx
EIM_LBA_B
WE39
WE40A
Last Valid Address Address V1
D(V1)
EIM_ADDRxx
EIM_DATAxx[7:0]
EIM_WE_B
EIM_LBA_B
EIM_OE_B
EIM_EBx_B
EIM_CSx_B
Next Address
WE39
WE35
WE37
WE32
WE36
WE38
WE43
WE40
WE31
WE44
EIM_DTACK_B
WE47
WE48
l
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Electrical Characteristics
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 55
Figure 20. DTACK Mode Write Access (DAP=0)
Table 40. EIM Asynchronous Timing Parameters Table Relative Chip to Select
Ref No. Parameter
Determination by
Synchronous measured
parameters1
Min
Max
(If 132 MHz is
supported by SoC)
Unit
WE31 EIM_CSx_B valid to Address
Valid
WE4 - WE6 - CSA2— 3 - CSA ns
WE32 Address Invalid to EIM_CSx_B
invalid
WE7 - WE5 - CSN3 —3 - CSNns
WE32A(m
uxed A/D
EIM_CSx_B valid to Address
Invalid
t4 + WE4 - WE7 + (ADVN5 +
ADVA6 + 1 - CSA)
-3 + (ADVN +
ADVA + 1 - CSA)
—ns
WE33 EIM_CSx_B Valid to
EIM_WE_B Valid
WE8 - WE6 + (WEA - WCSA) — 3 + (WEA - WCSA) ns
WE34 EIM_WE_B Invalid to
EIM_CSx_B Invalid
WE7 - WE9 + (WEN - WCSN) — 3 - (WEN_WCSN) ns
WE35 EIM_CSx_B Valid to
EIM_OE_B Valid
WE10 - WE6 + (OEA - RCSA) — 3 + (OEA - RCSA) ns
WE35A
(muxed
A/D)
EIM_CSx_B Valid to
EIM_OE_B Valid
WE10 - WE6 + (OEA + RADVN
+ RADVA + ADH + 1 - RCSA)
-3 + (OEA +
RADVN+RADVA+
ADH+1-RCSA)
3 + (OEA +
RADVN+RADVA+AD
H+1-RCSA)
ns
WE36 EIM_OE_B Invalid to
EIM_CSx_B Invalid
WE7 - WE11 + (OEN - RCSN) — 3 - (OEN - RCSN) ns
WE37 EIM_CSx_B Valid to
EIM_EBx_B Valid (Read
access)
WE12 - WE6 + (RBEA - RCSA) — 3 + (RBEA - RCSA) ns
Last Valid Address Address V1
D(V1)
EIM_ADDRxx
EIM_DATAxx
EIM_WE_B
EIM_LBA_B
EIM_OE_B
EIM_EBx_B
EIM_CSx_B
Next Address
WE31
WE39
WE33
WE45
WE32
WE40
WE34
WE46
WE42
WE41
EIM_DTACK_B
WE48
WE47
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56 NXP Semiconductors
Electrical Characteristics
WE38 EIM_EBx_B Invalid to
EIM_CSx_B Invalid (Read
access)
WE7 - WE13 + (RBEN - RCSN) — 3 - (RBEN- RCSN) ns
WE39 EIM_CSx_B Valid to
EIM_LBA_B Valid
WE14 - WE6 + (ADVA - CSA) — 3 + (ADVA - CSA) ns
WE40 EIM_LBA_B Invalid to
EIM_CSx_B Invalid (ADVL is
asserted)
WE7 - WE15 - CSN — 3 - CSN ns
WE40A
(muxed
A/D)
EIM_CSx_B Valid to
EIM_LBA_B Invalid
WE14 - WE6 + (ADVN + ADVA
+ 1 - CSA)
-3 + (ADVN +
ADVA + 1 - CSA)
3 + (ADVN + ADVA +
1 - CSA)
ns
WE41 EIM_CSx_B Valid to Output
Data Valid
WE16 - WE6 - WCSA — 3 - WCSA ns
WE41A
(muxed
A/D)
EIM_CSx_B Valid to Output
Data Valid
WE16 - WE6 + (WADVN +
WADVA + ADH + 1 - WCSA)
— 3 + (WADVN +
WADVA + ADH + 1 -
WCSA)
ns
WE42 Output Data Invalid to
EIM_CSx_B Invalid
WE17 - WE7 - CSN — 3 - CSN ns
MAXCO Output maximum delay from
internal driving
EIM_ADDRxx/control FFs to
chip outputs
10 — — ns
MAXCSO Output maximum delay from
CSx internal driving FFs to CSx
out
10 — — ns
MAXDI EIM_DATAxx maximum delay
from chip input data to its
internal FF
5——ns
WE43 Input Data Valid to EIM_CSx_B
Invalid
MAXCO - MAXCSO + MAXDI MAXCO -
MAXCSO +
MAXDI
—ns
WE44 EIM_CSx_B Invalid to Input
Data invalid
00—ns
WE45 EIM_CSx_B Valid to
EIM_EBx_B Valid (Write
access)
WE12 - WE6 + (WBEA -
WCSA)
— 3 + (WBEA - WCSA) ns
WE46 EIM_EBx_B Invalid to
EIM_CSx_B Invalid (Write
access)
WE7 - WE13 + (WBEN -
WCSN)
— -3 + (WBEN - WCSN) ns
Table 40. EIM Asynchronous Timing Parameters Table Relative Chip to Select (continued)
Ref No. Parameter
Determination by
Synchronous measured
parameters1
Min
Max
(If 132 MHz is
supported by SoC)
Unit
Electrical Characteristics
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NXP Semiconductors 57
4.10 Multi-Mode DDR Controller (MMDC)
The Multi-Mode DDR Controller is a dedicated interface to DDR3/DDR3L/LPDDR2 SDRAM.
4.10.1 MMDC compatibility with JEDEC-compliant SDRAMs
The i.MX 6ULL MMDC supports the following memory types:
• LPDDR2 SDRAM compliant with JESD209-2B LPDDR2 JEDEC standard release June, 2009
• DDR3/DDR3L SDRAM compliant with JESD79-3D DDR3 JEDEC standard release April, 2008
MMDC operation with the standards stated above is contingent upon the board DDR design adherence to
the DDR design and layout requirements stated in the Hardware Development Guide for the i.MX 6ULL
Applications Processor (IMX6ULLHDG).
4.10.2 MMDC supported DDR3/DDR3L/LPDDR2 configurations
Table 41 shows the supported DDR3/DDR3L/LPDDR2 configurations:
MAXDTI MAXIMUM delay from
EIM_DTACK_B to its internal
FF + 2 cycles for
synchronization
10 — — —
WE47 EIM_DTACK_B Active to
EIM_CSx_B Invalid
MAXCO - MAXCSO + MAXDTI MAXCO -
MAXCSO +
MAXDTI
—ns
WE48 EIM_CSx_B Invalid to
EIM_DTACK_B Invalid
00—ns
1For more information on configuration parameters mentioned in this table, see the i.MX 6ULL Reference Manual
(IMX6ULLRM).
2In this table, CSA means WCSA when write operation or RCSA when read operation.
3In this table, CSN means WCSN when write operation or RCSN when read operation.
4t is axi_clk cycle time.
5In this table, ADVN means WADVN when write operation or RADVN when read operation.
6In this table, ADVA means WADVA when write operation or RADVA when read operation.
Table 41. i.MX 6ULL Supported DDR3/DDR3L/LPDDR2 Configurations
Parameter DDR3 DDR3L LDDDR2
Clock frequency 400 MHz 400 MHz 400 MHz
Bus width 16-bit 16-bit 16-bit
Table 40. EIM Asynchronous Timing Parameters Table Relative Chip to Select (continued)
Ref No. Parameter
Determination by
Synchronous measured
parameters1
Min
Max
(If 132 MHz is
supported by SoC)
Unit
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x >:< commandi="">:< w5;="" :4—="" —.i4——~="">i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
58 NXP Semiconductors
Electrical Characteristics
4.11 General-Purpose Media Interface (GPMI) Timing
The i.MX 6ULL GPMI controller is a flexible interface NAND Flash controller with 8-bit data width, up
to 200 MB/s I/O speed and individual chip select.
It supports Asynchronous timing mode, Source Synchronous timing mode and Samsung Toggle timing
mode separately described in the following subsections.
4.11.1 Asynchronous Mode AC Timing (ONFI 1.0 Compatible)
Asynchronous mode AC timings are provided as multiplications of the clock cycle and fixed delay. The
maximum I/O speed of GPMI in asynchronous mode is about 50 MB/s. Figure 21 through Figure 24
depicts the relative timing between GPMI signals at the module level for different operations under
asynchronous mode. Table 42 describes the timing parameters (NF1–NF17) that are shown in the figures.
Figure 21. Command Latch Cycle Timing Diagram
Figure 22. Address Latch Cycle Timing Diagram
Channel Single Single Single
Chip selects 2 2 2
Table 41. i.MX 6ULL Supported DDR3/DDR3L/LPDDR2 Configurations
Parameter DDR3 DDR3L LDDDR2
Command
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NF8 NF9
NF7
NF6
NF5
NF2
NF1
NF3 NF4
Address
NF10
NF11
NF9NF8
NF7
NF6
NF5
NF1
NF3
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Electrical Characteristics
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NXP Semiconductors 59
Figure 23. Write Data Latch Cycle Timing Diagram
Figure 24. Read Data Latch Cycle Timing Diagram (Non-EDO Mode)
Figure 25. Read Data Latch Cycle Timing Diagram (EDO Mode)
Table 42. Asynchronous Mode Timing Parameters1
ID Parameter Symbol
Timing
T = GPMI Clock Cycle Unit
Min. Max.
NF1 NAND_CLE setup time tCLS (AS + DS) T - 0.12 [see 2,3]ns
NF2 NAND_CLE hold time tCLH DH T - 0.72 [see 2]ns
NF3 NAND_CE0_B setup time tCS (AS + DS + 1) T [see 3, 2]ns
NF4 NAND_CE0_B hold time tCH (DH+1) T - 1 [see 2]ns
NF5 NAND_WE_B pulse width tWP DS T [see 2]ns
Data to NF
NF10
NF11
NF7
NF6
NF5
NF1
NF3
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NF8
Data from NF
NF14
NF15
NF17
NF16
NF12
NF13
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NF14
NF15
NF17
NF16
NF12
NF13
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60 NXP Semiconductors
Electrical Characteristics
In EDO mode (Figure 24), NF16/NF17 is different from the definition in non-EDO mode (Figure 23).
They are called tREA/tRHOH (RE# access time/RE# HIGH to output hold). The typical values for them
are 16 ns (max for tREA)/15 ns (min for tRHOH) at 50 MB/s EDO mode. In EDO mode, GPMI will
sample NAND_DATAxx at rising edge of delayed NAND_RE_B provided by an internal DPLL. The
delay value can be controlled by GPMI_CTRL1.RDN_DELAY (see the GPMI chapter of the i.MX 6ULL
Reference Manual). The typical value of this control register is 0x8 at 50 MT/s EDO mode. But if the board
delay is big enough and cannot be ignored, the delay value should be made larger to compensate the board
delay.
4.11.2 Source Synchronous Mode AC Timing (ONFI 2.x Compatible)
Figure 26 to Figure 28 show the write and read timing of Source Synchronous Mode.
NF6 NAND_ALE setup time tALS (AS + DS) T - 0.49 [see 3,2]ns
NF7 NAND_ALE hold time tALH (DH T - 0.42 [see 2]ns
NF8 Data setup time tDS DS T - 0.26 [see 2]ns
NF9 Data hold time tDH DH T - 1.37 [see 2]ns
NF10 Write cycle time tWC (DS + DH) T [see 2]ns
NF11 NAND_WE_B hold time tWH DH T [see 2]ns
NF12 Ready to NAND_RE_B low tRR4(AS + 2) T [see 3,2]—ns
NF13 NAND_RE_B pulse width tRP DS T [see 2]ns
NF14 READ cycle time tRC (DS + DH) T [see 2]ns
NF15 NAND_RE_B high hold time tREH DH T [see 2]ns
NF16 Data setup on read tDSR — (DS T -0.67)/18.38 [see 5,6]ns
NF17 Data hold on read tDHR 0.82/11.83 [see 5,6]—ns
1GPMI’s Async Mode output timing can be controlled by the module’s internal registers
HW_GPMI_TIMING0_ADDRESS_SETUP, HW_GPMI_TIMING0_DATA_SETUP, and HW_GPMI_TIMING0_DATA_HOLD.
This AC timing depends on these registers settings. In the table, AS/DS/DH represents each of these settings.
2 AS minimum value can be 0, while DS/DH minimum value is 1.
3T = GPMI clock period -0.075ns (half of maximum p-p jitter).
4NF12 is guaranteed by the design.
5Non-EDO mode.
6EDO mode, GPMI clock 100 MHz
(AS=DS=DH=1, GPMI_CTL1 [RDN_DELAY] = 8, GPMI_CTL1 [HALF_PERIOD] = 0).
Table 42. Asynchronous Mode Timing Parameters1 (continued)
ID Parameter Symbol
Timing
T = GPMI Clock Cycle Unit
Min. Max.
Electrical Characteristics
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NXP Semiconductors 61
Figure 26. Source Synchronous Mode Command and Address Timing Diagram
NF18
NF25 NF26
NF25 NF26
NF20
NF21
NF20
NF23
NF24
NF19
NF22
NF21
CMD ADD
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NAND_CLE
NAND_ALE
NAND_WE/RE_B
NAND_CLK
NAND_DQS
NAND_DQS
Output enable
NAND_DATA[7:0]
NAND_DATA[7:0]
Output enable
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62 NXP Semiconductors
Electrical Characteristics
Figure 27. Source Synchronous Mode Data Write Timing Diagram
Figure 28. Source Synchronous Mode Data Read Timing Diagram
NF23
NF18
NF25
NF26
NF27
NF25
NF26
NF28 NF28
NF29 NF29
NF23 NF24
NF24
NF19
NF27
NF22
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NF23
NF18
NF25
NF26
NF25
NF26
NF23 NF24
NF24
NF19
NF22
NF25
NF26
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Electrical Characteristics
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NXP Semiconductors 63
Figure 29. NAND_DQS/NAND_DQ Read Valid Window
For DDR Source sync mode, Figure 29 shows the timing diagram of NAND_DQS/NAND_DATAxx read
valid window. The typical value of tDQSQ is 0.85ns (max) and 1ns (max) for tQHS at 200MB/s. GPMI
will sample NAND_DATA[7:0] at both rising and falling edge of a delayed NAND_DQS signal, which
can be provided by an internal DPLL. The delay value can be controlled by GPMI register
GPMI_READ_DDR_DLL_CTRL.SLV_DLY_TARGET (see the GPMI chapter of the i.MX 6ULL
Reference Manual). Generally, the typical delay value of this register is equal to 0x7 which means 1/4
Table 43. Source Synchronous Mode Timing Parameters1
1GPMI’s source synchronous mode output timing can be controlled by the module’s internal registers
GPMI_TIMING2_CE_DELAY, GPMI_TIMING_PREAMBLE_DELAY, GPMI_TIMING2_POST_DELAY. This AC timing depends
on these registers settings. In the table, CE_DELAY/PRE_DELAY/POST_DELAY represents each of these settings.
ID Parameter Symbol
Timing
T = GPMI Clock Cycle Unit
Min. Max.
NF18 NAND_CE0_B access time tCE CE_DELAY T - 0.79 [see 2]
2T = tCK(GPMI clock period) -0.075ns (half of maximum p-p jitter).
ns
NF19 NAND_CE0_B hold time tCH 0.5 tCK - 0.63 [see 2]ns
NF20 Command/address NAND_DATAxx setup time tCAS 0.5 tCK - 0.05 ns
NF21 Command/address NAND_DATAxx hold time tCAH 0.5 tCK - 1.23 ns
NF22 Clock period tCK — ns
NF23 Preamble delay tPRE PRE_DELAY T - 0.29 [see 2]ns
NF24 Postamble delay tPOST POST_DELAY T - 0.78 [see 2]ns
NF25 NAND_CLE and NAND_ALE setup time tCALS 0.5 tCK - 0.86 ns
NF26 NAND_CLE and NAND_ALE hold time tCALH 0.5 tCK - 0.37 ns
NF27 NAND_CLK to first NAND_DQS latching transition tDQSS T - 0.41 [see 2]ns
NF28 Data write setup — 0.25 tCK - 0.35 —
NF29 Data write hold — 0.25 tCK - 0.85 —
NF30 NAND_DQS/NAND_DQ read setup skew — — 2.06 —
NF31 NAND_DQS/NAND_DQ read hold skew — — 1.95 —
D0 D1 D2 D3
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64 NXP Semiconductors
Electrical Characteristics
clock cycle delay expected. But if the board delay is big enough and cannot be ignored, the delay value
should be made larger to compensate the board delay.
4.11.3 Samsung Toggle Mode AC Timing
4.11.3.1 Command and Address Timing
NOTE
Samsung Toggle Mode command and address timing is the same as ONFI
1.0 compatible Async mode AC timing. See Section 4.11.1, Asynchronous
Mode AC Timing (ONFI 1.0 Compatible)",” for details.
4.11.3.2 Read and Write Timing
Figure 30. Samsung Toggle Mode Data Write Timing
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NXP Semiconductors 65
Figure 31. Samsung Toggle Mode Data Read Timing
Table 44. Samsung Toggle Mode Timing Parameters1
ID Parameter Symbo
l
Timing
T = GPMI Clock Cycle Uni
t
Min. Max.
NF1 NAND_CLE setup time tCLS (AS + DS) T - 0.12 [see 2,3]—
NF2 NAND_CLE hold time tCLH DH T - 0.72 [see 2]—
NF3 NAND_CE0_B setup time tCS (AS + DS) T - 0.58 [see 3,2]—
NF4 NAND_CE0_B hold time tCH DH T - 1 [see 2]—
NF5 NAND_WE_B pulse width tWP DS T [see 2]—
NF6 NAND_ALE setup time tALS (AS + DS) T - 0.49 [see 3,2]—
NF7 NAND_ALE hold time tALH DH T - 0.42 [see 2]—
NF8 Command/address NAND_DATAxx setup time tCAS DS T - 0.26 [see 2]—
NF9 Command/address NAND_DATAxx hold time tCAH DH T - 1.37 [see 2]—
NF18 NAND_CEx_B access time tCE CE_DELAY T [see 4,2]—ns
NF22 clock period tCK — — ns
DEV?CLK
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i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
66 NXP Semiconductors
Electrical Characteristics
For DDR Toggle mode, Figure 29 shows the timing diagram of NAND_DQS/NAND_DATAxx read valid
window. The typical value of tDQSQ is 1.4 ns (max) and 1.4 ns (max) for tQHS at 133 MB/s. GPMI will
sample NAND_DATA[7:0] at both rising and falling edge of an delayed NAND_DQS signal, which is
provided by an internal DPLL. The delay value of this register can be controlled by GPMI register
GPMI_READ_DDR_DLL_CTRL.SLV_DLY_TARGET (see the GPMI chapter of the i.MX 6ULL
Reference Manual). Generally, the typical delay value is equal to 0x7 which means 1/4 clock cycle delay
expected. But if the board delay is big enough and cannot be ignored, the delay value should be made larger
to compensate the board delay.
4.12 External Peripheral Interface Parameters
The following subsections provide information on external peripheral interfaces.
4.12.1 CMOS Sensor Interface (CSI) Timing Parameters
4.12.1.0.1 Gated Clock Mode Timing
Figure 32 and Figure 33 shows the gated clock mode timings for CSI, and Table 45 describes the timing
parameters (P1–P7) shown in the figures. A frame starts with a rising/falling edge on CSI_VSYNC
NF23 preamble delay tPRE PRE_DELAY T [see 5,2]—ns
NF24 postamble delay tPOST POST_DELAY T +0.43 [see 2]— ns
NF28 Data write setup tDS60.25 tCK - 0.32 — ns
NF29 Data write hold tDH60.25 tCK - 0.79 — ns
NF30 NAND_DQS/NAND_DQ read setup skew tDQSQ
7
—3.18—
NF31 NAND_DQS/NAND_DQ read hold skew tQHS7—3.27—
1The GPMI toggle mode output timing can be controlled by the module’s internal registers
HW_GPMI_TIMING0_ADDRESS_SETUP, HW_GPMI_TIMING0_DATA_SETUP, and HW_GPMI_TIMING0_DATA_HOLD.
This AC timing depends on these registers settings. In the table, AS/DS/DH represents each of these settings.
2 AS minimum value can be 0, while DS/DH minimum value is 1.
3T = tCK (GPMI clock period) -0.075ns (half of maximum p-p jitter).
4CE_DELAY represents HW_GPMI_TIMING2[CE_DELAY]. NF18 is guaranteed by the design. Read/Write operation is started
with enough time of ALE/CLE assertion to low level.
5PRE_DELAY+1) (AS+DS)
6Shown in Figure 30.
7Shown in Figure 31.
Table 44. Samsung Toggle Mode Timing Parameters1 (continued)
ID Parameter Symbo
l
Timing
T = GPMI Clock Cycle Uni
t
Min. Max.
Electrical Characteristics
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NXP Semiconductors 67
(VSYNC), then CSI_HSYNC (HSYNC) is asserted and holds for the entire line. The pixel clock,
CSI_PIXCLK (PIXCLK), is valid as long as HSYNC is asserted.
Figure 32. CSI Gated Clock Mode—Sensor Data at Falling Edge, Latch Data at Rising Edge
Figure 33. CSI Gated Clock Mode—Sensor Data at Rising Edge, Latch Data at Falling Edge
Table 45. CSI Gated Clock Mode Timing Parameters
ID Parameter Symbol Min. Max. Units
P1 CSI_VSYNC to CSI_HSYNC time tV2H 33.5 — ns
P2 CSI_HSYNC setup time tHsu 1 — ns
P3 CSI DATA setup time tDsu 1 — ns
P4 CSI DATA hold time tDh 1 — ns
P5 CSI pixel clock high time tCLKh 3.75 — ns
CSI_PIXCLK
CSI_VSYNC
CSI_DATA[15:00]
P5
P1
P3 P4
CSI_HSYNC
P2 P6
P7
CSI_PIXCLK
CSI_VSYNC
CSI_DATA[15:00]
P6
P1
P3 P4
CSI_HSYNC
P2 P5
P7
m AREA
// Hm
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Electrical Characteristics
4.12.1.0.2 Ungated Clock Mode Timing
Figure 34 shows the ungated clock mode timings of CSI, and Table 46 describes the timing parameters
(P1–P6) that are shown in the figure. In ungated mode the CSI_VSYNC and CSI_PIXCLK signals are
used, and the CSI_HSYNC signal is ignored.
Figure 34. CSI Ungated Clock Mode—Sensor Data at Falling Edge, Latch Data at Rising Edge
The CSI enables the chip to connect directly to external CMOS image sensors, which are classified as
dumb or smart as follows:
• Dumb sensors only support traditional sensor timing (vertical sync (VSYNC) and horizontal sync
(HSYNC)) and output-only Bayer and statistics data.
• Smart sensors support CCIR656 video decoder formats and perform additional processing of the
image (for example, image compression, image pre-filtering, and various data output formats).
P6 CSI pixel clock low time tCLKl 3.75 — ns
P7 CSI pixel clock frequency fCLK — 133.3 MHz
Table 46. CSI Ungated Clock Mode Timing Parameters
ID Parameter Symbol Min. Max. Units
P1 CSI_VSYNC to pixel clock time tVSYNC 33.5 — ns
P2 CSI DATA setup time tDsu 1 — ns
P3 CSI DATA hold time tDh 1 — ns
P4 CSI pixel clock high time tCLKh 3.75 — ns
P5 CSI pixel clock low time tCLKl 3.75 — ns
P6 CSI pixel clock frequency fCLK — 133.3 MHz
Table 45. CSI Gated Clock Mode Timing Parameters (continued)
ID Parameter Symbol Min. Max. Units
CSI_PIXCLK
CSI_VSYNC
CSI_DATA[15:00]
P4
P1
P2 P3
P5
P6
H {L
NN
ER w
HffiTmN—if:
”L
Electrical Characteristics
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NXP Semiconductors 69
4.12.2 ECSPI Timing Parameters
This section describes the timing parameters of the ECSPI blocks. The ECSPI have separate timing
parameters for master and slave modes.
4.12.2.1 ECSPI Master Mode Timing
Figure 35 depicts the timing of ECSPI in master mode. Table 47 lists the ECSPI master mode timing
characteristics.
Figure 35. ECSPI Master Mode Timing Diagram
Table 47. ECSPI Master Mode Timing Parameters
ID Parameter Symbol Min Max Unit
CS1 ECSPIx_SCLK Cycle Time–Read
ECSPIx_SCLK Cycle Time–Write
tclk 43
15
—ns
CS2 ECSPIx_SCLK High or Low Time–Read
ECSPIx_SCLK High or Low Time–Write
tSW 21.5
7
—ns
CS3 ECSPIx_SCLK Rise or Fall1
1See specific I/O AC parameters Section 4.7, I/O AC Parameters".”
tRISE/FALL ——ns
CS4 ECSPIx_SS_B pulse width tCSLH Half ECSPIx_SCLK period — ns
CS5 ECSPIx_SS_B Lead Time (CS setup time) tSCS Half ECSPIx_SCLK period - 4 — ns
CS6 ECSPIx_SS_B Lag Time (CS hold time) tHCS Half ECSPIx_SCLK period - 2 — ns
CS7 ECSPIx_MOSI Propagation Delay (CLOAD =20pF) t
PDmosi -1 1 ns
CS8 ECSPIx_MISO Setup Time tSmiso 14 — ns
CS9 ECSPIx_MISO Hold Time tHmiso 0—ns
CS10 RDY to ECSPIx_SS_B Time2
2SPI_RDY is sampled internally by ipg_clk and is asynchronous to all other CSPI signals.
tSDRY 5—ns
CS7
CS2
CS2
CS4
CS6 CS5
CS8 CS9
ECSPIx_SCLK
ECSPIx_SS_B
ECSPIx_MOSI
ECSPIx_MISO
ECSPIx_RDY_B
CS10
CS3
CS3
CS1
[\j 7 7
N
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Electrical Characteristics
4.12.2.2 ECSPI Slave Mode Timing
Figure 36 depicts the timing of ECSPI in slave mode. Table 48 lists the ECSPI slave mode timing
characteristics.
Figure 36. ECSPI Slave Mode Timing Diagram
4.12.3 Enhanced Serial Audio Interface (ESAI) Timing Parameters
The ESAI consists of independent transmitter and receiver sections, each section with its own clock
generator. Table 49 shows the interface timing values. The number field in the table refers to timing signals
found in Figure 37 and Figure 38.
Table 48. ECSPI Slave Mode Timing Parameters
ID Parameter Symbol Min Max Unit
CS1 ECSPIx_SCLK Cycle Time–Read
ECSPI_SCLK Cycle Time–Write
tclk 15
43
—ns
CS2 ECSPIx_SCLK High or Low Time–Read
ECSPIx_SCLK High or Low Time–Write
tSW 7
21.5
—ns
CS4 ECSPIx_SS_B pulse width tCSLH Half ECSPIx_SCLK period — ns
CS5 ECSPIx_SS_B Lead Time (CS setup time) tSCS 5—ns
CS6 ECSPIx_SS_B Lag Time (CS hold time) tHCS 5—ns
CS7 ECSPIx_MOSI Setup Time tSmosi 4—ns
CS8 ECSPIx_MOSI Hold Time tHmosi 4—ns
CS9 ECSPIx_MISO Propagation Delay (CLOAD =20pF) t
PDmiso 419ns
CS1
CS7 CS8
CS2
CS2
CS4
CS6 CS5
CS9
ECSPIx_SCLK
ECSPIx_SS_B
ECSPIx_MISO
ECSPIx_MOSI
Electrical Characteristics
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NXP Semiconductors 71
Table 49. Enhanced Serial Audio Interface (ESAI) Timing
No. Characteristics1,2
Symbol Expression2Min Max Condition3Unit
62 Clock cycle4tSSICC 4 Tc
4 Tc
30.0
30.0
—
—
i ck
i ck
ns
63 Clock high period:
• For internal clock
• For external clock
—
—
2 Tc 9.0
2 Tc
6
15
—
—
—
—
ns
64 Clock low period:
• For internal clock
• For external clock
—
—
2 Tc 9.0
2 Tc
6
15
—
—
—
—
ns
65 ESAI_RX_CLK rising edge to ESAI_RX_FS out (bl) high —
—
—
—
—
—
17.0
7.0
x ck
i ck a
ns
66 ESAI_RX_CLK rising edge to ESAI_RX_FS out (bl) low —
—
—
—
—
—
17.0
7.0
x ck
i ck a
ns
67 ESAI_RX_CLK rising edge to ESAI_RX_FS out (wr)
high5
—
—
—
—
—
—
19.0
9.0
x ck
i ck a
ns
68 ESAI_RX_CLK rising edge to ESAI_RX_FS out (wr) low5—
—
—
—
—
—
19.0
9.0
x ck
i ck a
ns
69 ESAI_RX_CLK rising edge to ESAI_RX_FS out (wl) high —
—
—
—
—
—
16.0
6.0
x ck
i ck a
ns
70 ESAI_RX_CLK rising edge to ESAI_RX_FS out (wl) low —
—
—
—
—
—
17.0
7.0
x ck
i ck a
ns
71 Data in setup time before ESAI_RX_CLK (SCK in
synchronous mode) falling edge
—
—
—
—
12.0
19.0
—
—
x ck
i ck
ns
72 Data in hold time after ESAI_RX_CLK falling edge —
—
—
—
3.5
9.0
—
—
x ck
i ck
ns
73 ESAI_RX_FS input (bl, wr) high before ESAI_RX_CLK
falling edge5
—
—
—
—
2.0
12.0
—
—
x ck
i ck a
ns
74 ESAI_RX_FS input (wl) high before ESAI_RX_CLK
falling edge
—
—
—
—
2.0
12.0
—
—
x ck
i ck a
ns
75 ESAI_RX_FS input hold time after ESAI_RX_CLK falling
edge
—
—
—
—
2.5
8.5
—
—
x ck
i ck a
ns
76 Flags input setup before ESAI_RX_CLK falling edge —
—
—
—
0.0
19.0
—
—
x ck
i ck s
ns
77 Flags input hold time after ESAI_RX_CLK falling edge —
—
—
—
6.0
0.0
—
—
x ck
i ck s
ns
78 ESAI_TX_CLK rising edge to ESAI_TX_FS out (bl) high —
—
—
—
—
—
18.0
8.0
x ck
i ck
ns
79 ESAI_TX_CLK rising edge to ESAI_TX_FS out (bl) low —
—
—
—
—
—
20.0
10.0
x ck
i ck
ns
80 ESAI_TX_CLK rising edge to ESAI_TX_FS out (wr)
high5
—
—
—
—
—
—
20.0
10.0
x ck
i ck
ns
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Electrical Characteristics
81 ESAI_TX_CLK rising edge to ESAI_TX_FS out (wr) low5 —
—
—
—
—
—
22.0
12.0
x ck
i ck
ns
82 ESAI_TX_CLK rising edge to ESAI_TX_FS out (wl) high —
—
—
—
—
—
19.0
9.0
x ck
i ck
ns
83 ESAI_TX_CLK rising edge to ESAI_TX_FS out (wl) low —
—
—
—
—
—
20.0
10.0
x ck
i ck
ns
84 ESAI_TX_CLK rising edge to data out enable from high
impedance
—
—
—
—
—
—
22.0
17.0
x ck
i ck
ns
85 ESAI_TX_CLK rising edge to transmitter #0 drive enable
assertion
—
—
—
—
—
—
17.0
11.0
x ck
i ck
ns
86 ESAI_TX_CLK rising edge to data out valid —
—
—
—
—
—
18.0
13.0
x ck
i ck
ns
87 ESAI_TX_CLK rising edge to data out high impedance 67 —
—
—
—
—
—
21.0
16.0
x ck
i ck
ns
88 ESAI_TX_CLK rising edge to transmitter #0 drive enable
deassertion7
———
—
14.0
9.0
x ck
i ck
ns
89 ESAI_TX_FS input (bl, wr) setup time before
ESAI_TX_CLK falling edge5
—
—
—
—
2.0
18.0
—
—
x ck
i ck
ns
90 ESAI_TX_FS input (wl) setup time before ESAI_TX_CLK
falling edge
—
—
—
—
2.0
18.0
—
—
x ck
i ck
ns
91 ESAI_TX_FS input hold time after ESAI_TX_CLK falling
edge
—
—
—
—
4.0
5.0
—
—
x ck
i ck
ns
92 ESAI_TX_FS input (wl) to data out enable from high
impedance
———21.0—ns
93 ESAI_TX_FS input (wl) to transmitter #0 drive enable
assertion
———14.0—ns
94 Flag output valid after ESAI_TX_CLK rising edge — — —
—
14.0
9.0
x ck
i ck
ns
95 ESAI_RX_HF_CLK/ESAI_TX_HF_CLK clock cycle — 2 x TC15 — — ns
96 ESAI_TX_HF_CLK input rising edge to ESAI_TX_CLK
output
———18.0—ns
97 ESAI_RX_HF_CLK input rising edge to ESAI_RX_CLK
output
———18.0—ns
1i ck = internal clock
x ck = external clock
i ck a = internal clock, asynchronous mode
(asynchronous implies that ESAI_TX_CLK and ESAI_RX_CLK are two different clocks)
i ck s = internal clock, synchronous mode
(synchronous implies that ESAI_TX_CLK and ESAI_RX_CLK are the same clock)
Table 49. Enhanced Serial Audio Interface (ESAI) Timing (continued)
No. Characteristics1,2
Symbol Expression2Min Max Condition3Unit
Electrical Characteristics
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NXP Semiconductors 73
Figure 37. ESAI Transmitter Timing
2bl = bit length
wl = word length
wr = word length relative
3ESAI_TX_CLK(SCKT pin) = transmit clock
ESAI_RX_CLK(SCKR pin) = receive clock
ESAI_TX_FS(FST pin) = transmit frame sync
ESAI_RX_FS(FSR pin) = receive frame sync
ESAI_TX_HF_CLK(HCKT pin) = transmit high frequency clock
ESAI_RX_HF_CLK(HCKR pin) = receive high frequency clock
4For the internal clock, the external clock cycle is defined by Icyc and the ESAI control register.
5The word-relative frame sync signal waveform relative to the clock operates in the same manner as the bit-length frame sync
signal waveform, but it spreads from one serial clock before the first bit clock (like the bit length frame sync signal), until the
second-to-last bit clock of the first word in the frame.
6Periodically sampled and not 100% tested.
ESAI_TX_CLK
(Input/Output)
ESAI_TX_FS
(Bit)
Out
ESAI_TX_FS
(Word)
Out
Data Out
ESAI_TX_FS
(Bit) In
ESAI_TX_FS
(Word) In
62
64
78 79
82 83
87
8686
84
91
89
90 91
63
Last BitFirst Bit
O
m
—55—
a
M
n X
(r
u
_:J%4;E
0&_
_J/—‘
W
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74 NXP Semiconductors
Electrical Characteristics
Figure 38. ESAI Receiver Timing
Figure 39. ESAI ESAI_TX_HF_CLK Timing
ESAI_RX_CLK
(Input/Output)
ESAI_RX_FS
(Bit)
Out
ESAI_RX_FS
(Word)
Out
Data In
ESAI_RX_FS
(Bit)
In
ESAI_RX_FS
(Word)
In
62
64
65
69 70
72
71
75
73
74 75
63
66
First Bit Last Bit
ESAI_TX_HF_CLK
ESAI_TX_CLK (output)
96
95
+
a
+4—
EU
4—»
W ij /)
4
’m
Electrical Characteristics
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NXP Semiconductors 75
4.12.4 Ultra High Speed SD/SDIO/MMC Host Interface (uSDHC) AC
timing
This section describes the electrical information of the uSDHC, which includes SD/eMMC4.3 (Single
Data Rate) timing, eMMC4.4/4.41 (Dual Date Rate) timing and SDR104/50(SD3.0) timing.
4.12.4.1 SD/eMMC4.3 (Single Data Rate) AC Timing
Figure 40 depicts the timing of SD/eMMC4.3, and Table 50 lists the SD/eMMC4.3 timing characteristics.
Figure 40. SD/eMMC4.3 Timing
Table 50. SD/eMMC4.3 Interface Timing Specification
ID Parameter Symbols Min Max Unit
Card Input Clock
SD1 Clock Frequency (Low Speed) fPP10 400 kHz
Clock Frequency (SD/SDIO Full Speed/High Speed) fPP20 25/50 MHz
Clock Frequency (MMC Full Speed/High Speed) fPP30 20/52 MHz
Clock Frequency (Identification Mode) fOD 100 400 kHz
SD2 Clock Low Time tWL 7—ns
SD3 Clock High Time tWH 7—ns
SD4 Clock Rise Time tTLH —3ns
SD5 Clock Fall Time tTHL —3ns
uSDHC Output/Card Inputs SD_CMD, SDx_DATAx (Reference to CLK)
SD6 uSDHC Output Delay tOD -6.6 3.6 ns
SD1
SD3
SD5
SD4
SD7
SDx_CLK
SD2
SD8
SD6
Output from uSDHC to card
Input from card to uSDHC
SDx_DATA[7:0]
SDx_DATA[7:0]
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Electrical Characteristics
4.12.4.2 eMMC4.4/4.41 (Dual Data Rate) AC Timing
Figure 41 depicts the timing of eMMC4.4/4.41. Table 51 lists the eMMC4.4/4.41 timing characteristics.
Be aware that only DATA is sampled on both edges of the clock (not applicable to CMD).
Figure 41. eMMC4.4/4.41 Timing
uSDHC Input/Card Outputs SD_CMD, SDx_DATAx (Reference to CLK)
SD7 uSDHC Input Setup Time tISU 2.5 — ns
SD8 uSDHC Input Hold Time4tIH 1.5 — ns
1In low speed mode, card clock must be lower than 400 kHz, voltage ranges from 2.7 to 3.6 V.
2In normal (full) speed mode for SD/SDIO card, clock frequency can be any value between 0–25 MHz. In high-speed mode,
clock frequency can be any value between 0–50 MHz.
3In normal (full) speed mode for MMC card, clock frequency can be any value between 0–20 MHz. In high-speed mode, clock
frequency can be any value between 0–52 MHz.
4To satisfy hold timing, the delay difference between clock input and cmd/data input must not exceed 2 ns.
Table 51. eMMC4.4/4.41 Interface Timing Specification
ID Parameter Symbols Min Max Unit
Card Input Clock
SD1 Clock Frequency (eMMC4.4/4.41 DDR) fPP 052MHz
SD1 Clock Frequency (SD3.0 DDR) fPP 050MHz
uSDHC Output / Card Inputs SD_CMD, SDx_DATAx (Reference to CLK)
SD2 uSDHC Output Delay tOD 2.5 7.1 ns
uSDHC Input / Card Outputs SD_CMD, SDx_DATAx (Reference to CLK)
SD3 uSDHC Input Setup Time tISU 1.7 — ns
SD4 uSDHC Input Hold Time tIH 1.5 — ns
Table 50. SD/eMMC4.3 Interface Timing Specification (continued)
ID Parameter Symbols Min Max Unit
SD1
SD2
SD3
Output from eSDHCv3 to card
Input from card to eSDHCv3
SDx_DATA[7:0]
SDx_CLK
SD4
SD2
......
......
SDx_DATA[7:0]
Electrical Characteristics
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NXP Semiconductors 77
4.12.4.3 SDR50/SDR104 AC Timing
Figure 42 depicts the timing of SDR50/SDR104, and Table 52 lists the SDR50/SDR104 timing
characteristics.
Figure 42. SDR50/SDR104 Timing
Table 52. SDR50/SDR104 Interface Timing Specification
ID Parameter Symbols Min Max Unit
Card Input Clock
SD1 Clock Frequency Period tCLK 5.0 — ns
SD2 Clock Low Time tCL 0.46 x tCLK 0.54 x tCLK ns
SD3 Clock High Time tCH 0.46 x tCLK 0.54 x tCLK ns
uSDHC Output/Card Inputs SD_CMD, SDx_DATAx in SDR50 (Reference to CLK)
SD4 uSDHC Output Delay tOD –3 1 ns
uSDHC Output/Card Inputs SD_CMD, SDx_DATAx in SDR104 (Reference to CLK)
SD5 uSDHC Output Delay tOD –1.6 0.74 ns
uSDHC Input/Card Outputs SD_CMD, SDx_DATAx in SDR50 (Reference to CLK)
SD6 uSDHC Input Setup Time tISU 2.5 — ns
SD7 uSDHC Input Hold Time tIH 1.5 — ns
uSDHC Input/Card Outputs SD_CMD, SDx_DATAx in SDR104 (Reference to CLK)1
1Data window in SDR104 mode is variable.
SD8 Card Output Data Window tODW 0.5 x tCLK —ns
SCK
4-bit output from uSDHC to card
4-bit input from card to uSDHC
SD8
SD7
SD6
SD4/SD5
SD2 SD3
SD1
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Electrical Characteristics
4.12.4.4 HS200 Mode Timing
Figure 43 depicts the timing of HS200 mode, and Table 53 lists the HS200 timing characteristics.
Figure 43. HS200 Mode Timing
4.12.4.5 Bus Operation Condition for 3.3 V and 1.8 V Signaling
Signaling level of SD/eMMC4.3 and eMMC4.4/4.41 modes is 3.3 V. Signaling level of SDR104/SDR50
mode is 1.8 V. The DC parameters for the NVCC_SD1 supply are identical to those shown in Table 24,
"Single Voltage GPIO DC Parameters," on page 38.
4.12.5 Ethernet Controller (ENET) AC Electrical Specifications
The following timing specs are defined at the chip I/O pin and must be translated appropriately to arrive
at timing specs/constraints for the physical interface.
Table 53. HS200 Interface Timing Specification
ID Parameter Symbols Min Max Unit
Card Input Clock
SD1 Clock Frequency Period tCLK 5.0 — ns
SD2 Clock Low Time tCL 0.46 x tCLK 0.54 x tCLK ns
SD3 Clock High Time tCH 0.46 x tCLK 0.54 x tCLK ns
uSDHC Output/Card Inputs SD_CMD, SDx_DATAx in HS200 (Reference to CLK)
SD5 uSDHC Output Delay tOD –1.6 0.74 ns
uSDHC Input/Card Outputs SD_CMD, SDx_DATAx in HS200 (Reference to CLK)1
1HS200 is for 8 bits while SDR104 is for 4 bits.
SD8 Card Output Data Window tODW 0.5 x tCLK —ns
SCK
8-bit output from uSDHC to eMMC
8-bit input from eMMC to uSDHC
SD8
SD4/SD5
SD2 SD3
SD1
F6134
Electrical Characteristics
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 79
4.12.5.1 ENET MII Mode Timing
This subsection describes MII receive, transmit, asynchronous inputs, and serial management signal
timings.
4.12.5.1.1 MII Receive Signal Timing (ENET_RX_DATA3,2,1,0, ENET_RX_EN,
ENET_RX_ER, and ENET_RX_CLK)
The receiver functions correctly up to an ENET_RX_CLK maximum frequency of 25 MHz + 1%. There
is no minimum frequency requirement. Additionally, the processor clock frequency must exceed twice the
ENET_RX_CLK frequency.
Figure 44 shows MII receive signal timings. Table 54 describes the timing parameters (M1–M4) shown in
the figure.
Figure 44. MII Receive Signal Timing Diagram
1 ENET_RX_EN, ENET_RX_CLK, and ENET0_RXD0 have the same timing in 10 Mbps 7-wire interface mode.
4.12.5.1.2 MII Transmit Signal Timing (ENET_TX_DATA3,2,1,0, ENET_TX_EN,
ENET_TX_ER, and ENET_TX_CLK)
The transmitter functions correctly up to an ENET_TX_CLK maximum frequency of 25 MHz + 1%.
There is no minimum frequency requirement. Additionally, the processor clock frequency must exceed
twice the ENET_TX_CLK frequency.
Table 54. MII Receive Signal Timing
ID Characteristic1Min. Max. Unit
M1 ENET_RX_DATA3,2,1,0, ENET_RX_EN, ENET_RX_ER to
ENET_RX_CLK setup
5— ns
M2 ENET_RX_CLK to ENET_RX_DATA3,2,1,0, ENET_RX_EN,
ENET_RX_ER hold
5— ns
M3 ENET_RX_CLK pulse width high 35% 65% ENET_RX_CLK period
M4 ENET_RX_CLK pulse width low 35% 65% ENET_RX_CLK period
ENET_RX_CLK (input)
ENET_RX_DATA3,2,1,0
M3
M4
M1 M2
ENET_RX_ER
ENET_RX_EN
(inputs)
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80 NXP Semiconductors
Electrical Characteristics
Figure 45 shows MII transmit signal timings. Table 55 describes the timing parameters (M5–M8) shown
in the figure.
Figure 45. MII Transmit Signal Timing Diagram
1 ENET_TX_EN, ENET_TX_CLK, and ENET0_TXD0 have the same timing in 10-Mbps 7-wire interface mode.
4.12.5.1.3 MII Asynchronous Inputs Signal Timing (ENET_CRS and ENET_COL)
Figure 46 shows MII asynchronous input timings. Table 56 describes the timing parameter (M9) shown in
the figure.
Figure 46. MII Async Inputs Timing Diagram
1 ENET_COL has the same timing in 10-Mbit 7-wire interface mode.
Table 55. MII Transmit Signal Timing
ID Characteristic1Min. Max. Unit
M5 ENET_TX_CLK to ENET_TX_DATA3,2,1,0, ENET_TX_EN,
ENET_TX_ER invalid
5— ns
M6 ENET_TX_CLK to ENET_TX_DATA3,2,1,0, ENET_TX_EN,
ENET_TX_ER valid
—20 ns
M7 ENET_TX_CLK pulse width high 35% 65% ENET_TX_CLK period
M8 ENET_TX_CLK pulse width low 35% 65% ENET_TX_CLK period
Table 56. MII Asynchronous Inputs Signal Timing
ID Characteristic Min. Max. Unit
M91ENET_CRS to ENET_COL minimum pulse width 1.5 — ENET_TX_CLK period
ENET_TX_CLK (input)
ENET_TX_DATA3,2,1,0
M7
M8
M5
M6
ENET_TX_ER
ENET_TX_EN
(outputs)
ENET_CRS, ENET_COL
M9
Electrical Characteristics
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4.12.5.1.4 MII Serial Management Channel Timing (ENET_MDIO and ENET_MDC)
The MDC frequency is designed to be equal to or less than 2.5 MHz to be compatible with the IEEE 802.3
MII specification. However the ENET can function correctly with a maximum MDC frequency of
15 MHz.
Figure 47 shows MII asynchronous input timings. Table 57 describes the timing parameters (M10–M15)
shown in the figure.
Figure 47. MII Serial Management Channel Timing Diagram
4.12.5.2 RMII Mode Timing
In RMII mode, ENET_CLK is used as the REF_CLK, which is a 50 MHz ± 50 ppm continuous reference
clock. ENET_RX_EN is used as the RMII_CRS_DV in RMII. Other signals under RMII mode include
ENET_TX_EN, ENET_TX_DATA[1:0], ENET_RX_DATA[1:0], and ENET_RX_ER.
Table 57. MII Serial Management Channel Timing
ID Characteristic Min. Max. Unit
M10 ENET_MDC falling edge to ENET_MDIO output invalid (min.
propagation delay)
0— ns
M11 ENET_MDC falling edge to ENET_MDIO output valid (max.
propagation delay)
—5 ns
M12 ENET_MDIO (input) to ENET_MDC rising edge setup 18 — ns
M13 ENET_MDIO (input) to ENET_MDC rising edge hold 0 — ns
M14 ENET_MDC pulse width high 40% 60% ENET_MDC period
M15 ENET_MDC pulse width low 40% 60% ENET_MDC period
ENET_MDC (output)
ENET_MDIO (output)
M14
M15
M10
M11
M12 M13
ENET_MDIO (input)
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Figure 48 shows RMII mode timings. Table 58 describes the timing parameters (M16–M21) shown in the
figure.
Figure 48. RMII Mode Signal Timing Diagram
4.12.6 Flexible Controller Area Network (FLEXCAN) AC Electrical
Specifications
The Flexible Controller Area Network (FlexCAN) module is a communication controller implementing
the CAN protocol according to the CAN 2.0B protocol specification. The processor has two CAN modules
available for systems design. Tx and Rx ports for both modules are multiplexed with other I/O pins. See
the IOMUXC chapter of the i.MX 6ULL Reference Manual (IMX6ULLRM) to see which pins expose Tx
and Rx pins; these ports are named FLEXCAN_TX and FLEXCAN_RX, respectively.
Table 58. RMII Signal Timing
ID Characteristic Min. Max. Unit
M16 ENET_CLK pulse width high 35% 65% ENET_CLK period
M17 ENET_CLK pulse width low 35% 65% ENET_CLK period
M18 ENET_CLK to ENET0_TXD[1:0], ENET_TX_DATA invalid 4 — ns
M19 ENET_CLK to ENET0_TXD[1:0], ENET_TX_DATA valid — 13 ns
M20 ENET_RX_DATAD[1:0], ENET_RX_EN(ENET_RX_EN), ENET_RX_ER
to ENET_CLK setup
2— ns
M21 ENET_CLK to ENET_RX_DATAD[1:0], ENET_RX_EN, ENET_RX_ER
hold
2— ns
ENET_CLK (input)
ENET_TX_EN
M16
M17
M18
M19
M20 M21
ENET_RX_DATA[1:0]
ENET_TX_DATA (output)
ENET_RX_ER
ENET_RX_EN (input)
Electrical Characteristics
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4.12.7 I2C Bus Characteristics
The Inter-Integrated Circuit (I2C) provides functionality of a standard I2C master and slave. The I2C is
designed to be compatible with the I2C Bus Specification, version 2.1, by Philips Semiconductor (now
NXP Semiconductors).
4.12.8 Pulse Width Modulator (PWM) Timing Parameters
This section describes the electrical information of the PWM. The PWM can be programmed to select one
of three clock signals as its source frequency. The selected clock signal is passed through a prescaler before
being input to the counter. The output is available at the pulse-width modulator output (PWMO) external
pin.
Figure 49 depicts the timing of the PWM, and Table 59 lists the PWM timing parameters.
Figure 49. PWM Timing
Table 59. PWM Output Timing Parameters
ID Parameter Min Max Unit
PWM Module Clock Frequency 0 66 MHz
P1 PWM output pulse width high 15 — ns
P2 PWM output pulse width low 15 — ns
07-N?/54
0 0
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4.12.9 LCD Controller (LCDIF) Parameters
Figure 50 shows the LCDIF timing and Table 60 lists the timing parameters.
Figure 50. LCD Timing
4.12.9.1 LCDIF Signal Mapping
Table 61 lists the details about the mapping signals.
Table 60. LCD Timing Parameters
ID Parameter Symbol Min Max Unit
L1 LCD pixel clock frequency tCLK(LCD) — 150 MHz
L2 LCD pixel clock high (falling edge capture) tCLKH(LCD) 3 — ns
L3 LCD pixel clock low (rising edge capture) tCLKL(LCD) 3 — ns
L4 LCD pixel clock high to data valid (falling edge capture) td(CLKH-DV) -1 1 ns
L5 LCD pixel clock low to data valid (rising edge capture) td(CLKL-DV) -1 1 ns
L6 LCD pixel clock high to control signal valid (falling edge capture) td(CLKH-CTRLV) -1 1 ns
L7 LCD pixel clock low to control signal valid (rising edge capture) td(CLKL-CTRLV) -1 1 ns
Table 61. LCD Timing Parameters
Pin name 8-bit DOTCLK LCD
IF
16-bit DOTCLK LCD
IF
18-bit DOTCLK LCD
IF
24-bit DOTCLK LCD
IF
8-bit DVI LCD
IF
LCD_RS — — — — CCIR_CLK
LCD_VSYNC*
(Two options)
LCD_VSYNC LCD_VSYNC LCD_VSYNC LCD_VSYNC —
LCD_HSYNC LCD_HSYNC LCD_HSYNC LCD_HSYNC LCD_HSYNC —
LCD_DOTCLK LCD_DOTCLK LCD_DOTCLK LCD_DOTCLK LCD_DOTCLK —
L1 L2 L3
L4
LCDn_CLK
(falling edge capture)
LCDn_CLK
(rising edge capture)
LCDn_DATA[23:00]
LCDn Control Signals
L5
L6
L7
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LCD_ENABLE LCD_ENABLE LCD_ENABLE LCD_ENABLE LCD_ENABLE —
LCD_D23 — — — R[7] —
LCD_D22 — — — R[6] —
LCD_D21 — — — R[5] —
LCD_D20 — — — R[4] —
LCD_D19 — — — R[3] —
LCD_D18 — — — R[2] —
LCD_D17 — — R[5] R[1] —
LCD_D16 — — R[4] R[0] —
LCD_D15 /
VSYNC*
— R[4] R[3] G[7] —
LCD_D14 /
HSYNC**
— R[3] R[2] G[6] —
LCD_D13 /
LCD_DOTCLK
**
— R21] R[1] G[5] —
LCD_D12 /
ENABLE**
— R[1] R[0] G[4] —
LCD_D11 — R[0] G[5] G[3] —
LCD_D10 — G[5] G[4] G[2] —
LCD_D9 — G[4] G[3] G[1] —
LCD_D8 — G[3] G[2] G[0] —
LCD_D8 — G[3] G[2] G[0] —
LCD_D7 R[2] G[2] G[1] B[7] Y/C[7]
LCD_D6 R[1] G[1] G[0] B[6] Y/C[6]
LCD_D5 R[0] G[0] B[5] B[5] Y/C[5]
LCD_D4 G[2] B[4] B[4] B[4] Y/C[4]
LCD_D3 G[1] B[3] B[3] B[3] Y/C[3]
LCD_D2 G[0] B[2] B[2] B[2] Y/C[2]
LCD_D1 B[1] B[1] B[1] B[1] Y/C[1]
LCD_D0 B[0] B[0] B[0] B[0] Y/C[0]
LCD_RESET LCD_RESET LCD_RESET LCD_RESET LCD_RESET —
LCD_BUSY /
LCD_VSYNC
LCD_BUSY (or
optional
LCD_VSYNC)
LCD_BUSY (or
optional LCD_VSYNC)
LCD_BUSY (or
optional
LCD_VSYNC)
LCD_BUSY (or
optional
LCD_VSYNC)
—
Table 61. LCD Timing Parameters (continued)
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4.12.10 QUAD SPI (QSPI) Timing Parameters
Measurement conditions are with 35 pF load on SCK and SIO pins and input slew rate of 1 V/ns.
4.12.10.1 SDR Mode
Figure 51. QuadSPI Input/Read Timing (SDR mode with internal sampling)
Figure 52. QuadSPI Input/Read Timing (SDR mode with loopback DQS sampling)
NOTE
• For internal sampling, the timing values assumes using sample point 0,
that is QuadSPIx_SMPR[SDRSMP] = 0.
Table 62. QuadSPI Input Timing (SDR mode with internal sampling)
Symbol Parameter
Value
Unit
Min Max
TIS Setup time for incoming data 8.67 — ns
TIH Hold time requirement for incoming data 0 — ns
Table 63. QuadSPI Input/Read Timing (SDR mode with loopback DQS sampling)
Symbol Parameter
Value
Unit
Min Max
TIS Setup time for incoming data 2 — ns
TIH Hold time requirement for incoming data 1 — ns
TIS TIH TIS TIH
QSPIx_SCLK
QSPIx_DATA[0:3]
1234
TIS TIS TIHTIH
QSPIx_SCLK
QSPIx_DATA[0:3]
QSPIx_DQS
Electrical Characteristics
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• For loopback DQS sampling, the data strobe is output to the DQS pad
together with the serial clock. The data strobe is looped back from DQS
pad and used to sample input data.
Figure 53. QuadSPI Output/Write Timing (SDR mode)
NOTE
Tcss and Tcsh are configured by the QuadSPIx_FLSHCR register, the default
value of 3 are shown on the timing. Please refer to the i.MX 6ULL Reference
Manual (IMX6ULLRM) for more details.
Table 64. QuadSPI Output/Write Timing (SDR mode)
Symbol Parameter
Value
Unit
Min Max
TDVO Output data valid time — 2 ns
TDHO Output data hold time -0.5 — ns
TCK SCK clock period 10 — ns
TCSS Chip select output setup time 3 — SCK cycle(s)
TCSH Chip select output hold time 3 — SCK cycle(s)
TCSS TCK TCSH
TDVO
TDHO
TDVO
TDHO
QSPIx_SCLK
QSPIx_CS
QSPIx_SIO
1|
+
_H
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4.12.10.2 DDR Mode
Figure 54. QuadSPI Input/Read Timing (DDR mode with internal sampling)
Figure 55. QuadSPI Input/Read Timing (DDR mode with loopback DQS sampling)
NOTE
• For internal sampling, the timing values assumes using sample point 0,
that is QuadSPIx_SMPR[SDRSMP] = 0.
Table 65. QuadSPI Input/Read Timing (DDR mode with internal sampling)
Symbol Parameter
Value
Unit
Min Max
TIS Setup time for incoming data 8.67 — ns
TIH Hold time requirement for incoming data 0 — ns
Table 66. QuadSPI Input/Read Timing (DDR mode with loopback DQS sampling)
Symbol Parameter
Value
Unit
Min Max
TIS Setup time for incoming data 2 — ns
TIH Hold time requirement for incoming data 1 — ns
TIS TIH
T
IS
T
IH
QSPIx_SCLK
QSPIx_DATA[0:3]
1234
TIS TIHTIS TIH
QSPIx_SCLK
QSPIx_DATA[0:3]
QSPIx_DQS
Electrical Characteristics
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• For loopback DQS sampling, the data strobe is output to the DQS pad
together with the serial clock. The data strobe is looped back from DQS
pad and used to sample input data.
Figure 56. QuadSPI Output/Write Timing (DDR mode)
NOTE
Tcss and Tcsh are configured by the QuadSPIx_FLSHCR register, the default
value of 3 are shown on the timing. Please refer to the i.MX 6ULL Reference
Manual (IMX6ULLRM) for more details.
4.12.11 SAI/I2S Switching Specifications
This section provides the AC timings for the SAI in master (clocks driven) and slave (clocks input) modes.
All timings are given for non-inverted serial clock polarity (SAI_TCR[TSCKP] = 0, SAI_RCR[RSCKP]
= 0) and non-inverted frame sync (SAI_TCR[TFSI] = 0, SAI_RCR[RFSI] = 0). If the polarity of the clock
and/or the frame sync have been inverted, all the timings remain valid by inverting the clock signal
(SAI_BCLK) and/or the frame sync (SAI_FS) shown in the figures below.
Table 67. QuadSPI Output/Write Timing (DDR mode)
Symbol Parameter
Value
Unit
Min Max
TDVO Output data valid time — (0.25 x TSCLK) + 2 ns
TDHO Output data hold time (0.25 x TSCLK) - 0.5 — ns
TCK SCK clock period 20 — ns
TCSS Chip select output setup time 3 — SCK cycle(s)
TCSH Chip select output hold time 3 — SCK cycle(s)
Table 68. Master Mode SAI Timing
Num Characteristic Min Max Unit
S1 SAI_MCLK cycle time 2 x tsys —ns
S2 SAI_MCLK pulse width high/low 40% 60% MCLK period
S3 SAI_BCLK cycle time 4 x tsys —ns
S4 SAI_BCLK pulse width high/low 40% 60% BCLK period
12
TCSS TCK
TDVO
TDHO
TDVO
TDHO
TCSH
QSPIx_SCLK
QSPIx_CS
QSPIx_SIO
IZSJACLK (output)
IszCLK (outpul)
|2$_FS mucpun
IZSJS unpuu
IZSiTXD
|2$_HXD
.4311 —V.s2 fl— —V.sz ’—
*l
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Figure 57. SAI Timing — Master Modes
S5 SAI_BCLK to SAI_FS output valid — 15 ns
S6 SAI_BCLK to SAI_FS output invalid 0 — ns
S7 SAI_BCLK to SAI_TXD valid — 15 ns
S8 SAI_BCLK to SAI_TXD invalid 0 — ns
S9 SAI_RXD/SAI_FS input setup before SAI_BCLK 15 — ns
S10 SAI_RXD/SAI_FS input hold after SAI_BCLK 0 — ns
Table 69. Master Mode SAI Timing
Num Characteristic Min Max Unit
S11 SAI_BCLK cycle time (input) 4 x tsys —ns
S12 SAI_BCLK pulse width high/low (input) 40% 60% BCLK period
S13 SAI_FS input setup before SAI_BCLK 10 — ns
S14 SAI_FA input hold after SAI_BCLK 2 — ns
S15 SAI_BCLK to SAI_TXD/SAI_FS output valid — 20 ns
S16 SAI_BCLK to SAI_TXD/SAI_FS output invalid 0 — ns
S17 SAI_RXD setup before SAI_BCLK 10 — ns
S18 SAI_RXD hold after SAI_BCLK 2 — ns
Table 68. Master Mode SAI Timing (continued)
Num Characteristic Min Max Unit
lasJCLK (Input)
Izsjs (output)
Izsjs (mun)
|2S_TXD
I2S,RXD
Electrical Characteristics
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Figure 58. SAI Timing — Slave Modes
4.12.12 SCAN JTAG Controller (SJC) Timing Parameters
Figure 59 depicts the SJC test clock input timing. Figure 60 depicts the SJC boundary scan timing.
Figure 61 depicts the SJC test access port. Signal parameters are listed in Table 70.
Figure 59. Test Clock Input Timing Diagram
JTAG_TCK
(Input) VM VM
VIH VIL
SJ1
SJ2 SJ2
SJ3
SJ3
4* H SJ5—>
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Figure 60. Boundary Scan (JTAG) Timing Diagram
JTAG_TCK
(Input)
Data
Inputs
Data
Outputs
Data
Outputs
Data
Outputs
VIH
VIL
Input Data Valid
Output Data Valid
Output Data Valid
SJ4 SJ5
SJ6
SJ7
SJ6
Electrical Characteristics
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Figure 61. Test Access Port Timing Diagram
Figure 62. JTAG_TRST_B Timing Diagram
Table 70. JTAG Timing
ID Parameter1,2
All Frequencies
Unit
Min Max
SJ0 JTAG_TCK frequency of operation 1/(3•TDC)10.001 22 MHz
SJ1 JTAG_TCK cycle time in crystal mode 45 — ns
SJ2 JTAG_TCK clock pulse width measured at VM222.5 — ns
SJ3 JTAG_TCK rise and fall times — 3 ns
SJ4 Boundary scan input data set-up time 5 — ns
SJ5 Boundary scan input data hold time 24 — ns
SJ6 JTAG_TCK low to output data valid — 40 ns
SJ7 JTAG_TCK low to output high impedance — 40 ns
JTAG_TCK
(Input)
JTAG_TDI
(Input)
JTAG_TDO
(Output)
JTAG_TDO
(Output)
JTAG_TDO
(Output)
VIH
VIL
Input Data Valid
Output Data Valid
Output Data Valid
JTAG_TMS
SJ8 SJ9
SJ10
SJ11
SJ10
JTAG_TCK
(Input)
JTAG_TRST_B
(Input)
SJ13
SJ12
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4.12.13 SPDIF Timing Parameters
The Sony/Philips Digital Interface Format (SPDIF) data is sent using the bi-phase marking code. When
encoding, the SPDIF data signal is modulated by a clock that is twice the bit rate of the data signal.
Table 71, Figure 63, and Figure 64 show SPDIF timing parameters for the Sony/Philips Digital
Interconnect Format (SPDIF), including the timing of the modulating Rx clock (SPDIF_SR_CLK) for
SPDIF in Rx mode and the timing of the modulating Tx clock (SPDIF_ST_CLK) for SPDIF in Tx mode.
SJ8 JTAG_TMS, JTAG_TDI data set-up time 5 — ns
SJ9 JTAG_TMS, JTAG_TDI data hold time 25 — ns
SJ10 JTAG_TCK low to JTAG_TDO data valid — 44 ns
SJ11 JTAG_TCK low to JTAG_TDO high impedance — 44 ns
SJ12 JTAG_TRST_B assert time 100 — ns
SJ13 JTAG_TRST_B set-up time to JTAG_TCK low 40 — ns
1TDC = target frequency of SJC
2VM = mid-point voltage
Table 71. SPDIF Timing Parameters
Characteristics Symbol
Timing Parameter Range
Unit
Min Max
SPDIF_IN Skew: asynchronous inputs, no specs apply —— 0.7ns
SPDIF_OUT output (Load = 50pf)
• Skew
• Transition rising
• Transition falling
—
—
—
—
—
—
1.5
24.2
31.3
ns
SPDIF_OUT1 output (Load = 30pf)
• Skew
• Transition rising
• Transition falling
—
—
—
—
—
—
1.5
13.6
18.0
ns
Modulating Rx clock (SPDIF_SR_CLK) period srckp 40.0 — ns
SPDIF_SR_CLK high period srckph 16.0 — ns
SPDIF_SR_CLK low period srckpl 16.0 — ns
Modulating Tx clock (SPDIF_ST_CLK) period stclkp 40.0 — ns
SPDIF_ST_CLK high period stclkph 16.0 — ns
SPDIF_ST_CLK low period stclkpl 16.0 — ns
Table 70. JTAG Timing (continued)
ID Parameter1,2
All Frequencies
Unit
Min Max
Electrical Characteristics
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Figure 63. SPDIF_SR_CLK Timing Diagram
Figure 64. SPDIF_ST_CLK Timing Diagram
4.12.14 UART I/O Configuration and Timing Parameters
4.12.14.1 UART RS-232 Serial Mode Timing
The following sections describe the electrical information of the UART module in the RS-232 mode.
4.12.14.1.1 UART Transmitter
Figure 65 depicts the transmit timing of UART in the RS-232 serial mode, with 8 data bit/1 stop bit format.
Table 72 lists the UART RS-232 serial mode transmits timing characteristics.
Figure 65. UART RS-232 Serial Mode Transmit Timing Diagram
Table 72. RS-232 Serial Mode Transmit Timing Parameters
ID Parameter Symbol Min Max Unit
UA1 Transmit Bit Time tTbit 1/Fbaud_rate1 - Tref_clk2
1Fbaud_rate: Baud rate frequency. The maximum baud rate the UART can support is (ipg_perclk frequency)/16.
2Tref_clk: The period of UART reference clock ref_clk (ipg_perclk after RFDIV divider).
1/Fbaud_rate + Tref_clk —
SPDIF_SR_CLK
(Output)
VMVM
srckp
srckph
srckpl
SPDIF_ST_CLK
(Input)
VMVM
stclkp
stclkph
stclkpl
Start
Bit Bit 1 Bit 2Bit 0 Bit 4 Bit 5 Bit 6 Bit 7
UARTx_TX_DATA
(output) Bit 3 STOP
BIT
Next
Start
Bit
Possible
Parity
Bit
Par Bit
UA1
UA1 UA1
UA1
flflwm
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4.12.14.1.2 UART Receiver
Figure 66 depicts the RS-232 serial mode receives timing with 8 data bit/1 stop bit format. Table 73 lists
serial mode receive timing characteristics.
Figure 66. UART RS-232 Serial Mode Receive Timing Diagram
4.12.14.1.3 UART IrDA Mode Timing
The following subsections give the UART transmit and receive timings in IrDA mode.
UART IrDA Mode Transmitter
Figure 67 depicts the UART IrDA mode transmit timing, with 8 data bit/1 stop bit format. Table 74 lists
the transmit timing characteristics.
Figure 67. UART IrDA Mode Transmit Timing Diagram
Table 73. RS-232 Serial Mode Receive Timing Parameters
ID Parameter Symbol Min Max Unit
UA2 Receive Bit Time1
1The UART receiver can tolerate 1/(16 x Fbaud_rate) tolerance in each bit. But accumulation tolerance in one frame must not
exceed 3/(16 x Fbaud_rate).
tRbit 1/Fbaud_rate2 - 1/(16
x Fbaud_rate)
2Fbaud_rate: Baud rate frequency. The maximum baud rate the UART can support is (ipg_perclk frequency)/16.
1/Fbaud_rate +
1/(16 x Fbaud_rate)
—
Table 74. IrDA Mode Transmit Timing Parameters
ID Parameter Symbol Min Max Unit
UA3 Transmit Bit Time in IrDA mode tTIRbit 1/Fbaud_rate1 -
Tref_clk2
1/Fbaud_rate + Tref_clk —
UA4 Transmit IR Pulse Duration tTIRpulse (3/16) x (1/Fbaud_rate)
- Tref_clk
(3/16) x (1/Fbaud_rate)
+ Tref_clk
—
Bit 1 Bit 2Bit 0 Bit 4 Bit 5 Bit 6 Bit 7
UARTx_RX_DATA
(output)
Bit 3
Start
Bit STOP
BIT
Next
Start
Bit
Possible
Parity
Bit
Par Bit
UA2 UA2
UA2 UA2
Bit 1 Bit 2
Bit 0 Bit 4 Bit 5 Bit 6 Bit 7
RGMII_TXD
(output)
Bit 3
Start
Bit
STOP
BIT
Possible
Parity
Bit
UA3 UA3 UA3 UA3
UA4
W n H i a,
Electrical Characteristics
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UART IrDA Mode Receiver
Figure 68 depicts the UART IrDA mode receive timing, with 8 data bit/1 stop bit format. Table 75 lists the
receive timing characteristics.
Figure 68. UART IrDA Mode Receive Timing Diagram
4.12.15 USB PHY Parameters
This section describes the USB-OTG PHY parameters.
The USB PHY meets the electrical compliance requirements defined in the Universal Serial Bus Revision
2.0 OTG with the following amendments.
• USB ENGINEERING CHANGE NOTICE
— Title: 5V Short Circuit Withstand Requirement Change
— Applies to: Universal Serial Bus Specification, Revision 2.0
• Errata for USB Revision 2.0 April 27, 2000 as of 12/7/2000
• USB ENGINEERING CHANGE NOTICE
— Title: Pull-up/Pull-down resistors
— Applies to: Universal Serial Bus Specification, Revision 2.0
• USB ENGINEERING CHANGE NOTICE
— Title: Suspend Current Limit Changes
— Applies to: Universal Serial Bus Specification, Revision 2.0
1Fbaud_rate: Baud rate frequency. The maximum baud rate the UART can support is (ipg_perclk frequency)/16.
2Tref_clk: The period of UART reference clock ref_clk (ipg_perclk after RFDIV divider).
Table 75. IrDA Mode Receive Timing Parameters
ID Parameter Symbol Min Max Unit
UA5 Receive Bit Time1 in IrDA mode
1 The UART receiver can tolerate 1/(16 x Fbaud_rate) tolerance in each bit. But accumulation tolerance in one frame must not
exceed 3/(16 x Fbaud_rate).
tRIRbit 1/Fbaud_rate2 - 1/(16
x Fbaud_rate)
2Fbaud_rate: Baud rate frequency. The maximum baud rate the UART can support is (ipg_perclk frequency)/16.
1/Fbaud_rate + 1/(16 x
Fbaud_rate)
—
UA6 Receive IR Pulse Duration tRIRpulse 1.41 s (5/16) x (1/Fbaud_rate)—
Bit 1 Bit 2
Bit 0 Bit 4 Bit 5 Bit 6 Bit 7
RGMII_RXD
(input)
Bit 3
Start
Bit
STOP
BIT
Possible
Parity
Bit
UA5 UA5 UA5 UA5
UA6
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Electrical Characteristics
• USB ENGINEERING CHANGE NOTICE
— Title: USB 2.0 Phase Locked SOFs
— Applies to: Universal Serial Bus Specification, Revision 2.0
• On-The-Go and Embedded Host Supplement to the USB Revision 2.0 Specification
— Revision 2.0 plus errata and ecn June 4, 2010
• Battery Charging Specification (available from USB-IF)
— Revision 1.2, December 7, 2010
— Portable device only
4.13 A/D converter
The following subsections provide information about A/D converter.
4.13.1 12-bit ADC electrical characteristics
4.13.1.1 12-bit ADC operating conditions
Table 76. 12-bit ADC Operating Conditions
Characteristic Conditions Symb Min Typ1Max Unit Comment
Supply voltage Absolute VDDAD 3.0 - 3.6 V —
Delta to VDD
(VDD-VDDAD)2
VDDAD -100 0 100 mV —
Ground voltage Delta to VSS
(VSS-VSSAD)
VSSAD -100 0 100 mV —
Ref Voltage High — VREFH 1.13 VDDAD VDDAD V —
Ref Voltage Low — VREFL VSSAD VSSAD VSSAD V —
Input Voltage — VADIN VREFL —V
REFH V —
Input Capacitance 8/10/12 bit modes CADIN —1.52 pF —
Input Resistance ADLPC=0, ADHSC=1 RADIN —57kohms —
ADLPC=0, ADHSC=0 — 12.5 15 kohms —
ADLPC=1, ADHSC=0 — 25 30 kohms —
Analog Source
Resistance
12 bit mode fADCK =
40MHz ADLSMP=0,
ADSTS=10, ADHSC=1
RAS — — 1 kohms Tsamp=150
ns
RAS depends on Sample Time Setting (ADLSMP, ADSTS) and ADC Power Mode (ADHSC, ADLPC). See charts for Minimum
Sample Time vs RAS
Slmplifiod InpuI pin
equivalent circuit
,— —————————— ‘ ZADIN
: Pad : F ’
lea ' Simplified chaII nsl
35‘s : duty: : : salad circuit
I in In ' I ”””””
RAs : : pmlgctlon I : : RADN
I . I v : vvv
4* I I I I
' VAflNI I I I
v c : _ : : I ,
' I I : :
: l ' \— > I
i I i I i I I
- - . - . : J .
I l
J
Inpu1 pin
Electrical Characteristics
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NXP Semiconductors 99
Figure 69. 12-bit ADC Input Impedance Equivalency Diagram
ADC Conversion Clock
Frequency
ADLPC=0, ADHSC=1
12 bit mode
fADCK 4 — 40 MHz —
ADLPC=0, ADHSC=0
12 bit mode
4 — 30 MHz —
ADLPC=1, ADHSC=0
12 bit mode
4 — 20 MHz —
1Typical values assume VDDAD = 3.0 V, Temp = 25°C, fADCK=20 MHz unless otherwise stated. Typical values are for reference
only and are not tested in production.
2DC potential differences
Table 76. 12-bit ADC Operating Conditions (continued)
Characteristic Conditions Symb Min Typ1Max Unit Comment
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Electrical Characteristics
4.13.1.1.1 12-bit ADC characteristics
Table 77. 12-bit ADC Characteristics (VREFH = VDDAD, VREFL = VSSAD)
Characteristic Conditions1Symb Min Typ2Max Unit Comment
[L:] Supply Current ADLPC=1,
ADHSC=0
IDDAD — 250 — µA ADLSMP=0
ADSTS=10 ADCO=1
ADLPC=0,
ADHSC=0
350
ADLPC=0,
ADHSC=1
400
[L:] Supply Current Stop, Reset, Module
Off
IDDAD —0.010.8µA —
ADC Asynchronous
Clock Source
ADHSC=0 fADACK — 10 — MHz tADACK = 1/fADACK
ADHSC=1 — 20 —
Sample Cycles ADLSMP=0,
ADSTS=00
Csamp — 2 — cycles —
ADLSMP=0,
ADSTS=01
4
ADLSMP=0,
ADSTS=10
6
ADLSMP=0,
ADSTS=11
8
ADLSMP=1,
ADSTS=00
12
ADLSMP=1,
ADSTS=01
16
ADLSMP=1,
ADSTS=10
20
ADLSMP=1,
ADSTS=11
24
Electrical Characteristics
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NXP Semiconductors 101
Conversion Cycles ADLSMP=0
ADSTS=00
Cconv — 28 — cycles —
ADLSMP=0
ADSTS=01
30
ADLSMP=0
ADSTS=10
32
ADLSMP=0
ADSTS=11
34
ADLSMP=1
ADSTS=00
38
ADLSMP=1
ADSTS=01
42
ADLSMP=1
ADSTS=10
46
ADLSMP=1,
ADSTS=11
50
Conversion Time ADLSMP=0
ADSTS=00
Tconv — 0.7 — µs Fadc=40 MHz
ADLSMP=0
ADSTS=01
0.75
ADLSMP=0
ADSTS=10
0.8
ADLSMP=0
ADSTS=11
0.85
ADLSMP=1
ADSTS=00
0.95
ADLSMP=1
ADSTS=01
1.05
ADLSMP=1
ADSTS=10
1.15
ADLSMP=1,
ADSTS=11
1.25
[P:][C:] Total
Unadjusted Error
12 bit mode TUE — 4.5 — LSB
1 LSB =
(VREFH -
VREFL)/2
N
—
10 bit mode — 2 —
8 bit mode — 1.5 —
[P:][C:] Differential
Non-Linearity
12 bit mode DNL — 1 — LSB —
10bit mode — 0.5 —
8 bit mode — 0.2 —
Table 77. 12-bit ADC Characteristics (VREFH = VDDAD, VREFL = VSSAD) (continued)
Characteristic Conditions1Symb Min Typ2Max Unit Comment
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Electrical Characteristics
NOTE
The ADC electrical spec would be met with the calibration enabled
configuration.
[P:][C:] Integral
Non-Linearity
12 bit mode INL — 2.6 — LSB —
10bit mode — 0.8 —
8 bit mode — 0.3 —
Zero-Scale Error 12 bit mode EZS — -0.3 — LSB —
10bit mode — -0.15 —
8 bit mode — -0.15 —
Full-Scale Error 12 bit mode EFS — -2.5 — LSB —
10bit mode — -0.6 —
8 bit mode — -0.3 —
[L:] Effective Number
of Bits
12 bit mode ENOB 10.1 10.7 — Bits —
[L:] Signal to Noise
plus Distortion
See ENOB SINAD SINAD = 6.02 x ENOB + 1.76 dB —
1All accuracy numbers assume the ADC is calibrated with VREFH=VDDAD
2Typical values assume VDDAD = 3.0 V, Temp = 25°C, Fadck=20 MHz unless otherwise stated. Typical values are for reference
only and are not tested in production.
Table 77. 12-bit ADC Characteristics (VREFH = VDDAD, VREFL = VSSAD) (continued)
Characteristic Conditions1Symb Min Typ2Max Unit Comment
Boot Mode Configuration
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5 Boot Mode Configuration
This section provides information on boot mode configuration pins allocation and boot devices interfaces
allocation.
5.1 Boot Mode Configuration Pins
Table 78 provides boot options, functionality, fuse values, and associated pins. Several input pins are also
sampled at reset and can be used to override fuse values, depending on the value of BT_FUSE_SEL fuse.
The boot option pins are in effect when BT_FUSE_SEL fuse is ‘0’ (cleared, which is the case for an
unblown fuse). For detailed boot mode options configured by the boot mode pins, see the i.MX 6ULL Fuse
Map document and the System Boot chapter in i.MX 6ULL Reference Manual (IMX6ULLRM).
Table 78. Fuses and Associated Pins Used for Boot
Pin Direction at reset eFuse name Details
BOOT_MODE0 Input with 100 K pull-down N/A Boot mode selection
BOOT_MODE1 Input with 100 K pull-down N/A Boot mode selection
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Boot Mode Configuration
5.2 Boot Device Interface Allocation
The following tables list the interfaces that can be used by the boot process in accordance with the
specific boot mode configuration. The tables also describe the interface’s specific modes and IOMUXC
allocation, which are configured during boot when appropriate.
LCD_DATA00 Input with 100 K pull-down BT_CFG1[0] Boot Options, Pin value overrides
fuse settings for BT_FUSE_SEL =
‘0’. Signal Configuration as Fuse
Override Input at Power Up.
These are special I/O lines that
control the boot up configuration
during product development. In
production, the boot configuration
can be controlled by fuses.
LCD_DATA01 Input with 100 K pull-down BT_CFG1[1]
LCD_DATA02 Input with 100 K pull-down BT_CFG1[2]
LCD_DATA03 Input with 100 K pull-down BT_CFG1[3]
LCD_DATA04 Input with 100 K pull-down BT_CFG1[4]
LCD_DATA05 Input with 100 K pull-down BT_CFG1[5]
LCD_DATA06 Input with 100 K pull-down BT_CFG1[6]
LCD_DATA07 Input with 100 K pull-down BT_CFG1[7]
LCD_DATA08 Input with 100 K pull-down BT_CFG2[0]
LCD_DATA09 Input with 100 K pull-down BT_CFG2[1]
LCD_DATA10 Input with 100 K pull-down BT_CFG2[2]
LCD_DATA11 Input with 100 K pull-down BT_CFG2[3]
LCD_DATA12 Input with 100 K pull-down BT_CFG2[4]
LCD_DATA13 Input with 100 K pull-down BT_CFG2[5]
LCD_DATA14 Input with 100 K pull-down BT_CFG2[6]
LCD_DATA15 Input with 100 K pull-down BT_CFG2[7]
LCD_DATA16 Input with 100 K pull-down BT_CFG4[0]
LCD_DATA17 Input with 100 K pull-down BT_CFG4[1]
LCD_DATA18 Input with 100 K pull-down BT_CFG4[2]
LCD_DATA19 Input with 100 K pull-down BT_CFG4[3]
LCD_DATA20 Input with 100 K pull-down BT_CFG4[4]
LCD_DATA21 Input with 100 K pull-down BT_CFG4[5]
LCD_DATA22 Input with 100 K pull-down BT_CFG4[6]
LCD_DATA23 Input with 100 K pull-down BT_CFG4[7]
Table 79. QSPI Boot trough QSPI
Ball Name Signal Name Mux
Mode Common Quad
Mode
+ Port A
DQS
+ Port A
CS1
+ Port
B
+ Port B
DQS
+ Port B
CS1
NAND_WP_B qspi.A_SCLK Alt2 Yes Yes
NAND_DQS qspi.A_SS0_B Alt2 Yes Yes
Table 78. Fuses and Associated Pins Used for Boot (continued)
Pin Direction at reset eFuse name Details
Boot Mode Configuration
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NAND_READY_B qspi.A_DATA[0] Alt2 Yes Yes
NAND_CE0_B qspi.A_DATA[1] Alt2 Yes Yes
NAND_CE1_B qspi.A_DATA[2] Alt2 Yes Yes
NAND_CLE qspi.A_DATA[3] Alt2 Yes Yes
NAND_DATA05 qspi.B_DATA[3] Alt2 Yes
NAND_DATA04 qspi.B_DATA[2] Alt2 Yes
NAND_DATA03 qspi.B_DATA[1] Alt2 Yes
NAND_DATA02 qspi.B_DATA[0] Alt2 Yes
NAND_WE_B qspi.B_SS0_B Alt2 Yes
NAND_RE_B qspi.B_SCLK Alt2 Yes
NAND_DATA07 qspi.A_SS1_B Alt2 Yes
NAND_ALE qspi.A_DQS Alt2 Yes
NAND_DATA00 qspi.B_SS1_B Alt2 Yes
NAND_DATA01 qspi.B_DQS Alt2 Yes
Table 80. SPI Boot through ECSPI1
Ball Name Signal Name Mux
Mode Common BOOT_CFG4
[5:4]=00b
BOOT_CFG4
[5:4]=01b
BOOT_CFG4
[5:4]=10b
BOOT_CFG4
[5:4]=11b
CSI_DATA07 ecspi1.MISO Alt 3 Yes
CSI_DATA06 ecspi1.MOSI Alt 3 Yes
CSI_DATA04 ecspi1.SCLK Alt 3 Yes
CSI_DATA05 ecspi1.SS0 Alt 3 Yes
LCD_DATA05 ecspi1.SS1 Alt 8 Yes
LCD_DATA06 ecspi1.SS2 Alt 8 Yes
LCD_DATA07 ecspi1.SS3 Alt 8 Yes
Table 81. SPI Boot through ECSPI2
Ball Name Signal Name Mux Mode Common BOOT_CFG
4[5:4]=00b
BOOT_CFG4
[5:4]=01b
BOOT_CFG4
[5:4]=10b
BOOT_CFG4
[5:4]=11b
CSI_DATA03 ecspi2.MISO Alt 3 Yes
CSI_DATA02 ecspi2.MOSI Alt 3 Yes
CSI_DATA00 ecspi2.SCLK Alt 3 Yes
CSI_DATA01 ecspi2.SS0 Alt 3 Yes
LCD_HSYNC ecspi2.SS1 Alt 8 Yes
Table 79. QSPI Boot trough QSPI (continued)
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Boot Mode Configuration
LCD_VSYNC ecspi2.SS2 Alt 8 Yes
LCD_RESET ecspi2.SS3 Alt 8 Yes
Table 82. SPI Boot through ECSPI3
Ball Name Signal Name Mux
Mode Common BOOT_CFG4
[5:4]=00b
BOOT_CFG4[
5:4]=01b
BOOT_CFG4[
5:4]=10b
BOOT_CFG4
[5:4]=11b
UART2_RTS_B ecspi3.MISO Alt 8 Yes
UART2_CTS_B ecspi3.MOSI Alt 8 Yes
UART2_RX_DATA ecspi3.SCLK Alt 8 Yes
UART2_TX_DATA ecspi3.SS0 Alt 8 Yes
NAND_ALE ecspi3.SS1 Alt 8 Yes
NAND_RE_B ecspi3.SS2 Alt 8 Yes
NAND_WE_B ecspi3.SS3 Alt 8 Yes
Table 83. SPI Boot through ECSPI4
Ball Name Signal Name Mux
Mode Common BOOT_CFG4
[5:4]=00b
BOOT_CFG4
[5:4]=01b
BOOT_CFG4[
5:4]=10b
BOOT_CFG
4[5:4]=11b
ENET2_TX_CLK ecspi4.MISO Alt 3 Yes
ENET2_TX_EN ecspi4.MOSI Alt 3 Yes
ENET2_TX_DATA1 ecspi4.SCLK Alt 3 Yes
ENET2_RX_ER ecspi4.SS0 Alt 3 Yes
NAND_DATA01 ecspi4.SS1 Alt 8 Yes
NAND_DATA02 ecspi4.SS2 Alt 8 Yes
NAND_DATA03 ecspi4.SS3 Alt 8 Yes
Table 84. NAND Boot through GPMI
Ball Name Signal Name Mux Mode Common BOOT_CFG1[3:2]=
01b
BOOT_CFG1[3:2]=
10b
NAND_CLE rawnand.CLE Alt 0 Yes
NAND_ALE rawnand.ALE Alt 0 Yes
NAND_WP_B rawnand.WP_B Alt 0 Yes
NAND_READY_B rawnand.READY_B Alt 0 Yes
NAND_CE0_B rawnand.CE0_B Alt 0 Yes
NAND_CE1_B rawnand.CE1_B Alt 0 Yes Yes
NAND_RE_B rawnand.RE_B Alt 0 Yes
Table 81. SPI Boot through ECSPI2 (continued)
Boot Mode Configuration
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NXP Semiconductors 107
NAND_WE_B rawnand.WE_B Alt 0 Yes
NAND_DATA00 rawnand.DATA00 Alt 0 Yes
NAND_DATA01 rawnand.DATA01 Alt 0 Yes
NAND_DATA02 rawnand.DATA02 Alt 0 Yes
NAND_DATA03 rawnand.DATA03 Alt 0 Yes
NAND_DATA04 rawnand.DATA04 Alt 0 Yes
NAND_DATA05 rawnand.DATA05 Alt 0 Yes
NAND_DATA06 rawnand.DATA06 Alt 0 Yes
NAND_DATA07 rawnand.DATA07 Alt 0 Yes
NAND_DQS rawnand.DQS Alt 0 Yes
CSI_MCLK rawnand.CE2_B Alt 2 Yes
CSI_PIXCLK rawnand.CE3_B Alt 2 Yes
Table 85. SD/MMC Boot through USDHC1
Ball Name Signal Name Mux
Mode Common 4-bit 8-bit BOOT_CFG1[1]=1
(SD Power Cycle)
SDMMC
MFG
mode
UART1_RTS_B usdhc1.CD_B Alt 2 Yes
SD1_CLK usdhc1.CLK Alt 0 Yes
SD1_CMD usdhc1.CMD Alt 0 Yes
SD1_DATA0 usdhc1.DATA0 Alt 0 Yes
SD1_DATA1 usdhc1.DATA1 Alt 0 Yes Yes
SD1_DATA2 usdhc1.DATA2 Alt 0 Yes Yes
SD1_DATA3 usdhc1.DATA3 Alt 0 Yes
NAND_READY_B usdhc1.DATA4 Alt 1 Yes
NAND_CE0_B usdhc1.DATA5 Alt 1 Yes
NAND_CE1_B usdhc1.DATA6 Alt 1 Yes
NAND_CLE usdhc1.DATA7 Alt 1 Yes
GPIO1_IO09 GPIO1_IO091
1The Boot ROM uses GPIO1_IO09 to implement SD1_RESET_B.
Alt 5 Yes
GPIO1_IO05 usdhc1.VSELECT Alt 4 Yes
Table 84. NAND Boot through GPMI (continued)
Ball Name Signal Name Mux Mode Common BOOT_CFG1[3:2]=
01b
BOOT_CFG1[3:2]=
10b
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108 NXP Semiconductors
Boot Mode Configuration
Table 86. SD/MMC Boot through USDHC2
Ball Name Signal Name Mux Mode Commo
n4-bit 8-bit BOOT_CFG1[1]=1
(SD Power Cycle)
NAND_RE_B usdhc2.CLK Alt 1 Yes
NAND_WE_B usdhc2.CMD Alt 1 Yes
NAND_DATA00 usdhc2.DATA0 Alt 1 Yes
NAND_DATA01 usdhc2.DATA1 Alt 1 Yes Yes
NAND_DATA02 usdhc2.DATA2 Alt 1 Yes Yes
NAND_DATA03 usdhc2.DATA3 Alt 1 Yes
NAND_DATA04 usdhc2.DATA4 Alt 1 Yes
NAND_DATA05 usdhc2.DATA5 Alt 1 Yes
NAND_DATA06 usdhc2.DATA6 Alt 1 Yes
NAND_DATA07 usdhc2.DATA7 Alt 1 Yes
NAND_ALE NAND_ALE1
1The Boot ROM uses NAND_ALE to implement SD2_RESET_B.
Alt 5 Yes
GPIO1_IO08 usdhc2.VSELECT Alt 4 Yes
Table 87. NOR/OneNAND Boot through EIM
Ball Name Signal Name Mux Mode Common ADL16
Non-Mux AD16 Mux
CSI_DATA00 weim.AD[0] Alt 4 Yes
CSI_DATA01 weim.AD[1] Alt 4 Yes
CSI_DATA02 weim.AD[2] Alt 4 Yes
CSI_DATA03 weim.AD[3] Alt 4 Yes
CSI_DATA04 weim.AD[4] Alt 4 Yes
CSI_DATA05 weim.AD[5] Alt 4 Yes
CSI_DATA06 weim.AD[6] Alt 4 Yes
CSI_DATA07 weim.AD[7] Alt 4 Yes
NAND_DATA00 weim.AD[8] Alt 4 Yes
NAND_DATA01 weim.AD[9] Alt 4 Yes
NAND_DATA02 weim.AD[10] Alt 4 Yes
NAND_DATA03 weim.AD[11] Alt 4 Yes
NAND_DATA04 weim.AD[12] Alt 4 Yes
NAND_DATA05 weim.AD[13] Alt 4 Yes
NAND_DATA06 weim.AD[14] Alt 4 Yes
Boot Mode Configuration
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NXP Semiconductors 109
NAND_DATA07 weim.AD[15] Alt 4 Yes
NAND_CLE weim.ADDR[16] Alt 4 Yes Yes
NAND_ALE weim.ADDR[17] Alt 4 Yes Yes
NAND_CE1_B weim.ADDR[18] Alt 4 Yes Yes
SD1_CMD weim.ADDR[19] Alt 4 Yes Yes
SD1_CLK weim.ADDR[20] Alt 4 Yes Yes
SD1_DATA0 weim.ADDR[21] Alt 4 Yes Yes
SD1_DATA1 weim.ADDR[22] Alt 4 Yes Yes
SD1_DATA2 weim.ADDR[23] Alt 4 Yes Yes
SD1_DATA3 weim.ADDR[24] Alt 4 Yes Yes
ENET2_RXER weim.ADDR[25] Alt 4 Yes Yes
ENET2_CRS_DV weim.ADDR[26] Alt 4 Yes Yes
CSI_MCLK weim.CS0_B Alt 4 Yes
LCD_DATA08 weim.DATA[0] Alt 4 Yes
LCD_DATA09 weim.DATA[1] Alt 4 Yes
LCD_DATA10 weim.DATA[2] Alt 4 Yes
LCD_DATA11 weim.DATA[3] Alt 4 Yes
LCD_DATA12 weim.DATA[4] Alt 4 Yes
LCD_DATA13 weim.DATA[5] Alt 4 Yes
LCD_DATA14 weim.DATA[6] Alt 4 Yes
LCD_DATA15 weim.DATA[7] Alt 4 Yes
LCD_DATA16 weim.DATA[8] Alt 4 Yes
LCD_DATA17 weim.DATA[9] Alt 4 Yes
LCD_DATA18 weim.DATA[10] Alt 4 Yes
LCD_DATA19 weim.DATA[11] Alt 4 Yes
LCD_DATA20 weim.DATA[12] Alt 4 Yes
LCD_DATA21 weim.DATA[13] Alt 4 Yes
LCD_DATA22 weim.DATA[14] Alt 4 Yes
LCD_DATA23 weim.DATA[15] Alt 4 Yes
NAND_RE_B weim.EB_B[0] Alt 4 Yes Yes
NAND_WE_B weim.EB_B[1] Alt 4 Yes Yes
CSI_HSYNC weim.LBA_B Alt 4 Yes
Table 87. NOR/OneNAND Boot through EIM (continued)
Ball Name Signal Name Mux Mode Common ADL16
Non-Mux AD16 Mux
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110 NXP Semiconductors
Boot Mode Configuration
CSI_PIXCLK weim.OE Alt 4 Yes
CSI_VSYNC weim.RW Alt 4 Yes
Table 88. Serial Download through UART1
Ball Name Signal Name Mux Mode Common
UART1_TX_DATA uart1.TX_DATA Alt 0 Yes
UART1_RX_DATA uart1.RX_DATA Alt 0 Yes
Table 89. Serial Download through UART2
Ball Name Signal Name Mux Mode Common
UART2_TX_DATA uart2.TX_DATA Alt 0 Yes
UART2_RX_DATA uart2.RX_DATA Alt 0 Yes
Table 87. NOR/OneNAND Boot through EIM (continued)
Ball Name Signal Name Mux Mode Common ADL16
Non-Mux AD16 Mux
Package Information and Contact Assignments
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NXP Semiconductors 111
6 Package Information and Contact Assignments
This section includes the contact assignment information and mechanical package drawing.
6.1 14 x 14 mm Package Information
6.1.1 14 x 14 mm, 0.8 mm Pitch, Ball Matrix
Figure 70 shows the top, bottom, and side views of the 14 x 14 mm BGA package.
E El D
<_ a1="" index="" area="" i="" .="" \1="" seat‘ng="" ‘="" plane="" i="" l-="" '="" a="" \="" \="" i="" ‘="" i="" h="" \="" 4x="" ‘="" 0,15="" :="" ‘="" ‘="" top="" view="" ‘="" d‘—="" "'="" i="" \="" h="" \="" \="" :x="" 0.34="" 0="" 45="" *="" ‘—="" 25“="" "’0="" 35="" a="" 0'20="" ‘3511‘="" u="" ‘5="" w="" $="" ao.15®="" a="" a="" c="" wo.oa®="" a="" 132="" max="" z4eamuzmm="" a1="" \ndex="" area="" v‘ew="" did="" bottom="" v‘ew="" t‘tle:="" mapbga,="" document="" n0295asa00555d="" rev:="" o="" 14="" x="" 14="" x="" mb="" pkg,="" standard:="" nonidedec="" 0.8="" mm="" pitch,="" 289="" \/0="" sheet;="" 1="" of="" 3="">i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
112 NXP Semiconductors
Package Information and Contact Assignments
Figure 70. 14 x 14 mm BGA, Case x Package Top, Bottom, and Side Views
Package Information and Contact Assignments
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NXP Semiconductors 113
6.1.2 14 x 14 mm Supplies Contact Assignments and Functional Contact
Assignments
Table 90 shows the device connection list for ground, sense, and reference contact signals.
Table 90. 14 x 14 mm Supplies Contact Assignment
Supply Rail Name Ball(s) Position(s) Remark
ADC_VREFH M13 —
DRAM_VREF P4 —
GPANIO R13 —
NGND_KEL0 M12 —
NVCC_CSI F4 —
NVCC_DRAM G6, H6, J6, K6, L6, M6 —
NVCC_DRAM_2P5 N6 —
NVCC_ENET F13 —
NVCC_GPIO J13 —
NVCC_LCD E13 —
NVCC_NAND E7 —
NVCC_PLL P13 —
NVCC_SD1 C4 —
NVCC_UART H13 —
VDD_ARM_CAP G9, G10, G11, H11 —
VDD_HIGH_CAP R14, R15 —
VDD_HIGH_IN N13 —
VDD_SNVS_CAP N12 —
VDD_SNVS_IN P12 —
VDD_SOC_CAP G8, H8, J8, J11, K8, K11, L8, L9, L10, L11 —
VDD_SOC_IN H9, H10, J9, J10, K9, 10 —
VDD_USB_CAP R12 —
VDDA_ADC_3P3 L13 —
VSS A1, A17, C3, C7, C11, C15, E8, E11, F6, F7, F8, F9, F10,F11, F12, G3, G5, G7,
G12, G15, H7, H12, J5, J7, J12, K7, K12, L3, L7, L12, M7, M8, M9, M10, M11,
N3, N5, R3, R5, R7, R11, R16, R17, T14, U1, U14, U17
—
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Package Information and Contact Assignments
Table 91 shows an alpha-sorted list of functional contact assignments for the 14 x 14 mm package.
Table 91. 14 x 14 mm Functional Contact Assignments
Ball Name 14x14
Ball
Power
Group
Ball
Type
Out of Reset Condition
Default
Mode
Default
Function
Input/
Output Value
BOOT_MODE0 T10 VDD_SNVS_IN GPIO ALT5 GPIO5_IO10 Input 100 k
pull-down
BOOT_MODE1 U10 VDD_SNVS_IN GPIO ALT5 GPIO5_IO11 Input 100 k
pull-down
CCM_CLK1_N P16 VDD_HIGH_CAP CCM — CCM_CLK1_N — —
CCM_CLK1_P P17 VDD_HIGH_CAP CCM — CCM_CLK1_P — —
CCM_PMIC_STBY_REQ U9 VDD_SNVS_IN CCM ALT0 CCM_PMIC_VSTBY_REQ Output —
CSI_DATA00 E4 NVCC_CSI GPIO ALT5 GPIO4_IO21 Input Keeper
CSI_DATA01 E3 NVCC_CSI GPIO ALT5 GPIO4_IO22 Input Keeper
CSI_DATA02 E2 NVCC_CSI GPIO ALT5 GPIO4_IO23 Input Keeper
CSI_DATA03 E1 NVCC_CSI GPIO ALT5 GPIO4_IO24 Input Keeper
CSI_DATA04 D4 NVCC_CSI GPIO ALT5 GPIO4_IO25 Input Keeper
CSI_DATA05 D3 NVCC_CSI GPIO ALT5 GPIO4_IO26 Input Keeper
CSI_DATA06 D2 NVCC_CSI GPIO ALT5 GPIO4_IO27 Input Keeper
CSI_DATA07 D1 NVCC_CSI GPIO ALT5 GPIO4_IO28 Input Keeper
CSI_HSYNC F3 NVCC_CSI GPIO ALT5 GPIO4_IO20 Input Keeper
CSI_MCLK F5 NVCC_CSI GPIO ALT5 GPIO4_IO17 Input Keeper
CSI_PIXCLK E5 NVCC_CSI GPIO ALT5 GPIO4_IO18 Input Keeper
CSI_VSYNC F2 NVCC_CSI GPIO ALT5 GPIO4_IO19 Input Keeper
DRAM_ADDR00 L5 NVCC_DRAM MMDC ALT0 DRAM_ADDR00 Output 100 k
pull-up
DRAM_ADDR01 H2 NVCC_DRAM DDR ALT0 DRAM_ADDR01 Output 100 k
pull-up
DRAM_ADDR02 K1 NVCC_DRAM DDR ALT0 DRAM_ADDR02 Output 100 k
pull-up
DRAM_ADDR03 M2 NVCC_DRAM DDR ALT0 DRAM_ADDR03 Output 100 k
pull-up
DRAM_ADDR04 K4 NVCC_DRAM DDR ALT0 DRAM_ADDR04 Output 100 k
pull-up
DRAM_ADDR05 L1 NVCC_DRAM DDR ALT0 DRAM_ADDR05 Output 100 k
pull-up
DRAM_ADDR06 G2 NVCC_DRAM DDR ALT0 DRAM_ADDR06 Output 100 k
pull-up
Package Information and Contact Assignments
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 115
DRAM_ADDR07 H4 NVCC_DRAM DDR ALT0 DRAM_ADDR07 Output 100 k
pull-up
DRAM_ADDR08 J4 NVCC_DRAM DDR ALT0 DRAM_ADDR08 Output 100 k
pull-up
DRAM_ADDR09 L2 NVCC_DRAM DDR ALT0 DRAM_ADDR09 Output 100 k
pull-up
DRAM_ADDR10 M4 NVCC_DRAM DDR ALT0 DRAM_ADDR10 Output 100 k
pull-up
DRAM_ADDR11 K3 NVCC_DRAM DDR ALT0 DRAM_ADDR11 Output 100 k
pull-up
DRAM_ADDR12 L4 NVCC_DRAM DDR ALT0 DRAM_ADDR12 Output 100 k
pull-up
DRAM_ADDR13 H3 NVCC_DRAM DDR ALT0 DRAM_ADDR13 Output 100 k
pull-up
DRAM_ADDR14 G1 NVCC_DRAM DDR ALT0 DRAM_ADDR14 Output 100 k
pull-up
DRAM_ADDR15 K5 NVCC_DRAM DDR ALT0 DRAM_ADDR15 Output 100 k
pull-up
DRAM_CAS_B J2 NVCC_DRAM DDR ALT0 DRAM_CAS_B Output 100 k
pull-up
DRAM_CS0_B N2 NVCC_DRAM DDR ALT0 DRAM_CS0_B Output 100 k
pull-up
DRAM_CS1_B H5 NVCC_DRAM DDR ALT0 DRAM_CS1_B Output 100 k
pull-up
DRAM_DATA00 T4 NVCC_DRAM DDR ALT0 DRAM_DATA00 Input 100 k
pull-up
DRAM_DATA01 U6 NVCC_DRAM DDR ALT0 DRAM_DATA01 Input 100 k
pull-up
DRAM_DATA02 T6 NVCC_DRAM DDR ALT0 DRAM_DATA02 Input 100 k
pull-up
DRAM_DATA03 U7 NVCC_DRAM DDR ALT0 DRAM_DATA03 Input 100 k
pull-up
DRAM_DATA04 U8 NVCC_DRAM DDR ALT0 DRAM_DATA04 Input 100 k
pull-up
DRAM_DATA05 T8 NVCC_DRAM DDR ALT0 DRAM_DATA05 Input 100 k
pull-up
DRAM_DATA06 T5 NVCC_DRAM DDR ALT0 DRAM_DATA06 Input 100 k
pull-up
DRAM_DATA07 U4 NVCC_DRAM DDR ALT0 DRAM_DATA07 Input 100 k
pull-up
DRAM_DATA08 U2 NVCC_DRAM DDR ALT0 DRAM_DATA08 Input 100 k
pull-up
Table 91. 14 x 14 mm Functional Contact Assignments (continued)
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
116 NXP Semiconductors
Package Information and Contact Assignments
DRAM_DATA09 U3 NVCC_DRAM DDR ALT0 DRAM_DATA09 Input 100 k
pull-up
DRAM_DATA10 U5 NVCC_DRAM DDR ALT0 DRAM_DATA10 Input 100 k
pull-up
DRAM_DATA11 R4 NVCC_DRAM DDR ALT0 DRAM_DATA11 Input 100 k
pull-up
DRAM_DATA12 P5 NVCC_DRAM DDR ALT0 DRAM_DATA12 Input 100 k
pull-up
DRAM_DATA13 P3 NVCC_DRAM DDR ALT0 DRAM_DATA13 Input 100 k
pull-up
DRAM_DATA14 R2 NVCC_DRAM DDR ALT0 DRAM_DATA14 Input 100 k
pull-up
DRAM_DATA15 R1 NVCC_DRAM DDR ALT0 DRAM_DATA15 Input 100 k
pull-up
DRAM_DQM0 T7 NVCC_DRAM DDR ALT0 DRAM_DQM0 Output 100 k
pull-up
DRAM_DQM1 T3 NVCC_DRAM DDR ALT0 DRAM_DQM1 Output 100 k
pull-up
DRAM_ODT0 N1 NVCC_DRAM DDR ALT0 DRAM_ODT0 Output 100 k
pull-down
DRAM_ODT1 F1 NVCC_DRAM DDR ALT0 DRAM_ODT1 Output 100 k
pull-down
DRAM_RAS_B M5 NVCC_DRAM DDR ALT0 DRAM_RAS_B Output 100 k
pull-up
DRAM_RESET G4 NVCC_DRAM DDR ALT0 DRAM_RESET Output 100 k
pull-down
DRAM_SDBA0 M1 NVCC_DRAM DDR ALT0 DRAM_SDBA0 Output 100 k
pull-up
DRAM_SDBA1 H1 NVCC_DRAM DDR ALT0 DRAM_SDBA1 Output 100 k
pull-up
DRAM_SDBA2 K2 NVCC_DRAM DDR ALT0 DRAM_SDBA2 Output 100 k
pull-up
DRAM_SDCKE0 M3 NVCC_DRAM DDR ALT0 DRAM_SDCKE0 Output 100 k
pull-down
DRAM_SDCKE1 J3 NVCC_DRAM DDR ALT0 DRAM_SDCKE1 Output 100 k
pull-down
DRAM_SDCLK0_N P2 NVCC_DRAM DDRCL
K
ALT0 DRAM_SDCLK0_N Input 100 k
pull-up
DRAM_SDCLK0_P P1 NVCC_DRAM DDRCL
K
ALT0 DRAM_SDCLK0_P Input 100 k
pull-up
DRAM_SDQS0_N P7 NVCC_DRAM DDRCL
K
ALT0 DRAM_SDQS0_N Input 100 k
pull-down
Table 91. 14 x 14 mm Functional Contact Assignments (continued)
Package Information and Contact Assignments
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 117
DRAM_SDQS0_P P6 NVCC_DRAM DDRCL
K
ALT0 DRAM_SDQS0_P Input 100 k
pull-down
DRAM_SDQS1_N T2 NVCC_DRAM DDRCL
K
ALT0 DRAM_SDQS1_N Input 100 k
pull-down
DRAM_SDQS1_P T1 NVCC_DRAM DDRCL
K
ALT0 DRAM_SDQS1_P Input 100 k
pull-down
DRAM_SDWE_B J1 NVCC_DRAM DDR ALT0 DRAM_SDWE_B Output 100 k
pull-up
DRAM_ZQPAD N4 NVCC_DRAM GPIO — DRAM_ZQPAD Input Keeper
ENET1_RX_DATA0 F16 NVCC_ENET GPIO ALT5 GPIO2_IO0 Input Keeper
ENET1_RX_DATA1 E17 NVCC_ENET GPIO ALT5 GPIO2_IO1 Input Keeper
ENET1_RX_EN E16 NVCC_ENET GPIO ALT5 GPIO2_IO2 Input Keeper
ENET1_RX_ER D15 NVCC_ENET GPIO ALT5 GPIO2_IO7 Input Keeper
ENET1_TX_CLK F14 NVCC_ENET GPIO ALT5 GPIO2_IO6 Input Keeper
ENET1_TX_DATA0 E15 NVCC_ENET GPIO ALT5 GPIO2_IO3 Input Keeper
ENET1_TX_DATA1 E14 NVCC_ENET GPIO ALT5 GPIO2_IO4 Input Keeper
ENET1_TX_EN F15 NVCC_ENET GPIO ALT5 GPIO2_IO5 Input Keeper
ENET2_RX_DATA0 C17 NVCC_ENET GPIO ALT5 GPIO2_IO8 Input Keeper
ENET2_RX_DATA1 C16 NVCC_ENET GPIO ALT5 GPIO2_IO9 Input Keeper
ENET2_RX_EN B17 NVCC_ENET GPIO ALT5 GPIO2_IO10 Input Keeper
ENET2_RX_ER D16 NVCC_ENET GPIO ALT5 GPIO2_IO15 Input Keeper
ENET2_TX_CLK D17 NVCC_ENET GPIO ALT5 GPIO2_IO14 Input Keeper
ENET2_TX_DATA0 A15 NVCC_ENET GPIO ALT5 GPIO2_IO11 Input Keeper
ENET2_TX_DATA1 A16 NVCC_ENET GPIO ALT5 GPIO2_IO12 Input Keeper
ENET2_TX_EN B15 NVCC_ENET GPIO ALT5 GPIO2_IO13 Input Keeper
GPIO1_IO00 K13 NVCC_GPIO GPIO ALT5 GPIO1_IO00 Input Keeper
GPIO1_IO01 L15 NVCC_GPIO GPIO ALT5 GPIO1_IO01 Input Keeper
GPIO1_IO02 L14 NVCC_GPIO GPIO ALT5 GPIO1_IO02 Input Keeper
GPIO1_IO03 L17 NVCC_GPIO GPIO ALT5 GPIO1_IO03 Input Keeper
GPIO1_IO04 M16 NVCC_GPIO GPIO ALT5 GPIO1_IO04 Input Keeper
GPIO1_IO05 M17 NVCC_GPIO GPIO ALT5 GPIO1_IO05 Input Keeper
GPIO1_IO06 K17 NVCC_GPIO GPIO ALT5 GPIO1_IO06 Input Keeper
GPIO1_IO07 L16 NVCC_GPIO GPIO ALT5 GPIO1_IO07 Input Keeper
GPIO1_IO08 N17 NVCC_GPIO GPIO ALT5 GPIO1_IO08 Input Keeper
GPIO1_IO09 M15 NVCC_GPIO GPIO ALT5 GPIO1_IO09 Input Keeper
Table 91. 14 x 14 mm Functional Contact Assignments (continued)
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
118 NXP Semiconductors
Package Information and Contact Assignments
JTAG_MOD P15 NVCC_GPIO SJC ALT0 SJC_MOD Input 100 k
pull-up
JTAG_TCK M14 NVCC_GPIO SJC ALT0 SJC_TCK Input 47 k
pull-up
JTAG_TDI N16 NVCC_GPIO SJC ALT0 SJC_TDI Input 47 k
pull-up
JTAG_TDO N15 NVCC_GPIO SJC ALT0 SJC_TDO Output Keeper
JTAG_TMS P14 NVCC_GPIO SJC ALT0 SJC_TMS Input 47 k
pull-up
JTAG_TRST_B N14 NVCC_GPIO SJC ALT0 SJC_TRSTB Input 47 k
pull-up
LCD_CLK A8 NVCC_LCD GPIO ALT5 GPIO3_IO0 Input Keeper
LCD_DATA00 B9 NVCC_LCD GPIO ALT5 GPIO3_IO5 Input Keeper
LCD_DATA01 A9 NVCC_LCD GPIO ALT5 GPIO3_IO6 Input Keeper
LCD_DATA02 E10 NVCC_LCD GPIO ALT5 GPIO3_IO7 Input Keeper
LCD_DATA03 D10 NVCC_LCD GPIO ALT5 GPIO3_IO8 Input Keeper
LCD_DATA04 C10 NVCC_LCD GPIO ALT5 GPIO3_IO9 Input Keeper
LCD_DATA05 B10 NVCC_LCD GPIO ALT5 GPIO3_IO10 Input Keeper
LCD_DATA06 A10 NVCC_LCD GPIO ALT5 GPIO3_IO11 Input Keeper
LCD_DATA07 D11 NVCC_LCD GPIO ALT5 GPIO3_IO12 Input Keeper
LCD_DATA08 B11 NVCC_LCD GPIO ALT5 GPIO3_IO13 Input Keeper
LCD_DATA09 A11 NVCC_LCD GPIO ALT5 GPIO3_IO14 Input Keeper
LCD_DATA10 E12 NVCC_LCD GPIO ALT5 GPIO3_IO15 Input Keeper
LCD_DATA11 D12 NVCC_LCD GPIO ALT5 GPIO3_IO16 Input Keeper
LCD_DATA12 C12 NVCC_LCD GPIO ALT5 GPIO3_IO17 Input Keeper
LCD_DATA13 B12 NVCC_LCD GPIO ALT5 GPIO3_IO18 Input Keeper
LCD_DATA14 A12 NVCC_LCD GPIO ALT5 GPIO3_IO19 Input Keeper
LCD_DATA15 D13 NVCC_LCD GPIO ALT5 GPIO3_IO20 Input Keeper
LCD_DATA16 C13 NVCC_LCD GPIO ALT5 GPIO3_IO21 Input Keeper
LCD_DATA17 B13 NVCC_LCD GPIO ALT5 GPIO3_IO22 Input Keeper
LCD_DATA18 A13 NVCC_LCD GPIO ALT5 GPIO3_IO23 Input Keeper
LCD_DATA19 D14 NVCC_LCD GPIO ALT5 GPIO3_IO24 Input Keeper
LCD_DATA20 C14 NVCC_LCD GPIO ALT5 GPIO3_IO25 Input Keeper
LCD_DATA21 B14 NVCC_LCD GPIO ALT5 GPIO3_IO26 Input Keeper
LCD_DATA22 A14 NVCC_LCD GPIO ALT5 GPIO3_IO27 Input Keeper
LCD_DATA23 B16 NVCC_LCD GPIO ALT5 GPIO3_IO28 Input Keeper
Table 91. 14 x 14 mm Functional Contact Assignments (continued)
Package Information and Contact Assignments
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 119
LCD_ENABLE B8 NVCC_LCD GPIO ALT5 GPIO3_IO1 Input Keeper
LCD_HSYNC D9 NVCC_LCD GPIO ALT5 GPIO3_IO2 Input Keeper
LCD_RESET E9 NVCC_LCD GPIO ALT5 GPIO3_IO4 Input Keeper
LCD_VSYNC C9 NVCC_LCD GPIO ALT5 GPIO3_IO3 Input Keeper
NAND_ALE B4 NVCC_NAND GPIO ALT5 GPIO4_IO10 Input Keeper
NAND_CE0_B C5 NVCC_NAND GPIO ALT5 GPIO4_IO13 Input Keeper
NAND_CE1_B B5 NVCC_NAND GPIO ALT5 GPIO4_IO14 Input Keeper
NAND_CLE A4 NVCC_NAND GPIO ALT5 GPIO4_IO15 Input Keeper
NAND_DATA00 D7 NVCC_NAND GPIO ALT5 GPIO4_IO2 Input Keeper
NAND_DATA01 B7 NVCC_NAND GPIO ALT5 GPIO4_IO3 Input Keeper
NAND_DATA02 A7 NVCC_NAND GPIO ALT5 GPIO4_IO4 Input Keeper
NAND_DATA03 D6 NVCC_NAND GPIO ALT5 GPIO4_IO5 Input Keeper
NAND_DATA04 C6 NVCC_NAND GPIO ALT5 GPIO4_IO6 Input Keeper
NAND_DATA05 B6 NVCC_NAND GPIO ALT5 GPIO4_IO7 Input Keeper
NAND_DATA06 A6 NVCC_NAND GPIO ALT5 GPIO4_IO8 Input Keeper
NAND_DATA07 A5 NVCC_NAND GPIO ALT5 GPIO4_IO9 Input Keeper
NAND_DQS E6 NVCC_NAND GPIO ALT5 GPIO4_IO16 Input Keeper
NAND_RE_B D8 NVCC_NAND GPIO ALT5 GPIO4_IO0 Input Keeper
NAND_READY_B A3 NVCC_NAND GPIO ALT5 GPIO4_IO12 Input Keeper
NAND_WE_B C8 NVCC_NAND GPIO ALT5 GPIO4_IO1 Input Keeper
NAND_WP_B D5 NVCC_NAND GPIO ALT5 GPIO4_IO11 Input Keeper
ONOFF R8 VDD_SNVS_IN SRC ALT0 SRC_RESET_B Input 100 k
pull-up
POR_B P8 VDD_SNVS_IN SRC ALT0 SRC_POR_B Input 100 k
pull-up
RTC_XTALI T11 VDD_SNVS_CAP ANALO
G
— RTC_XTALI — —
RTC_XTALO U11 VDD_SNVS_CAP ANALO
G
— RTC_XTALO — —
SD1_CLK C1 NVCC_SD GPIO ALT5 GPIO2_IO17 Input Keeper
SD1_CMD C2 NVCC_SD GPIO ALT5 GPIO2_IO16 Input Keeper
SD1_DATA0 B3 NVCC_SD GPIO ALT5 GPIO2_IO18 Input Keeper
SD1_DATA1 B2 NVCC_SD GPIO ALT5 GPIO2_IO19 Input Keeper
SD1_DATA2 B1 NVCC_SD GPIO ALT5 GPIO2_IO20 Input Keeper
SD1_DATA3 A2 NVCC_SD GPIO ALT5 GPIO2_IO21 Input Keeper
Table 91. 14 x 14 mm Functional Contact Assignments (continued)
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
120 NXP Semiconductors
Package Information and Contact Assignments
SNVS_PMIC_ON_REQ T9 VDD_SNVS_IN GPIO ALT0 SNVS_PMIC_ON_REQ Output 100 k
pull-up
SNVS_TAMPER0 R10 VDD_SNVS_IN GPIO ALT5 GPIO5_IO00/SNVS_TAMPE
R01
Input Keeper/N
ot
connecte
d1,2
SNVS_TAMPER1 R9 VDD_SNVS_IN GPIO ALT5 GPIO5_IO01/SNVS_TAMPE
R11
Input Keeper/N
ot
connecte
d1,2
SNVS_TAMPER2 P11 VDD_SNVS_IN GPIO ALT5 GPIO5_IO02/SNVS_TAMPE
R21
Input Keeper/N
ot
connecte
d1,2
SNVS_TAMPER3 P10 VDD_SNVS_IN GPIO ALT5 GPIO5_IO03/SNVS_TAMPE
R31
Input Keeper/N
ot
connecte
d1,2
SNVS_TAMPER4 P9 VDD_SNVS_IN GPIO ALT5 GPIO5_IO04/SNVS_TAMPE
R41
Input Keeper/N
ot
connecte
d1,2
SNVS_TAMPER5 N8 VDD_SNVS_IN GPIO ALT5 GPIO5_IO05/SNVS_TAMPE
R51
Input Keeper/N
ot
connecte
d1,2
SNVS_TAMPER6 N11 VDD_SNVS_IN GPIO ALT5 GPIO5_IO06/SNVS_TAMPE
R61
Input Keeper/N
ot
connecte
d1,2
SNVS_TAMPER7 N10 VDD_SNVS_IN GPIO ALT5 GPIO5_IO07/SNVS_TAMPE
R71
Input Keeper/N
ot
connecte
d1,2
SNVS_TAMPER8 N9 VDD_SNVS_IN GPIO ALT5 GPIO5_IO08/SNVS_TAMPE
R81
Input Keeper/N
ot
connecte
d1,2
SNVS_TAMPER9 R6 VDD_SNVS_IN GPIO ALT5 GPIO5_IO09/SNVS_TAMPE
R91
Input Keeper/N
ot
connecte
d1,2
TEST_MODE N7 VDD_SNVS_IN TCU ALT0 TCU_TEST_MODE Input Keeper
UART1_CTS_B K15 NVCC_UART GPIO ALT5 GPIO1_IO18 Input Keeper
UART1_RTS_B J14 NVCC_UART GPIO ALT5 GPIO1_IO19 Input Keeper
UART1_RX_DATA K16 NVCC_UART GPIO ALT5 GPIO1_IO17 Input Keeper
Table 91. 14 x 14 mm Functional Contact Assignments (continued)
Package Information and Contact Assignments
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 121
UART1_TX_DATA K14 NVCC_UART GPIO ALT5 GPIO1_IO16 Input Keeper
UART2_CTS_B J15 NVCC_UART GPIO ALT5 GPIO1_IO22 Input Keeper
UART2_RTS_B H14 NVCC_UART GPIO ALT5 GPIO1_IO23 Input Keeper
UART2_RX_DATA J16 NVCC_UART GPIO ALT5 GPIO1_IO21 Input Keeper
UART2_TX_DATA J17 NVCC_UART GPIO ALT5 GPIO1_IO20 Input Keeper
UART3_CTS_B H15 NVCC_UART GPIO ALT5 GPIO1_IO26 Input Keeper
UART3_RTS_B G14 NVCC_UART GPIO ALT5 GPIO1_IO27 Input Keeper
UART3_RX_DATA H16 NVCC_UART GPIO ALT5 GPIO1_IO25 Input Keeper
UART3_TX_DATA H17 NVCC_UART GPIO ALT5 GPIO1_IO24 Input Keeper
UART4_RX_DATA G16 NVCC_UART GPIO ALT5 GPIO1_IO29 Input Keeper
UART4_TX_DATA G17 NVCC_UART GPIO ALT5 GPIO1_IO28 Input Keeper
UART5_RX_DATA G13 NVCC_UART GPIO ALT5 GPIO1_IO31 Input Keeper
UART5_TX_DATA F17 NVCC_UART GPIO ALT5 GPIO1_IO30 Input Keeper
USB_OTG1_CHD_B U16 OPEN DRAIN GPIO — USB_OTG1_CHD_B — —
USB_OTG1_DN T15 VDD_USB_CAP ANALO
G
— USB_OTG1_DN — —
USB_OTG1_DP U15 VDD_USB_CAP ANALO
G
— USB_OTG1_DP — —
USB_OTG1_VBUS T12 USB_VBUS VBUS
POWE
R
— USB_OTG1_VBUS — —
USB_OTG2_DN T13 VDD_USB_CAP ANALO
G
— USB_OTG2_DN — —
USB_OTG2_DP U13 VDD_USB_CAP ANALO
G
— USB_OTG2_DP — —
USB_OTG2_VBUS U12 USB_VBUS VBUS
POWE
R
— USB_OTG2_VBUS — —
XTALI T16 NVCC_PLL ANALO
G
—XTALI ——
XTALO T17 NVCC_PLL ANALO
G
—XTALO ——
1SNVS_TAMPER0 to SNVS_TAMPER9 can be configured as GPIO or tamper detection pin, it is depending on the fuse setting
TAMPER_PIN_DISABLE[1:0]. When the pad is configured as GPIO, the value is keeper out of reset.
2SNVS_TAMPER0 to SNVS_TAMPER9 is input unconnected in the following conditions.
—SNVS low power mode when configured as GPIO
—Tamper functions are not used when configured as TAMPER detection pins
It is required to connect external 1M Ohm pull-up or pull-down resistors to the pad to avoid the undesired leakage under two
conditions above.
Table 91. 14 x 14 mm Functional Contact Assignments (continued)
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
122 NXP Semiconductors
Package Information and Contact Assignments
6.1.3 14 x 14 mm, 0.8 mm Pitch, Ball Map
Table 92 shows the 14 x 14 mm, 0.8 mm pitch ball map for the i.MX 6ULL.
Table 92. 14 x 14 mm, 0.8 mm Pitch, Ball Map
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
A
VSS
SD1_DATA3
NAND_READY_B
NAND_CLE
NAND_DATA07
NAND_DATA06
NAND_DATA02
LCD_CLK
LCD_DATA01
LCD_DATA06
LCD_DATA09
LCD_DATA14
LCD_DATA18
LCD_DATA22
ENET2_TX_DATA0
ENET2_TX_DATA1
VSS
A
B
SD1_DATA2
SD1_DATA1
SD1_DATA0
NAND_ALE
NAND_CE1_B
NAND_DATA05
NAND_DATA01
LCD_ENABLE
LCD_DATA00
LCD_DATA05
LCD_DATA08
LCD_DATA13
LCD_DATA17
LCD_DATA21
ENET2_TX_EN
LCD_DATA23
ENET2_RX_EN
B
C
SD1_CLK
SD1_CMD
VSS
NVCC_SD1
NAND_CE0_B
NAND_DATA04
VSS
NAND_WE_B
LCD_VSYNC
LCD_DATA04
VSS
LCD_DATA12
LCD_DATA16
LCD_DATA20
VSS
ENET2_RX_DATA1
ENET2_RX_DATA0
C
D
CSI_DATA07
CSI_DATA06
CSI_DATA05
CSI_DATA04
NAND_WP_B
NAND_DATA03
NAND_DATA00
NAND_RE_B
LCD_HSYNC
LCD_DATA03
LCD_DATA07
LCD_DATA11
LCD_DATA15
LCD_DATA19
ENET1_RX_ER
ENET2_RX_ER
ENET2_TX_CLK
D
E
CSI_DATA03
CSI_DATA02
CSI_DATA01
CSI_DATA00
CSI_PIXCLK
NAND_DQS
NVCC_NAND
VSS
LCD_RESET
LCD_DATA02
VSS
LCD_DATA10
NVCC_LCD
ENET1_TX_DATA1
ENET1_TX_DATA0
ENET1_RX_EN
ENET1_RX_DATA1
E
F
DRAM_ODT1
CSI_VSYNC
CSI_HSYNC
NVCC_CSI
CSI_MCLK
VSS
VSS
VSS
VSS
VSS
VSS
VSS
NVCC_ENET
ENET1_TX_CLK
ENET1_TX_EN
ENET1_RX_DATA0
UART5_TX_DATA
F
Package Information and Contact Assignments
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 123
G
DRAM_ADDR14
DRAM_ADDR06
VSS
DRAM_RESET
VSS
NVCC_DRAM
VSS
VDD_SOC_CAP
VDD_ARM_CAP
VDD_ARM_CAP
VDD_ARM_CAP
VSS
UART5_RX_DATA
UART3_RTS_B
VSS
UART4_RX_DATA
UART4_TX_DATA
G
H
DRAM_SDBA1
DRAM_ADDR01
DRAM_ADDR13
DRAM_ADDR07
DRAM_CS1_B
NVCC_DRAM
VSS
VDD_SOC_CAP
VDD_SOC_IN
VDD_SOC_IN
VDD_ARM_CAP
VSS
NVCC_UART
UART2_RTS_B
UART3_CTS_B
UART3_RX_DATA
UART3_TX_DATA
H
J
DRAM_SDWE_B
DRAM_CAS_B
DRAM_SDCKE1
DRAM_ADDR08
VSS
NVCC_DRAM
VSS
VDD_SOC_CAP
VDD_SOC_IN
VDD_SOC_IN
VDD_SOC_CAP
VSS
NVCC_GPIO
UART1_RTS_B
UART2_CTS_B
UART2_RX_DATA
UART2_TX_DATA
J
K
DRAM_ADDR02
DRAM_SDBA2
DRAM_ADDR11
DRAM_ADDR04
DRAM_ADDR15
NVCC_DRAM
VSS
VDD_SOC_CAP
VDD_SOC_IN
VDD_SOC_IN
VDD_SOC_CAP
VSS
GPIO1_IO00
UART1_TX_DATA
UART1_CTS_B
UART1_RX_DATA
GPIO1_IO06
K
L
DRAM_ADDR05
DRAM_ADDR09
VSS
DRAM_ADDR12
DRAM_ADDR00
NVCC_DRAM
VSS
VDD_SOC_CAP
VDD_SOC_CAP
VDD_SOC_CAP
VDD_SOC_CAP
VSS
VDDA_ADC_3P3
GPIO1_IO02
GPIO1_IO01
GPIO1_IO07
GPIO1_IO03
L
M
DRAM_SDBA0
DRAM_ADDR03
DRAM_SDCKE0
DRAM_ADDR10
DRAM_RAS_B
NVCC_DRAM
VSS
VSS
VSS
VSS
VSS
NGND_KEL0
ADC_VREFH
JTAG_TCK
GPIO1_IO09
GPIO1_IO04
GPIO1_IO05
M
N
DRAM_ODT0
DRAM_CS0_B
VSS
DRAM_ZQPAD
VSS
NVCC_DRAM_2P5
TEST_MODE
SNVS_TAMPER5
SNVS_TAMPER8
SNVS_TAMPER7
SNVS_TAMPER6
VDD_SNVS_CAP
VDD_HIGH_IN
JTAG_TRST_B
JTAG_TDO
JTAG_TDI
GPIO1_IO08
N
Table 92. 14 x 14 mm, 0.8 mm Pitch, Ball Map (continued)
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
124 NXP Semiconductors
Package Information and Contact Assignments
6.2 9 x 9 mm Package Information
6.2.1 9 x 9 mm, 0.5 mm Pitch, Ball Matrix
Figure 71 shows the top, bottom, and side views of the 9 x 9 mm BGA package.
P
DRAM_SDCLK0_P
DRAM_SDCLK0_N
DRAM_DATA13
DRAM_VREF
DRAM_DATA12
DRAM_SDQS0_P
DRAM_SDQS0_N
POR_B
SNVS_TAMPER4
SNVS_TAMPER3
SNVS_TAMPER2
VDD_SNVS_IN
NVCC_PLL
JTAG_TMS
JTAG_MOD
CCM_CLK1_N
CCM_CLK1_P
P
R
DRAM_DATA15
DRAM_DATA14
VSS
DRAM_DATA11
VSS
SNVS_TAMPER9
VSS
ONOFF
SNVS_TAMPER1
SNVS_TAMPER0
VSS
VDD_USB_CAP
GPANAIO
VDD_HIGH_CAP
VDD_HIGH_CAP
VSS
VSS
R
T
DRAM_SDQS1_P
DRAM_SDQS1_N
DRAM_DQM1
DRAM_DATA00
DRAM_DATA06
DRAM_DATA02
DRAM_DQM0
DRAM_DATA05
SNVS_PMIC_ON_REQ
BOOT_MODE0
RTC_XTALI
USB_OTG1_VBUS
USB_OTG2_DN
VSS
USB_OTG1_DN
XTALI
XTALO
T
U
VSS
DRAM_DATA08
DRAM_DATA09
DRAM_DATA07
DRAM_DATA10
DRAM_DATA01
DRAM_DATA03
DRAM_DATA04
CCM_PMIC_STBY_REQ
BOOT_MODE1
RTC_XTALO
USB_OTG2_VBUS
USB_OTG2_DP
VSS
USB_OTG1_DP
USB_OTG1_CHD_B
VSS
U
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
Table 92. 14 x 14 mm, 0.8 mm Pitch, Ball Map (continued)
A1 \NDEX AREA
TOP VIEW
15X 05
I
4X @015 '
272x 5-. v
SEAT‘NG
PLANE
5 A
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fiib’jp‘L
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E q“somobmac 0‘5
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5 7 9 H ‘3 ‘5 17
2 4 6 5 10 12 M ‘5
A1 \NDEX AREA
BOTTOM V‘EW V‘EW D—D
T‘TLE: MAPBGA, DOCUMENT N0295ASAOOEBQD REV: O
9 X 9 X MW PKG, STANDARD: JEDEC M07275 DDCErW
0.5 MM PITCH, 272 \/O SHEET; 1 OF 3
Package Information and Contact Assignments
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 125
Figure 71. 9 x 9 mm BGA, Case x Package Top, Bottom, and Side Views
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
126 NXP Semiconductors
Package Information and Contact Assignments
6.2.2 9 x 9 mm Supplies Contact Assignments and Functional Contact
Assignments
Table 93 shows the device connection list for ground, sense, and reference contact signals.
Table 93. 9 x 9 mm Supplies Contact Assignment
Supply Rail Name Ball(s) Position(s) Remark
ADC_VREFH N13 —
DRAM_VREF T1 —
GPANAIO T11 —
NGND_KEL0 M10 —
NVCC_CSI E5 —
NVCC_DRAM G5, L5, M5, N6 —
NVCC_DRAM_2P5 K6 —
NVCC_ENET G13 —
NVCC_GPIO M13 —
NVCC_LCD E13 —
NVCC_NAND E11 —
NVCC_PLL T13 —
NVCC_SD1 E7 —
NVCC_UART L13 —
VDD_ARM_CAP G9, G10, G11, H9, H10, H11 —
VDD_HIGH_CAP U11 —
VDD_HIGH_IN U15 —
VDD_SNVS_CAP N12 —
VDD_SNVS_IN P12 —
VDD_SOC_CAP G7, G8, H7, H8, J7, J8, K7, K8, L7, L8 —
VDD_SOC_IN J9, J10, J11, K9, K10, K11, L9, L10, L11 —
VDD_USB_CAP N11 —
VDDA_ADC_3P3 T17 —
VSS A2, A7, A12, A17, B1, C15, F1, F3, F8, F10, F17, H6, H12, J3, J15, K12, M1, M3,
M8, M17, R3, R9, R12, R15, U1, U6, U13, U17
—
Package Information and Contact Assignments
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 127
Table 94 shows an alpha-sorted list of functional contact assignments for the 9 x 9 mm package.
Table 94. 9 x 9 mm Functional Contact Assignments
Ball Name 9x9
Ball
Power
Group
Ball
Type
Out of Reset Condition
Default
Mode
Default
Function
Input/
Output Value
BOOT_MODE0 T8 VDD_SNVS_IN GPIO ALT5 GPIO5_IO10 Input 100 k
pull-down
BOOT_MODE1 U8 VDD_SNVS_IN GPIO ALT5 GPIO5_IO11 Input 100 k
pull-down
CCM_CLK1_N U16 VDD_HIGH_CAP LVDS — CCM_CLK1_N — —
CCM_CLK1_P T16 VDD_HIGH_CAP LVDS — CCM_CLK1_P — —
CCM_PMIC_STBY_REQ U7 VDD_SNVS_IN GPIO ALT0 CCM_PMIC_VSTBY_REQ Output —
CSI_DATA00 C3 NVCC_CSI GPIO ALT5 GPIO4_IO21 Input Keeper
CSI_DATA01 D4 NVCC_CSI GPIO ALT5 GPIO4_IO22 Input Keeper
CSI_DATA02 B2 NVCC_CSI GPIO ALT5 GPIO4_IO23 Input Keeper
CSI_DATA03 D1 NVCC_CSI GPIO ALT5 GPIO4_IO24 Input Keeper
CSI_DATA04 C4 NVCC_CSI GPIO ALT5 GPIO4_IO25 Input Keeper
CSI_DATA05 B3 NVCC_CSI GPIO ALT5 GPIO4_IO26 Input Keeper
CSI_DATA06 A3 NVCC_CSI GPIO ALT5 GPIO4_IO27 Input Keeper
CSI_DATA07 C2 NVCC_CSI GPIO ALT5 GPIO4_IO28 Input Keeper
CSI_HSYNC D2 NVCC_CSI GPIO ALT5 GPIO4_IO20 Input Keeper
CSI_MCLK C1 NVCC_CSI GPIO ALT5 GPIO4_IO17 Input Keeper
CSI_PIXCLK D5 NVCC_CSI GPIO ALT5 GPIO4_IO18 Input Keeper
CSI_VSYNC D3 NVCC_CSI GPIO ALT5 GPIO4_IO19 Input Keeper
DRAM_ADDR00 G1 NVCC_DRAM DDR ALT0 DRAM_ADDR00 Output 100 k
pull-up
DRAM_ADDR01 G2 NVCC_DRAM DDR ALT0 DRAM_ADDR01 Output 100 k
pull-up
DRAM_ADDR02 H1 NVCC_DRAM DDR ALT0 DRAM_ADDR02 Output 100 k
pull-up
DRAM_ADDR03 J2 NVCC_DRAM DDR ALT0 DRAM_ADDR03 Output 100 k
pull-up
DRAM_ADDR04 M4 NVCC_DRAM DDR ALT0 DRAM_ADDR04 Output 100 k
pull-up
DRAM_ADDR05 H2 NVCC_DRAM DDR ALT0 DRAM_ADDR05 Output 100 k
pull-up
DRAM_ADDR06 E4 NVCC_DRAM DDR ALT0 DRAM_ADDR06 Output 100 k
pull-up
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
128 NXP Semiconductors
Package Information and Contact Assignments
DRAM_ADDR07 J4 NVCC_DRAM DDR ALT0 DRAM_ADDR07 Output 100 k
pull-up
DRAM_ADDR08 J5 NVCC_DRAM DDR ALT0 DRAM_ADDR08 Output 100 k
pull-up
DRAM_ADDR09 J1 NVCC_DRAM DDR ALT0 DRAM_ADDR09 Output 100 k
pull-up
DRAM_ADDR10 M2 NVCC_DRAM DDR ALT0 DRAM_ADDR10 Output 100 k
pull-up
DRAM_ADDR11 K5 NVCC_DRAM DDR ALT0 DRAM_ADDR11 Output 100 k
pull-up
DRAM_ADDR12 L3 NVCC_DRAM DDR ALT0 DRAM_ADDR12 Output 100 k
pull-up
DRAM_ADDR13 H4 NVCC_DRAM DDR ALT0 DRAM_ADDR13 Output 100 k
pull-up
DRAM_ADDR14 E3 NVCC_DRAM DDR ALT0 DRAM_ADDR14 Output 100 k
pull-up
DRAM_ADDR15 E2 NVCC_DRAM DDR ALT0 DRAM_ADDR15 Output 100 k
pull-up
DRAM_CAS_B G4 NVCC_DRAM DDR ALT0 DRAM_CAS_B Output 100 k
pull-up
DRAM_CS0_B L1 NVCC_DRAM DDR ALT0 DRAM_CS0_B Output 100 k
pull-up
DRAM_CS1_B H5 NVCC_DRAM DDR ALT0 DRAM_CS1_B Output 100 k
pull-up
DRAM_DATA00 T3 NVCC_DRAM DDR ALT0 DRAM_DATA00 Input 100 k
pull-up
DRAM_DATA01 N5 NVCC_DRAM DDR ALT0 DRAM_DATA01 Input 100 k
pull-up
DRAM_DATA02 T4 NVCC_DRAM DDR ALT0 DRAM_DATA02 Input 100 k
pull-up
DRAM_DATA03 T5 NVCC_DRAM DDR ALT0 DRAM_DATA03 Input 100 k
pull-up
DRAM_DATA04 U5 NVCC_DRAM DDR ALT0 DRAM_DATA04 Input 100 k
pull-up
DRAM_DATA05 T6 NVCC_DRAM DDR ALT0 DRAM_DATA05 Input 100 k
pull-up
DRAM_DATA06 R4 NVCC_DRAM DDR ALT0 DRAM_DATA06 Input 100 k
pull-up
DRAM_DATA07 U3 NVCC_DRAM DDR ALT0 DRAM_DATA07 Input 100 k
pull-up
DRAM_DATA08 P1 NVCC_DRAM DDR ALT0 DRAM_DATA08 Input 100 k
pull-up
Table 94. 9 x 9 mm Functional Contact Assignments (continued)
Package Information and Contact Assignments
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 129
DRAM_DATA09 U2 NVCC_DRAM DDR ALT0 DRAM_DATA09 Input 100 k
pull-up
DRAM_DATA10 P3 NVCC_DRAM DDR ALT0 DRAM_DATA10 Input 100 k
pull-up
DRAM_DATA11 R2 NVCC_DRAM DDR ALT0 DRAM_DATA11 Input 100 k
pull-up
DRAM_DATA12 P4 NVCC_DRAM DDR ALT0 DRAM_DATA12 Input 100 k
pull-up
DRAM_DATA13 N2 NVCC_DRAM DDR ALT0 DRAM_DATA13 Input 100 k
pull-up
DRAM_DATA14 N1 NVCC_DRAM DDR ALT0 DRAM_DATA14 Input 100 k
pull-up
DRAM_DATA15 P2 NVCC_DRAM DDR ALT0 DRAM_DATA15 Input 100 k
pull-up
DRAM_DQM0 U4 NVCC_DRAM DDR ALT0 DRAM_DQM0 Output 100 k
pull-up
DRAM_DQM1 R1 NVCC_DRAM DDR ALT0 DRAM_DQM1 Output 100 k
pull-up
DRAM_ODT0 K2 NVCC_DRAM DDR ALT0 DRAM_ODT0 Output 100 k
pull-down
DRAM_ODT1 E1 NVCC_DRAM DDR ALT0 DRAM_ODT1 Output 100 k
pull-down
DRAM_RAS_B L4 NVCC_DRAM DDR ALT0 DRAM_RAS_B Output 100 k
pull-up
DRAM_RESET F2 NVCC_DRAM DDR ALT0 DRAM_RESET Output 100 k
pull-down
DRAM_SDBA0 H3 NVCC_DRAM DDR ALT0 DRAM_SDBA0 Output 100 k
pull-up
DRAM_SDBA1 F5 NVCC_DRAM DDR ALT0 DRAM_SDBA1 Output 100 k
pull-up
DRAM_SDBA2 G3 NVCC_DRAM DDR ALT0 DRAM_SDBA2 Output 100 k
pull-up
DRAM_SDCKE0 L2 NVCC_DRAM DDR ALT0 DRAM_SDCKE0 Output 100 k
pull-down
DRAM_SDCKE1 K1 NVCC_DRAM DDR ALT0 DRAM_SDCKE1 Output 100 k
pull-down
DRAM_SDCLK0_N K4 NVCC_DRAM DDRC
LK
ALT0 DRAM_SDCLK0_N Input 100 k
pull-up
DRAM_SDCLK0_P K3 NVCC_DRAM DDRC
LK
ALT0 DRAM_SDCLK0_P Input 100 k
pull-up
DRAM_SDQS0_N R5 NVCC_DRAM DDRC
LK
ALT0 DRAM_SDQS0_N Input 100 k
pull-down
Table 94. 9 x 9 mm Functional Contact Assignments (continued)
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
130 NXP Semiconductors
Package Information and Contact Assignments
DRAM_SDQS0_P P5 NVCC_DRAM DDRC
LK
ALT0 DRAM_SDQS0_P Input 100 k
pull-down
DRAM_SDQS1_N N4 NVCC_DRAM DDRC
LK
ALT0 DRAM_SDQS1_P Input 100 k
pull-down
DRAM_SDQS1_P N3 NVCC_DRAM DDRC
LK
ALT0 DRAM_SDQS1_N Input 100 k
pull-down
DRAM_SDWE_B F4 NVCC_DRAM DDR ALT0 DRAM_SDWE_B Output 100 k
pull-up
DRAM_ZQPAD T2 NVCC_DRAM GPIO — DRAM_ZQPAD Input Keeper
ENET1_RX_DATA0 G17 NVCC_ENET GPIO ALT5 GPIO2_IO0 Input Keeper
ENET1_RX_DATA1 F16 NVCC_ENET GPIO ALT5 GPIO2_IO1 Input Keeper
ENET1_RX_EN G16 NVCC_ENET GPIO ALT5 GPIO2_IO2 Input Keeper
ENET1_RX_ER G14 NVCC_ENET GPIO ALT5 GPIO2_IO7 Input Keeper
ENET1_TX_CLK G15 NVCC_ENET GPIO ALT5 GPIO2_IO6 Input Keeper
ENET1_TX_DATA0 E16 NVCC_ENET GPIO ALT5 GPIO2_IO3 Input Keeper
ENET1_TX_DATA1 F13 NVCC_ENET GPIO ALT5 GPIO2_IO4 Input Keeper
ENET1_TX_EN F15 NVCC_ENET GPIO ALT5 GPIO2_IO5 Input Keeper
ENET2_RX_DATA0 E17 NVCC_ENET GPIO ALT5 GPIO2_IO8 Input Keeper
ENET2_RX_DATA1 D17 NVCC_ENET GPIO ALT5 GPIO2_IO9 Input Keeper
ENET2_RX_EN D16 NVCC_ENET GPIO ALT5 GPIO2_IO10 Input Keeper
ENET2_RX_ER H13 NVCC_ENET GPIO ALT5 GPIO2_IO15 Input Keeper
ENET2_TX_CLK H14 NVCC_ENET GPIO ALT5 GPIO2_IO14 Input Keeper
ENET2_TX_DATA0 E14 NVCC_ENET GPIO ALT5 GPIO2_IO11 Input Keeper
ENET2_TX_DATA1 F14 NVCC_ENET GPIO ALT5 GPIO2_IO12 Input Keeper
ENET2_TX_EN E15 NVCC_ENET GPIO ALT5 GPIO2_IO13 Input Keeper
GPIO1_IO00 M14 NVCC_GPIO GPIO ALT5 GPIO1_IO00 Input Keeper
GPIO1_IO01 M15 NVCC_GPIO GPIO ALT5 GPIO1_IO01 Input Keeper
GPIO1_IO02 M16 NVCC_GPIO GPIO ALT5 GPIO1_IO02 Input Keeper
GPIO1_IO03 N16 NVCC_GPIO GPIO ALT5 GPIO1_IO03 Input Keeper
GPIO1_IO04 N17 NVCC_GPIO GPIO ALT5 GPIO1_IO04 Input Keeper
GPIO1_IO05 P15 NVCC_GPIO GPIO ALT5 GPIO1_IO05 Input Keeper
GPIO1_IO06 N15 NVCC_GPIO GPIO ALT5 GPIO1_IO06 Input Keeper
GPIO1_IO07 N14 NVCC_GPIO GPIO ALT5 GPIO1_IO07 Input Keeper
GPIO1_IO08 P14 NVCC_GPIO GPIO ALT5 GPIO1_IO08 Input Keeper
GPIO1_IO09 P16 NVCC_GPIO GPIO ALT5 GPIO1_IO09 Input Keeper
Table 94. 9 x 9 mm Functional Contact Assignments (continued)
Package Information and Contact Assignments
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 131
JTAG_MOD R13 NVCC_GPIO SJC ALT0 SJC_MOD Input 100 k
pull-up
JTAG_TCK R17 NVCC_GPIO SJC ALT0 SJC_TCK Input 47 k
pull-up
JTAG_TDI P17 NVCC_GPIO SJC ALT0 SJC_TDI Input 47 k
pull-up
JTAG_TDO R16 NVCC_GPIO SJC ALT0 SJC_TDO Output Keeper
JTAG_TMS R14 NVCC_GPIO SJC ALT0 SJC_TMS Input 47 k
pull-up
JTAG_TRST_B P13 NVCC_GPIO SJC ALT0 SJC_TRSTB Input 47 k
pull-up
LCD_CLK C11 NVCC_LCD GPIO ALT5 GPIO3_IO0 Input Keeper
LCD_DATA00 D11 NVCC_LCD GPIO ALT5 GPIO3_IO5 Input Keeper
LCD_DATA01 B12 NVCC_LCD GPIO ALT5 GPIO3_IO6 Input Keeper
LCD_DATA02 D10 NVCC_LCD GPIO ALT5 GPIO3_IO7 Input Keeper
LCD_DATA03 B11 NVCC_LCD GPIO ALT5 GPIO3_IO8 Input Keeper
LCD_DATA04 A11 NVCC_LCD GPIO ALT5 GPIO3_IO9 Input Keeper
LCD_DATA05 D12 NVCC_LCD GPIO ALT5 GPIO3_IO10 Input Keeper
LCD_DATA06 D13 NVCC_LCD GPIO ALT5 GPIO3_IO11 Input Keeper
LCD_DATA07 C12 NVCC_LCD GPIO ALT5 GPIO3_IO12 Input Keeper
LCD_DATA08 B13 NVCC_LCD GPIO ALT5 GPIO3_IO13 Input Keeper
LCD_DATA09 A13 NVCC_LCD GPIO ALT5 GPIO3_IO14 Input Keeper
LCD_DATA10 D14 NVCC_LCD GPIO ALT5 GPIO3_IO15 Input Keeper
LCD_DATA11 C13 NVCC_LCD GPIO ALT5 GPIO3_IO16 Input Keeper
LCD_DATA12 C14 NVCC_LCD GPIO ALT5 GPIO3_IO17 Input Keeper
LCD_DATA13 A14 NVCC_LCD GPIO ALT5 GPIO3_IO18 Input Keeper
LCD_DATA14 B14 NVCC_LCD GPIO ALT5 GPIO3_IO19 Input Keeper
LCD_DATA15 A16 NVCC_LCD GPIO ALT5 GPIO3_IO20 Input Keeper
LCD_DATA16 A15 NVCC_LCD GPIO ALT5 GPIO3_IO21 Input Keeper
LCD_DATA17 D15 NVCC_LCD GPIO ALT5 GPIO3_IO22 Input Keeper
LCD_DATA18 B15 NVCC_LCD GPIO ALT5 GPIO3_IO23 Input Keeper
LCD_DATA19 E12 NVCC_LCD GPIO ALT5 GPIO3_IO24 Input Keeper
LCD_DATA20 B17 NVCC_LCD GPIO ALT5 GPIO3_IO25 Input Keeper
LCD_DATA21 C16 NVCC_LCD GPIO ALT5 GPIO3_IO26 Input Keeper
LCD_DATA22 B16 NVCC_LCD GPIO ALT5 GPIO3_IO27 Input Keeper
LCD_DATA23 C17 NVCC_LCD GPIO ALT5 GPIO3_IO28 Input Keeper
Table 94. 9 x 9 mm Functional Contact Assignments (continued)
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
132 NXP Semiconductors
Package Information and Contact Assignments
LCD_ENABLE A10 NVCC_LCD GPIO ALT5 GPIO3_IO1 Input Keeper
LCD_HSYNC B10 NVCC_LCD GPIO ALT5 GPIO3_IO2 Input Keeper
LCD_RESET E10 NVCC_LCD GPIO ALT5 GPIO3_IO4 Input Keeper
LCD_VSYNC C10 NVCC_LCD GPIO ALT5 GPIO3_IO3 Input Keeper
NAND_ALE D8 NVCC_NAND GPIO ALT5 GPIO4_IO10 Input Keeper
NAND_CE0_B E8 NVCC_NAND GPIO ALT5 GPIO4_IO13 Input Keeper
NAND_CE1_B B6 NVCC_NAND GPIO ALT5 GPIO4_IO14 Input Keeper
NAND_CLE B7 NVCC_NAND GPIO ALT5 GPIO4_IO15 Input Keeper
NAND_DATA00 D7 NVCC_NAND GPIO ALT5 GPIO4_IO2 Input Keeper
NAND_DATA01 A9 NVCC_NAND GPIO ALT5 GPIO4_IO3 Input Keeper
NAND_DATA02 C9 NVCC_NAND GPIO ALT5 GPIO4_IO4 Input Keeper
NAND_DATA03 C7 NVCC_NAND GPIO ALT5 GPIO4_IO5 Input Keeper
NAND_DATA04 C8 NVCC_NAND GPIO ALT5 GPIO4_IO6 Input Keeper
NAND_DATA05 A6 NVCC_NAND GPIO ALT5 GPIO4_IO7 Input Keeper
NAND_DATA06 B9 NVCC_NAND GPIO ALT5 GPIO4_IO8 Input Keeper
NAND_DATA07 B8 NVCC_NAND GPIO ALT5 GPIO4_IO9 Input Keeper
NAND_DQS E6 NVCC_NAND GPIO ALT5 GPIO4_IO16 Input Keeper
NAND_RE_B D9 NVCC_NAND GPIO ALT5 GPIO4_IO0 Input Keeper
NAND_READY_B E9 NVCC_NAND GPIO ALT5 GPIO4_IO12 Input Keeper
NAND_WE_B A8 NVCC_NAND GPIO ALT5 GPIO4_IO1 Input Keeper
NAND_WP_B D6 NVCC_NAND GPIO ALT5 GPIO4_IO11 Input Keeper
ONOFF R6 VDD_SNVS_IN SRC ALT0 SRC_RESET_B Input 100 k
pull-up
POR_B R10 VDD_SNVS_IN SRC ALT0 SRC_POR_B Input 100 k
pull-up
RTC_XTALI T12 VDD_SNVS_CA
P
ANAL
OG
—RTC_XTALI ——
RTC_XTALO U12 VDD_SNVS_CA
P
ANAL
OG
—RTC_XTALO ——
SD1_CLK C5 NVCC_SD GPIO ALT5 GPIO2_IO17 Input Keeper
SD1_CMD C6 NVCC_SD GPIO ALT5 GPIO2_IO16 Input Keeper
SD1_DATA0 A5 NVCC_SD GPIO ALT5 GPIO2_IO18 Input Keeper
SD1_DATA1 A4 NVCC_SD GPIO ALT5 GPIO2_IO19 Input Keeper
SD1_DATA2 B5 NVCC_SD GPIO ALT5 GPIO2_IO20 Input Keeper
SD1_DATA3 B4 NVCC_SD GPIO ALT5 GPIO2_IO21 Input Keeper
Table 94. 9 x 9 mm Functional Contact Assignments (continued)
Package Information and Contact Assignments
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 133
SNVS_PMIC_ON_REQ T7 VDD_SNVS_IN GPIO ALT0 SNVS_PMIC_ON_REQ Output 100 k
pull-up
SNVS_TAMPER0 R8 VDD_SNVS_IN GPIO ALT5 GPIO5_IO00/SNVS_TAMPE
R01
Input Keeper1,
2
SNVS_TAMPER1 P6 VDD_SNVS_IN GPIO ALT5 GPIO5_IO01/SNVS_TAMPE
R11
Input Keeper/N
ot
connecte
d1,2
SNVS_TAMPER2 N10 VDD_SNVS_IN GPIO ALT5 GPIO5_IO02/SNVS_TAMPE
R21
Input Keeper/N
ot
connecte
d1,2
SNVS_TAMPER3 P10 VDD_SNVS_IN GPIO ALT5 GPIO5_IO03/SNVS_TAMPE
R31
Input Keeper/N
ot
connecte
d1,2
SNVS_TAMPER4 P7 VDD_SNVS_IN GPIO ALT5 GPIO5_IO04/SNVS_TAMPE
R41
Input Keeper/N
ot
connecte
d1,2
SNVS_TAMPER5 P8 VDD_SNVS_IN GPIO ALT5 GPIO5_IO05/SNVS_TAMPE
R51
Input Keeper/N
ot
connecte
d1,2
SNVS_TAMPER6 R7 VDD_SNVS_IN GPIO ALT5 GPIO5_IO06/SNVS_TAMPE
R61
Input Keeper/N
ot
connecte
d1,2
SNVS_TAMPER7 N9 VDD_SNVS_IN GPIO ALT5 GPIO5_IO07/SNVS_TAMPE
R71
Input Keeper/N
ot
connecte
d1,2
SNVS_TAMPER8 N8 VDD_SNVS_IN GPIO ALT5 GPIO5_IO08/SNVS_TAMPE
R81
Input Keeper/N
ot
connecte
d1,2
SNVS_TAMPER9 P9 VDD_SNVS_IN GPIO ALT5 GPIO5_IO09/SNVS_TAMPE
R91
Input Keeper/N
ot
connecte
d1,2
TEST_MODE N7 VDD_SNVS_IN TCU ALT0 TCU_TEST_MODE Input Keeper
UART1_CTS_B L14 NVCC_UART GPIO ALT5 GPIO1_IO18 Input Keeper
UART1_RTS_B K14 NVCC_UART GPIO ALT5 GPIO1_IO19 Input Keeper
UART1_RX_DATA L17 NVCC_UART GPIO ALT5 GPIO1_IO17 Input Keeper
UART1_TX_DATA L15 NVCC_UART GPIO ALT5 GPIO1_IO16 Input Keeper
Table 94. 9 x 9 mm Functional Contact Assignments (continued)
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
134 NXP Semiconductors
Package Information and Contact Assignments
UART2_CTS_B J17 NVCC_UART GPIO ALT5 GPIO1_IO22 Input Keeper
UART2_RTS_B J14 NVCC_UART GPIO ALT5 GPIO1_IO23 Input Keeper
UART2_RX_DATA K16 NVCC_UART GPIO ALT5 GPIO1_IO21 Input Keeper
UART2_TX_DATA L16 NVCC_UART GPIO ALT5 GPIO1_IO20 Input Keeper
UART3_CTS_B H16 NVCC_UART GPIO ALT5 GPIO1_IO26 Input Keeper
UART3_RTS_B H15 NVCC_UART GPIO ALT5 GPIO1_IO27 Input Keeper
UART3_RX_DATA K15 NVCC_UART GPIO ALT5 GPIO1_IO25 Input Keeper
UART3_TX_DATA K17 NVCC_UART GPIO ALT5 GPIO1_IO24 Input Keeper
UART4_RX_DATA H17 NVCC_UART GPIO ALT5 GPIO1_IO29 Input Keeper
UART4_TX_DATA J16 NVCC_UART GPIO ALT5 GPIO1_IO28 Input Keeper
UART5_RX_DATA J13 NVCC_UART GPIO ALT5 GPIO1_IO31 Input Keeper
UART5_TX_DATA K13 NVCC_UART GPIO ALT5 GPIO1_IO30 Input Keeper
USB_OTG1_CHD_B T15 OPEN DRAIN GPIO — USB_OTG1_CHD_B — —
USB_OTG1_DN R11 VDD_USB_CAP ANAL
OG
— USB_OTG1_DN — —
USB_OTG1_DP P11 VDD_USB_CAP ANAL
OG
— USB_OTG1_DP — —
USB_OTG1_VBUS T9 USB_VBUS VBUS
POWE
R
— USB_OTG1_VBUS — —
USB_OTG2_DN T10 VDD_USB_CAP ANAL
OG
— USB_OTG2_DN — —
USB_OTG2_DP U10 VDD_USB_CAP ANAL
OG
— USB_OTG2_DP — —
USB_OTG2_VBUS U9 USB_VBUS VBUS
POWE
R
— USB_OTG2_VBUS — —
XTALI T14 NVCC_PLL ANAL
OG
—XTALI ——
XTALO U14 NVCC_PLL ANAL
OG
—XTALO ——
1SNVS_TAMPER0 to SNVS_TAMPER9 can be configured as GPIO or tamper detection pin, it is depending on the fuse setting
TAMPER_PIN_DISABLE[1:0]. When the pad is configured as GPIO, the value is keeper out of reset.
2SNVS_TAMPER0 to SNVS_TAMPER9 is input unconnected in the following conditions.
—SNVS low power mode when configured as GPIO
—Tamper functions are not used when configured as TAMPER detection pins
It is required to connect external 1M Ohm pull-up or pull-down resistors to the pad to avoid the undesired leakage under two
conditions above.
Table 94. 9 x 9 mm Functional Contact Assignments (continued)
Package Information and Contact Assignments
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 135
6.2.3 9 x 9 mm, 0.5 mm Pitch, Ball Map
Table 95 shows the 9 x 9 mm, 0.5 mm pitch ball map for the i.MX 6ULL.
Table 95. 9x9 mm, 0.5 mm Pitch, Ball Map
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
A
VSS
CSI_DATA06
SD1_DATA1
SD1_DATA0
NAND_DATA05
VSS
NAND_WEB
NAND_DATA01
LCD_ENABLE
LCD_DATA04
VSS
LCD_DATA09
LCD_DATA13
LCD_DATA16
LCD_DATA15
VSS
A
B
VSS
CSI_DATA02
CSI_DATA05
SD1_DATA3
SD1_DATA2
NAND_CE1_B
NAND_CLE
NAND_DATA07
NAND_DATA06
LCD_HSYNC
LCD_DATA03
LCD_DATA01
LCD_DATA08
LCD_DATA14
LCD_DATA18
LCD_DATA22
LCD_DATA20
B
C
CSI_MCLK
CSI_DATA07
CSI_DATA00
CSI_DATA04
SD1_CLK
SD1_CMD
NAND_DATA03
NAND_DATA04
NAND_DATA02
LCD_VSYNC
LCD_CLK
LCD_DATA07
LCD_DATA11
LCD_DATA12
VSS
LCD_DATA21
LCD_DATA23
C
D
CSI_DATA03
CSI_HSYNC
CSI_VSYNC
CSI_DATA01
CSI_PIXCLK
NAND_WP_B
NAND_DATA00
NAND_ALE
NAND_RE_B
LCD_DATA02
LCD_DATA00
LCD_DATA05
LCD_DATA06
LCD_DATA10
LCD_DATA17
ENET2_RX_EN
ENET2_RX_DATA1
D
E
DRAM_ODT1
DRAM_ADDR15
DRAM_ADDR14
DRAM_ADDR06
NVCC_CSI
NAND_DQS
NVCC_SD1
NAND_CE0_B
NAND_READY_B
LCD_RESET
NVCC_NAND
LCD_DATA19
NVCC_LCD
ENET2_TX_DATA0
ENET2_TX_EN
ENET1_TX_DATA0
ENET2_RX_DATA0
E
F
VSS
DRAM_RESET
VSS
DRAM_SDWE_B
DRAM_SDBA1
VSS
VSS
ENET1_TX_DATA1
ENET2_TX_DATA1
ENET1_TX_EN
ENET1_RX_DATA1
VSS
F
G
DRAM_ADDR00
DRAM_ADDR01
DRAM_SDBA2
DRAM_CAS_B
NVCC_DRAM
VDD_SOC_CAP
VDD_SOC_CAP
VDD_ARM_CAP
VDD_ARM_CAP
VDD_ARM_CAP
NVCC_ENET
ENET1_RX_ER
ENET1_TX_CLK
ENET1_RX_EN
ENET1_RX_DATA0
G
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
136 NXP Semiconductors
Package Information and Contact Assignments
H
DRAM_ADDR02
DRAM_ADDR05
DRAM_SDBA0
DRAM_ADDR13
DRAM_CSI_B
VSS
VDD_SOC_CAP
VDD_SOC_CAP
VDD_ARM_CAP
VDD_ARM_CAP
VDD_ARM_CAP
VSS
ENET2_RX_ER
ENET2_TX_CLK
UART3_RTS_B
UART3_CTS_B
UART4_RX_DAT
H
J
DRAM_ADDR09
DRAM_ADDR03
VSS
DRAM_ADDR07
DRAM_ADDR08
VDD_SOC_CAP
VDD_SOC_CAP
VDD_SOC_IN
VDD_SOC_IN
VDD_SOC_IN
UART5_RX_DAT
UART2_RTS_B
VSS
UART4_TX_DATA
UART2_CTS_B
J
K
DRAM_SDCKE1
DRAM_ODT0
DRAM_SDCLK0_P
DRAM_SDCLK0_N
DRAM_ADDR11
NVCC_DRAM_2P5
VDD_SOC_CAP
VDD_SOC_CAP
VDD_SOC_IN
VDD_SOC_IN
VDD_SOC_IN
VSS
UART5_TX_DATA
UART1_RTS_B
UART3_RX_DATA
UART2_RX_DATA
UART3_TX_DATA
K
L
DRAM_CS0_B
DRAM_SDCKE0
DRAM_ADDR12
DRAM_RAS_B
NVCC_DRAM
VDD_SOC_CAP
VDD_SOC_CAP
VDD_SOC_IN
VDD_SOC_IN
VDD_SOC_IN
NVCC_UART
UART1_CTS_B
UART1_TX_DATA
UART2_TX-DATA
UART1_RX_DAT
L
M
VSS
DRAM_ADDR10
VSS
DRAM_ADDR04
NVCC_DRAM
VSS
NGND_KEL0
NVCC_GPIO
GPIO1_IO00
GPIO_IO01
GPIO1_IO02
VSS
M
N
DRAM_DATA14
DRAM_DATA13
DRAM_SDQS1_P
DRAM_SDQS1_N
DRAM_DATA01
NVCC_DRAM
TEST_MODE
SNVS_TAMPER8
SNVS_TAMPER7
SNVS_DAMPER2
VDD_USB_CAP
VDD_SNVS_CAP
ADC_VREFH
GPIO1_IO07
GPIO1_IO06
GPIO1_IO03
GPIO1_IO04
N
P
DRAM_DATA08
DRAM_DATA15
DRAM_DATA10
DRAM_DATA12
DRAM_SDQS0_P
SNVS_TAMPER1
SNVS_TAMPER4
SNVS_TAMPER5
SNVS_TAMPER9
SNVS_TAMPER3
USB_OTG1_DP
VDD_SNVS_IN
JTAG_TRST_B
GPIO1_IO08
GPIO1_IO05
GPIO1_IO09
JTAG_TDI
P
Table 95. 9x9 mm, 0.5 mm Pitch, Ball Map (continued)
Package Information and Contact Assignments
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
NXP Semiconductors 137
R
DRAM_DM1
DRAM_DATA11
VSS
DRAM_DATA06
DRAM_SDQS0_N
ONOFF
SNVS_TAMPER6
SNVS_TAMPER0
VSS
POR_B
USB_OTG1_DN
VSS
JTAG_MOD
JTAG_TMS
VSS
JTAG_TDO
JTAG_TCK
R
T
DRAM_VREF
DRAM_ZQPAD
DRAM_DATA00
DRAM_DATA02
DRAM_DATA03
DRAM_DATA05
SNVS_PMIC_ON_REQ
BOOT_MODE0
USB_OTG1_VBUS
USB_OTG2_DN
GPANAIO
RTC_XTALI
NVCC_PLL
XTALI
USB_OTG1_CHD_B
CCM_CLK1_P
VDDA_ADC_3P3
T
U
VSS
DRAM_DATA09
DRAM_DATA07
DRAM_DQM0
DRAM_DATA04
VSS
CCM_PMIC_STBY_REQ
BOOT_MODE1
USB_OTG2_VBUS
USB_OTG2_DP
VDD_HIGH_CAP
RTC_XTALO
VSS
XTALO
VDD_HIGH_IN
CCM_CLK1_N
VSS
U
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
Table 95. 9x9 mm, 0.5 mm Pitch, Ball Map (continued)
i.MX 6ULL Applications Processors for Consumer Products, Rev. 1.3, 08/2018
138 NXP Semiconductors
Revision History
7 Revision History
Table 96 provides a revision history for this data sheet.
Table 96. i.MX 6ULL Data Sheet Document Revision History
Rev.
Number Date Substantive Change(s)
1.3 08/2018 • Updated the VDD_SOC_CAP values in the Table 10, "Operating Ranges"
1.2 09/2017 • Updated the part numbers and added a new part number (MCIMX6Y2DVK09AB) in the Table 1,
"Ordering Information"
• Updated the silicon revision number in the Figure 1, "Part Number Nomenclature—i.MX 6ULL"
• Updated the GPIO1_IO09 signal name in the Table 85, "SD/MMC Boot through USDHC1" and added
a footnote
• Updated the NAND_ALE signal name in the Table 86, "SD/MMC Boot through USDHC2" and added
a footnote
1.1 05/2017 • Changed terminology from “floating” to “not connected”
• Changed the LV-DDR3 to DDR3L in the Section 1.2, Features"
• Added a footnote regarding maximum voltage allowance in the Table 7, "Absolute Maximum Ratings"
• Updated the minimum value of VDD_SOC_CAP in the Low Power Run Mode: LDO Enabled from the
Table 10, "Operating Ranges"
• Removed the LPSR mode in the Section 4.1.6, Power Modes"
• Removed a note in the Section 4.2.1, Power-Up Sequence"
• Replaced the MMDC compatible information with a cross reference in the Section 4.6.3, DDR I/O DC
Parameters" and Section 4.7.2, DDR I/O AC Parameters"
• Removed the Section 4.9.4, “DDR SDRAM Specific Parameters (DDR3 and LPDDR2)”
• Added a new Section 4.10, Multi-Mode DDR Controller (MMDC)"
• Changed SD3 min to 1.7 ns in the Table 51, "eMMC4.4/4.41 Interface Timing Specification"
1 04/2017 • Added two new part numbers in the Table 1, "Ordering Information"
• Updated the Part differentiator number 3 to Reserved, removed 300 MHz from frequency, and added
900 MHz in the Figure 1, "Part Number Nomenclature—i.MX 6ULL"
• Updated the DDR I/O supply voltage and added a table not in the Table 7, "Absolute Maximum
Ratings"
• Updated Table 10, "Operating Ranges"
• Added Max. current for VDD_SOC_IN at 900 MHz in the Table 13, "Maximum Supply Currents"
• Updated the LDO_2P5 of the LOW POWER IDLE: LDO Bypassed row in the Table 15, "Low Power
Mode Current and Power Consumption"
• Updated the Figure 18, "Asynchronous A/D Muxed Write Access"
• Added a new Section 4.12.9.1, LCDIF Signal Mapping"
• Added a note in the Section 4.2.1, Power-Up Sequence"
• Updated VDD_HIGH_CAP pin assignment in the Table 90, "14 x 14 mm Supplies Contact
Assignment"
• Updated VDD_HIGH_CAP pin name in the Table 92, "14 x 14 mm, 0.8 mm Pitch, Ball Map"
0 09/2016 • Initial public release
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Document Number: IMX6ULLCEC
Rev. 1.3
08/2018
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