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X7R Dielectric
Specifications and Test Methods
Parameter/Test X7R Specification Limits Measuring Conditions
Operating Temperature Range -55ºC to +125ºC Temperature Cycle Chamber
Capacitance Within specified tolerance
Freq.: 1.0 kHz ± 10%
Voltage: 1.0Vrms ± .2V
For Cap > 10µF, 0.5Vrm @ 120Hz
Dissipation Factor
≤ 10% for ≥ 50V DC rating≤ 12.5% for 25V DC rating
≤ 12.5% for 25V and 16V DC rating
≤ 12.5% for ≤ 10V DC rating
Contact Factory for DF by PN
Insulation Resistance 100,000MΩ or 1000MΩ - µF,
whichever is less
Charge device with rated voltage for
120 ± 5 secs @ room temp/humidity
Dielectric Strength No breakdown or visual defects
Charge device with 250% of rated voltage for 1-5
seconds, w/charge and discharge current limited to
50 mA (max)
Note: Charge device with 150% of rated voltage for
500V devices.
Resistance to
Flexure
Stresses
Appearance No defects
Deflection: 2mm
Test Time: 30 seconds
Capacitance
Variation ≤ ±12%
Dissipation
Factor Meets Initial Values (As Above)
Insulation
Resistance ≥ Initial Value x 0.3
Solderability ≥ 95% of each terminal should be covered with
fresh solder
Dip device in eutectic solder at 230 ± 5ºC
for 5.0 ± 0.5 seconds
Resistance to
Solder Heat
Appearance No defects, <25% leaching of either end terminal
Dip device in eutectic solder at 260ºC for 60
seconds. Store at room temperature for 24 ± 2hours
before measuring electrical properties.
Capacitance
Variation ≤ ±7.5%
Dissipation Factor Meets Initial Values (As Above)
Insulation
Resistance Meets Initial Values (As Above)
Dielectric
Strength Meets Initial Values (As Above)
Thermal Shock
Appearance No visual defects Step 1: -55ºC ± 2º 30 ± 3 minutes
Capacitance
Variation ≤ ±7.5% Step 2: Room Temp ≤ 3 minutes
Dissipation
Factor Meets Initial Values (As Above) Step 3: +125ºC ± 2º 30 ± 3 minutes
Insulation
Resistance Meets Initial Values (As Above) Step 4: Room Temp ≤ 3 minutes
Dielectric
Strength Meets Initial Values (As Above) Repeat for 5 cycles and measure after 24 ± 2 hours
at room temperature
Load Life
Appearance No visual defects
Charge device with ≥ rated voltage in test chamber
set at 125ºC ± 2ºC for 1000 hours (+48, -0).
Remove from test chamber and stabilize at room
temperature for 24 ± 2 hours before measuring.
Contact AVX for datasheet of specific parts.
Capacitance
Variation ≤ ±12.5%
Dissipation
Factor ≤ Initial Value x 2.0 (See Above)
Insulation
Resistance ≥ Initial Value x 0.3 (See Above)
Dielectric
Strength Meets Initial Values (As Above)
Load
Humidity
Appearance No visual defects
Store in a test chamber set at 85ºC ± 2ºC/ 85% ± 5%
relative humidity for 1000 hours (+48, -0) with rated
voltage applied.
Remove from chamber and stabilize at room
temperature and humidity for 24 ± 2 hours before
measuring.
Capacitance
Variation ≤ ±12.5%
Dissipation
Factor ≤ Initial Value x 2.0 (See Above)
Insulation
Resistance ≥ Initial Value x 0.3 (See Above)
Dielectric
Strength Meets Initial Values (As Above)
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