JDP2S02AFS Datasheet by Toshiba Semiconductor and Storage

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TOSHIBA 2014-03-01
JDP2S02AFS
2014-03-01
1
0.8±0.05
0.2
1.0±0.05
0.0.05
0.6±0.05
カソ
マー
0.1 0.1
A
0.48+0.02
-0.03
±0.05
A
M
0.07
TOSHIBA Diode Silicon Epitaxial PIN Type
JDP2S02AFS
UHF~VHF Band RF Switch Applications
Suitable for reducing set’s size as a result from enabling high-density
mounting due to 2-pin small packages.
Low series resistance: rs = 1.0 (typ.)
Low capacitance: CT = 0.3 pF (typ.)
Absolute Maximum Ratings (Ta = 25°C)
Characteristics Symbol Rating Unit
Reverse voltage VR 30 V
Forward current IF 50 mA
Junction temperature Tj 150 °C
Storage temperature range Tstg 55 to 150 °C
Note: Using continuously under heavy loads (e.g. the application of high
temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the
reliability significantly even if the operating conditions (i.e.
operating temperature/current/voltage, etc.) are within the
absolute maximum ratings.
Please design the appropriate reliability upon reviewing the
Toshiba Semiconductor Reliability Handbook (“Handling
Precautions”/“Derating Concept and Methods”) and individual
reliability data (i.e. reliability test report and estimated failure rate, etc).
Electrical Characteristics (Ta = 25°C)
Characteristics Symbol Test Condition Min Typ. Max Unit
Reverse voltage VR I
R = 10 μA 30 V
Reverse current IR V
R = 30 V 0.1 μA
Forward voltage VF IF = 50 mA 0.9 0.94 V
Capacitance CT V
R = 1 V, f = 1 MHz 0.3 0.4 pF
Series resistance rs I
F = 10 mA, f = 100 MHz 1.0 1.5
Note: Signal level when capacitance is measured. Vsig = 100 mVrms
Marking
Unit: mm
JEDEC
JEITA
TOSHIBA 1-1L1A
Weight: 0.0006 g (typ.)
2
Start of commercial production
2002-12
TOSHIBA Ta 2m Teslev ngm mu g E ,_ 3 U n) s g m E 2 w ‘ 3 5 m 3a 5a 05 cm (H ‘ m Reverse venege vR (V) Forwardcurrem \; (mA) 2 2014-03-01
JDP2S02AFS
2014-03-01
2
Reverse voltage VR (V)
CT – VR
Capacitance CT (pF)
Forward current IF (mA)
rs – IF
Series resistance rs (Ω)
3
0.1
1
0.3
0.5
1
3 5 30 5010
f = 1 MHz
Ta = 25°C
0.5
0.01 0.1 1 10
1
10
100
Ta = 25°C
Tester: HP4291A
f = 0.1 GHz
0.5
1.0
1.5
f = 0.1 GHz
0.5
1.0
1.5
TOSHIBA 2014-03-01
JDP2S02AFS
2014-03-01
3
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OCCURRING AS A RESULT OF NONCOMPLIANCE WITH APPLICABLE LAWS AND REGULATIONS.

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